TWI360658B - - Google Patents
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- Publication number
- TWI360658B TWI360658B TW97108934A TW97108934A TWI360658B TW I360658 B TWI360658 B TW I360658B TW 97108934 A TW97108934 A TW 97108934A TW 97108934 A TW97108934 A TW 97108934A TW I360658 B TWI360658 B TW I360658B
- Authority
- TW
- Taiwan
- Prior art keywords
- probe
- test
- probes
- testing device
- signal
- Prior art date
Links
- 239000000523 sample Substances 0.000 claims description 222
- 238000012360 testing method Methods 0.000 claims description 140
- 239000000463 material Substances 0.000 claims description 9
- 229910000679 solder Inorganic materials 0.000 claims description 8
- 239000007769 metal material Substances 0.000 claims 3
- 241000255925 Diptera Species 0.000 claims 2
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims 2
- 229910000831 Steel Inorganic materials 0.000 claims 1
- 238000003745 diagnosis Methods 0.000 claims 1
- 239000010959 steel Substances 0.000 claims 1
- 238000004154 testing of material Methods 0.000 claims 1
- 239000010410 layer Substances 0.000 description 52
- 230000005540 biological transmission Effects 0.000 description 17
- 230000008054 signal transmission Effects 0.000 description 7
- 239000011810 insulating material Substances 0.000 description 6
- 238000004519 manufacturing process Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 239000011229 interlayer Substances 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 4
- 239000002356 single layer Substances 0.000 description 4
- 239000000084 colloidal system Substances 0.000 description 3
- 239000003989 dielectric material Substances 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 239000011295 pitch Substances 0.000 description 3
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 239000000839 emulsion Substances 0.000 description 1
- 238000005265 energy consumption Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000003365 glass fiber Substances 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 230000001404 mediated effect Effects 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 230000010412 perfusion Effects 0.000 description 1
- 229910052573 porcelain Inorganic materials 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000007639 printing Methods 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 229910001220 stainless steel Inorganic materials 0.000 description 1
- 239000010935 stainless steel Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (6)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW97108934A TW200938846A (en) | 2008-03-13 | 2008-03-13 | Probing testing device |
| US12/133,249 US7782070B2 (en) | 2007-06-05 | 2008-06-04 | Probing device |
| KR1020080052519A KR100965923B1 (ko) | 2007-06-05 | 2008-06-04 | 프로브 테스트 장치 |
| DE102008045726.4A DE102008045726B4 (de) | 2007-09-19 | 2008-09-04 | Prüfvorrichtung |
| SG200806872-8A SG151211A1 (en) | 2007-09-19 | 2008-09-17 | Probing device |
| FR0856318A FR2924816B1 (fr) | 2007-09-19 | 2008-09-19 | Dispositif de controle sous pointes |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW97108934A TW200938846A (en) | 2008-03-13 | 2008-03-13 | Probing testing device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200938846A TW200938846A (en) | 2009-09-16 |
| TWI360658B true TWI360658B (enExample) | 2012-03-21 |
Family
ID=44867471
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW97108934A TW200938846A (en) | 2007-06-05 | 2008-03-13 | Probing testing device |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW200938846A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI763692B (zh) * | 2017-07-28 | 2022-05-11 | 薩摩亞商頂勝世界股份有限公司 | 針座 |
-
2008
- 2008-03-13 TW TW97108934A patent/TW200938846A/zh unknown
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI763692B (zh) * | 2017-07-28 | 2022-05-11 | 薩摩亞商頂勝世界股份有限公司 | 針座 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW200938846A (en) | 2009-09-16 |
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