TWI425224B - Automatic test device - Google Patents
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- TWI425224B TWI425224B TW98125086A TW98125086A TWI425224B TW I425224 B TWI425224 B TW I425224B TW 98125086 A TW98125086 A TW 98125086A TW 98125086 A TW98125086 A TW 98125086A TW I425224 B TWI425224 B TW I425224B
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- 238000012360 testing method Methods 0.000 title claims description 133
- 238000003825 pressing Methods 0.000 claims description 12
- 238000004891 communication Methods 0.000 claims description 4
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 238000000034 method Methods 0.000 description 5
- 230000008569 process Effects 0.000 description 4
- 239000000969 carrier Substances 0.000 description 2
- 239000000835 fiber Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000006855 networking Effects 0.000 description 2
- 229920001342 Bakelite® Polymers 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 239000004637 bakelite Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000010365 information processing Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
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Description
本發明有關於一種自動測試裝置,且特別是有關於一種應用於電路板之自動測試裝置。The present invention relates to an automatic test apparatus, and more particularly to an automatic test apparatus for use in a circuit board.
隨著電子科技的發展,電腦已成為資訊處理的必要配備。主機板是電腦不可或缺的重要組成部分,在主機板生產過程中,需要對其各個元件進行測試以確定其功能是否正常。With the development of electronic technology, computers have become a necessary equipment for information processing. The motherboard is an indispensable part of the computer. During the production process of the motherboard, each component needs to be tested to determine whether its function is normal.
以網路卡的測試為例,主機板上的網路卡主要為電腦之間的數據通訊提供物理連接。對於網路卡的測試,通常需要架設一台或者幾台測試伺服器作為測試平台。作業員用手插附網線以進行聯網,在網路中通過傳輸資料檔案等一系列方式進行測試。Taking the network card test as an example, the network card on the motherboard mainly provides a physical connection for data communication between computers. For network card testing, it is usually necessary to set up one or several test servers as test platforms. The operator inserts the network cable by hand to connect to the network, and tests it in a series of ways such as transmitting data files in the network.
上述做法需要耗費較多時間進行聯網,測試成本高,無法同時測試多個網路卡,而且由於實際聯網可能出現的人工錯誤會導致測試的結果不準確。The above method requires a lot of time for networking, the test cost is high, and multiple network cards cannot be tested at the same time, and the artificial error that may occur due to actual networking may result in inaccurate test results.
本發明的目的在於提供一種自動測試裝置,以改善現有技術的缺失。It is an object of the present invention to provide an automated test apparatus to improve the deficiencies of the prior art.
根據本發明之一特色,提出一種自動測試裝置,用以測試多個電路板。自動測試裝置包括控制單元、夾取件以及測試單元。夾取件耦接控制單元。控制單元控制夾取件將這些電路板中位於輸出位置之至少一電路板夾取至測試位置。測試單元耦接控制單元。測試單元用以測試位於測試位置的電路板,並提供測試信號至控制單元。控制單元根據測試信號控制夾取件夾取電路板至多個不同預設位置的其中之一。According to a feature of the present invention, an automatic test apparatus is proposed for testing a plurality of circuit boards. The automatic test device includes a control unit, a gripping member, and a test unit. The clamping member is coupled to the control unit. The control unit controls the gripping member to clamp at least one of the circuit boards at the output position to the test position. The test unit is coupled to the control unit. The test unit is used to test the board at the test location and provide test signals to the control unit. The control unit controls the gripper to grip the circuit board to one of a plurality of different preset positions according to the test signal.
本發明有益效果為,利用本發明之自動測試裝置可實現電路板測試過程自動化。自動測試裝置之控制單元控制夾取件將位於輸出位置之電路板夾取至測試位置。藉由測試單元完成對電路板的測試後,控制單元依據測試信號控制夾取件將電路板夾取至不同的預設位置。整個測試過程可自動完成,解放了人力,並提高了生產效率。The invention has the beneficial effects that the automatic testing device of the invention can realize the automation of the circuit board testing process. The control unit of the automatic test device controls the gripping member to clamp the board located at the output position to the test position. After the testing of the circuit board is completed by the test unit, the control unit controls the clamping member to clamp the circuit board to different preset positions according to the test signal. The entire testing process is automated, freeing up manpower and increasing productivity.
為讓本發明的上述和其他目的、特徵和優點能更明顯易懂,下文特舉較佳實施例,並配合附圖,作詳細說明如下。The above and other objects, features, and advantages of the present invention will become more apparent and understood by the appended claims appended claims
圖1繪示為根據本發明一較佳實施例的自動測試裝置的結構示意圖。圖2繪示為根據本發明一較佳實施例的自動測試裝置的電路板提供單元之局部示意圖。圖3繪示為根據本發明一較佳實施例的自動測試裝置的夾取件之局部示意圖。圖4繪示為根據本發明一較佳實施例的自動測試裝置的測試單元之局部示意圖。請一併參照圖1~圖4。FIG. 1 is a schematic structural view of an automatic test apparatus according to a preferred embodiment of the present invention. 2 is a partial schematic view of a circuit board providing unit of an automatic test apparatus according to a preferred embodiment of the present invention. 3 is a partial schematic view of a gripping member of an automatic testing device in accordance with a preferred embodiment of the present invention. 4 is a partial schematic view of a test unit of an automatic test apparatus in accordance with a preferred embodiment of the present invention. Please refer to FIG. 1 to FIG. 4 together.
本實施例所提供的自動測試裝置1用以測試多個電路板2(見圖4)。於本實施例中,電路板2具體可為一網路卡,於其他實施例中,電路板2也可為其他類型之電路板,本發明對此並不作出限制。The automatic test apparatus 1 provided in this embodiment is used to test a plurality of circuit boards 2 (see FIG. 4). In the embodiment, the circuit board 2 can be a network card. In other embodiments, the circuit board 2 can also be other types of circuit boards, which is not limited by the present invention.
於本實施例中,自動測試裝置1包括電路板提供單元10、第一感應單元11、控制單元12、夾取件13、承載件14、第二感應單元15、測試單元16、電路板輸出單元17以及指示單元18。In this embodiment, the automatic testing device 1 includes a circuit board providing unit 10, a first sensing unit 11, a control unit 12, a clamping member 13, a carrier 14, a second sensing unit 15, a testing unit 16, and a circuit board output unit. 17 and the indicating unit 18.
於本實施例中,電路板提供單元10用以提供待測試之電路板。如圖2所示,電路板提供單元10包括殼體100、容置件102、第一驅動件103以及推進件104。其中,殼體100具有多個表面1000,於本實施例中,該些表面1000呈矩形,本發明並不對此作出限制。In this embodiment, the circuit board providing unit 10 is configured to provide a circuit board to be tested. As shown in FIG. 2, the circuit board providing unit 10 includes a housing 100, a receiving member 102, a first driving member 103, and a pushing member 104. The housing 100 has a plurality of surfaces 1000. In the present embodiment, the surfaces 1000 are rectangular, and the invention is not limited thereto.
於本實施例中,容置件102可具有多個容置格1020,用以容置待測試之電路板。如圖2中細部放大圖所示,這些容置格1020呈上下等距排列。於本實施例中,容置件102的材質為電木,並且相鄰兩個容置格1020之間存在電木隔板。然而,本發明對容置格1020的數目與排列方式不作任何限定。In this embodiment, the accommodating member 102 can have a plurality of accommodating cells 1020 for accommodating the circuit board to be tested. As shown in the enlarged detail in FIG. 2, these receptacles 1020 are arranged equidistantly. In this embodiment, the material of the accommodating member 102 is bakelite, and there is an electric baffle between the two adjacent accommodating cells 1020. However, the present invention does not limit the number and arrangement of the accommodating cells 1020.
於本實施例中,殼體100形成一半開放空間。首先作業員可將裝滿電路板之容置件102推入此半開放空間,且放置於第一驅動件103上。藉此,可利用第一驅動件103來驅動容置件102運動,例如,可驅動容置件102向上運動,以使其中的電路板依次通過一輸出位置101。於本實施例中,兩塊並列之電路板可以同時通過此輸出位置101。然而,本發明對此不作任何限定。In the present embodiment, the housing 100 forms a half open space. First, the operator can push the housing 102 filled with the circuit board into the semi-open space and place it on the first driving member 103. Thereby, the first driving member 103 can be used to drive the movement of the accommodating member 102, for example, the accommodating member 102 can be moved upward to sequentially pass the circuit board therein through an output position 101. In this embodiment, two parallel circuit boards can pass through the output position 101 at the same time. However, the present invention is not limited thereto.
於本實施例中,輸出位置101可位於殼體100的表面1000。具體而言,在殼體100其中的一個表面1000上可具有一矩形開口。此矩形開口即可作為本實施例中的輸出位置101。然而,本發明對此不作任何限定。於其它實施例中,亦可不設置此殼體100,而將輸出位置101設置於任意位置,只要確保電路板提供單元10中的電路板可依次通過此輸出位置即可。In the present embodiment, the output location 101 can be located on the surface 1000 of the housing 100. In particular, one of the surfaces 1000 of the housing 100 can have a rectangular opening. This rectangular opening can be used as the output position 101 in this embodiment. However, the present invention is not limited thereto. In other embodiments, the housing 100 may not be provided, and the output position 101 may be disposed at any position as long as the circuit board in the circuit board providing unit 10 can be sequentially passed through the output position.
於本實施例中,當電路板位於輸出位置101時,藉由推進件104作用於電路板,使得電路板脫離容置件102以暴露於殼體100之外,方便夾取件13(見圖3)夾取。待夾取件13夾取電路板後,第一驅動件103可繼續向上移動容置件102,使得下一列的兩個電路板進入此輸出位置101。然而,本發明對此不作任何限定。In this embodiment, when the circuit board is located at the output position 101, the pusher 104 acts on the circuit board, so that the circuit board is detached from the accommodating member 102 to be exposed outside the housing 100, and the clip member 13 is conveniently arranged (see FIG. 3) Clipping. After the clamping member 13 grips the circuit board, the first driving member 103 can continue to move the receiving member 102 upward, so that the two circuit boards of the next column enter the output position 101. However, the present invention is not limited thereto.
如圖2所示,第一感應單元11設置於輸出位置101,用以感應電路板並輸出第一感應信號。具體來說,第一感應單元11可以為光纖感應器。當電路板提供單元10提供的電路板通過輸出位置101時,第一感應單元11感應電路板的存在,並發出第一感應信號。As shown in FIG. 2, the first sensing unit 11 is disposed at the output position 101 for sensing the circuit board and outputting the first sensing signal. Specifically, the first sensing unit 11 can be a fiber optic sensor. When the circuit board provided by the circuit board providing unit 10 passes through the output position 101, the first sensing unit 11 senses the presence of the circuit board and emits a first sensing signal.
於本實施例中,控制單元12接收第一感應信號,並根據第一感應信號控制夾取件13之運動。In this embodiment, the control unit 12 receives the first sensing signal and controls the movement of the clamping member 13 according to the first sensing signal.
如圖1所示,於本實施例中,控制單元12具體可包括主機(圖未示)、顯示器120、鍵盤121以及滑鼠122。其中,顯示器120可顯示自動測試裝置1之工作狀態。作業員藉由鍵盤121與滑鼠122對控制單元12進行操作。特別的,鍵盤121可設計為旋轉地樞接於工作台123。當不需要使用鍵盤121時,可將鍵盤121扣合於工作台123,有利於節省空間。As shown in FIG. 1 , in the embodiment, the control unit 12 may specifically include a host (not shown), a display 120 , a keyboard 121 , and a mouse 122 . The display 120 can display the working state of the automatic testing device 1. The operator operates the control unit 12 via the keyboard 121 and the mouse 122. In particular, the keyboard 121 can be designed to be pivotally pivoted to the table 123. When the keyboard 121 is not required to be used, the keyboard 121 can be fastened to the work table 123, which is advantageous for saving space.
於本實施例中,夾取件13具體可為機械手,藉由控制單元12控制以完成對電路板之夾取動作。如圖3所示,夾取件13設置於Y軌道130,並可沿該軌道進行Y方向移動。Y軌道130之中部具有滑動部132,透過滑動部132使得Y軌道130沿X軌道131滑動,以完成夾取件13於X方向之移動。另外,夾取件13還可沿圖3所示之Z方向移動。In this embodiment, the gripping member 13 is specifically a robot, and is controlled by the control unit 12 to complete the clamping action on the circuit board. As shown in FIG. 3, the gripping member 13 is disposed on the Y rail 130 and is movable in the Y direction along the rail. The middle portion of the Y rail 130 has a sliding portion 132 through which the Y rail 130 is slid along the X rail 131 to complete the movement of the gripping member 13 in the X direction. In addition, the gripping member 13 is also movable in the Z direction shown in FIG.
於本實施例中,為了提高測試效率,自動測試裝置1包括多個承載件14與多個測試單元16,並且每一個承載件14對應一個測試單元16,然而本發明並不對此作出限制。In the present embodiment, in order to improve the test efficiency, the automatic test apparatus 1 includes a plurality of carriers 14 and a plurality of test units 16, and each of the carriers 14 corresponds to one test unit 16, but the invention is not limited thereto.
如圖1所示,承載件14具有測試位置。第二感應單元15設置於該測試位置,用以感應電路板並輸出第二感應信號至控制單元12。於本實施例中,第二感應單元15可為光纖感應器。然而,本發明對此並不作出限制。As shown in Figure 1, the carrier 14 has a test position. The second sensing unit 15 is disposed at the test position for sensing the circuit board and outputting the second sensing signal to the control unit 12. In this embodiment, the second sensing unit 15 can be a fiber optic sensor. However, the invention is not limited thereto.
具體來說,控制單元12根據第一感應信號控制夾取件13將位於輸出位置之電路板夾取至測試位置,此時第二感應單元15感應該電路板並輸出第二感應信號至控制單元12。控制單元12根據第二感應信號控制測試單元16連接至電路板以進行測試。Specifically, the control unit 12 controls the clamping member 13 to clamp the circuit board located at the output position to the test position according to the first sensing signal. At this time, the second sensing unit 15 senses the circuit board and outputs the second sensing signal to the control unit. 12. The control unit 12 controls the test unit 16 to be connected to the circuit board for testing according to the second sensing signal.
如圖4所示,本實施例所提供之測試單元16設置於承載件14,用以測試電路板2並提供測試信號。如圖4所示,承載件14具有固定部140,用以固定電路板2。As shown in FIG. 4, the test unit 16 provided in this embodiment is disposed on the carrier 14 for testing the circuit board 2 and providing a test signal. As shown in FIG. 4, the carrier 14 has a fixing portion 140 for fixing the circuit board 2.
於本實施例中,每個測試單元16可以同時測試兩塊電路板2。承載件14上具有八個固定部140,其中每四個固定部140用於固定一塊電路板2。然而,本發明對電路板測試數量以及固定部個數並不作出限制。In this embodiment, each test unit 16 can test two circuit boards 2 at the same time. The carrier 14 has eight fixing portions 140 thereon, wherein each of the four fixing portions 140 is for fixing a circuit board 2. However, the present invention does not limit the number of board tests and the number of fixed parts.
於本實施例中,測試單元16包括下壓件160、第二驅動件161以及控制件162。電路板2包括第一連接器20與第三連接器21。In the present embodiment, the test unit 16 includes a lower pressing member 160, a second driving member 161, and a control member 162. The circuit board 2 includes a first connector 20 and a third connector 21.
於本實施例中,下壓件160耦接控制單元12與第二驅動件161,並藉由第二驅動件161驅動而完成下壓動作。於本實施例中,第二驅動件161可為氣缸,於其他實施例中,第二驅動件可以為其它等效之動力裝置。In the embodiment, the pressing member 160 is coupled to the control unit 12 and the second driving member 161, and is driven by the second driving member 161 to complete the pressing operation. In this embodiment, the second driving member 161 can be a cylinder. In other embodiments, the second driving member can be other equivalent power devices.
於本實施例中,下壓件160包括緩衝件1600、第二連接器1601以及第四連接器1602。其中,第二連接器1601耦接控制件162。於本實施例中,控制件162為存儲有測試程式之主機,其可耦接至控制單元12。In the present embodiment, the pressing member 160 includes a buffer member 1600, a second connector 1601, and a fourth connector 1602. The second connector 1601 is coupled to the control member 162. In this embodiment, the control unit 162 is a host that stores a test program, which can be coupled to the control unit 12.
具體來說,控制單元12控制夾取件13沿Z方向移動,以將電路板2放置於承載件14之固定部140上。此時,待測試之電路板2即位於測試位置。第二感應單元15輸出第二感應信號至控制單元12。控制單元12在接收到此第二感應信號後,即控制第二驅動件161作動。Specifically, the control unit 12 controls the gripping member 13 to move in the Z direction to place the circuit board 2 on the fixing portion 140 of the carrier 14. At this time, the circuit board 2 to be tested is located at the test position. The second sensing unit 15 outputs a second sensing signal to the control unit 12. After receiving the second sensing signal, the control unit 12 controls the second driving member 161 to operate.
於本實施例中,第二驅動件161首先驅動緩衝件1600下壓。由於電路板2上具有與固定部140相對應之固定孔,緩衝件1600下壓將電路板2固定於固定部140。In the embodiment, the second driving member 161 first drives the buffer member 1600 to be pressed down. Since the circuit board 2 has a fixing hole corresponding to the fixing portion 140, the buffer member 1600 is pressed down to fix the circuit board 2 to the fixing portion 140.
待緩衝件1600將電路板2固定後,第二驅動件161驅動下壓件160下壓,使得第二連接器1601連接至電路板2之第一連接器20。藉此,電路板2與控制件162電性連接,使得控制件162對電路板2執行測試程式。After the buffer member 1600 fixes the circuit board 2, the second driving member 161 drives the lower pressing member 160 to be pressed, so that the second connector 1601 is connected to the first connector 20 of the circuit board 2. Thereby, the circuit board 2 is electrically connected to the control member 162, so that the control member 162 performs a test program on the circuit board 2.
當第二驅動件161驅動下壓件160下壓時,第四連接器1602亦連接至電路板2之第三連接器21。藉此,兩塊電路板2透過下壓件160實現相互通信。When the second driving member 161 drives the lower pressing member 160 to be pressed down, the fourth connector 1602 is also connected to the third connector 21 of the circuit board 2. Thereby, the two circuit boards 2 communicate with each other through the lower pressing member 160.
於本實施例中,經由測試單元16電性連接這兩個電路板2,測試單元16是通過測試兩個待測電路板2之間的通信狀況來輸出測試信號。然而,本發明對此不作任何限制。於其它實施例中,亦可通過測試一待測電路板與其它已通過測試之電路板之間的通信狀況來輸出測試信號。In the present embodiment, the two circuit boards 2 are electrically connected via the test unit 16, and the test unit 16 outputs a test signal by testing the communication condition between the two circuit boards 2 to be tested. However, the present invention does not impose any limitation on this. In other embodiments, the test signal can also be output by testing the communication condition between a circuit board to be tested and other boards that have passed the test.
於本實施例中,待完成對電路板的測試後,測試單元16提供測試信號至控制單元12。控制單元12根據測試信號控制夾取件13夾取已完成測試之電路板至不同的預設位置。In the present embodiment, after the test of the circuit board is completed, the test unit 16 provides a test signal to the control unit 12. The control unit 12 controls the gripping member 13 to grip the circuit board that has been tested to a different preset position according to the test signal.
於本實施例中,這些預設位置包括第一預設位置190與第二預設位置191。其中,第一預設位置190用以放置測試通過之電路板,第二預設位置191用以放置測試未通過之電路板。於本實施例中,第二預設位置191處可設置有皮帶等輸出裝置,直接輸出測試未通過之電路板。In the embodiment, the preset positions include a first preset position 190 and a second preset position 191. The first preset position 190 is used to place a circuit board through which the test passes, and the second preset position 191 is used to place a circuit board that fails the test. In this embodiment, an output device such as a belt may be disposed at the second preset position 191 to directly output a circuit board that fails the test.
具體來說,若電路板通過測試,測試單元16可提供 一高準位測試信號至控制單元12。藉此,控制單元12依據此高準位測試信號控制夾取件13夾取電路板至第一預設位置190。若電路板未通過測試,測試單元16輸出一低準位測試信號,夾取件13夾取電路板至第二預設位置191。Specifically, if the board passes the test, the test unit 16 can provide A high level test signal is sent to control unit 12. Thereby, the control unit 12 controls the gripping member 13 to grip the circuit board to the first preset position 190 according to the high level test signal. If the circuit board fails the test, the test unit 16 outputs a low level test signal, and the chucking member 13 grips the circuit board to the second preset position 191.
如圖2所示,電路板輸出單元17設置於第一預設位置190,用以輸出測試通過之電路板。於本實施例中,電路板輸出單元17包括排列件170、第三驅動件171、抓取件172以及滑軌173。As shown in FIG. 2, the circuit board output unit 17 is disposed at a first preset position 190 for outputting a circuit board through which the test passes. In the present embodiment, the circuit board output unit 17 includes an arrangement member 170, a third driving member 171, a gripping member 172, and a slide rail 173.
於本實施例中,排列件170具有複數個容置格(圖未示),每一個容置格可容置一塊電路板。若控制單元12控制夾取件13將測試通過之電路板夾取至排列件170之容置格後,第三驅動件171驅動排列件170下降一容置格距離,以暴露出空的容置格。於本實施例中,第三驅動件171可為氣缸,於其他實施例中,第三驅動件171也可以為其它等效之驅動裝置。In this embodiment, the arranging member 170 has a plurality of accommodating cells (not shown), and each of the accommodating cells can accommodate a circuit board. If the control unit 12 controls the gripping member 13 to clamp the board through which the test passes to the accommodating compartment 170, the third driving member 171 drives the arranging member 170 to drop by a accommodating distance to expose the empty accommodating member. grid. In this embodiment, the third driving member 171 can be a cylinder. In other embodiments, the third driving member 171 can also be other equivalent driving devices.
於本實施例中,待排列件170之容置格全部容置有電路板後,藉由抓取件172將排列件170輸出。於本實施例中,抓取件172可沿滑軌173移動。In this embodiment, after the accommodating cells of the to-be-arranged member 170 are all housed with the circuit board, the aligning member 170 is outputted by the grasping member 172. In the present embodiment, the gripping member 172 is movable along the slide rail 173.
於本實施例中,指示單元18設置於測試單元16,用於指示自動測試裝置1之工作狀態。於本實施例中,指示單元18為可顯示多種顏色之LED燈管。例如,當自動測試裝置1正常工作時,指示單元18顯示綠色。當自動測試裝置1當機時,指示單元18顯示紅色以警示作業員出現故障。In the embodiment, the indicating unit 18 is disposed in the testing unit 16 for indicating the working state of the automatic testing device 1. In this embodiment, the indicating unit 18 is an LED tube that can display multiple colors. For example, when the automatic test apparatus 1 is operating normally, the indication unit 18 displays green. When the automatic test device 1 is down, the indication unit 18 displays red to alert the operator that a malfunction has occurred.
綜上所述,本實施例所提供的自動測試裝置可實現電路板測試過程自動化之目的。作業員只需將待測試之電路板放入相應的容置件中,整個測試過程即可自動化完成。多個測試單元實現批量電路板同時進行測試過程的操作,解放了人力,並提高了生產效率。In summary, the automatic test device provided in this embodiment can achieve the purpose of automating the test process of the circuit board. The operator only needs to put the circuit board to be tested into the corresponding housing, and the entire test process can be automated. Multiple test units enable batch circuit boards to perform simultaneous test operations, freeing up manpower and increasing production efficiency.
雖然本發明已以較佳實施例揭露如上,然其並非用以限定本發明,任何所屬技術領域中具有通常知識者,在不脫離本發明的精神和範圍內,當可作些許的更動與潤飾,因此本發明的保護範圍當視申請專利範圍所界定者為準。Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the present invention, and those skilled in the art can make some modifications and refinements without departing from the spirit and scope of the invention. Therefore, the scope of protection of the present invention is subject to the definition of the scope of the patent application.
1...自動測試裝置1. . . Automatic test device
10...電路板提供單元10. . . Board supply unit
100...殼體100. . . case
1000...表面1000. . . surface
101...輸出位置101. . . Output position
102...容置件102. . . Container
1020...容置格1020. . .容格
103...第一驅動件103. . . First drive
104...推進件104. . . Propulsion
11...第一感應單元11. . . First sensing unit
12...控制單元12. . . control unit
120...顯示器120. . . monitor
121...鍵盤121. . . keyboard
122...滑鼠122. . . mouse
123...工作台123. . . Workbench
13...夾取件13. . . Clamping piece
130...Y軌道130. . . Y track
131...X軌道131. . . X track
132...滑動部132. . . Sliding portion
14...承載件14. . . Carrier
140...固定部140. . . Fixed part
15...第二感應單元15. . . Second sensing unit
16...測試單元16. . . Test unit
160...下壓件160. . . Lower pressing piece
1600...緩衝件1600. . . Buffer
1601...第二連接器1601. . . Second connector
1602...第四連接器1602. . . Fourth connector
161...第二驅動件161. . . Second drive
162...控制件162. . . Control
17...電路板輸出單元17. . . Board output unit
170...排列件170. . . Arrangement
171...第三驅動件171. . . Third drive
172...抓取件172. . . Grab
173...滑軌173. . . Slide rail
18...指示單元18. . . Indicating unit
190...第一預設位置190. . . First preset position
191...第二預設位置191. . . Second preset position
2...電路板2. . . Circuit board
20...第一連接器20. . . First connector
21...第三連接器twenty one. . . Third connector
圖1繪示為根據本發明一較佳實施例的自動測試裝置的結構示意圖。FIG. 1 is a schematic structural view of an automatic test apparatus according to a preferred embodiment of the present invention.
圖2繪示為根據本發明一較佳實施例的自動測試裝置的電路板提供單元之局部示意圖。2 is a partial schematic view of a circuit board providing unit of an automatic test apparatus according to a preferred embodiment of the present invention.
圖3繪示為根據本發明一較佳實施例的自動測試裝置的夾取件之局部示意圖。3 is a partial schematic view of a gripping member of an automatic testing device in accordance with a preferred embodiment of the present invention.
圖4繪示為根據本發明一較佳實施例的自動測試裝置的測試單元之局部示意圖。4 is a partial schematic view of a test unit of an automatic test apparatus in accordance with a preferred embodiment of the present invention.
1...自動測試裝置1. . . Automatic test device
12...控制單元12. . . control unit
120...顯示器120. . . monitor
121...鍵盤121. . . keyboard
122...滑鼠122. . . mouse
123...工作台123. . . Workbench
14...承載件14. . . Carrier
15...第二感應單元15. . . Second sensing unit
16...測試單元16. . . Test unit
18...指示單元18. . . Indicating unit
191...第二預設位置191. . . Second preset position
Claims (12)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2009101647770A CN101963648A (en) | 2009-07-24 | 2009-07-24 | Automatic testing device |
| TW98125086A TWI425224B (en) | 2009-07-24 | 2009-07-24 | Automatic test device |
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| Application Number | Priority Date | Filing Date | Title |
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| TW98125086A TWI425224B (en) | 2009-07-24 | 2009-07-24 | Automatic test device |
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| TW201104695A TW201104695A (en) | 2011-02-01 |
| TWI425224B true TWI425224B (en) | 2014-02-01 |
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| Application Number | Title | Priority Date | Filing Date |
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| TW98125086A TWI425224B (en) | 2009-07-24 | 2009-07-24 | Automatic test device |
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| CN (1) | CN101963648A (en) |
| TW (1) | TWI425224B (en) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102830343B (en) * | 2012-09-06 | 2015-07-29 | 苏州工业园区世纪福科技有限公司 | A kind of circuit board testing system |
| CN103522265B (en) * | 2013-09-26 | 2015-07-22 | 新天科技股份有限公司 | Wireless module automatic detection table |
| CN104597388B (en) * | 2013-10-31 | 2017-06-06 | 纬创资通股份有限公司 | Automated inspection system for inspecting motherboards |
| CN104133127B (en) * | 2014-07-07 | 2017-12-05 | 珠海市运泰利自动化设备有限公司 | Multi-functional linkage test equipment |
| CN104133128B (en) * | 2014-07-07 | 2017-08-08 | 珠海市运泰利自动化设备有限公司 | Mini quick multifunctional linkage test equipment |
| CN104614666B (en) * | 2015-02-05 | 2017-07-07 | 深圳创维-Rgb电子有限公司 | Automatic tester for circuitboard |
| CN105785258B (en) * | 2016-04-25 | 2018-12-28 | 罗仙凤 | A kind of automatic detection device of PCBA board |
| CN108318752A (en) * | 2017-01-16 | 2018-07-24 | 研华股份有限公司 | Detection system |
| CN109542068B (en) * | 2018-12-10 | 2022-04-19 | 武汉中原电子集团有限公司 | High-temperature electrified aging and control system |
| CN110906980B (en) * | 2019-11-14 | 2021-10-08 | 深圳市华星光电半导体显示技术有限公司 | Detection system and detection method |
| CN115878393B (en) * | 2022-01-20 | 2023-09-12 | 北京沃华慧通测控技术有限公司 | Test system and test method |
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| US6437557B1 (en) * | 2000-01-19 | 2002-08-20 | Dell Usa, L.P. | PC card clamping device for automated test fixture |
| US6760680B2 (en) * | 2002-10-09 | 2004-07-06 | Nyt Press Services Llc | Testing system for printing press circuit board controllers |
| US6882156B2 (en) * | 2002-02-14 | 2005-04-19 | Teradyne, Inc. | Printed circuit board assembly for automatic test equipment |
| TWI308963B (en) * | 2006-09-05 | 2009-04-21 | Inventec Appliances Corp |
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- 2009-07-24 CN CN2009101647770A patent/CN101963648A/en active Pending
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US6437557B1 (en) * | 2000-01-19 | 2002-08-20 | Dell Usa, L.P. | PC card clamping device for automated test fixture |
| US6882156B2 (en) * | 2002-02-14 | 2005-04-19 | Teradyne, Inc. | Printed circuit board assembly for automatic test equipment |
| US6760680B2 (en) * | 2002-10-09 | 2004-07-06 | Nyt Press Services Llc | Testing system for printing press circuit board controllers |
| TWI308963B (en) * | 2006-09-05 | 2009-04-21 | Inventec Appliances Corp |
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| CN101963648A (en) | 2011-02-02 |
| TW201104695A (en) | 2011-02-01 |
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