TW200919625A - A substrate-holding apparatus and release method thereof - Google Patents
A substrate-holding apparatus and release method thereof Download PDFInfo
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- TW200919625A TW200919625A TW097134006A TW97134006A TW200919625A TW 200919625 A TW200919625 A TW 200919625A TW 097134006 A TW097134006 A TW 097134006A TW 97134006 A TW97134006 A TW 97134006A TW 200919625 A TW200919625 A TW 200919625A
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/6838—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping with gripping and holding devices using a vacuum; Bernoulli devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68742—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by a lifting arrangement, e.g. lift pins
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
- H01L21/68714—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support
- H01L21/68785—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a susceptor, stage or support characterised by the mechanical construction of the susceptor, stage or support
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Cleaning In General (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Description
200919625 九、發明說明: 【發明所屬之技術領域】 本發明係有關玻璃基板等之基板的曝光、顯像等的處 理,或進行基板表面之圖案的尺寸量測及性能檢查等處理 之用於基板處理裝置之基板保持裝置及將處理後之基板解 放的方法。 【先前技術】 在上述之基板處理裝置,係將搬入機台裝載之基板眞空 吸附保持,當既定的處理結束之後解除眞空吸附並將處理 完畢之基板,從機台解放而搬出,但由於帶電基板強烈地 被吸附在機台上,在此狀態下勉強將基板取出時在基板上 會發生破損之虞。因此,在機台表面上施以防止帶電的處 理,或如專利文獻1所揭示,採取從電離裝置噴吹離子化 氣體而將靜電去除等的手段。 專利文獻1:日本專利特開2003 - 100821號公報 【發明內容】 [發明所欲解決之課題] 然而’前者在機台表面上施以防止帶電之處理的手段, 最初雖可發揮所期望之防止帶電的機能,但隨著進行反覆 處理其帶電量逐漸地增加而無法發揮所欲的機能,產生有 需要再度施以防止帶電處理,因此在其間強行使基板處理 停止。 又’後者之從電離裝置噴吹離子化氣體而去除靜電的手 段’因爲係從上方對裝載於機台之基板噴吹離子化的氣 is ’所以對機台與基板之接觸面的靜電無法充分地進行去 200919625 除。 本發明係鑒於這些問題而創作者,目的係提供一種對機 台與基板之接觸面的靜電可充分去除之基板保持裝置及基 板解放方法。 [用以解決課題之手段] (1) 本發明之基板保持裝置,係具備裝載基板的機台, 而在該機台的表面側設置有噴出口,其可將來自電離裝置 之離子化氣體對基板的背面噴吹以去除靜電。 機台,係可移動,或亦可被固定。 電離裝置,係可與機台設置成一體,亦可與機台分別設 置。 噴出口,係可形成於機台自身,亦可將形成噴出口之配 管等設置於機台者。 根據本發明之基板保持裝置時,將基板的背面與機台 之接觸面的帶電電荷透過從機台表面側的噴出口噴出之 離子化的空氣而中和確實地可去除靜電,藉此,將處理 完畢的基板,不會產生靜電破壞等,可從機台圓滑地剝 離而搬出。 (2) 在本發明之基板保持裝置的一個實施形態,係於 該機台的表面上,具備吸附保持該基板的吸附溝。 根據此實施形態時,將裝載於機台的基板藉由吸附溝吸 附,而可穩定地保持。 (3) 在本發明之基板保持裝置之較佳實施形態,係於 該機台之表面所形成的溝,埋設連通該電離裝置之連接 配管,而在此配管上形成該噴出口。 200919625 根據此實施形態時,可將來自電離裝置之離子化氣體藉 由配管有效率地對基板的背面噴吹以去除靜電。 (4) 在上述(3)之實施形態,亦可將該電離裝置分別連通 該配管的兩端而連接。 根據此實施形態時,由於從配管的兩端供應離子化氣 體,所以即使配管長也可將離子化氣體均勻地從噴出口噴 出,而可將基板之背面的靜電去除均勻且確實地執行。 (5) 在本發明之基板保持裝置之其他實施形態,係將該 基板從該機台舉起用的複數個升降銷以可進退自如地配置 在該機台上。 根據此實施形態時,透過噴吹離子化氣體以去除靜電之 後,由於使退到待機之升降銷突出到機台上,所以可毫無 阻力地將基板舉起,而圓滑地搬出。在此種情況下,由於 以適度的壓力從噴出口噴吹離子化氣體,而更可圓滑地將 基板舉起。 (6) 本發明之基板解放方法,係包含從設置在裝載基板 之機台面上的噴出口吹出離子化氣體,並對該基板的背面 噴吹以進行靜電去除之步驟;及,將該基板從機台卸掉之 步驟。 根據本發明之基板解放方法時,將基板的背面與機台之 接觸面的帶電電荷,透過從機台之噴出口噴出之離子化氣 體中和而可確實地去除靜電,據此,將處理完畢之基板, 不會發生靜電破壞,而可從機台圓滑地剝離而解放。 [發明效果] ®據本發明時,可充分地進行機台與基板之接觸面的靜 200919625 電去除,並將處理完畢的基板,不會發生靜電破壞等,而 可圓滑地從機台剝離解放。 【實施方式】 [發明之最佳實施形態] 以下,依據圖式詳細說明有關本發明之實施形態。 第1圖至第3圖係顯示,從上方以照相機等拍攝玻璃基 板等的基板w,然後將在基板表面所形成之圖案的尺寸等 經畫像處理而檢査之基板檢查裝置的基板保持裝置1。 此基板保持裝置1,係將基板w以水平姿勢裝載保持者, 具備有鋁材料等形成矩形並可在水平方向移動的機台2。 在機台2之上面(表面)的基板裝載區域內,形成內外 2條之矩形環狀的吸附溝3,適當部位之吸附口連接於未圖 示之眞空裝置使其連通。 又,在機台2之上面的基板裝載區域內,複數條(在 本例爲6條)的溝4被平行地形成。在各溝4中,埋設 有配管5,同時如第2圖所示,各配管5的兩端貫通延 伸到機台下方,其延伸端連接於分別設置在機台2之左 右的電離裝置6使其連通。 該配管5係如第4圖所示,利用由不銹鋼或乙烯基等 所形成的圓形管,而在其上面,則如第1圖及第2圖所 示,噴出口 7瀕臨該溝4之開口側的方式,沿著配管長 度方向被形成於複數個部位。 該電離裝置6’係建構成橫長條棒狀,該配管5之下 方延伸出之端連接並列形成於其側面之離子化氣體的噴 出口 8使其連通’在此例,於電離裝置6產生的離子化 200919625 氣體’係將離子化空氣從噴出口 8供應到配管5,而在 機台2上面從複數個噴出口 7噴出的方式。 再者,升降銷9以可進退自如地被分散配置在機台2 之基板裝載區域內的複數個部位。各升降銷9係被連結 在機台2下方未圖示的驅動升降機構,全部升降銷9以 可滑動驅動的方式形成跨越從機台上面沒入之縮回位置 及從機台上面突出的作用位置。 基板保持裝置1如以上所構成,當量測處理基板w之 圖案的尺寸等時,將被搬入之基板w定位裝載於機台2, 操作眞空裝置控制吸附溝3作用於既定的負壓,使裝載 之基板w被眞空吸附保持在既定的位置。此時,升降銷 9退到縮回位置,同時停止從電離裝置6供應離子化空 氣。 基板w之處理結束時,解除在吸附溝3的眞空吸附而 回到大氣壓,同時開始從電離裝置6供應離子化空氣, 而從配管5之噴出口 7對基板w的背面噴吹供應離子化 空氣,在機台2與基板w之接觸面的帶電電荷透過離子 化空氣而被中和(去除靜電)。 其後,由於全部升降銷9被突出到作用位置而使基板 w被舉起浮上機台上,此時所產生之靜電也藉由離子化 空氣而去除。 被舉起之處理完畢的基板w,透過未圖示之卸載機等 而搬出。 (其他實施形態) (1)如第5圖所示,亦可將離子化氣體的噴出口 7,沿著 200919625 圓形之配管5的圓周方向形成複數個,例如爲2個部位。 (2) 如第6圖所示,亦可將供應離子化氣體的配管5形 成四方形管,而具備有噴出口 7的上面,大致形成與機 台上面同一面般地埋設在溝4而實施。 (3) 如第7圖所示,亦可將由四方形管所形成的配管5 , 從機台上面大大地沒入之方式設置而實施。據此,從噴 出口 7噴出之離子化氣體,在形成於溝4上部之長空隙 c擴散流動而均勻地噴出。 f (4)亦可由於將該吸附溝3及配管5設置成同心圓狀之 方式,使容易適應圓形的基板w。 [產業上之利用可能性] 本發明係對基板執行處理之基板處理裝置的基板之保 持有用。 【圖式簡單說明】 第1圖係基板保持裝置的俯視圖。 第2圖係基板保持裝置的縱斷側視圖。 第3圖係基板保持裝置的立體圖。 .i; 第4圖係離子化氣體抽出部的縱截面圖。 第5圖係使用其他實施形態之配管的離子化氣體抽出部 的縱截面圖。 第6圖係使用再其他實施形態之配管的離子化氣體抽出 部的縱截面圖。 第7圖係使用其他實施形態之配管的離子化氣體抽出部 的縱截面圖。 -10- 200919625 【主要元件符號說明 2 機台 3 吸附溝 4 溝 5 配管 6 電離裝置 7 噴出口 9 升降銷 W 基板
Claims (1)
- 200919625 十、申請專利範圍: 1. 一種基板保持裝置’其特徵在於:具備裝載基板的機台, 在該機台的表面側設置有噴出口,其可將來自電離裝置 之離子化的氣體對基板的背面噴吹以去除靜電。 2. 如申請專利範圍第丨項之基板保持裝置,其中,在該機 台的表面’具備有吸附保持該基板的吸附溝。 3 ·如申§靑專利範圍第1項之基板保持裝置,其中,於該機 台之表面所形成的溝,埋設連通該電離裝置而連接之配 管,而在此配管上形成該噴出口。 4. 如申請專利範圍第2項之基板保持裝置,其中,於該機 台之表面所形成的溝,埋設連通該電離裝置而連接之配 管,在此配管上形成該噴出口。 5. 如申請專利範圍第3項之基板保持裝置,其中,在該配 管的兩端,分別連接該電離裝置使其連通。 6. 如申請專利範圍第4項之基板保持裝置’其中,在該配 管的兩端,分別連接該電離裝置使其連通。 7. 如申請專利範圍第1至6項中任一項之基板保持裝置’ 其中,將該基板從該機台舉起用的複數個升降銷以可進 退自如地配置在該機台上。 8. 一種基板解放方法,其特徵在於:包含 從設置在裝載基板之機台面上的噴出口吹出離子化氣 體,並對該基板的背面噴吹以進行靜電去除之步驟;及 ,將該基板從機台卸掉之步驟。 -12-
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JP2007231327A JP2009064950A (ja) | 2007-09-06 | 2007-09-06 | 基板保持装置および基板リリース方法 |
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Cited By (1)
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Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
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TWI671844B (zh) * | 2017-01-30 | 2019-09-11 | 日商新川股份有限公司 | 拾取裝置以及拾取方法 |
CN107329289A (zh) * | 2017-07-19 | 2017-11-07 | 武汉华星光电技术有限公司 | 去静电剥离装置及液晶面板制作设备 |
KR102177490B1 (ko) * | 2019-08-12 | 2020-11-11 | 주식회사 영우디에스피 | 디스플레이 패널용 프로브 검사장치 |
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JPH0927540A (ja) * | 1995-07-10 | 1997-01-28 | Nikon Corp | 基板の保持装置 |
-
2007
- 2007-09-06 JP JP2007231327A patent/JP2009064950A/ja active Pending
-
2008
- 2008-08-26 KR KR1020080083207A patent/KR20090026049A/ko not_active Application Discontinuation
- 2008-09-05 TW TW097134006A patent/TW200919625A/zh unknown
- 2008-09-08 CN CNA2008102137910A patent/CN101382414A/zh active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI559493B (zh) * | 2015-01-09 | 2016-11-21 | 伸興股份有限公司 | 靜電去除裝置及靜電去除方法 |
Also Published As
Publication number | Publication date |
---|---|
KR20090026049A (ko) | 2009-03-11 |
CN101382414A (zh) | 2009-03-11 |
JP2009064950A (ja) | 2009-03-26 |
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