CN203275596U - Keyboard life testing apparatus - Google Patents
Keyboard life testing apparatus Download PDFInfo
- Publication number
- CN203275596U CN203275596U CN 201320240548 CN201320240548U CN203275596U CN 203275596 U CN203275596 U CN 203275596U CN 201320240548 CN201320240548 CN 201320240548 CN 201320240548 U CN201320240548 U CN 201320240548U CN 203275596 U CN203275596 U CN 203275596U
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- keyboard
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Abstract
A keyboard life testing apparatus is applied to the test of a laptop keyboard. The keyboard is provided with buttons indicating different digits and the buttons have signal pins ranging from a first signal pin to a twenty-fourth signal pin. The testing apparatus comprises a keyboard cable, a keyboard connector and a testing circuit. The keyboard cable has terminals ranging from a first terminal to a twenty-fourth terminal which are corresponding to the signal pins ranging from the first signal pin to the twenty-fourth signal pin; the keyboard connector has pins ranging from a first pin to a twenty-fourth pin which are corresponding to the terminals ranging from the first terminal to the twenty-fourth terminal; the testing circuit comprises a display unit, a power supply unit and a lead, wherein the display unit and the power supply unit are both electrically in series connection with the lead, one terminal of the lead is connected with any one pin from the first pin to a sixteenth pin, and the other terminal of the lead is connected with any one pin from a seventeenth pin to the twenty-fourth pin. By adopting the keyboard life testing apparatus, the states of the tested buttons can be monitored at any time, the keyboard is free from being removed when tested million times, energy is saved, a machine table can be prevented from being frequently detached and installed, and a service life testing machine can be prevented from being frequently stopped and started as well.
Description
[technical field]
The utility model relates to a kind of proving installation, particularly relates to a kind of keyboard endurance testing device.
[background technology]
Along with growth in the living standard, people are also more and more higher to the quality requirements of electronic product.In order to guarantee the quality of electronic product, all can carry out durable (reliability) test to button before the electronic product shipment, in use can keep good electrical performance with the button that guarantees electronic product.
Traditional durable test to button is that the open/close number of times of button directly is set in system.For example, for common key in keyboard of notebook computer and the test in function key life-span, wherein common key arranges 2,000 ten thousand times and presses down, and function key arranges 1,000 ten thousand times and presses down.Test about the keyboard of notebook computer life-span, generally after every press down for 2,000,000 times or 1,000,000 times on life testing machine, keyboard is taken out on the board that is installed to specifications and models verify whether the function of each button is qualified, if qualified continue to be arranged on life testing machine and test, if defective take off and analyze improvement.
Yet, after the method for above-mentioned test must be waited until certain testing time, could confirm whether tested keyboard underproof phenomenon occurs, if keyboard had produced bad phenomenon before reaching testing time, test afterwards is exactly to lose time and electric power.In addition, often reach certain testing time at keyboard, after just must taking off keyboard, dismounting board, bad phenomenon whether occurs install to confirm tested keyboard, remove and install so frequently board and the life testing machine that stops beginning has not only been wasted the plenty of time and more wasted great effort.
In view of this, be necessary to provide a kind of keyboard endurance testing device in fact, to address the above problem.
[summary of the invention]
Therefore, the purpose of this utility model is to provide a kind of keyboard endurance testing device, the problem of losing time, wasting electric power and frittering away energy to solve above-mentioned keyboard life testing method.
In order to achieve the above object, the keyboard endurance testing device that the utility model provides, it is applied in the keyboard of notebook computer test, the button that has the mark different digital on described keyboard, described button comprises entrance and the outlet that is distributed in the grid matrix edge, described entrance has the first to the 16 signal pins, and described outlet has the 17 to the 24 signal pins, and described proving installation comprises:
The keyboard winding displacement, it has the first to the 24 terminal, described the first to the 16 terminal is the first to the 16 signal pins of corresponding described button entrance successively, and described the 17 to the 24 terminal is the 17 to the 24 signal pins of corresponding described button outlet successively;
Keyboard connector, it has first to two ten four pin corresponding with described the first to the 24 terminal, and an end of described keyboard connector is connected with described keyboard winding displacement;
Some test circuits, it comprises a display unit, a power supply unit and a wire, described display unit and power supply unit all electrically are serially connected with in described wire, any pin in described the first to the 16 pin of one termination of described wire, any pin in described the 17 to the 24 pin of another termination of described wire.
Optionally, described test circuit has three, the quantity of the described button of the corresponding test of the quantity of described test circuit.
Optionally, described display unit is the LED lamp.
Optionally, described power supply unit is the 1.5V battery.
Compared to prior art, the utility model keyboard endurance testing device can be monitored the state of tested button at any time, has avoided that tested button is bad is also continuing test, thereby has saved time and electric power; This keyboard endurance testing device need not every test just must take off keyboard 1,000,000 times, thereby has saved energy and avoided removing and installing frequently board and stopping the life testing machine that begins.
[description of drawings]
Fig. 1 illustrates the keyboard matrix figure into one preferred embodiment of the utility model keyboard endurance testing device.
Fig. 2 illustrates as Fig. 1 the button distribution plan on keyboard.
Fig. 3 illustrates the structural representation into one preferred embodiment of the utility model keyboard endurance testing device.
[embodiment]
The button of general keyboard is all to utilize matrix diagram to control and realize corresponding function, namely determined the coordinate position of described button by the line in described matrix diagram and alignment, when the button on this coordinate position is pressed down, internal circuit can be because of the contact conducting, thereby produces the represented specific character model of this coordinate.See also Fig. 1 and Fig. 2 illustrates, as required three buttons are carried out life test.
In order to achieve the above object, seeing also Fig. 3 illustrates, the keyboard endurance testing device that the utility model provides, it is applied in the keyboard of notebook computer test, have the button 200 of mark different digital on described keyboard 100, described button 200 comprises entrance and the outlet that is distributed in the grid matrix edge, and described entrance has the first to the 16 signal pins (1～～16), described outlet has the 17 to the 24 signal pins (17～～24), and described proving installation comprises:
Some test circuits, it comprises a display unit 500, a power supply unit 510 and a wire 520, described display unit 500 and power supply unit 510 all electrically are serially connected with in described wire 520, any pin in described the first to the 16 pin of one termination of described wire 520 (1 '～～16 '), any pin in described the 17 to the 24 pin of another termination (17 '～～24 ') of described wire 520.
Wherein, described test circuit has three, the quantity of the described button 200 of the corresponding test of the quantity of described test circuit.
Wherein, described display unit 500 is the LED lamp.
Wherein, described power supply unit 510 is the 1.5V battery.
In the present embodiment, Fig. 1 illustrates the keyboard matrix figure into one preferred embodiment of the utility model keyboard endurance testing device, and at first selecting numerical reference according to Fig. 1 is that three buttons 200 that " 210 ", " 220 " reach " 230 " carry out life test.when test, contrast Fig. 1, find this button entrance and signal pins corresponding to outlet according to the digital correspondence that marks on button, described numerical reference is the corresponding first signal pin 1 of the button of " 210 " and the 24 signal pins 24, described numerical reference is the corresponding secondary signal pin 2 of the button of " 220 " and the 23 signal pins 23, described numerical reference is corresponding the 4th signal pins 4 of the button of " 230 " and the 23 signal pins 23, thereby an end of three wires 520 in described three test circuits is connect respectively the first pin 1 ' successively, the second pin 2 ', the 4th pin 4 ', the other end of corresponding described three wires 520 connects the 24 pin 24 ' successively, the 23 pin 23 ', the 23 pin 23 ', above-mentioned keyboard 100 is connected the circuit loop of rear formation semi-closure.
Secondly, find according to Fig. 1 correspondence that in Fig. 2, numerical reference reach the physical location of button 200 in keyboard 100 of " 230 " for " 210 ", " 220 ", and the corresponding button 200 of testing of keyboard 100 is placed on life testing machine tests.If it is errorless that circuit connects, pressing down numerical reference is after " 210 ", " 220 " reach the button of " 230 ", can form closed circuit loop, thereby display unit 500 can glimmer according to the Frequency Synchronization that presses down of life testing machine, beginning is bad if any display unit 500 flickers, again checks circuit or checks whether the pressure of life testing machine is enough.
Press down after 1,000,000 times or in the process of 1,000,000 times at life testing machine, if have display unit 500 constants, press the binding key thereby explanation is existing, if the glittering frequency such as appearance is different from test frequency, the bad phenomenon such as string key have appearred in explanation, can stop life test.
The utility model keyboard endurance testing device can be monitored the state of tested button at any time, has avoided that tested button is bad is also continuing test, thereby has saved time and electric power; This keyboard endurance testing device need not every test just must take off keyboard 1,000,000 times, thereby has saved energy and avoided removing and installing frequently board and stopping the life testing machine that begins.
Claims (4)
1. keyboard endurance testing device, it is applied in the keyboard of notebook computer test, described keyboard has the button of mark different digital, described button comprises entrance and the outlet that is distributed in the grid matrix edge, described entrance has the first to the 16 signal pins, described outlet has the 17 to the 24 signal pins, it is characterized in that, described proving installation comprises:
The keyboard winding displacement, it has the first to the 24 terminal, described the first to the 16 terminal is the first to the 16 signal pins of corresponding described button entrance successively, and described the 17 to the 24 terminal is the 17 to the 24 signal pins of corresponding described button outlet successively;
Keyboard connector, it has first to two ten four pin corresponding with described the first to the 24 terminal, and an end of described keyboard connector is connected with described keyboard winding displacement;
Some test circuits, it comprises a display unit, a power supply unit and a wire, described display unit and power supply unit all electrically are serially connected with in described wire, any pin in described the first to the 16 pin of one termination of described wire, any pin in described the 17 to the 24 pin of another termination of described wire.
2. keyboard endurance testing device according to claim 1, is characterized in that, described test circuit has three, the quantity of the described button of the corresponding test of the quantity of described test circuit.
3. keyboard endurance testing device according to claim 1, is characterized in that, described display unit is the LED lamp.
4. keyboard endurance testing device according to claim 1, is characterized in that, described power supply unit is the 1.5V battery.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320240548 CN203275596U (en) | 2013-05-07 | 2013-05-07 | Keyboard life testing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201320240548 CN203275596U (en) | 2013-05-07 | 2013-05-07 | Keyboard life testing apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN203275596U true CN203275596U (en) | 2013-11-06 |
Family
ID=49505973
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201320240548 Withdrawn - After Issue CN203275596U (en) | 2013-05-07 | 2013-05-07 | Keyboard life testing apparatus |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN203275596U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104142467A (en) * | 2013-05-07 | 2014-11-12 | 神讯电脑(昆山)有限公司 | Keyboard service life testing device |
-
2013
- 2013-05-07 CN CN 201320240548 patent/CN203275596U/en not_active Withdrawn - After Issue
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104142467A (en) * | 2013-05-07 | 2014-11-12 | 神讯电脑(昆山)有限公司 | Keyboard service life testing device |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20131106 Effective date of abandoning: 20170815 |
|
| AV01 | Patent right actively abandoned |