CN102136298A - Memory card testing method - Google Patents
Memory card testing method Download PDFInfo
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- CN102136298A CN102136298A CN2010106121393A CN201010612139A CN102136298A CN 102136298 A CN102136298 A CN 102136298A CN 2010106121393 A CN2010106121393 A CN 2010106121393A CN 201010612139 A CN201010612139 A CN 201010612139A CN 102136298 A CN102136298 A CN 102136298A
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Abstract
The invention relates to a memory card testing method, which is mainly used for an automatic tester. The automatic tester comprises a storage management unit, more than one group of card activating test unit, more than one group of reading-writing test unit, a traveling load unit, and a control unit. The memory card testing method comprises the steps as follows: firstly, tested substances are moved out by the traveling load unit from the storage management unit and fed to the card activating test units; secondly, the card activating test units test the tested substances; thirdly, the tested substances passing the test are moved from the card activating test units to the reading-writing test units by the traveling load unit; and the tested substances not passing the test are fed back to a corresponding holding area of the storage management unit; fourthly, the reading-writing test units implement reading-writing test on the tested substances; and fifthly, the tested substances are moved to the corresponding holding area of the storage management unit by the traveling load unit according to the test results. The memory card testing method has high testing efficiency, short testing time, and correct result.
Description
Technical field
The present invention relates to a kind of memory card method of testing.
Background technology
General flash type memory card (for example SD card, mini SD card) must pass through the test jobs in two roads at least before manufacturer's shipment.First road is for opening the card test, and this test parameter is to be provided by memory card production firm, confirms whether memory card is defective products.Second road is a readwrite tests, and this test parameter generally changes into and uses manufacturer to provide.Using manufacturer is characteristic according to each tame card reader of market, formulates suitable test parameter, guarantees memory card by readwrite tests after selling the consumer, and this memory card still can normally use.
It is to adopt manual mode that existing memory card is opened the card test jobs, and testing process is in regular turn for confirming tester quantity, set test parameter, connect measurement jig, tester being positioned over the measurement jig place, opening the card test and distinguishing non-defective unit and defective products according to test result.Owing to be manual mode, thus must utilize a large amount of personnel operation and test, so also must substantive test tool and equipment.The readwrite tests operation in another road of memory card also is to adopt manual mode in addition, and with aforementioned to open card testing process roughly the same, difference is testing process basically: the different and proving installation that is used of the test parameter of setting is difference also.Generally speaking, former times with the memory card test jobs because of adopting relatively poor and equipment of manual mode efficient and human cost higher.Moreover, because it is also inequality to open the device that card is tested and readwrite tests is adopted, carry out respectively so must distinguish two perform regions.When memory card is distinguished non-defective unit and defective products earlier after opening the card test, by statistics after the classification, non-defective unit being moved to the readwrite tests district tests again, distinguish non-defective unit and defective products afterwards once more, then collect through statistic of classification once more, so constantly the statistics collection mode is not only time-consuming takes a lot of work, and also improper because of manual operation easily caused the incorrect of final amt.
For above-mentioned reasons, partly manufacturer promptly begins to research and develop the tester table of robotization, but owing to opens the card survey
Examination or some difference of the employed proving installation of readwrite tests, it is shorter to add out the card test duration, and readwrite tests constantly promotes because of present memory card capacity, makes the test duration more and more long.Therefore at present the tester table of robotization only can provide the test of single-mode usually, and for example the T1 test machine that is commonly called as of industry only can provide out the card test, and the T2 test machine then only provides readwrite tests.This mode then is to exist a shortcoming, still needs manpower to move to the readwrite tests board with the manpower transport by the non-defective unit of opening the card test, imports the work of quantity and statistics again.And single T1 test machine is in use, only can test the product of single memory card production company, if the memory card of test different vendor, then must be first the test interface of update all different vendor, very trouble and time-consuming.
Summary of the invention
The technical problem to be solved in the present invention provides a kind of testing efficiency height, and the test duration is simplified the memory card method of testing that the result is correct.The present invention is achieved through the following technical solutions:
A kind of memory card method of testing of the present invention is mainly used in automatically testing machine, and this automatically testing machine comprises and stores administrative unit, and one group of above card test cell of opening, and one group of above readwrite tests unit, and the transfer unit, and control module, the steps include:
1). with the transfer unit tester is shifted out and delivers to out the card test cell from storing administrative unit;
2). open the card test cell tester is tested;
3). the tester by test moves to the readwrite tests unit with the transfer unit from opening Ka Ceshidanyuanchu, and the tester that does not pass through is then sent the storing district that stores the administrative unit correspondence back to;
4). the test that the readwrite tests unit is read and write tester;
5). with tester according to test result with the transfer cell moving to storing the corresponding storing of administrative unit district.
As preferably, the described administrative unit of storing can be placed for tester; The described card test cell of opening can be opened the dependence test of card operation to tester; Described readwrite tests unit can be read and write the dependence test of operation to tester; Described transfer unit can be with tester in storing administrative unit, opening the action of doing immigration or shifting out between the third-class units such as card test cell and readwrite tests unit; Described control module can be controlled aforementioned
The unit produces the action of expection, makes that being positioned over the tester that stores administrative unit can carry out Kai Ka or readwrite tests in regular turn.
As preferably, described storing is formed with tester and puts district, not the storing district by opening card test, storing district and the storing district by testing by readwrite tests in the administrative unit.
As preferably, described storing district by test can divide into by the finished product district that opens card test and pass through the finished product district of readwrite tests.
As preferably, wherein this tester is a memory card.
A kind of memory card method of testing of the present invention, easy to use applied widely, this test function makes the memory card of different vendor open the card test on same machine, carries out follow-up readwrite tests afterwards more respectively, according to test result difference store collected, make manufacturer more convenient when test again.And buy this single board except carrying out individually Kai Ka and the readwrite tests, the testing process that also can adopt consistentization is the cost of investment that manufacturer reduces equipment as opening card test, readwrite tests in regular turn.
Description of drawings
In order to be easy to explanation, the present invention is done to describe in detail by following preferred embodiment and accompanying drawing.
Fig. 1 is the structure calcspar of test machine of the present invention;
Fig. 2 is the process flow diagram of memory card method of testing of the present invention.
Embodiment
A kind of memory card method of testing of the present invention, as depicted in figs. 1 and 2, automatically testing machine mainly include store administrative unit 11, at least one group open card test cell 12, at least one group readwrite tests unit 13, transfer unit 14 and control module 15.This stores administrative unit 11 can place wherein for tester, and this tester is the flash type memory card in the present embodiment, for example SD card, mini SD card, mmc card ... Deng.This store be formed with at least in the administrative unit 11 tester put the district, not by opening card
The storing district of test, storing district by readwrite tests and the storing district by test.Should further can divide into by the storing district of test by finished product district that opens the card test and the finished product district that passes through readwrite tests.This transfer unit 14 is to be used for tester is moved to each test cell, and tester is sent back in regular turn according to test result store corresponding storing districts in the administrative unit 11.This transfer unit 14 includes array horizontal cross transfer mechanism, the vertical transfer mechanism of array level, array vertical lifting mechanism, array suction nozzle unit ... Deng, the independent respectively start in good time of each group, this is partly to existing similar, so no longer encyclopaedize.This is opened card test cell 12 and is used for opening card test to putting to tester herein, and it includes several bearings, several drive the card machine ... Deng, once can open the card test to several testers, this interface of driving the card machine is then provided by memory card manufacturer.This is opened card test cell 12 and is connected with control module 15, with the flow process of operational testing, and the result of statistics last test.13 of this readwrite tests unit are in order to the tester of placing is herein carried out readwrite tests, the test interface of this readwrite tests unit 13 is then by using manufacturer to design voluntarily or formulating test parameter according to the characteristic of each tame card reader on the market, with the versatility of the memory card after guaranteeing after tested.And this control module 15 is connected with each unit respectively, is responsible for the action that each unit of control produces expection.For example controlling transfer unit 14 shifts out tester and stores administrative unit 11, again tester is transferred load to out card test cell 12 and readwrite tests unit 13, driving is opened card test cell 12 and is carried out relevant test with readwrite tests unit 13, and last according to test result tester being retracted with transfer unit 14 again stored the relative position of administrative unit 11.
Shown in second figure, be test flow chart of the present invention, memory card method of testing of the present invention must be used aforesaid automatically testing machine, the steps include:
1). with the transfer unit tester is shifted out and delivers to out the card test cell from storing administrative unit;
2). open the card test cell tester is tested;
3). the tester by test moves to the readwrite tests unit with the transfer unit from opening Ka Ceshidanyuanchu, and the tester that does not pass through is then sent the storing district that stores the administrative unit correspondence back to;
4). the test that the readwrite tests unit is read and write tester;
5). with tester according to test result with the transfer cell moving to storing the corresponding storing of administrative unit
The district.
In the present embodiment, automatically testing machine of the present invention open the card test cell and the readwrite tests unit only draws one group, but, also can be two or three groups not as limit.In addition owing to the time of opening the card test is shorter, and that the time of readwrite tests is being complied with the increasing time of memory capacity is more and more long, therefore the configuration of the member of this automatically testing machine also can be adopted one group and be opened two ~ three groups of readwrite tests unit of card test cell collocation, to shorten the stand-by period of test process, promote the efficient of test.
In addition automatically testing machine of the present invention open the card test cell also can allow different vendor the card machine of opening setting wherein, be responsible for control with control module, the memory card tester of corresponding manufacturer is transferred load to out corresponding position in the card test cell, store the corresponding storing of administrative unit district behind Kai Ka or readwrite tests, transferring load to again.Thus, all can test no matter receive the makers' memory card of that tame memory card more conveniently.
Comprehensive the above, automatically testing machine of the present invention is to be incorporated on same the machine opening card test cell and readwrite tests unit, tests and readwrite tests the flow process that simplification is tested, lifting work efficiency so can open card to memory card in regular turn.
The foregoing description, just example of the present invention is not to be used for limiting interest field of the present invention, and is all according to equivalence variation and modification that the present invention did, all should be included in the patent claimed range of the present invention.
Claims (5)
1. a memory card method of testing is mainly used in automatically testing machine, and this automatically testing machine comprises and store administrative unit, and one group of above card test cell of opening, and one group of above readwrite tests unit, and the transfer unit, and control module, the steps include:
1). with the transfer unit tester is shifted out and delivers to out the card test cell from storing administrative unit;
2). open the card test cell tester is tested;
3). the tester by test moves to the readwrite tests unit with the transfer unit from opening Ka Ceshidanyuanchu, and the tester that does not pass through is then sent the storing district that stores the administrative unit correspondence back to;
4). the test that the readwrite tests unit is read and write tester;
5). with tester according to test result with the transfer cell moving to storing the corresponding storing of administrative unit district.
2. a kind of memory card method of testing according to claim 1 is characterized in that: the described administrative unit of storing can be placed for tester; The described card test cell of opening can be opened the dependence test of card operation to tester; Described readwrite tests unit can be read and write the dependence test of operation to tester; Described transfer unit can be with tester in storing administrative unit, opening the action of doing immigration or shifting out between the third-class units such as card test cell and readwrite tests unit; Described control module can be controlled the action that aforementioned unit produces expection, makes that being positioned over the tester that stores administrative unit can carry out Kai Ka or readwrite tests in regular turn.
3. a kind of memory card method of testing according to claim 2 is characterized in that: described storing is formed with tester and puts district, not the storing district by opening card test, storing district and the storing district by testing by readwrite tests in the administrative unit.
4. a kind of memory card method of testing according to claim 3 is characterized in that: the finished product district that described storing district by test can divide into by opening the card test reaches the finished product district that passes through readwrite tests.
5. a kind of memory card method of testing according to claim 1 is characterized in that: wherein this tester is a memory card.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010106121393A CN102136298A (en) | 2010-12-29 | 2010-12-29 | Memory card testing method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010106121393A CN102136298A (en) | 2010-12-29 | 2010-12-29 | Memory card testing method |
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| CN102136298A true CN102136298A (en) | 2011-07-27 |
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| CN2010106121393A Pending CN102136298A (en) | 2010-12-29 | 2010-12-29 | Memory card testing method |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103324560A (en) * | 2013-06-28 | 2013-09-25 | 深圳市江波龙电子有限公司 | Testing method and device of flash memory |
| CN105004957A (en) * | 2015-07-31 | 2015-10-28 | 福州瑞芯微电子股份有限公司 | SD card test method and test device |
| CN108627195A (en) * | 2018-08-17 | 2018-10-09 | 深圳市金邦科技发展有限公司 | A kind of intelligent detecting method and intelligent checking system that memory body module is detected |
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| TW200846679A (en) * | 2007-05-18 | 2008-12-01 | Li-Ling Wang | Testing and classifying machine capable of initially using and further reading and writing test card |
| TW200901211A (en) * | 2007-06-27 | 2009-01-01 | Chip Right Corp | Memory card testing method and automatic testing machine |
| CN201194167Y (en) * | 2008-04-23 | 2009-02-11 | 邱士荣 | Inclined slide type storage card test device |
| CN201219035Y (en) * | 2008-06-20 | 2009-04-08 | 邱士荣 | Angle-adjustable slide rail type memory card test write-in apparatus |
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2010
- 2010-12-29 CN CN2010106121393A patent/CN102136298A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW200846679A (en) * | 2007-05-18 | 2008-12-01 | Li-Ling Wang | Testing and classifying machine capable of initially using and further reading and writing test card |
| TW200901211A (en) * | 2007-06-27 | 2009-01-01 | Chip Right Corp | Memory card testing method and automatic testing machine |
| CN201194167Y (en) * | 2008-04-23 | 2009-02-11 | 邱士荣 | Inclined slide type storage card test device |
| CN201219035Y (en) * | 2008-06-20 | 2009-04-08 | 邱士荣 | Angle-adjustable slide rail type memory card test write-in apparatus |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103324560A (en) * | 2013-06-28 | 2013-09-25 | 深圳市江波龙电子有限公司 | Testing method and device of flash memory |
| CN103324560B (en) * | 2013-06-28 | 2016-05-25 | 深圳市江波龙电子有限公司 | A kind of flash memories method of testing and device |
| CN105004957A (en) * | 2015-07-31 | 2015-10-28 | 福州瑞芯微电子股份有限公司 | SD card test method and test device |
| CN108627195A (en) * | 2018-08-17 | 2018-10-09 | 深圳市金邦科技发展有限公司 | A kind of intelligent detecting method and intelligent checking system that memory body module is detected |
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Application publication date: 20110727 |