TW200914854A - High speed testing device - Google Patents

High speed testing device Download PDF

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Publication number
TW200914854A
TW200914854A TW96134978A TW96134978A TW200914854A TW 200914854 A TW200914854 A TW 200914854A TW 96134978 A TW96134978 A TW 96134978A TW 96134978 A TW96134978 A TW 96134978A TW 200914854 A TW200914854 A TW 200914854A
Authority
TW
Taiwan
Prior art keywords
probe
test device
test
layer
electrically connected
Prior art date
Application number
TW96134978A
Other languages
English (en)
Chinese (zh)
Other versions
TWI334032B (enExample
Inventor
Wei-Jeng Gu
Jr-Hau He
Jr-Jung Jian
He-Huei Lin
de-cheng Feng
Jiun-Liang Lai
Jia-Chi He
Chian-Huei Huang
Ai-Juan Jang
Original Assignee
Microelectonics Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Microelectonics Technology Inc filed Critical Microelectonics Technology Inc
Priority to TW96134978A priority Critical patent/TW200914854A/zh
Priority to US12/133,249 priority patent/US7782070B2/en
Priority to KR1020080052519A priority patent/KR100965923B1/ko
Priority to DE102008045726.4A priority patent/DE102008045726B4/de
Priority to SG200806872-8A priority patent/SG151211A1/en
Priority to FR0856318A priority patent/FR2924816B1/fr
Publication of TW200914854A publication Critical patent/TW200914854A/zh
Application granted granted Critical
Publication of TWI334032B publication Critical patent/TWI334032B/zh

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  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Measuring Leads Or Probes (AREA)
TW96134978A 2007-06-05 2007-09-19 High speed testing device TW200914854A (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
TW96134978A TW200914854A (en) 2007-09-19 2007-09-19 High speed testing device
US12/133,249 US7782070B2 (en) 2007-06-05 2008-06-04 Probing device
KR1020080052519A KR100965923B1 (ko) 2007-06-05 2008-06-04 프로브 테스트 장치
DE102008045726.4A DE102008045726B4 (de) 2007-09-19 2008-09-04 Prüfvorrichtung
SG200806872-8A SG151211A1 (en) 2007-09-19 2008-09-17 Probing device
FR0856318A FR2924816B1 (fr) 2007-09-19 2008-09-19 Dispositif de controle sous pointes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW96134978A TW200914854A (en) 2007-09-19 2007-09-19 High speed testing device

Publications (2)

Publication Number Publication Date
TW200914854A true TW200914854A (en) 2009-04-01
TWI334032B TWI334032B (enExample) 2010-12-01

Family

ID=44209684

Family Applications (1)

Application Number Title Priority Date Filing Date
TW96134978A TW200914854A (en) 2007-06-05 2007-09-19 High speed testing device

Country Status (1)

Country Link
TW (1) TW200914854A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI422846B (zh) * 2012-01-03 2014-01-11 Rato High Tech Corp The circuit board of the test fixture structure improved

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI422846B (zh) * 2012-01-03 2014-01-11 Rato High Tech Corp The circuit board of the test fixture structure improved

Also Published As

Publication number Publication date
TWI334032B (enExample) 2010-12-01

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MM4A Annulment or lapse of patent due to non-payment of fees