TWI337360B - Testing and classifying machine for use in memory ics - Google Patents

Description

1337360 IX. Description of the invention: Revision of the replacement page on October 29 of the following year [Technical field of the invention] The present invention provides a memory IC that can simultaneously transfer and test a plurality of memory ICs to effectively shorten the standby time and substantially increase the memory I c detects the capacity of the memory IC detection classifier. [Prior Art]

At present, the I c of the semiconductor component is divided into different types such as the logic I c , the memory IC, the analog IC, and the micro IC I c , and the logic I c is taken as an example, and is applied to the central processing unit on the motherboard, 俾Responsible for the signal conversion, transmission, and operation of the central processing unit and other peripheral components. The memory is more lion-like, and the memory I ^ is simply used to store data and is installed on the module circuit board. The board is reloaded, on the domain board, its Wei recorded as simple, but no matter what type of I c is guaranteed, it must go through a test operation to eliminate the defective products, and the 1 (10) is equipped with the central processing 11 series. Directly load the main board, and k is complex and recorded 'wire for the logic〗 c can be used in the real f4 authenticity' to the actual assembly of the logic IC in the future, please refer to the logic IC classification machine, included in the machine === Logic 1 C IC detection and the first transfer material f, there is a supply 枓匣 1 1 , a plurality of receipt 匣 1 2 for reclaiming, each receipt E i 2 1 1 can be placed logic The IC uses - the transfer device TS to: = IC for receiving, and the first with multiple test devices & Temple / 1st C And the rear end 14 of the machine is provided with a single-test sleeve real ^ 15, each test device presses the crimping mechanism of the logic I c to be tested} 2 of the board 1 4 1 ' and the following is used to place the order - In the logic 33 2 to be tested, 'the test socket 14 2 can be Cl7' and the second transfer device 15 is used to move 5!337360 October 29, 1999 to correct the logic IC for the planting/finishing, Another one can be placed in front of the machine, a _ page transfer device i 6 ' ^, 6 series for planting to be completed / completed, and the first - transfer device 13 can be taken at the feeding! C17, placed side by side on the transfer device 16, after the transfer device 16 congratulates the stage, the second transfer device 15 takes the transfer device IC6 IC 1 7 out, and carries it to the test device 14 and puts it into the second In the test suite 1 4 2 of 1 4, in order to perform the inspection operation, the logic Ic丄7 of the second transfer device 15 to be tested is taken out on the detection board, and is carried by the transfer device 16 on the 4' transport device 16. Sended to the front end of the machine, the device 13 takes out the logic Ic 2 7 on the transfer device 16 and assembles the receipt 匣12, and sorts and collects according to the detection result to complete the logic T c ^ To detect, classify jobs. < In contrast, memory IC is purely used for storing data, and its functionality is simple. Therefore, it is generally tested with multiple memory ICs at the same time; if the operator uses the logic IC detection classifier to perform memory IC detection During operation, it is not possible to simultaneously transfer and test multiple memory ICs to be tested, and only carry a single memory IC to be tested via the transfer device, which will make the entire shift standby time too long ^ Right for multiple The large § 体 体 IC tester of the test device, the operation of each device, the waiting time will be more cumbersome and time consuming, and the detection capacity of the memory I ^ is greatly reduced, so the IC detection classifier is not applicable to Execution of memory 丨 (^ detection operation. Therefore, in the demand for rapid detection of use efficiency and increased productivity, such as the memory detection IC, and greatly improve the detection capacity of the memory r detection classifier, that is, the operator The main purpose of the package is to provide a memory 1C detection sorting machine, and the second is to supply the feed g and at least one receiving material n at the front end of the machine, and set it on the machine. The end-to-end misplacement test and positioning device, and the supply and receiving devices and the test device 3 are placed; the supply and receiving devices are respectively used to hold the memory to be/completed. 1337360 October, 1999 29曰Revised replacement page material has a number of test sets, a system, and a plurality of pick and place heads, and the number of detections that can be moved at the same time as the feed is blocked.

Do the plural, _ 丨 _ more than in the test socket </ /> to carry out the test operation, to achieve effective J

Two:, "it test socket is a normally closed type of socket (Qpen Top socket), another tree mg: a plurality of top pressure fixtures, and transfer a plurality of memory 丨c to the test test socket When the test sleeve sleeve can be opened by pressing the top pressure fixture, the memory I c can be fixed in the test sleeve to enter; and achieve the purpose of improving the use efficiency. Staying ^ [embodiment] The reviewer will further understand the present invention, and an embodiment will be described in detail with reference to the following figures. Referring to FIG. 3, the memory jc detection sorting machine of the present invention is provided at the front end of the machine 20. Feeding 匣21, a plurality of receiving 匣2 2a, 2 2 B, 2 2 C 'the test device 2 3, 2 4 disposed at the rear end of the machine 2, is disposed between the two test devices 2 3, 2 4 a positioning device 25, and a moving device 2 6 moving between the supply and receiving units g2丄, 22A, 22B, 22C and the testing devices 2 3 and 24; the feeding H 21 is for holding the test to be tested Memory! c, and a plurality of receipts E 22A, 22B, 22 C can be subdivided into different levels for storing and testing different levels of memory IC; test devices 2 3, 2 4 There are a number of tests 7 1337360 99 I am the 29th day to replace the replacement page test socket 2 2 4 2 'test circuit board 2 (3 test circuit board 2 3 2, test machine (not shown), test f 2 parallel, ., Q to machine 2 below the measuring device, the device; from the input to control and the whole 26 series has a plurality of top pressure; central processor, ·- Transfer a plurality of memories 2, c to 2 work and the memory I g position after the feeding ^疋 position and complete the test suites of 2 3 1 , 2 4 η 士 = device 2 3, 2 4 2 3 1, 2 4 1, for: two top = with 2 6 6 press open test socket test set 2 3 1, 2 4 ί, & 5 factory, 6 8 put memory 1 C into Each test 2 3 1 , 2 4 1 hour % 2 „ 2 6 6 in ascending off _ test socket 24 for testing can be fixed to the test socket 2 3 1 , tied to the test device 2 2 2 , 2 4 , 2 4 1, to measure the air coat wide 0 2 4 2 on the sigh 4 * 8 test sets 2 31

Top Socket) (〇pen 1=;=22 33 ;27,= = There are several on the upper seat. 2 3 1 4 Series ί When the pin is inserted, the position is pressed, so that = and press the clamp when pressing down ί When the 升 Λ 升 升 升 升 升 升 升 升 升 升 升 升 升 升 升 升 升 升 升 升 升 升 升 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 When the seat 1 C is placed, the slider is guided, and the 1 c pin is inserted into the corresponding insertion hole 2312 of the base 1. Positioning 7 Figure 'The device of the present invention is provided between the two test devices 2 3 and 24 The 2 5 series is fixed on the machine 20, and the positioning device 25 is provided with a plurality of corrections on October 29, 1999. The replacement page is 匣2曰1, and the second is for the 2C replied body 1 C, due to the memory 1 C is not very accurate for 2 3 1 ^ ο a ^1 eight angles, so it is placed in the test socket to place the 4 cores 1 into the positioning groove 2 of the positioning device 2 51 51 2'峨 Accurately place the memory IC into the test sleeve 2 οϋϋΐ8, 9Fig. 'The moving device of the present invention 2 6 oblique to the machine frame slide 2 6 γ on the moving device 2 6 is attached to the brake unit 2 β ^ 加 ΐ 6 6 (7) seat 2 6 2, then on the slide 2 6 2 The slide rails are connected to a vertical guide frame 2 6 4 'the upright guides 2 6 4 and the upper end of the axial joints move 'to make the upright guides 2 6 4 drive the top press fixtures 2 6 6 for Z f Above the fixture 2 6 6 «上, with the second waste cylinder 2 6 7 head 2 6 8 ', the pick-and-place head 2 6 8 can be the second pressure 2 = move, press the fixture 2 6 6 Internal lifting and lowering displacement. Complex number ^ 恃 ^ ^ c 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移 移2 6 8 Lifting and lowering to pick up and store memory 1 c to measure “ϋ1 f map” When the loading device 2 6 transfers a plurality of memory top pressures and ^ 3, the memory on each pick-up head 268 is C The system is located in 2 3 1 You, Fan, and each of the top pressure fixtures 2 6 6 corresponds to each test socket test socket 2 h ^ drop M pressure turn 2 6 6 will be pressed against the test piece 2 3 1 f 23 1 4 Drop, and make the base of the base 2 3 Η and then the pin of the moving material 1 C. Please refer to Figure 1 2, drop, will: mi take the head 2 6 8 will be the second cylinder 2 6 7 drive

Pin insertion == 2 If the material is tested 3 231, and the memory 1C, 2 3 1 1 metal film 231 3 inside. % &amp; 1 Q Figure 'The pick-and-place head 268 of the transfer device 26 is replaced by the second heart 2 = 13J/360 October 29, 1999. After the replacement page, the 'touch fixture 2' is called the first Age 2 6 51SI? 7^ Two seats 2 31 Upper seat 2 3 14 is the ascending reset, and the metal loss piece 2 313 is clamped to fix the memory i C, and the test operation is performed. = Refer to Figure 14 when the test device 2 3, 2 4 memory! c completed the test, after the 'transfer device 2 6 phase _ will test the test suite 2 3 i above, and press the test socket 2 31 to open the memory for the test The body c c- moxibustion read the 15th picture, and then the transfer device 26 will place the measured ς ^ c in the receiving materials s22A, 22B, 22C according to the test result, and complete the classification ^ stay 0 according to this, the present invention It is possible to simultaneously transfer and test a plurality of memory ports C to shorten the standby time and greatly increase the detection capacity of the memory r C. It is a practical and progressive design. : The requirements for the invention patent application are allowed, and the application is filed according to law. [Simplified description of the drawing] Figure 1: Configuration diagram of the conventional IC detection classifier. Figure 2 Figure 4 Figure 5 Figure 6 Figure 7 Figure 8 Figure 9 Schematic diagram of the test device of the IC detection classifier. The memory Ic detection classifier configuration diagram of the present invention. Schematic diagram of the test suite of the present invention. Schematic diagram of the test apparatus of the present invention. Schematic diagram of the positioning apparatus of the present invention. Schematic diagram of the appearance of the material transfer apparatus of the present invention. Side view of the material transfer apparatus of the present invention. The body I c is placed in the test socket. Figure 1: The memory of the present month ί C is placed in the test socket S3 a). Figure 12: Memory ί C of the present invention is placed in the test sleeve The movement of the seat rJ. Figure 1 3 shows the memory I c of the present invention placed in the test socket (-). Figure 14: Schematic diagram of the operation of the present invention after completion of the test (― (4). Figure 5: Schematic diagram of the action of the present invention after completion of the test (2) 10 1337360 October 29, 1999 revised replacement page [main component symbol description]

12: Receiving cassette 14 2 : Test socket 16: Transfer device 2 2 B : Receiving cassette 2 312 : Inserting hole 2 315 : Spring 2 318 : Leading bevel 2 41 · Test housing 2 51 : Positioning groove 2 6 2: slide 2 6 5 first cylinder 2 6 8 : pick-up head part: 11: feed 匣 1 4 : test device 141: solid plate 15: second transfer device part of the invention: 2 0 : Machine 21: Feed 匣 2 2A : Receiver 匣 2 3 : Test set 2 31 : Test set 2 31 1 : Base 2 314 : Upper seat 2 317 : Guide 2 2 2 : Test board 2 4 : Test device 2 5 : Positioning device 2 6 : Transfer device 2 61 : Rack slide 2 6 4 : Upright guide 2 6 7 : Second pressure red 13: First transfer device 14 3 . Crimping mechanism

1 7 : I C 2 2 C : receiving 匣 2 3 1 3 : metal clip 2 316 : sliding piece 2 4 2 : test circuit board 2 6 3 : slippery group 2 6 6 : top press fixture

Claims (1)

Patent application scope: - Memory I c detection classification machine, which includes: supply, S: is set on the machine to hold the memory IC to be tested; Receive, E: is set in the machine On the stage, the memory IC for receiving the test is completed; the test device for the transfer device is set on the machine table, and is provided with a plurality of test sockets, the test socket is a normally closed test socket, and the test sleeve The base comprises a base, an upper seat and a guiding seat. The base is provided with a plurality of insertion holes, and a metal clip for opening and closing is arranged in the insertion hole, and the upper seat is arranged above the base by a spring and a sliding piece. When pressing down, the metal clip of the base can be externally stretched to press the pin of the Ic, and the guiding seat is arranged in the frame of the base and the upper seat to guide the positioning 丨C; the system is arranged on the machine. The utility model has a top pressure fixture and a plurality of pick and place heads for transferring a plurality of memory JCs to be tested/completed at a time between the feeding device, the testing device and the receiving device; and the processor is used for controlling And integrate the various devices to perform automated operations. ·=The memory range described in item i of the patent application is different, such as TM, which is used for the memory of the first item of the month, and the memory type 1 C detection classification and tender test road test set wire loading fiber _ road board The second machine, memory IC positioning.待 枓匣 枓匣 • • f f f f 申请 申请 申请 申请 申请 申请 申请 申请 申请 申请 申请 申请 申请 申请 申请 申请 申请 τ τ τ τ τ τ τ τ τ τ τ τ τ τ τ τ τ τ τ τ τ τ τ τ τ τ Wherein, the moving device, the memory 1 C detecting sorting machine, and a plurality of vertical stands are arranged: a sliding seat is arranged on the sliding rail of the frame, and a top pressing core is mounted on the upper frame of the sliding seat and The upper end of the upright guide is connected to a first pressure cylinder, and the lower end is in accordance with the patent application. The compartment Γ drives the lifting and lowering displacement of the pressing fixture with the first cylinder. In the first aspect, the memory 1 c detection classifier according to the item (10) is attached to the upper frame of the top pressure fixture, and the second pressure cylinder is 逑, ·. The head is taken, and the second pressure cylinder is used to drive the pick-and-place head to move up and down in the top pressure fixture. 13