200800768 九、發明說明： 【發明所屬之技術領域】 本發明尤指其提供一種利用輸出、入山 取料機構的時序搭配作動’以快速進行元件則= 使檢測機有效提升檢·能之電子元件檢^u娜敦進而 【先前技術】 “ ° 請參閱第1圖，其係為本申請人先前之200800768 IX. Description of the invention: [Technical field to which the invention pertains] The present invention particularly provides an electronic component inspection that utilizes an output, a timing matching operation of a mountain feeding mechanism, to quickly perform components, and enables the inspection machine to effectively improve inspection and energy. ^u Na Dun and [Prior Art] " ° Please refer to Figure 1, which is the previous
號『ic檢之運送裝置』專利案，該檢測^於機台 2 0刖侧排列e又置數個可自動升降之供料架21及收料架2 2， 機台2 0之後侧則設有數組裝設有測試板之檢測台2 3，於供、 收料架21、2 2與檢測台2 3間設有包括左懸臂取放機構 2 4、右懸臂取放機構2 5及轉運機構2 6 ;當1C執行測試作業 日守，係以左懸臂取放機構2 4將單一待測ic移送至轉運機構 2 6，轉運機構2 6以隧道穿越的方式移動到後侧後，接著由右 懸臂取放機構2 5將1C移送至檢測台2 3進行檢測作業，於完成 檢測後，右懸臂取放機構2 5再將單一之完測ic移送至轉運機構 2 6，由轉運機構2 6將1C移送回至前側，復由左懸臂取放機構 2 4將完測之1C取出並依據檢測結果，將ic移送並分類至各收 料架2 2 ’而完成1C的檢測作業。 請參閱第2圖，該各組檢測台23之上方係分別對應設置有 壓接機構2 7，該壓接機構2 7具有一可由驅動源驅動升降之下 壓桿2 7 1及下壓治具2 7 2，於1C個別置入於各檢測台2 3之 測試座2 31後，該下壓桿2 71將會下降使下壓治具2 7 2壓 抵於1C的表面，以使得ic確保接觸到測試座2 3 1之接點，以 順利進行檢測的作業。 由於上述的1C檢測作業，其各組檢測台2 3的待測1C及完 測1C的移送，均係由一組的左懸臂取放機構2 4、轉運機構2 6 及右懸臂取放機構2 5交替完成運送，在一組的左懸臂取放機構 2 4、轉運機構2 6及右懸臂取放機構2 5對應多組檢測台2 3 200800768 ^.^w, tjtii ί s^r：^ Γί；ί^^^ ic4,,^ 型離之電子元件m間’然而’該檢測機對於其他種不同檢測 mttt產不咖的情形，魏明如下： 」^電I檢測時間極短之電子元件 =;;r:，，因此_ 機以—組的左懸臂取放機構2 4、 2· 23 ίί:=取同時對應多組檢測台 而、生速的執仃檢測物的移入交換及移出作業，進 q 長畴待移送_，而降低檢測效率。’ 座2 的^呈中’各待測IC置入於各檢測台2 3之測試 獨桿2 7 1下降壓抵於IC的表面，以 測試座2 3 1之接點，亦即每一檢測台 及提高ί備之壓桿2 7 1 ’進而造成設備過於複雜 經驗有C ^ 人遂以其多年從事相關行業的研發與製作 【發明内容】 入端種ί子元件檢測機’其係設有輸 替的方式，快速ί ίϋ時序祕配作動，而以循環交 升檢測，，達===:進而使檢測機有效提 本發明之另—目的係提供—種電子元件檢測機，其於進行檢 200800768 測的過程中，係直接以第一、二料機 件的表面，以使得元件確保接觸到測試|之接^。=^於? 構的設置，達断低設鄕作成本之目的。接'，細可間化機 ί 放，紐職有峨雜測的產 【實施方式】 為使貴審查委員對本發明有進一步之深入瞭 較佳實施例，並配合圖式說明如后： “ 牛 3 圖;t發明係於機台之前侧設有可平移之供料匿No. "Ic inspection transport device" patent case, the detection ^ is arranged on the 20 side of the machine, and several sets of automatic lifting and lowering supply rack 21 and receiving rack 2 2 are set, and the rear side of the machine 20 is set. There are a plurality of test stands 2 3 for assembling test boards, and a left cantilever pick-and-place mechanism 24, a right cantilever pick-and-place mechanism 25 and a transfer mechanism 2 are provided between the supply and receiving racks 21, 22 and the test stand 23. 6; When 1C performs the test operation, the left cantilever pick-and-place mechanism 24 transfers the single test ic to the transfer mechanism 2 6, and the transfer mechanism 26 moves to the rear side by tunneling, followed by the right cantilever The pick-and-place mechanism 25 transfers the 1C to the test station 23 for the detection operation. After the completion of the test, the right boom pick-and-place mechanism 25 transfers the single test ic to the transfer mechanism 2 6, and the transfer mechanism 26 sets the 1C. After being transferred back to the front side, the left cantilever pick-and-place mechanism 24 takes out the measured 1C and according to the detection result, the ic is transferred and sorted to each receiving rack 2 2 ' to complete the 1C detecting operation. Referring to FIG. 2, the upper part of each group of test stands 23 is respectively provided with a crimping mechanism 2 7 . The crimping mechanism 27 has a driving source capable of driving the lower pressing rod 2 7 1 and the pressing fixture. 2 7 2, after 1C is placed in the test stand 2 31 of each test stand 23, the lower press bar 2 71 will be lowered to press the lower press fixture 2 7 2 against the surface of 1C, so that ic ensures Contact the contact of test stand 2 3 1 to perform the test smoothly. Due to the above 1C detection operation, the transfer of the 1C to be tested and the 1C of the test 1 of each group are performed by a set of left cantilever pick-and-place mechanism 24, transfer mechanism 26 and right cantilever pick-and-place mechanism 2 5 alternately complete the transport, in a group of left cantilever pick-and-place mechanism 24, transport mechanism 26 and right cantilever pick-and-place mechanism 25 correspond to multiple sets of test stations 2 3 200800768 ^.^w, tjtii ί s^r:^ Γί ; ί ^ ^ ^ ic4,, ^ type away from the electronic components m 'however' the detector for other kinds of different detection mttt production, Wei Ming is as follows: " ^ Electric I detection time is extremely short electronic components = ;;r:,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, Into the long domain to be transferred _, and reduce the detection efficiency. The test IC of each of the test ICs placed in each test stand 2 3 is lowered to the surface of the IC to test the contact of the seat 2 3 1 , that is, each The test bench and the improvement of the pressure bar 2 7 1 'the result is too complicated for the equipment. C ^ people have been engaged in the research and development and production of related industries for many years. [Inventive content] There is a way to replace, fast ϋ ϋ 秘 秘 秘 秘 , , , , , 秘 秘 秘 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环 循环During the inspection of 200800768, the surface of the first and second material parts is directly used to ensure that the components are in contact with the test. =^ The setting of the structure is set to break the cost of the production.接 接 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , 3; the invention is based on the front side of the machine with a translatable supply
^ =以及於周側設有可平移之良品的收料E 3^、34及不良品的收料£35、36、37、38，於供料 匣3 0之侧邊設有輸入端輸送機構4 〇，於收料匣3 5、3 &、 23ί侧邊則设有輸出端輸送機構41，輸入端輸送機構 =係汉具有至少-吸嘴之取放頭4〇1，並使取放頭4〇ι可 Q 一、二方向（χ、γ、ζ軸向）的位移，以吸取移置供料匣 $ 〇上之待測電子藉，輸出端輸送機構4 i則係相同設具有至 乂一吸嘴之取放頭41 1，並使取放頭4 i i可作第一、二、三 方向（X、Y、Z軸向）的位移，以將完測電子元件吸 j 料 n 33、34、35、36、37、38,檢測埠 5 0 係可裝設測試板或CCD，以進行電子元件（如Ic或記憶卡）之電 ^檢測或外觀檢測作業，而於檢測埠5㈣裝設測試板^ CCD，該 核，埠5 0兩外侧分別設有第一暫存區5 i及第二暫存區5 2， 該第暫存區51及弟二暫存區5 2係分別為定位治具，以供定 f出電子元件之中心位置，另檢測埠5 〇_係裝“具取^器 53 1、54 1之第一、二取料機構5 3、54，該第一、二取 200800768 ^斗機構5 3、5 4係可帶動其上之取料器5 31、5 4 1作第—、 三方向（X、Z軸向）的位移，而可將第一暫存區5 i之測、 g件【营$琿5 〇内進行檢測，並將完測之電子元件移送至 ，參閱第4圖，本發明於初始狀態時，輸人端輸送機 、取放頭4 0 1，係於供舰3㈣吸轉測之電子 ^ if置Ϊ第—暫存區51，以定位出電子元件6◦之中心位置。 子接端輸，構4 0回到供料昆3 〇内吸取 ί ί電子牛6 1，而苐一取料機構5 3則移至第-暫存 =1^以取料器5 3 i吸取待測之電子元件6 〇。請來g 取料麟5 3之取料n5 3 i吸取制之電子 ϋ將會移置到檢測埠5 Q内放置及下壓電子元件6 〇以 4'(ϊΤ子的檢測’而輸入端輸送機構4 0之取放頭 閱第7圖，在電子元件6 〇檢測的同時 i :多 回到供料H 3 0内吸取另一待測之g元$=輸=構4 0又 構5 4則移至第-暫存區5!，並以取 q =二取料機 子元件61。請參閱第8圖，在電子元件取待測之電 取料機構5 3之取料器5 3 1將會吸取檢:f，第-移送至第二暫存區5 2，同時第子轉6 0，並 將待測之電子元件6 !移送至檢==器5 4 i 電子元件61的檢測，以及輸入端輪送撼堪，及下S，以進行 U測之電子· 2移置到第—暫存 ° ^ 1 在電子元件61檢測的同時，輸入端於 i> 閱弟9圖， 3 0内吸取另-制之電子元件6 3 =、料Q又回到供料ϋ 至第-暫存區51，並以取料哭5 ?1取料機構5 3則移 62,另輸出端輸送機構4 子元件 之電子树6 0。請參閱第1⑽，在存f 5 2上吸取完測 第二取料機構5 4之取_ 4 i將完測之f 6 1完成檢移則後’ 200800768 巧’同時第-取料機構5 3之取料器5 3 之電 ===:壓：行 暫機構4〇及: 入端輸送機構4 ίΞ取ίΐ二種態時’輪 0，並移置到第一暫存===== 6 0之中心位置。諸袁間篦1 9闽^ iA 心议出逼子兀件 到供料E 3 0内吸取i-待測之^子機構4 0回 5 3則移至第一暫存區5丄，並以:3 J :第-取料機構 元件6 0。請_丄3圖，吸取待測之電子 吸取待測之電子元件6 〇後，器5 3 i 壓電子元件6 0，以進行電子元件6=:;埠2内放置及下 構4 0之取放頭4 〇 i ’則將待測之電子元 ^端輸送機 存區51。請參閱第14圖，在電子元 U置到第-暫 取料機構5 3之取料器5 3 1將會移至第—後，第一 到供觸0内吸取另一待測=元端;，構4 0回 圖，接著第二取料機構5 4之取器將^閱第15 6 〇移送至移至第二暫存區5 2 = 之電子元件 $ 1則娜狀電子元件6 "娜細之取料器 子疋件61的檢测，而輸入端輸送機構 #内’以進仃電 將待測之電子元件6 2移置到第；⑽=6則 200800768 ，疋件21完成檢測後，第—取料機構5 3之取料器 、，夺a移至第-暫存區5 1吸取待測之電子元件2，二 ::料，” 4之取料器5 4 1則移至檢測埠5 〇 取完$ 二主5 61’而輸入端輸送機構4 0回到供料£ 3 〇内吸取另 之電子元件6 3，另輸出端輸送機構4 及g 4之取料器5 4丄將完測之電子元件J 存區5 2，而第-取料機構53之取料器53 =弟：暫 二件6 2移置到檢測埠5 〇内，以進行電子元件6 = 0之取G 1 ’鑛制之電子件 s件===動及m型嫩替的方式，快速進行電 請參閱第18圖’其係為本發明之另—配置圖 設有可平移之供料◦，以及於周側 。$ : 的收料E 7 1、7 2及不良品的收龍7 3，於供斗二 ..a 0 «««8 1； 8 2#^t^Wll8 χ χ . 3ΐ；,；ί $至檢稱8 (3峨彳刺’並肺狀树 請參閱f19圖，本發明於初始狀態時，第 係移至供舰7 0，並辑料器8丨！吸取待i 200800768 9 0。請參閱第2 〇圖，第一取料機構8 ;[之取料器8工i吸取 待測之電子元件9 〇後，將會移置到檢測埠8置及下壓電 子元件9 0，以進行電子元件g 〇的檢測。請參閱第21圖，在 電子元件9 0檢測的同時，第二取料機構8 2則移至供料匣 ^0，並以取料器82 1吸取另一待測之電子元件91。請參閱 第22圖，在電子元件90完成檢測後，第一取料機構81之取 料器811將會吸取完測之電子元件9 〇，並依據檢測結果移送 至f分級之收料匣71、7 2、7 3，而第二取料機構8 2之取 料器8 21則將待測之電子元件g1移送至檢測琿8 〇内放置及 _ 了壓’以進行電子元件91的檢測，進而以檢測埠8 〇兩侧方之 第一、二取料機構81、8 2時序的搭配作動及迴旋循環交替的 方式’快速進行電子元件的移置交換取放。 請參閱第2 3圖’本發明另一種實施方式之初始狀態時，第 一取料機構81係移至供料匣7 〇，並以取料器8 i i吸取待測 之電子元件9 0。請參閱第24圖，第一取料機構8 1之取料器 811吸取待測之電子元件9 〇後，將會移置到檢測槔8 〇内放 置及下壓電子元件9 〇，以進行電子元件9 〇的檢測。請參閱第 2 5圖’在電子元件9 〇完成檢測後，第一取料機構81係移至 供料！7 0，並以取料器811吸取待測之電子元件91，而第 9 =取料機構8 2之取料器8 21將會移置到檢測琿8 0内並吸取 完測之電子元件9 0。請參閱第2 6圖，接著第二取料機構8 2 之取料器8 21依據檢測結果，將完測之電子元件9 〇移送至各 分級之收料匣71、72、73，而第一取料機構81之取料器 811則將待測之電子元件91移送至檢測埠8 0内放置及下 壓’以進行電子元件91的檢測，進而以檢測埠8 0兩側方之第 一、二取料機構81、8 2時序的搭配作動及Μ型循環交替的方 式’快速進行電子元件的移置交換取放。 據此，本發明可快速進行元件移置交換取放，進而使檢測機 有效提升檢測的產能，實為一深具實用性及進步性之設計，然未 200800768 見有相同之產品及刊物公開，從而允符發明專利申請要件，查依 法提出申請。 【圖式簡單說明】 第2圖 第3圖 第4圖 第5圖 第6圖 第7圖 第8圖 第9圖 第1 0圖 第1 1圖 第1 2圖 第1 3圖 第1 4圖 弟1 5圖 第1 6圖 第1 7圖 第1 8圖 第1 9圖 第2 〇圖 第2 1圖 第2 2圖 第2 3圖 第2 4圖 第2 5圖 第2 6圖 第1圖：係為習式ic檢測機之配置示意圖。 係為習式ic檢測機之檢測台與壓接機構之配置示意圖。 本發明之配置示意圖。 ^ 1 ° 本發明第一種實施例之動作示意圖（―）。 本發明第一種實施例之動作示意圖（二 本發明第一種實施例之動作示意圖（三 本發明第一種實施例之動作示意圖（四）。 本發明第一種實施例之動作示意圖（五）。 本發明第一種實施例之動作示意圖（六）。 本發明第一種實施例之動作示意圖（七）。 本發明第二種實施例之動作示意圖（一）。 本發明第二種實施例之動作示意圖（二）。 本發明第二種實施例之動作示意圖（三 本發明第二種實施例之動作示意圖（四 本發明第二種實施例之動作示意圖（五）。 本發明第二種實施例之動作示意圖（六）。 本發明第二種實施例之動作示意圖（七）。 本發明另一配置示意圖。 本發明另一配置之第一種實施例之動作示意圖（一 本發明另一配置之第一種實施例之動作示意圖（二）。 本發明另一配置之第一種實施例之動作示意圖（三）。 本發明另一配置之，一種實施例之動作示意圖（四）。 本發明另一配置之第二種實施例之動作示意圖（一）。 本發明另一配置之第一種實施例之動作示意圖（二）c 本發明另一配置之第一種實施例之動作示意圖（三）c 本發明另一配置之第二種實施例之動作示意圖（四）c 12 200800768^ = and on the side of the circumference, there are retractable goods E 3 ^, 34 and defective goods receipts of 35, 36, 37, 38, and the input end conveying mechanism is provided on the side of the feeding 匣 30 4 〇, on the side of the receiving 匣 3 5, 3 & 23, there is an output conveying mechanism 41, the input conveying mechanism = the 汉 has at least - the suction head of the nozzle 4 〇 1, and pick and place The displacement of the head 4〇ι can be in the first and second directions (χ, γ, ζ axial direction) to absorb the electrons to be tested on the displacement supply 匣$ ,, and the output conveying mechanism 4 i is the same The pick-up head 41 1 of the pick-up nozzle and the displacement head 4 ii can be displaced in the first, second and third directions (X, Y, Z-axis) to suck the finished electronic component n 33 , 34, 35, 36, 37, 38, test 埠50 can be installed with a test board or CCD for electronic components (such as Ic or memory card) for electrical or visual inspection, and for detection 埠 5 (four) The test board ^ CCD is provided, and the first temporary storage area 5 i and the second temporary storage area 5 2 are respectively disposed on the outer sides of the core 50, and the temporary storage area 51 and the second temporary storage area 52 are respectively Positioning fixtures for the purpose of The center position of the piece, another test 埠 5 〇 _ 装 装 "The first and second reclaiming mechanism 5 3, 54 with the device 53 1 , 54 1 , the first and second take 200800768 ^ fighting mechanism 5 3, 5 The 4 series can drive the retractor 5 31, 5 4 1 on it to make the displacement of the first and third directions (X, Z axis), and the first temporary storage area 5 i can be measured, g piece [Ying $珲5 进行 进行 进行 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , The electronic ^ if is placed in the first temporary storage area 51 to locate the center position of the electronic component 6 。. The sub-terminal input, the structure 4 0 back to the supply Kun 3 〇 ί ί ί electronic cattle 6 1, and 苐A reclaiming mechanism 5 3 is moved to the first temporary storage = 1 ^ to take the electronic component 6 待 to be tested by the reclaimer 5 3 i. Please come to g to take the material of the lining 5 3 to take the material n5 3 i to absorb the electronic ϋ will be placed in the detection 埠 5 Q to place and depress the electronic components 6 〇 4' (detection of the scorpion] and the input end of the transport mechanism 40 to read the head 7 to view the electronic component 6 〇 detection At the same time i: more back to the feed H 3 0 to absorb another The g element to be tested is $============================================================================================ The reclaimer 5 3 1 of the electric reclaiming mechanism 5 to be tested will take the inspection: f, the first transfer to the second temporary storage area 5 2, and the first sub-transfer 60, and the electronic component 6 to be tested Transfer to the test == 5 4 i The detection of the electronic component 61, and the input end of the wheel, and the lower S, to perform the U measurement of the electronic · 2 displacement to the first temporary storage ° ^ 1 in the electronic component 61 At the same time of detection, the input terminal is in i> reading the brother's figure 9, and the other electronic components 6 3 =, the material Q is returned to the feeding ϋ to the first temporary storage area 51, and crying 5 The 1 reclaiming mechanism 5 3 is shifted 62, and the output end 4 of the sub-component of the transport mechanism 4 is an electronic tree 60. Please refer to the 1st (10), pick up the second reclaiming mechanism 5 4 on the storage f 5 2 _ 4 i will complete the f 6 1 after the completion of the inspection and then '200800768 coincidence' simultaneous - reclaiming mechanism 5 3 The electric charge of the reclaimer 5 3 ===: pressure: the temporary mechanism 4〇 and: the infeed conveying mechanism 4 ίΞ ΐ ΐ ΐ ΐ ' ' ' ' ' ' ' ' ' ' ' ' 轮 轮 轮 轮 轮 轮 轮 轮 轮 轮 轮 轮 轮 轮 轮 轮 轮 轮 轮 轮 轮The center position of 60. Between the Yuan and the Yuan 篦1 9闽^ iA, the heart is forced out to the feeding material E 3 0 to absorb the i-tested sub-mechanism 4 0 back 5 3 then moved to the first temporary storage area 5丄, and :3 J : The first-retracting mechanism element 60. Please _丄3, take the electronic component to be tested and take the electronic component 6 to be tested, then the device 5 3 i presses the electronic component 60 to perform the placement of the electronic component 6=:; Putting the head 4 〇i ' will be the electronic component end of the conveyor to be tested 51. Referring to Fig. 14, the retractor 5 3 1 of the electronic temporary unit U to the first temporary reclaiming mechanism 5 3 will be moved to the first, and then the first to the contact 0 will draw another to be tested = the end of the element The structure of the second reclaiming mechanism 5 4 is transferred to the second temporary storage area 5 2 = electronic component $ 1 then the electronic component 6 " The detection of the picker unit 61 of the Na, and the transmission of the electronic component 6 2 to the first in the input end of the transport mechanism #; (10) = 6 then 200800768, the completion of the 21 After the detection, the reclaimer of the first reclaiming mechanism 5 3 moves to the first temporary storage area 5 1 to extract the electronic component 2 to be tested, two:: material, "4 of the reclaimer 5 4 1 Move to detection 埠 5 $ $ 二 二 二 二 而 而 而 而 而 而 而 而 而 而 而 而 而 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入 输入5 4丄 The electronic component J storage area 5 2 will be completed, and the reclaimer 53 of the first reclaiming mechanism 53 = brother: the temporary two pieces 6 2 are displaced into the detection 埠 5 , for the electronic component 6 = 0 take G 1 'Mineral electronic parts s === move and m-type tender For quick power, please refer to Figure 18, which is another part of the invention. The configuration diagram is provided with a translatable feed port, and on the side of the circumference. $: Receipt E 7 1, 7 2 and defective products收龙7 3,在斗斗二..a 0 «««8 1; 8 2#^t^Wll8 χ χ . 3ΐ;,; ί $ to check 8 (3 峨彳 刺 ' and lung tree please Referring to the figure f19, when the invention is in the initial state, the first system is moved to the ship 70, and the picker 8 is sucked; the pipe is to be i 200800768 9 0. Please refer to the second drawing, the first reclaiming mechanism 8; After the reclaimer 8 draws the electronic component 9 to be tested, it will be displaced to the detection 埠8 and the depressed electronic component 90 to detect the electronic component g 。. Please refer to Fig. 21, in the electronic While the component 90 is being detected, the second reclaiming mechanism 8 2 is moved to the feeding device 0, and the other electronic component 91 to be tested is taken up by the reclaimer 82 1. Referring to Fig. 22, in the electronic component 90 After the test is completed, the reclaimer 811 of the first reclaiming mechanism 81 will absorb the measured electronic component 9 〇 and transfer it to the f-level receiving 匣 71, 7 2, 7 3 according to the detection result, and the second take Reclaimer 8 21 of material mechanism 8 2 The electronic component g1 to be tested is transferred to the detection 珲8 放置 and the pressure _ is performed to perform the detection of the electronic component 91, thereby detecting the timing of the first and second reclaiming mechanisms 81 and 8 2 on both sides of the 埠8 〇 The mode of the collocation and the cycle of the gyro cycle is as follows: 'The rapid displacement of the electronic components is exchanged. Please refer to FIG. 2 3 'In the initial state of another embodiment of the present invention, the first reclaiming mechanism 81 is moved to the feeding匣7 〇, and the electronic component 90 to be tested is sucked by the reclaimer 8 ii. Referring to Fig. 24, the reclaimer 811 of the first reclaiming mechanism 8 1 picks up the electronic component 9 to be tested, and then moves and places the electronic component 9 移 into the detecting 槔8 〇 to perform electronic Detection of component 9 〇. Referring to Figure 25, after the electronic component 9 has finished testing, the first reclaiming mechanism 81 is moved to the supply! 70, and the electronic component 91 to be tested is sucked by the reclaimer 811, and the retractor 8 21 of the 9th reclaiming mechanism 8 2 is displaced into the detecting port 80 and the electronic component 9 is taken up. 0. Referring to FIG. 26, the reclaimer 8 21 of the second reclaiming mechanism 8 2 transfers the completed electronic component 9 至 to the grading receipts 71, 72, 73 according to the detection result, and the first The reclaimer 811 of the reclaiming mechanism 81 transfers the electronic component 91 to be tested to the detecting and pressing in the detecting port 80 to perform the detection of the electronic component 91, thereby detecting the first side of the two sides of the 埠80. The two reclaiming mechanisms 81, 8 2, the timing of the collocation and the Μ-type cyclic alternating mode 'fast transfer of electronic components. Accordingly, the present invention can quickly perform component shifting exchange and transfer, thereby enabling the detector to effectively increase the detection throughput, which is a practical and progressive design. However, the same products and publications are not disclosed in 200800768. Therefore, the requirements for invention patent applications are allowed to be filed, and the application is filed according to law. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 2, Fig. 3, Fig. 4, Fig. 5, Fig. 6, Fig. 7, Fig. 8 Fig. 9 Fig. 1 0 Fig. 1 1 Fig. 1 2 Fig. 1 3 Fig. 1 Fig. Brother 1 5 Figure 1 6 Figure 1 7 Figure 1 8 Figure 1 9 Figure 2 2 Figure 2 2 Figure 2 2 Figure 2 3 Figure 2 4 Figure 2 5 Figure 2 6 Figure 1 Figure: Schematic diagram of the configuration of the ic detector. It is a schematic diagram of the configuration of the test bench and the crimping mechanism of the conventional ic detector. Schematic diagram of the configuration of the present invention. ^ 1 ° Schematic diagram of the operation of the first embodiment of the present invention (-). BRIEF DESCRIPTION OF THE FUNCTION OF THE FIRST EMBODIMENT OF THE PREFERRED EMBODIMENT (2) A schematic diagram of the operation of the first embodiment of the present invention (the operation diagram of the first embodiment of the present invention (4). Fig. 6 is a schematic view showing the operation of the first embodiment of the present invention. (VII). Fig. 7 is a schematic view showing the operation of the second embodiment of the present invention. Schematic diagram of the operation of the second embodiment of the present invention (the operation diagram of the second embodiment of the present invention (fourth embodiment of the second embodiment of the invention) Schematic diagram of the operation of the embodiment (six). Schematic diagram of the operation of the second embodiment of the present invention (7). Another schematic diagram of the configuration of the first embodiment of the present invention. Schematic diagram of the operation of the first embodiment of a configuration (2). The operation diagram (3) of the first embodiment of another configuration of the present invention. Another configuration of the present invention Schematic diagram of the operation of an embodiment (four). The operation diagram of the second embodiment of another configuration of the present invention (1). The operation diagram of the first embodiment of another configuration of the present invention (2) c Schematic diagram of the operation of the first embodiment of a configuration (c) c. Schematic diagram of the operation of the second embodiment of another configuration of the present invention (4) c 12 200800768
【主要元件符號說明】 習式部份： 2 0 :機台 21 :供料架 2 2 3 :檢測台 2 31 :測試座 2 4 :左懸臂取放機構 2 5 :右懸臂取放機構 2 6 :轉運機構 2 7 :壓接機構 2 7 1 :下壓桿 2 7 2 ··下壓治具 本發明部份： 3 0 :供料匣 3 1 :空匣 3 3 :收料匣 3 4 :收料匣 3 6 :收料匣 3 7 :收料匣 4 0 :輸入端輸送機構 41:輸出端輸送機構 5 0 :檢測埠 5 1 :第一暫存區 5 2 ··第二暫存區 5 3 :第一取料機構 5 31 :取料器 5 4 :第二取料機構5 41 :取料器 6 0 :電子元件 6 1 ··電子元件 6 2 ··電子元件 6 3 :電子元件 7 0 :供料匣 7 1 :收料匣 7 3 :收料匣 8 0 :檢測埠 81:第一取料機構811:取料器 8 2 :第二取料機構8 21 :取料器 9 0 ··電子元件 9 1 ··電子元件 :收料架 3 2 :空匣 3 5 :收料匣 3 8 :收料匣 4 01 :取放頭 411:取放頭 7 2 :收料匣 13[Main component symbol description] Part of the formula: 2 0 : Machine table 21 : Feeding rack 2 2 3 : Test stand 2 31 : Test stand 2 4 : Left cantilever pick-and-place mechanism 2 5 : Right cantilever pick-and-place mechanism 2 6 :Transportation mechanism 2 7 : Crimp mechanism 2 7 1 : Lower pressing rod 2 7 2 ·· Lower pressing jig Part of the invention: 3 0 : Feeding machine 3 1 : Air 3 3 : Receiving 匣 3 4 : Receipt 匣3 6 : Receipt 匣3 7 : Receipt 匣4 0 : Input end conveying mechanism 41: Output end conveying mechanism 5 0: Detection 埠 5 1 : First temporary storage area 5 2 ··Second temporary storage area 5 3 : First reclaiming mechanism 5 31 : Reclaimer 5 4 : Second reclaiming mechanism 5 41 : Reclaimer 6 0 : Electronic component 6 1 · Electronic component 6 2 · Electronic component 6 3 : Electronic component 7 0 : Feeder 匣 7 1 : Receipt 匣 7 3 : Receipt 匣 8 0 : Test 埠 81: First reclaim mechanism 811: Reclaimer 8 2 : Second reclaim mechanism 8 21 : Reclaimer 9 0 ··Electronic component 9 1 ··Electronic component: Receipt rack 3 2 : Empty 3 5 : Receipt 匣 3 8 : Receipt 匣 4 01 : Pickup head 411: Pickup head 7 2 : Receipt 匣 13