TWI419825B - Micro - sensing of electronic components of the test classification machine - Google Patents

Description

Micro-sensing electronic component test sorting machine

The invention provides a test sorting machine which can effectively reduce the configuration of the mechanism and is easy to perform multi-axial angular motion test, thereby greatly saving cost and improving test quality.

According to the micro-sensing electronic components, after the completion of the production, the angular motion test must be performed to ensure the quality and eliminate the defective products. Please refer to Figure 1, which is the current tester for micro-sensing electronic components. The feeding device 11 at the front end of the machine table 10, the plurality of receiving devices 12 and the empty disk device 13, wherein the feeding device 11 is for holding the micro-sensing electronic components to be tested, and the plurality of receiving devices 12 are The micro-sensing electronic components are measured at different levels, and the empty disk device 13 receives the empty tray at the feeding device 11 or the empty tray required at the replenishing device 12, and the rear end of the machine table 10 is provided with an angle. The motion testing device 14 is provided with a two-angle testing machine. Referring to FIG. 2, each angle testing machine is provided with a lifting mechanism, a Y-axis rotating mechanism and an X-axis rotating mechanism. The motor 141 drives a receiving plate 143 for lifting displacement via the transmission group 142, and an X-axis rotating mechanism is mounted on the receiving plate 143, and the X-axis rotating mechanism drives the first carrier with another motor 144. 145 for X-axis rotation angle movement, and the first bearing The frame 145 is provided with a Y-axis rotation mechanism, and the Y-axis rotation mechanism drives the second frame 147 to drive the Y-axis rotation angle, and the second frame 147 carries the plurality of tests. The test board 148 of the socket 149, the test board 148 can transmit the test signal of the micro-sensing electronic component to the tester (not shown), and the tester transmits the test result to the central control unit, and the central control unit controls each device. Actuated, the machine 10 is provided with a conveying device 15 for taking out the micro-sensing electronic component 16 to be tested at the feeding device 11 by a first pick-and-placer 151 capable of axial displacement of XYZ. And transferring to a first stage 152 capable of X-axis displacement, the first stage 152 carries the micro-sensing electronic component 16 to be tested to the angular motion testing device 14, and then The second pick-and-place device 153 for XYZ axial displacement takes the micro-sensing electronic component 16 to be tested on the first stage 152 and transfers it to the test stand 149 of the angle tester for the rotation angle test operation. After the test operation is completed, a third pick-and-place 154 that can be used for XYZ axial displacement is tested. The micro-sensing electronic component 16 is taken out from the holder 149 and transferred to a second stage 155 which can be X-axis displaced. The second stage 155 will be finished with the micro-sensing electronic component 16 Carrying the angular motion testing device 14, a fourth pick-and-place device 156 capable of XYZ axial displacement takes the measured micro-sensing electronic component 16 on the second stage 155, and transfers to the receiving device according to the detection result. 12, the classification and storage; however, the angle tester must be equipped with a lifting mechanism for assembling the X-axis rotation mechanism and the Y-axis rotation mechanism to drive the test seat 149 to move up and down, and must be assembled on the X-axis rotation mechanism. The axial rotation mechanism can make the test socket 149 and the micro-sensing electronic component 16 perform the two-axis rotational angle motion test, and the design of each mechanism of the angle tester is complicated, so that the production is cumbersome and time-consuming, and the cost is increased. It is only limited to the XY axial rotation angle test, so that the detection quality cannot be effectively improved. Furthermore, the conveying device 15 must configure the second pick-and-placer 153 and the third pick-and-placer 154 at the angle testing machine for respectively taking Micro-sensing electronic element to be tested/completed Item 16, not only increases the production cost, but also occupies space of the machine 10, which is not conducive to space configuration.

A first object of the present invention is to provide a test sorting machine for micro-sensing electronic components, comprising a feeding device, a receiving device, an angular motion testing device and a conveying device, which are to accommodate the micro-sensing electronic components to be tested. The receiving device is for accommodating different levels of micro-sensing electronic components, and the angular motion testing device is provided with at least one multi-axial joint angle tester with test seats, and the conveying device is taken out at the feeding device for testing. The micro-sensing electronic component is transferred to the test socket of the angle tester, and the angle tester drives the test socket and the micro-sensing electronic component to perform the multi-axial angular motion test. After the test is completed, the transport device is tested again. The micro-sensing electronic component is taken out and the measured micro-sensing electronic components are transferred to the receiving device according to the test result, and the device is classified and stored; thereby, the mechanism configuration and the assembly operation can be effectively reduced, and the device can be greatly reduced. Save on the practical benefits of equipment costs.

A second object of the present invention is to provide a test sorting machine for micro-sensing electronic components, wherein the angular motion test device is mounted on a multi-axial joint type angle tester, and the test stand can be mounted on the test stand. The micro-sensing electronic component performs a rotational angle motion test of four or more axes, so that the micro-sensing electronic component can perform a full-scale test operation, which is not limited to the two-axis test operation, and achieves the practical benefit of improving the test quality.

A third object of the present invention is to provide a test sorting machine for micro-sensing electronic components, wherein the transporting device can be provided with a pick-and-place device at the feeding and receiving device or the angular motion testing device for transferring the test/ The micro-sensing electronic components are completed, which effectively simplifies the configuration of the mechanism, saves costs and reduces the space occupied by the mechanism, so as to facilitate the practical benefits of space configuration.

In order to make the present invention more fully understood by the reviewing committee, a preferred embodiment and a drawing will be described in detail. As follows: Referring to FIG. 3, the test sorting machine of the present invention is provided at the front end of the machine table 20. The feeding device 30, the receiving device 40 and the empty disk device 50, the rear end of the machine table 20 is provided with an angular motion testing device 60 for testing the micro sensing electronic components, and the conveying device 70 is provided on the machine table 20. For transferring the micro-sensing electronic component to be tested/finished between the feeding and receiving device 30, 40 and the angular motion testing device 60; the feeding device 30 is for accommodating at least one micro sensing electronic component to be tested The tray 31 and the receiving device 40 are provided with a plurality of empty trays 41, and the micro-sensing electronic components, the micro-sensing electronic components and the secondary products of the defective products can be classified according to the test results. After the measurement of the micro-sensing electronic component, the empty disk device 50 can receive the tray 31 empty at the feeding device 30, or replenish the empty tray 31 to the receiving device 40, please refer to the fourth and fifth figures. The angle motion testing device 60 is provided with at least one angle testing machine 61, and the angle testing machine 61 The utility model has a multi-axial joint type angular motion mechanism 611 which is a mechanical arm, and the multi-axial joint type angular motion mechanism 611 can be used for four-axis (for example, XYZ-θ) or more omnidirectional angular motion, and is provided with a frame. The test 612 is a normally closed test stand or a normally open test stand. The test stand 614 of the embodiment is a normally open test stand, and the test stand 614 is a normally open test stand. The carrier 612 is provided with a micro-sensing electronic component lower pressing member 615 in the movable lower pressing type test socket 614, and the micro sensing electronic component is positioned by the following pressure. If the test socket 614 is a normally closed type test socket, The support member 612 can move the lower pressing member 615, and then move the lower pressing to open the normally closed type test seat, so that the micro sensing electronic component to be tested is placed in the normally closed type test seat, and then the lower pressing member is pressed. The 615 is removed from the normally closed test stand, and the normally closed test stand automatically closes the positioning micro-sensing electronic component. Regardless of the normally closed test stand or the normally open test stand, the micro-sensing electronic components can be avoided. During the rotation angle motion test, it is taken out from the test seat 614, so that the angle is transported The mechanism 611 can drive the test socket 614 and the micro-sensing electronic component to be tested to perform a multi-axis rotational angle motion test operation, and cause the tester (not shown) to transmit the test result to the central control unit, and the central control unit Controlling the operation of each device, the transport device 70 includes a carrying mechanism 71 and a loading mechanism 72. The carrying mechanism 71 has at least one loading base. The carrying mechanism 71 of the present embodiment is provided behind the feeding device 30. The material loading stage 711 is configured to carry the micro sensing electronic component to be tested, and the receiving device 712 is disposed behind the receiving device 40 for carrying the measured micro sensing electronic component. The loading mechanism 72 The pick-up mechanism 72 of the embodiment is provided with a first pick-and-place mechanism 721 and a second pick-and-placer 722, and the first pick-and-placer 721 can be used for XYZ axial displacement. The micro-sensing electronic component to be tested/finished is taken between the feeding and receiving device 30, 40 and the carrying mechanism 71, and the second pick-and-place device 722 is disposed on the frame 612 of the angle testing machine 61, and The YZ axial displacement is used for picking up the test/testing between the test seat 614 and the bearing mechanism 71. Sensing electronics.

Referring to FIG. 6, in the initial state, the material transfer mechanism 72 of the conveying device 70 is axially displaced by the first pick-and-placer 721, and the micrometer to be tested is taken out from the tray 31 of the feeding device 30. The electronic component 81 is sensed and placed on the loading stage 711.

Referring to Figures 7, 8, and 9, since the angular motion mechanism 611 of the angle testing machine 61 can perform at least XYZ-θ four-axis displacement, the angular motion mechanism 611 can drive the second pick-and-placer 722 to directly shift to the feeding load. At the stage 711, the second pick-and-place device 722 takes out the micro-sensing electronic component 81 to be tested and transfers it to the test socket 614. After the test socket 614 is placed in the micro-sensing electronic component 81 to be tested, the depression is performed. The member 615 moves the micro-sensing electronic component 81 downwardly to electrically connect the micro-sensing electronic component 81 to the test socket 614. Thereafter, the angular motion mechanism 611 drives the test socket 614 and the micro-sensing electronic component 81. The XY-θ rotation angle motion test is performed, and the test board 613 transmits the test signal of the micro-sensing electronic component 81 to be tested to the tester, and the tester transmits the test result of the micro-sensing electronic component 81 to the central control unit. .

Referring to FIG. 10, when the angle tester 61 performs the test operation, the material transfer mechanism 72 is axially displaced by the first pick-and-placer 721, and the next test piece is taken out on the tray 31 of the feeding device 30. The electronic component 82 is micro-sensed and placed on the loading stage 711.

Referring to FIGS. 11 and 12, after the angle tester 61 completes the angular motion test operation of the micro-sensing electronic component 81, the lower pressing member 615 is separated from the measured micro-sensing electronic component 81, and the second pick-and-placer 722 is The YZ axial displacement is taken out, and the micro-sensing electronic component 81 is taken out in the test socket 614. Then, the angular motion mechanism 611 drives the second pick-and-placer 722 to the receiving stage 712 to make the second pick-and-placer 722, the completed micro-sensing electronic component 81 is placed on the receiving stage 712; referring to FIG. 13, the angular moving mechanism 611 can further drive the second pick-and-placer 722 to the feeding stage 711. The second pick-and-place device 722 takes out the next micro-sensing electronic component 82 to be tested, and the loading is placed in the test socket 614 to perform the test operation successively. At this time, the loading mechanism 72 is firstly picked and placed. The 721 is axially displaced by XYZ, and the measured micro-sensing electronic component 81 is taken out on the receiving stage 712, and according to the test result (such as good micro-sensing electronic components, defective micro-sensing electronic components or secondary products) Micro-sensing electronic component), transferring the completed micro-sensing electronic component 81 to the tray 41 of the receiving device 40 To complete the job classification stowed.

Referring to FIG. 14, another embodiment of the test sorting machine of the present invention is provided with a feeding device 30, a receiving device 40 and an empty disk device 50 at the front end of the machine table 20, and the rear end of the machine table 20 is provided. There are a plurality of angular motion testing devices 60A, 60B, 60C for testing micro-sensing electronic components, and a transport device 70A is provided on the machine 20 for feeding and receiving devices 30, 40 and various angular motion tests. The micro-sense electronic component to be tested/completed is transferred between the devices 60A, 60B, and 60C; the feeding device 30 houses at least one tray 31 for holding the micro-sensing electronic component to be tested, and the receiving device 40 is provided A plurality of empty trays 41, and according to the test results, the micro-sensing electronic components of the finished products, the micro-sensing electronic components of the defective products, and the micro-sensing electronic components of the sub-products, the empty discs The device 50 can receive the tray 31 empty at the feeding device 30, or replenish the empty tray 31 to the receiving device 40. Each angle motion testing device 60A, 60B, 60C is provided with an angle testing machine 61A, 61B, 61C, taking the angle tester 61A as an example, the angle tester 61A has a multi-axis of a mechanical arm To the articulated angular motion mechanism 611A, the multi-axial articulated angular motion mechanism 611A can perform an omnidirectional angular motion of four axes (eg, XYZ-θ) or more, and is provided with a frame 612A for mounting a plurality of test seats. 614A test board 613A, the test stand 614A is a normally open test stand, and the support 612A is provided with a movable lower pressure normally open type test seat 614A in the micro-sensing electronic component lower press part 615A, with the following The micro-sensing electronic component is pressed and positioned to prevent the micro-sensing electronic component from coming out of the test socket 614A during the rotation angle motion test, so that the angular motion mechanism 611A can drive the test socket 614A and the micro-sensing electronic component to be tested. Performing a multi-axis rotation angle motion test operation, and causing a tester (not shown) to transmit the test result to the central control unit, and the central control unit controls the operation of each device. The transport device 70A is provided with a transfer mechanism 72A. The moving mechanism 72A is provided with a first pick-and-placer 721A and a second pick-and-placer 722A which can be synchronously displaced by XY, and the first and second pick-and-placers 721A, 722A can be respectively displaced in the Z-axis. , the first pick and place device 721A is provided for Device 30 and the sensing electronics micro test to take place between the test blocks 614A, 722A of the second pick and place unit between the feed means 40 in the receiving seat 614A and testing to take place micro End element to sense the sensing electronics.

Referring to FIG. 15, the material transfer mechanism 72A is axially displaced by the first pick-and-placer 721A, and the micro-sensing electronic component 83 to be tested is taken out from the tray 31 of the feeding device 30, and moved. Into the test stand 614A of the angle tester 61A; please refer to the figures 16, 17, and 18, under the angle tester 61A, the presser 615A moves the micro-sensing electronic component 83 to stabilize the micro-sensing electronic component 83. Electrically contacting the test socket 614A, the angular motion mechanism 611A then drives the test socket 614A and the micro-sensing electronic component 83 to perform a rotational angle motion test of XY-θ, and causes the test board 613A to measure the micro-sensing to be tested. The test signal of the electronic component 83 is transmitted to the tester, and the tester transmits the test result of the micro-sensing electronic component 83 to the central control unit.

Referring to FIG. 19, when the angle tester 61A performs the test operation, the first pick-and-placer 721A of the transfer mechanism 72A takes out the next micro-sensing electronic component to be tested again on the tray 31 of the feeding device 30. 84, and the loading is placed in the test socket 614B of the angle tester 61B to perform the rotation angle motion test operation; please refer to FIGS. 20 and 21, when the angle tester 61A completes the angular motion test of the micro-sensing electronic component 83 After the operation, the lower pressing member 615A is separated from the measured micro-sensing electronic component 83, and the loading mechanism 72A takes out the micro-sensing electronic component 83 in the test socket 614A by the second pick-and-placer 722A, due to the first The pick-and-placer 721A has taken out another micro-sensing electronic component 85 to be tested at the feeding device 30, and the first pick-and-placer 721A can place the micro-sensing electronic component 85 to be tested into the test socket 614A. In order to continue the test operation; please refer to Figure 22, the second pick-and-placer 722A of the transfer mechanism 72A can be based on the test results (such as good micro-sensing electronic components, defective micro-sensing electronic components or secondary products) Measuring the electronic component), transferring the measured micro-sensing electronic component 83 to the receiving and receiving The feeding means 40 on the tray 41 to complete the job classification stowed.

Accordingly, the test sorting machine of the present invention can effectively reduce the mechanism configuration and perform multi-axial angular motion test, thereby greatly saving cost and improving test quality, and is actually a practical and progressive design, but there is no The same products and publications are made public, so that the requirements for invention patent applications are allowed, and the application is filed according to law.

[Literature]

10. . . Machine

11. . . Feeding device

12. . . Receiving device

13. . . Empty disk device

14. . . Angle motion test device

141. . . motor

142. . . Drive set

143. . . Bearing board

144. . . motor

145. . . First carrier

146. . . motor

147. . . Second carrier

148. . . Test board

149. . . Test stand

15. . . Conveyor

151. . . First pick and place

152. . . First stage

153. . . Second pick and place

154. . . Third pick and place

155. . . Second stage

156. . . Fourth pick and place

16. . . Micro-sensing electronic component

[this invention]

20. . . Machine

30. . . Feeding device

31. . . Trays

40. . . Receiving device

41. . . Trays

50. . . Empty disk device

60, 60A, 60B, 60C. . . Angle motion test device

61, 61A, 61B, 61C. . . Angle tester

611, 611A. . . Angle motion mechanism

612, 612A. . . Shelf

613, 613A. . . Test board

614, 614A, 614B. . . Test stand

615, 615A. . . Lower pressing piece

70, 70A. . . Conveyor

71. . . Carrying mechanism

711. . . Feeding platform

712. . . Receiving platform

72, 72A. . . Transfer mechanism

721, 721A. . . First pick and place

722, 722A. . . Second pick and place

81, 82, 83, 84, 85. . . Micro-sensing electronic component

Figure 1: Configuration diagram of the test test sorter.

Figure 2: Schematic diagram of the angular motion test device of the conventional test classifier.

Figure 3: Configuration diagram of each device of the test sorting machine of the present invention.

Figure 4: Schematic diagram (I) of the angular motion test device of the test sorter of the present invention.

Figure 5: Schematic diagram of the angular motion test device of the test sorter of the present invention (2).

Figure 6: Schematic diagram of the use of the test sorter of the present invention (1).

Figure 7: Schematic diagram of the use of the test sorter of the present invention (2).

Figure 8: Schematic diagram of the use of the test sorter of the present invention (3).

Figure 9: Schematic diagram of the use of the test sorter of the present invention (4).

Figure 10: Schematic diagram of the use of the test sorter of the present invention (5).

Figure 11: Schematic diagram of the use of the test sorter of the present invention (6).

Figure 12: Schematic diagram of the use of the test sorter of the present invention (7).

Figure 13: Schematic diagram of the use of the test sorter of the present invention (8).

Figure 14 is a diagram showing the configuration of each device of another embodiment of the test sorting machine of the present invention.

Figure 15 is a schematic view showing the use of another embodiment of the test sorting machine of the present invention (I).

Figure 16: Schematic diagram of the use of another embodiment of the test sorter of the present invention (2).

Figure 17 is a schematic view showing the use of another embodiment of the test sorter of the present invention (3).

Figure 18: Schematic diagram of the use of another embodiment of the test sorter of the present invention (4).

Figure 19 is a schematic view showing the use of another embodiment of the test sorting machine of the present invention (5).

Figure 20: Schematic diagram of the use of another embodiment of the test sorter of the present invention (vi).

Figure 21: Schematic diagram of the use of another embodiment of the test sorter of the present invention (7).

Figure 22: Schematic diagram of the use of another embodiment of the test sorter of the present invention (VIII).

20. . . Machine

30. . . Feeding device

31. . . Trays

40. . . Receiving device

41. . . Trays

50. . . Empty disk device

60. . . Angle motion test device

61. . . Angle tester

611. . . Angle motion mechanism

612. . . Shelf

613. . . Test board

614. . . Test stand

615. . . Lower pressing piece

70. . . Conveyor

71. . . Carrying mechanism

711. . . Feeding platform

712. . . Receiving platform

72. . . Transfer mechanism

721. . . First pick and place

722. . . Second pick and place

Claims (12)

A test classification machine for micro-sensing electronic components, comprising: a machine table; a feeding device: is arranged on the machine platform to accommodate the micro-sensing electronic components to be tested; and the receiving device is arranged on the machine platform. The micro-sensing electronic component is used for accommodating the measurement; the angular motion testing device is arranged on the machine table, and is provided with a multi-axial joint angle testing machine with a test seat, and the angle testing machine is provided with multi-axial An articulated angle motion mechanism, and a frame on the angle motion mechanism for mounting a test board having at least one test seat, the test seat on the test board is a normally open test seat for bearing a micro sense The electronic component is measured, and a lower pressing member of the micro-sensing electronic component is arranged on the frame, so that the angle testing machine drives the micro-sensing electronic component to perform multi-axial rotation angle motion test; the conveying device is set on the machine. On the stage, it is used to transfer the micro-sensing components to be tested/completed between the feeding and receiving device and the angle motion testing device; the central control unit is used to control and integrate the devices to perform the automation work. A test classification machine for micro-sensing electronic components, comprising: a machine table; a feeding device: is arranged on the machine platform to accommodate the micro-sensing electronic components to be tested; and the receiving device is arranged on the machine platform. The micro-sensing electronic component is used for accommodating the measurement; the angular motion testing device is arranged on the machine table, and is provided with a multi-axial joint angle testing machine with a test seat, and the angle testing machine is provided with multi-axial An articulated angle motion mechanism, and a frame is provided on the angle motion mechanism for mounting a test board having at least one test seat, and the test seat on the test board is a normally closed test seat for bearing a micro sense The electronic component is tested, and a movable lower pressing open normal pressure type test seat lower pressing member is arranged on the frame, so that the angle testing machine drives the micro sensing electronic component to perform multi-axial rotation angle motion test; Conveying device: is arranged on the machine for transferring the micro sensing components to be tested/finished between the feeding and receiving device and the angle motion testing device; the central control unit is used for controlling and integrating the devices To perform automated work. The test sorting machine for micro-sensing electronic components according to claim 1 or 2, wherein the feeding device is provided with a plurality of trays for receiving the micro-sensing electronic components to be tested. The test sorting machine for micro-sensing electronic components according to claim 1 or 2, wherein the receiving device is provided with a plurality of trays for receiving micro-sensing electrons of different test results. element. The test sorting machine for micro-sensing electronic components according to claim 1 or 2, wherein the angular motion mechanism is a mechanical arm. The test sorting machine for micro-sensing electronic components according to claim 1 or 2, wherein the conveying device is provided with a carrying mechanism and a feeding mechanism, the loading mechanism is attached to the feeding and receiving device and the angular movement The micro-sense electronic components to be tested/completed are carried between the test devices, and the transfer mechanism is used to transfer the micro-sensing electronic components to be tested/completed between the supply and receiving devices, the angular motion test device and the support mechanism. The test classification machine for micro-sensing electronic components according to claim 6, wherein the carrier mechanism is provided with at least one carrier for carrying the micro-sensing electronic components to be tested/finished. According to the test classification machine of the micro-sensing electronic component described in claim 7, wherein the carrier mechanism is provided with a feeding stage and a receiving stage for respectively carrying the micro-sensing to be tested/finished Measuring electronic components. According to the test classification machine of the micro-sensing electronic component described in claim 6, wherein the material-feeding mechanism is provided with a first pick-and-place device and a second pick-and-place device, and the first pick-and-place device is provided for Above the receiving device, and can be used as XYZ axial displacement for transferring and testing between the feeding and receiving device and the supporting mechanism. The micro-sensing electronic component, the second pick-and-place device is disposed on the angle tester of the angle motion testing device, and can be used as the YZ axial displacement for transferring between the test socket and the bearing mechanism of the angle testing machine. / Complete micro-sensing electronic components. The test sorting machine for micro-sensing electronic components according to claim 1 or 2, wherein the conveying device is provided with a material moving mechanism for transferring between the feeding and receiving device and the angle motion testing device. Micro-sensing electronic components to be tested/completed. The test classification machine for micro-sensing electronic components according to claim 10, wherein the material-feeding mechanism is provided with first and second pick-and-placers for XYZ axial displacement, and the first pick-and-place device The micro-sensing electronic component to be tested is transferred between the feeding device and the angular motion testing device, and the second pick-and-place device transfers the micro-sensing electronic component between the receiving device and the angular motion testing device. The test sorting machine for micro-sensing electronic components according to the scope of claim 1 or 2 of the patent application, further comprising an empty disk device on the machine table for collecting empty trays and emptying as needed The tray is replenished to the receiving device.