TWI394172B - Automatic test sorting machine - Google Patents
Automatic test sorting machine Download PDFInfo
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- TWI394172B TWI394172B TW97149838A TW97149838A TWI394172B TW I394172 B TWI394172 B TW I394172B TW 97149838 A TW97149838 A TW 97149838A TW 97149838 A TW97149838 A TW 97149838A TW I394172 B TWI394172 B TW I394172B
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Description
本發明係提供一種利用各裝置之時序搭配作動,可一貫化自動執行隨身碟之測試及分類作業,而大幅提升作業便利性及測試產能之隨身碟自動測試分類機。The present invention provides a portable automatic test sorting machine that can automatically improve the convenience and test throughput by utilizing the timing matching of each device to consistently automate the testing and classification of the flash drive.
按,隨著科技資訊的進步,早期用以儲存電子資料之磁碟片已逐漸被體積輕巧且儲存容量大之隨身碟所取代,請參閱第1圖,該隨身碟1係設有一具LED12之電路板11,並於電路板11之前端固設有金屬製之插頭13,該插頭13末端之連結部131係搭接於電路板11上,再以外殼14將電路板11包覆於內,而完成隨身碟1之組裝作業。With the advancement of technology information, the disk used to store electronic data has gradually been replaced by a compact and large storage capacity. Please refer to Figure 1. The USB flash drive 1 is equipped with an LED12. The circuit board 11 is fixed with a metal plug 13 at the front end of the circuit board 11. The connecting portion 131 at the end of the plug 13 is attached to the circuit board 11, and the circuit board 11 is covered by the outer casing 14. And complete the assembly work of the pen drive 1.
由於隨身碟需歷經多道加工製程,業者為確保隨身碟之品質,而會選擇於隨身碟尚未加裝外殼或已裝設外殼之二種狀態下執行測試作業,以測試隨身碟是否損壞,並淘汰出不良品,目前業者測試隨身碟之方式,係以人工一一將待測隨身碟之插頭插置電性連結於測試機之測試插座上而執行測試作業,於測試完畢後,再以人工依測試結果,將不同測試等級之隨身碟加以分類收置;惟此一測試方式對於數量龐大之隨身碟而言,以人工方式將各待測之隨身碟一一插置於測試機之測試插座上,不僅作業緩慢耗時,亦大幅降低生產效能,再者,人工測試作業易因人工操作不確實或誤判等因素而降低測試準確率。Since the flash drive needs to go through multiple processing processes, in order to ensure the quality of the flash drive, the manufacturer will choose to perform the test operation in the two states where the flash drive has not been installed with the outer casing or the installed outer casing to test whether the flash drive is damaged or not. Eliminating defective products, the current method of testing the flash drive by the manufacturer is to manually insert the plug of the portable drive to be connected to the test socket of the test machine to perform the test operation. After the test is completed, the manual is performed. According to the test results, the pens of different test levels are classified and stored. However, for this large number of pen drives, the pens to be tested are manually inserted into the test socket of the test machine. In addition, not only is the operation slow and time consuming, but also the production efficiency is greatly reduced. Moreover, the manual test operation is easy to reduce the test accuracy due to factors such as inaccurate manual operation or misjudgment.
故在講求全面自動化及品質提升之趨勢下,以人工執行隨身碟測試作業之方式實有改進之必要,如何設計一種可自動化測試及分類,以大幅提高生產效能之隨身碟自動測試分類機,即為業者致力研發之標的。Therefore, under the trend of full automation and quality improvement, it is necessary to improve the manual test of the pen drive. How to design a portable automatic test sorting machine that can automatically test and classify to greatly improve the production performance, namely Dedicated to the development of the target for the industry.
本發明之目的一,係提供一種隨身碟自動測試分類機,包含有供料匣、收料匣、移料裝置及複數個測試裝置,該供料匣係用以承置待測之隨身碟,可供移料裝置之取放器取出移載待測之隨身碟至測試裝置處,該測試裝置係設有複數層可作X軸向位移之載具,用以承置整組之承座、測試機構及定位機構,並將承座及各機構由測試區載送至換料區,以供取放器將待測之隨身碟置入於承座上,再載送反向復位至測試區,該定位機構及測試機構即作Y軸向位移,使定位機構壓抵待測之隨身碟定位,並使測試機構之測試插座插合電性連結於待測隨身碟之插頭以執行測試作業,於測試完畢後,載具再將承座及各機構移出至換料區,以供取放器取出完測之隨身碟,並依測試結果移載至收料匣而分類收置;藉此,利用各裝置之時序搭配作動,而可自動執行隨身碟之測試作業,達到大幅提升測試產能之實用效益。A first object of the present invention is to provide a portable automatic disc sorting machine, which comprises a feeding magazine, a receiving magazine, a material feeding device and a plurality of testing devices, wherein the feeding device is used for holding a pen drive to be tested. The pick-and-place device of the loading device can take out the portable drive to be tested to the test device, and the test device is provided with a plurality of layers for X-axis displacement, for holding the entire set of seats, The testing mechanism and the positioning mechanism, and the bearing seat and each mechanism are carried from the test area to the refueling area, so that the pick-up device puts the portable disc to be tested on the bearing, and then carries the reverse reset to the test area. The positioning mechanism and the testing mechanism are used for the Y-axis displacement, so that the positioning mechanism is pressed against the pen tray to be tested, and the test socket of the testing mechanism is electrically connected to the plug of the pen to be tested to perform the test operation. After the test is completed, the carrier then removes the seat and each mechanism to the refueling area for the pick-and-place device to take out the measured pen drive and sort it according to the test result and transfer it to the receiving hopper; thereby, Automate the measurement of the pen drive by using the timing of each device Operations, to achieve practical benefits greatly enhance the production capacity of the test.
本發明之目的二,係提供一種隨身碟自動測試分類機,更包含於該測試裝置之定位機構上裝配有具複數個感測器之檢查模組,而可利用定位機構帶動檢查模組位移至待測隨身碟之上方,使檢查模組之各感測器分別檢查待測隨身碟是否放反或LED是否損壞,以淘汰出擺置錯誤或不良品之隨身碟,達到提升測試品質之實用效益。The object of the present invention is to provide a portable automatic disc sorting machine, which further comprises an inspection module with a plurality of sensors mounted on the positioning mechanism of the testing device, and the positioning mechanism can be used to drive the inspection module to the displacement. Above the pen drive to be tested, the sensors of the inspection module respectively check whether the pen drive to be tested is reversed or the LED is damaged, so as to eliminate the pendulum that is placed incorrectly or defective, and achieve the practical benefit of improving the test quality. .
本發明之目的三,係提供一種隨身碟自動測試分類機,其中,該測試裝置係採多層式載具設計,而可供配置更多承座,以大幅增加隨身碟之測試產量,並可縮減佔用空間,達到提升產能及利於空間配置之實用效益。A third object of the present invention is to provide a portable automatic test sorting machine, wherein the test device adopts a multi-layered vehicle design, and can be configured with more sockets, so as to greatly increase the test output of the flash drive and can be reduced. Take up space and achieve practical benefits of increasing production capacity and facilitating space allocation.
本發明之目的四,係提供一種隨身碟自動測試分類機,而以機器取代人工作業,而自動化測試隨身碟,以節省人力及設備,達到降低成本之實用效益。The fourth object of the present invention is to provide a portable automatic test sorting machine, and replace the manual work with a machine, and automatically test the flash drive to save manpower and equipment, and achieve the practical benefit of reducing the cost.
本發明之目的五,係提供一種隨身碟自動測試分類機,而以機器取代人工作業,可自動取料及分類良品、不良品,達到提升檢測作業便利性之實用效益。The fifth object of the present invention is to provide a portable automatic sorting and sorting machine, and replace the manual operation with a machine, which can automatically take and classify good and bad products, and achieve the practical benefit of improving the convenience of the testing operation.
為使 貴審查委員對本發明作更進一步之瞭解,茲舉一較佳實施例並配合圖式,詳述如后:In order to make the reviewer further understand the present invention, a preferred embodiment will be described in conjunction with the drawings, as follows:
請參閱第2圖,該隨身碟自動測試分類機可應用測試具LED之隨身碟成品/半成品,以及不具LED之隨身碟成品/半成品,本實施例之隨身碟自動測試分類機係應用於測試具LED且為半成品之隨身碟,而包含於機台20之前端設有供料匣30、良品收料匣40,該供料匣30係用以承置待測之隨身碟,良品收料匣40係用以承置完測之良品隨身碟,另於機台20之後端則設有不良品收料匣50、複數個測試裝置60,以及可於供料匣30、良品收料匣40、不良品收料匣50及各測試裝置60間移載待/完測隨身碟之移料裝置70,其中,該不良品收料匣50係位於測試裝置60之側方,並設有空的料盤,用以承置擺置錯誤或不良品之隨身碟,由於不良品收料匣50與供料匣30二者所使用之料盤相同,而可將供料匣30上被取料完畢之空料盤移載至不良品收料匣50處,以供承置擺置錯誤或不良品之隨身碟。Please refer to Fig. 2, the portable automatic test sorting machine can apply the test piece with the LED with the finished/semi-finished product of the flash drive, and the finished/semi-finished product with the LED without the LED. The automatic test and classification machine of the portable disc of this embodiment is applied to the test tool. The LED is a semi-finished flash drive, and is provided at the front end of the machine 20 with a supply port 30 and a good receipt 匣 40. The supply 匣 30 is used to hold the pen drive to be tested, and the good receipt 匣 40 It is used to hold the finished good-quality pen drive, and at the rear of the machine 20, there is a defective product receipt 匣50, a plurality of test devices 60, and a supply 匣30, a good receipt 匣40, no The good product receiving device 50 and the testing device 60 transfer the loading/unloading device 70 to be tested/completed, wherein the defective product receiving device 50 is located on the side of the testing device 60 and is provided with an empty tray. For the storage of misplaced or defective products, since the defective product receipt 50 is the same as the tray used for the supply cassette 30, the supply cassette 30 can be reclaimed. The tray is transferred to the defective product receipt 匣 50 for the placement of the wrong or defective product.
請參閱第3、4、5圖,該供料匣30係於前、後方設有疊置區301及暫置區302,其疊置區301之兩側係分別設有固定式軌道31及可作X軸向伸縮位移之承置件32,並以承置件32承置具待測隨身碟之料盤,另於疊置區301之二固定式軌道31間設有一頂盤機構及Y軸向載送機構,該頂盤機構係設有一由驅動源331驅動作Z軸向升降位移之承板332,而可以承板332頂置承置件32上之料盤,並移載至二固定式軌道31上,而Y軸向載送機構係設有一由驅動源341驅動作Y軸向位移之推桿342,而可利用推桿342將二固定式軌道31上之料盤由疊置區301推移至暫置區302,該暫置區302之兩側係設有二由驅動源351驅動作X軸向位移之活動式軌道352,並於二活動式軌道352上設有可作X軸向位移之定位件36,以及於二活動式軌道352間設有另一可旋轉作動之定位件37,當推桿342將料盤推移至二活動式軌道352上後,可利用二定位件36、37分別頂置於料盤之側面及前面,而將料盤定位,另於暫置區302設有一頂盤機構,其係設有一由驅動源381驅動作Z軸向升降位移之承板382,而可使承板382頂置於料盤之底面,以使料盤平穩供料。Referring to Figures 3, 4, and 5, the supply magazine 30 is provided with a stacking area 301 and a temporary area 302 at the front and the rear, and the fixed area of the stacking area 301 is respectively provided with a fixed rail 31 and The X-axis telescopic displacement of the mounting member 32, and the mounting member 32 is used to mount the tray with the to-be-tested disc, and the top plate mechanism 301 and the fixed rail 31 are provided with a top disc mechanism and a Y-axis. To the carrying mechanism, the top plate mechanism is provided with a carrier plate 332 driven by the driving source 331 for Z-axis lifting and lowering, and the carrier plate 332 can be placed on the receiving plate 32 and transferred to the second fixing. On the rail 31, the Y-axis carrying mechanism is provided with a push rod 342 which is driven by the driving source 341 for Y-axis displacement, and the pusher 342 can be used to stack the trays on the two fixed rails 31 from the stacking area. The 301 is moved to the temporary area 302. The two sides of the temporary area 302 are provided with two movable rails 352 driven by the driving source 351 for X-axis displacement, and the X-axis is provided on the two movable rails 352. Another rotatably movable positioning member 37 is disposed between the displacement positioning member 36 and the two movable rails 352. When the push rod 342 moves the tray to the two movable rails 352, The two positioning members 36, 37 are respectively placed on the side and the front of the tray to position the tray, and the temporary portion 302 is provided with a top plate mechanism, which is driven by the driving source 381 for Z-axis lifting. The carrier plate 382 is displaced, and the carrier plate 382 is placed on the bottom surface of the tray to ensure smooth feeding of the tray.
請參閱第2、6圖,該移料裝置70係設有一載送機構71用以帶動複數個取放器72同步作X-Y-Z軸向位移,而各取放器72則可再由獨立之驅動源73分別驅動作Z軸向位移,由於移料裝置70係設有至少前後二排取放器72,其中一排取放器係用以取放待測之隨身碟,而另一排取放器則用以取放完測之隨身碟,進而可利用載送機構71先帶動複數個取放器72作X-Y軸向位移至供料匣30之暫置區302上方,並使各取放器72同步作Z軸向下降位移,而於暫置區302之料盤上取出待測之隨身碟80。Referring to Figures 2 and 6, the loading device 70 is provided with a carrier mechanism 71 for driving a plurality of pick and placeers 72 for axial displacement of XYZ, and each of the pickers 72 can be driven by an independent driving source. 73 is respectively driven for Z-axis displacement, because the loading device 70 is provided with at least two rows of pick-and-place devices 72, one row of pick and place devices for picking up the pen drive to be tested, and the other row of pick and place devices The pick-up disc is used for picking up and dropping, and then the pick-up mechanism 71 can be used to first drive the plurality of pick-and-placers 72 for XY axial displacement to the temporary area 302 of the feed cassette 30, and the pick-and-place units 72 are provided. Simultaneously, the Z-axis downward displacement is taken, and the pen drive 80 to be tested is taken out on the tray of the temporary area 302.
請參閱第7、8、9、10圖所示,各測試裝置60係於一盛裝容器61內設有複數層容置空間供分別裝設載具62,並以複數個驅動源63分別驅動各載具62於盛裝容器61內、外部之測試區及換料區間作X軸向往復位移,且於盛裝容器61與各載具62間設有相互配合之滑軌611及滑座621,用以輔助載具62平穩位移,而各層載具62上則裝設有整組之承座64、定位機構及測試機構,其中,該承座64係設有複數個容置槽641供承置待測之隨身碟,並於承座64之後方設有定位機構及測試機構,該定位機構係設有一由驅動源651驅動作Y軸向位移之機架652,並於機架652上相對應各容置槽641位置設有一可作Z軸向位移之壓件653,用以壓抵於各待測隨身碟之插頭上,而定位待測之隨身碟,另於機架652上設有檢查模組,該檢查模組係於電路板661上相對應各容置槽641位置設有第一感測器662及第二感測器663,其第一感測器662係用以感測各待測隨身碟之插頭的金屬連結部,以檢查待測之隨身碟是否放置反面,而第二感測器663係用以感測各待測隨身碟之LED是否損壞,而測試機構則設有一由驅動源671驅動作Y軸向位移之機架672,並於機架672上設有測試板673,測試板673係於相對應各容置槽641位置設有複數個測試插座674,用以分別插合於待測隨身碟之插頭而作電性連結,另於測試板673之底面設有相對應測試插座674數量之傳輸線675以連結測試機(圖未示出),測試機可將測試結果傳輸至中央控制單元(圖未示出),該中央控制單元再依測試結果控制及整合各裝置作動。Referring to Figures 7, 8, 9, and 10, each test apparatus 60 is provided with a plurality of accommodating spaces in a container 61 for separately mounting the carriers 62, and each of the plurality of driving sources 63 drives each of the driving devices 63. The carrier 62 is reciprocally displaced in the X-axis in the test container 61 and the external test area and the refueling section, and a matching rail 611 and a slide 621 are disposed between the container 61 and each of the carriers 62 for The auxiliary carrier 62 is smoothly displaced, and the carrier 62 of the layer is provided with a whole set of sockets 64, a positioning mechanism and a testing mechanism. The carrier 64 is provided with a plurality of receiving slots 641 for mounting. The portable disk and the positioning mechanism and the testing mechanism are disposed behind the bearing 64. The positioning mechanism is provided with a frame 652 driven by the driving source 651 for Y-axis displacement, and correspondingly arranged on the frame 652. The position of the slot 641 is provided with a pressing member 653 which can be used for Z-axis displacement, for pressing against the plug of the portable disc to be tested, and positioning the pen tray to be tested, and the inspection module is arranged on the rack 652. The inspection module is disposed on the circuit board 661 corresponding to each of the accommodating slots 641 to be provided with a first sensor 662 and a second sensor 663. The first sensor 662 is configured to sense the metal joint of each plug of the pen to be tested to check whether the pen drive to be tested is placed on the reverse side, and the second sensor 663 is used to sense each The LED of the flash drive is damaged, and the test mechanism is provided with a frame 672 driven by the driving source 671 for Y-axis displacement, and a test board 673 is disposed on the frame 672, and the test board 673 is correspondingly corresponding. A plurality of test sockets 674 are disposed at positions of the slots 641 for electrically connecting to the plugs of the pens to be tested, and a transmission line 675 corresponding to the number of test sockets 674 is connected to the bottom surface of the test board 673 for connection. The test machine (not shown) can transmit the test result to a central control unit (not shown), and the central control unit controls and integrates the devices according to the test result.
請參閱第11、12圖,當移料裝置70之取放器72將待測之隨身碟80移載至測試裝置60之換料區時,該測試裝置60可控制其中一層之驅動源63驅動載具62作X軸向位移,使載具62將承座64、定位機構及測試機構由測試區載送至換料區,該移料裝置70之載送機構71即可視位於換料區之該層承座64位置,而帶動取放器72作Z軸向位移,並將待測之隨身碟80置入於承座64之容置槽641內;請參閱第13、14圖,接著該測試裝置60之驅動源63係驅動載具62載送承座64、定位機構及測試機構由換料區復位至測試區,該定位機構之驅動源651即驅動機架652作Y方向位移,而帶動各壓件653及檢查模組同步作Y方向位移至承座64之上方,並使各壓件653、第一感測器662及第二感測器663分別相對應於待測隨身碟80之插頭801、金屬連結部802及LED803,進而使壓件653作Z軸向位移而下降壓抵於待測隨身碟80之插頭801定位,並以第一感測器662感測待測隨身碟80之金屬連結部802,以判別待測隨身碟80是否放置反面,再以第二感測器663檢查待測隨身碟80之LED803是否損壞,例如待測隨身碟80之LED803損壞時,可先控制定位機構復位,並以驅動源63驅動載具62將承座64及損壞之LED803由測試區載出至換料區,以供移料裝置70之取放器72可將損壞之隨身碟80取出移載至不良品收料匣50收置,之後再控制驅動源63驅動載具62將承座64等由換料區載入至測試區,並使定位機構之各壓件653再次壓抵待測隨身碟80之插頭801定位;請參閱第15圖所示,於各待測隨身碟80定位後,該測試裝置60之測試機構係以驅動源671帶動機架672作Y方向位移,而使各測試插座674插合於相對應待測隨身碟80之插頭801,以電性連結至測試機而執行測試作業;請參閱第16圖所示,當第一層承座64內之待測隨身碟80進行測試時,測試裝置60可控制第二層之驅動源63A驅動載具62A將承座64A、定位機構及測試機構由測試區載出至換料區,由於移料裝置70之取放器72已將下一待測之隨身碟81取出移載至換料區,而可使移料裝置70之取放器72作Z軸向位移將下一待測之隨身碟81置入於承座64A之容置槽641A內而完成下一置料動作;請參閱第17圖所示,於測試完畢後,測試機係將測試結果傳輸至中央控制單元,由中央控制單元控制各裝置作動,該測試裝置60之測試機構係以驅動源671帶動機架672及各測試插座674反向位移復位,而定位機構之各壓件653係上升復位以解除完測隨身碟80之定位,並以驅動源651帶動機架652及壓件653、檢查模組反向復位;請參閱第18圖所示,於測試裝置60完成隨身碟80之測試作業後,即以驅動源63驅動載具62作X軸向位移,使載具62將承座64、定位機構及測試機構由測試區載送至換料區,以供移料裝置70之取放器72可於承座64之容置槽641取出完測之隨身碟80。Referring to FIGS. 11 and 12, when the pick-up unit 72 of the loading device 70 transfers the pen drive 80 to be tested to the refueling area of the testing device 60, the testing device 60 can control the driving source 63 of one of the layers. The carrier 62 is X-axis displaced, so that the carrier 62 carries the bearing 64, the positioning mechanism and the testing mechanism from the test zone to the refueling zone, and the carrying mechanism 71 of the loading device 70 can be regarded as being located in the refueling zone. The layer of the bearing 64 is positioned to drive the pick-and-placer 72 for Z-axis displacement, and the portable disk 80 to be tested is placed in the receiving groove 641 of the socket 64; please refer to Figures 13, 14 and then The driving source 63 of the testing device 60 drives the carrier 62 to carry the carrier 64, the positioning mechanism and the testing mechanism are reset from the refueling zone to the test zone, and the driving source 651 of the positioning mechanism, that is, the driving frame 652 is displaced in the Y direction, and The pressing member 653 and the inspection module are synchronously displaced in the Y direction to the upper side of the socket 64, and the pressing members 653, the first sensor 662 and the second sensor 663 respectively correspond to the pen tray 80 to be tested. The plug 801, the metal connecting portion 802 and the LED 803 further reduce the pressing force of the pressing member 653 in the Z-axis direction and press the plug 8 of the pen tray 80 to be tested. 01 is positioned, and the metal connector 802 of the pen drive 80 to be tested is sensed by the first sensor 662 to determine whether the counter disk 80 to be tested is placed on the reverse side, and then the second sensor 663 is used to check the pen drive 80 to be tested. Whether the LED 803 is damaged, for example, when the LED 803 of the pen drive 80 to be tested is damaged, the positioning mechanism can be first reset, and the carrier 62 is driven by the driving source 63 to carry the bearing 64 and the damaged LED 803 from the test area to the refueling area. The pick-up device 72 of the feeding device 70 can take out the damaged portable disk 80 and transfer it to the defective product receiving container 50 for storage. Then, the driving source 63 is driven to drive the carrier 62 to carry the bearing 64 and the like from the refueling area. The test piece is inserted into the test area, and the pressing members 653 of the positioning mechanism are pressed against the plug 801 of the pen tray 80 to be tested. Referring to FIG. 15 , after the positions of the pens 80 to be tested are positioned, the test device 60 is The test mechanism drives the frame 672 to be displaced in the Y direction by the driving source 671, and the test sockets 674 are inserted into the plugs 801 corresponding to the pens 80 to be tested, and electrically connected to the testing machine to perform the test operation; As shown in Fig. 16, when the to-be-tested portable disk 80 in the first-layer socket 64 is tested The testing device 60 can control the driving source 63A of the second layer to drive the carrier 62A to carry the bearing 64A, the positioning mechanism and the testing mechanism from the test zone to the refueling zone, since the picker 72 of the loading device 70 has been next The portable disk 81 to be tested is taken out and transferred to the refueling area, and the pick-up device 72 of the loading device 70 can be displaced in the Z-axis to place the next pen 81 to be tested into the receiving groove of the socket 64A. The next stocking action is completed in 641A; please refer to Figure 17, after the test is completed, the test machine transmits the test result to the central control unit, and the central control unit controls the operation of each device. The test device 60 is tested. The mechanism drives the frame 672 and the test sockets 674 to be reversely displaced by the driving source 671, and the pressing members 653 of the positioning mechanism are raised and reset to release the positioning of the measuring pen 80, and the driving source 651 drives the frame 652. And the pressing member 653 and the inspection module are reversely reset; as shown in FIG. 18, after the testing device 60 completes the testing operation of the flash drive 80, the driving source 63 is driven to drive the carrier 62 for X-axis displacement. 62 carries the socket 64, the positioning mechanism and the testing mechanism from the test area to Feed section, for shifting the feed extracting means 70 may be placed in the seat 72 accommodating vessel 641 taken pen drive 64. End 80 of the measurement.
請參閱第3、19圖,該移料裝置70之取放器72係將完測之隨身碟80移載至收料匣40處,該收料匣40係於前、後方設有疊置區401及暫置區402,其暫置區402之兩側係設有二由驅動源411驅動作X軸向位移之活動式軌道412以承置空的料盤,並於二活動式軌道412上設有可作X軸向位移之定位件42,以及於二活動式軌道412間設有另一可旋轉作動之定位件43,而可利用二定位件42、43分別頂置於料盤之側面及前面,而將料盤定位,另於暫置區402之二活動式軌道412間設有一頂盤機構及Y軸向載送機構,該頂盤機構係設有一由驅動源441驅動作Z軸向升降位移之承板442,而可使承板442頂置於料盤之底面,以使料盤平穩收料,該移料裝置70之取放器72即可將完測之隨身碟80置入於料盤中收置;請參閱第3、19、20圖,當暫置區402之料盤盛滿完測之隨身碟80後,該暫置區402之Y軸向載送機構係設有一由驅動源451驅動作Y軸向位移之推桿452,而可利用推桿452將二活動式軌道412上盛滿完測隨身碟80之料盤由暫置區402推移至疊置區401,該疊置區401之兩側係分別設有固定式軌道46及可作旋轉擺動之承置件47,該承置件47可用以承置料盤,另於疊置區401之二固定式軌道46間設有一頂盤機構,該頂盤機構係設有一由驅動源481驅動作Z軸向升降位移之承板482,而可以承板482將固定式軌道46上之料盤頂置於承置件47上收置。Referring to Figures 3 and 19, the pick-and-place unit 72 of the loading device 70 transfers the completed portable drive 80 to the receiving magazine 40. The receiving cassette 40 is provided with a stacking area at the front and the rear. 401 and the temporary area 402, the two sides of the temporary area 402 are provided with two movable rails 412 driven by the driving source 411 for X-axis displacement to receive the empty tray, and on the two movable rails 412. A positioning member 42 capable of X-axis displacement is provided, and another rotatable positioning member 43 is disposed between the two movable rails 412, and the two positioning members 42 and 43 can be respectively placed on the side of the tray. And the front side, and the tray is positioned, and another movable mechanism rail 412 between the temporary area 402 is provided with a top disc mechanism and a Y-axis carrying mechanism, and the top disc mechanism is provided with a driving source 441 for driving the Z-axis. To the displacement plate 442, the carrier plate 442 can be placed on the bottom surface of the tray so that the tray can be smoothly received, and the pick-up device 72 of the material transfer device 70 can place the completed USB flash drive 80 Entering in the tray; please refer to Figures 3, 19 and 20. When the tray of the temporary area 402 is full of the measured portable disk 80, the Y-axis carrying mechanism of the temporary area 402 is set. A push rod 452 for Y-axis displacement is driven by the driving source 451, and the tray of the two movable rails 412 full of the test drive 80 is moved from the temporary area 402 to the overlapping area 401 by the push rod 452. The two sides of the stacking area 401 are respectively provided with a fixed rail 46 and a bearing member 47 which can be rotated and oscillated. The bearing member 47 can be used for receiving the tray, and the fixed area 401 is fixed. A top plate mechanism is disposed between the rails 46. The top plate mechanism is provided with a carrier plate 482 driven by the driving source 481 for Z-axis lifting and lowering, and the carrier plate 482 can be placed on the fixed track 46. The device 47 is housed.
請參閱第21、22、23圖,為使供料匣30暫置區302處被取料完的空料盤可作有效之利用,而於供、收料匣30、40之二暫置區302、402間設有一空盤載送機構,該空盤載送機構係以驅動源391驅動一載送件392於二暫置區302、402間作X軸向位移,當供料匣30暫置區302之料盤被取料完畢後,由於承板382已頂置於料盤之底面,而可控制驅動源351驅動二活動式滑軌352向外側位移,使承板382可頂置空的料盤下降位移,並移載至空盤載送機構之載送件392上方;該空盤載送機構即以驅動源391驅動載送件392作X軸向位移,使載送件392將空的料盤由供料匣30之暫置區302載送至收料匣40之暫置區402處;接著該收料匣40暫置區402係以驅動源411驅動二活動式軌道412作X軸向外移,使承板442可頂置載送件392上之空料盤上升至二活動式軌道412之上方,於二活動式軌道412反向復位後,再控制承板442下降位移,而將空料盤置放於二活動式軌道412上以供收料;另該收料匣40之暫置區402係於機台之下方設有暫存架49,以供暫時收置空的料盤,因此,當二活動式軌道412上已具有空的料盤時,該頂盤機構則可控制承板442將下一空料盤頂置於暫存架49上收置備料。Please refer to Figures 21, 22 and 23 for the effective use of the empty trays that have been taken in the temporary storage area 302 of the feed 匣30, and in the temporary area of the supply and receipt 匣30, 40 bis 302, 402 is provided with an empty disk carrying mechanism, which drives the driving member 392 to drive the carrier member 392 to X-axis displacement between the two temporary regions 302 and 402. After the tray of the receiving zone 302 is taken out, since the bearing plate 382 has been placed on the bottom surface of the tray, the driving source 351 can be controlled to drive the two movable sliding rails 352 to be displaced outward, so that the bearing plate 382 can be placed overhead. The tray is lowered in displacement and transferred to the carrier 392 of the empty tray carrying mechanism; the empty tray carrying mechanism drives the carrier 392 to drive the X-axis displacement so that the carrier 392 will The empty tray is carried by the temporary storage area 302 of the supply cassette 30 to the temporary area 402 of the receiving cassette 40; then the receiving cassette 40 is temporarily driven by the driving source 411 to drive the two movable rails 412. The X axially outwardly moves, so that the empty tray on the carrier 442 can be lifted above the two movable rails 412, and after the two movable rails 412 are reversely reset, the carrier 442 is controlled. Displacement, the empty tray is placed on the two movable rails 412 for receiving; the temporary storage area 402 of the receiving magazine 40 is located below the machine with a temporary storage frame 49 for temporary storage. The empty tray, therefore, when the two movable rails 412 already have an empty tray, the top tray mechanism can control the carrier 442 to place the next empty tray top on the temporary storage rack 49 to receive the stock.
據此,本發明係利用各裝置之時序搭配作動,可一貫化自動執行隨身碟之測試及分類作業,而大幅提升作業便利性及測試產能,實為一深具實用性及進步性之設計,然未見有相同之產品及刊物公開,從而允符發明專利申請要件,爰依法提出申請。Accordingly, the present invention utilizes the timing matching of each device to consistently automate the testing and classification of the flash drive, and greatly improves the work convenience and test throughput, which is a practical and progressive design. However, the same products and publications have not been disclosed, so that the requirements for invention patent applications are allowed, and applications are filed according to law.
1...隨身碟1. . . Flash drive
11...電路板11. . . Circuit board
12...LED12. . . led
13...插頭13. . . plug
131...連結部131. . . Linkage
14...外殼14. . . shell
20...機台20. . . Machine
30...供料匣30. . . Feeding 匣
301...疊置區301. . . Overlapping area
302...暫置區302. . . Temporary zone
31...固定式軌道31. . . Fixed track
32...承置件32. . . Bearing
331...驅動源331. . . Drive source
332...承板332. . . Board
341...驅動源341. . . Drive source
342...推桿342. . . Putt
351...驅動源351. . . Drive source
352...活動式軌道352. . . Movable track
36...定位件36. . . Positioning member
37...定位件37. . . Positioning member
381...驅動源381. . . Drive source
382...承板382. . . Board
391...驅動源391. . . Drive source
392...載送件392. . . Carrier
40...良品收料匣40. . . Good receipt 匣
401...疊置區401. . . Overlapping area
402...暫置區402. . . Temporary zone
411...驅動源411. . . Drive source
412...活動式軌道412. . . Movable track
42...定位件42. . . Positioning member
43...定位件43. . . Positioning member
441...驅動源441. . . Drive source
442...承板442. . . Board
451...驅動源451. . . Drive source
452...推桿452. . . Putt
46...固定式軌道46. . . Fixed track
47...承置件47. . . Bearing
481...驅動源481. . . Drive source
482...承板482. . . Board
49...暫存架49. . . Temporary shelf
50...不良品收料匣50. . . Bad goods receipts匣
60...測試裝置60. . . Test device
61...盛裝容器61. . . Container
611...滑軌611. . . Slide rail
62、62A...載具62, 62A. . . vehicle
621...滑座621. . . Slide
63、63A...驅動源63, 63A. . . Drive source
64、64A...承座64, 64A. . . Seat
641、641A...容置槽641, 641A. . . Locating slot
651...驅動源651. . . Drive source
652...機架652. . . frame
653...壓件653. . . Pressing piece
661...電路板661. . . Circuit board
662...第一感測器662. . . First sensor
663...第二感測器663. . . Second sensor
671...驅動源671. . . Drive source
672...機架672. . . frame
673...測試板673. . . Test board
674...測試插座674. . . Test socket
675...傳輸線675. . . Transmission line
70...移料裝置70. . . Transfer device
71...載送機構71. . . Carrier mechanism
72...取放器72. . . Pick and place
73...驅動源73. . . Drive source
80、81...隨身碟80, 81. . . Flash drive
801...插頭801. . . plug
802...金屬連結部802. . . Metal joint
803...LED803. . . led
第1圖:隨身碟之示意圖。Figure 1: Schematic diagram of the flash drive.
第2圖:本發明之各裝置配置圖。Fig. 2 is a view showing the arrangement of each device of the present invention.
第3圖:本發明供料匣及收料匣之示意圖。Figure 3: Schematic diagram of the feed and receipt of the present invention.
第4圖:本發明供料匣之使用示意圖(一)。Figure 4: Schematic diagram of the use of the feed crucible of the present invention (I).
第5圖:本發明供料匣之使用示意圖(二)。Figure 5: Schematic diagram of the use of the feed crucible of the present invention (2).
第6圖:本發明移料裝置移料至供料匣之使用示意圖。Figure 6 is a schematic view showing the use of the material transfer device of the present invention for transferring materials to a feed port.
第7圖:本發明測試裝置之示意圖。Figure 7: Schematic diagram of the test device of the present invention.
第8圖:本發明測試裝置之局部示意圖(一)。Figure 8 is a partial schematic view (I) of the test device of the present invention.
第9圖:本發明測試裝置之局部示意圖(二)。Figure 9: A partial schematic view of the test device of the present invention (2).
第10圖:本發明測試裝置之局部示意圖(三)。Figure 10: A partial schematic view (3) of the test device of the present invention.
第11圖:本發明測試裝置之使用示意圖(一)。Figure 11: Schematic diagram of the use of the test device of the present invention (1).
第12圖:本發明測試裝置之使用示意圖(二)。Figure 12: Schematic diagram of the use of the test device of the present invention (2).
第13圖:本發明測試裝置之使用示意圖(三)。Figure 13: Schematic diagram of the use of the test device of the present invention (3).
第14圖:本發明測試裝置之使用示意圖(四)。Figure 14: Schematic diagram of the use of the test device of the present invention (4).
第15圖:本發明測試裝置之使用示意圖(五)。Figure 15: Schematic diagram of the use of the test device of the present invention (5).
第16圖:本發明測試裝置之使用示意圖(六)。Figure 16: Schematic diagram of the use of the test device of the present invention (6).
第17圖:本發明測試裝置之使用示意圖(七)。Figure 17: Schematic diagram of the use of the test device of the present invention (7).
第18圖:本發明測試裝置之使用示意圖(八)。Figure 18: Schematic diagram of the use of the test device of the present invention (8).
第19圖:本發明收料匣之使用示意圖(一)。Figure 19: Schematic diagram of the use of the receiving crucible of the present invention (1).
第20圖:本發明收料匣之使用示意圖(二)。Figure 20: Schematic diagram of the use of the receiving crucible of the present invention (2).
第21圖:本發明空盤載送機構之使用示意圖(一)。Figure 21: Schematic diagram of the use of the empty disk carrying mechanism of the present invention (1).
第22圖:本發明空盤載送機構之使用示意圖(二)。Figure 22: Schematic diagram of the use of the empty disk carrying mechanism of the present invention (2).
第23圖:本發明空盤載送機構之使用示意圖(三)。Figure 23: Schematic diagram of the use of the empty disk carrying mechanism of the present invention (3).
20...機台20. . . Machine
30...供料匣30. . . Feeding 匣
40...良品收料匣40. . . Good receipt 匣
50...不良品收料匣50. . . Bad goods receipts匣
60...測試裝置60. . . Test device
70...移料裝置70. . . Transfer device
Claims (39)
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TW97149838A TWI394172B (en) | 2008-12-19 | 2008-12-19 | Automatic test sorting machine |
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TW97149838A TWI394172B (en) | 2008-12-19 | 2008-12-19 | Automatic test sorting machine |
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TW201025347A TW201025347A (en) | 2010-07-01 |
TWI394172B true TWI394172B (en) | 2013-04-21 |
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CN103293402B (en) * | 2012-02-28 | 2017-06-20 | 富泰华工业(深圳)有限公司 | Test device |
TWI454715B (en) * | 2012-08-17 | 2014-10-01 | Hon Tech Inc | Electronic components composite receiving unit and its application of the test equipment |
CN103852710B (en) * | 2012-11-29 | 2017-08-15 | 鸿劲科技股份有限公司 | Opposed type electronic building brick implement |
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