TW200905018A - Apparatus for plating and method for controlling plating - Google Patents
Apparatus for plating and method for controlling plating Download PDFInfo
- Publication number
- TW200905018A TW200905018A TW097115399A TW97115399A TW200905018A TW 200905018 A TW200905018 A TW 200905018A TW 097115399 A TW097115399 A TW 097115399A TW 97115399 A TW97115399 A TW 97115399A TW 200905018 A TW200905018 A TW 200905018A
- Authority
- TW
- Taiwan
- Prior art keywords
- plating
- plating solution
- solution
- amount
- electroplating
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D21/00—Processes for servicing or operating cells for electrolytic coating
- C25D21/16—Regeneration of process solutions
- C25D21/18—Regeneration of process solutions of electrolytes
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D21/00—Processes for servicing or operating cells for electrolytic coating
- C25D21/12—Process control or regulation
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D17/00—Constructional parts, or assemblies thereof, of cells for electrolytic coating
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Automation & Control Theory (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007115599A JP4940008B2 (ja) | 2007-04-25 | 2007-04-25 | めっき成膜装置および成膜制御方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| TW200905018A true TW200905018A (en) | 2009-02-01 |
Family
ID=39938778
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW097115399A TW200905018A (en) | 2007-04-25 | 2008-04-25 | Apparatus for plating and method for controlling plating |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US20080271989A1 (enExample) |
| JP (1) | JP4940008B2 (enExample) |
| TW (1) | TW200905018A (enExample) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI413708B (zh) * | 2010-08-20 | 2013-11-01 | Zhen Ding Technology Co Ltd | 電鍍裝置及電鍍方法 |
| TWI479054B (zh) * | 2010-10-27 | 2015-04-01 | Tokyo Electron Ltd | 電鍍處理裝置及電鍍處理方法以及記錄電鍍處理程式的記錄媒體 |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5446126B2 (ja) * | 2008-05-13 | 2014-03-19 | 富士通セミコンダクター株式会社 | 電解メッキ方法および半導体装置の製造方法 |
| JP2012182169A (ja) * | 2011-02-28 | 2012-09-20 | Toshiba Corp | 半導体装置の製造方法、半導体装置の製造装置および半導体装置 |
| TW201251094A (en) * | 2011-06-07 | 2012-12-16 | Hon Hai Prec Ind Co Ltd | Electrode of dye-sensitized solar cells manufacturing equipment |
| US9469913B2 (en) * | 2013-12-05 | 2016-10-18 | Applied Materials, Inc. | Closed loop electrolyte analyzer |
| CN110218992A (zh) * | 2019-05-08 | 2019-09-10 | 金驰 | 一种基于远程操控的钢材化学镀层系统及其工作方法 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5352350A (en) * | 1992-02-14 | 1994-10-04 | International Business Machines Corporation | Method for controlling chemical species concentration |
| JP2720130B2 (ja) * | 1992-03-17 | 1998-02-25 | 株式会社三井ハイテック | 電気めっき用の電源装置 |
| US5368715A (en) * | 1993-02-23 | 1994-11-29 | Enthone-Omi, Inc. | Method and system for controlling plating bath parameters |
| US6267853B1 (en) * | 1999-07-09 | 2001-07-31 | Applied Materials, Inc. | Electro-chemical deposition system |
| JP2001073200A (ja) * | 1999-08-30 | 2001-03-21 | Ebara Corp | めっき液管理方法及び管理装置 |
| US6458262B1 (en) * | 2001-03-09 | 2002-10-01 | Novellus Systems, Inc. | Electroplating chemistry on-line monitoring and control system |
| JP3694001B2 (ja) * | 2003-03-07 | 2005-09-14 | 松下電器産業株式会社 | メッキ方法、半導体装置の製造方法およびメッキ装置 |
| JP2006291289A (ja) * | 2005-04-11 | 2006-10-26 | Renesas Technology Corp | 半導体装置の製造装置及び製造方法 |
-
2007
- 2007-04-25 JP JP2007115599A patent/JP4940008B2/ja not_active Expired - Fee Related
-
2008
- 2008-04-23 US US12/108,296 patent/US20080271989A1/en not_active Abandoned
- 2008-04-25 TW TW097115399A patent/TW200905018A/zh unknown
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI413708B (zh) * | 2010-08-20 | 2013-11-01 | Zhen Ding Technology Co Ltd | 電鍍裝置及電鍍方法 |
| TWI479054B (zh) * | 2010-10-27 | 2015-04-01 | Tokyo Electron Ltd | 電鍍處理裝置及電鍍處理方法以及記錄電鍍處理程式的記錄媒體 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP4940008B2 (ja) | 2012-05-30 |
| US20080271989A1 (en) | 2008-11-06 |
| JP2008274313A (ja) | 2008-11-13 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| TW200905018A (en) | Apparatus for plating and method for controlling plating | |
| TWI841618B (zh) | 奈米雙晶銅結構的電沉積 | |
| JP6585434B2 (ja) | めっき方法 | |
| KR102281073B1 (ko) | 도금 해석 방법, 도금 해석 시스템, 및 도금 해석을 위한 컴퓨터 판독 가능 기억 매체 | |
| TWI810195B (zh) | 通遮罩互連線製造中的電氧化金屬移除 | |
| JP6619718B2 (ja) | 基板のめっきに使用される酸化銅粉体、該酸化銅粉体を用いて基板をめっきする方法、該酸化銅粉体を用いてめっき液を管理する方法 | |
| CN112160003B (zh) | 电镀装置中的电流密度的控制 | |
| US8323471B2 (en) | Automatic deposition profile targeting | |
| JP2001520315A (ja) | 不溶解性アノードを用いてのシリコンウエファーの銅金属被膜化 | |
| JP2008500455A (ja) | 電気めっき浴の化学的性質の制御方法 | |
| WO2001016405A1 (en) | Method for measuring leveler concentration of plating solution, and method and apparatus for controlling plating solution | |
| KR20150086184A (ko) | 도금 방법 및 도금 장치 | |
| TW201827654A (zh) | 使用犧牲性氧化劑之鈷電填充最佳化程序 | |
| US20100122908A1 (en) | Electroplating apparatus and method with uniformity improvement | |
| TW202325899A (zh) | 在電化學電鍍設備上控制鍍電解液濃度 | |
| JP4221365B2 (ja) | 電気分解を監視するための装置および方法 | |
| JP2003277998A (ja) | メッキ装置及びそれを用いたメッキ液の管理方法 | |
| JP2001073200A (ja) | めっき液管理方法及び管理装置 | |
| JP5365296B2 (ja) | 湿式めっき方法及び湿式めっき装置 | |
| US20230203701A1 (en) | Plating apparatus and plating method | |
| CN100550309C (zh) | 制造半导体器件的方法以及电镀装置 | |
| CN100449710C (zh) | 电化学电镀半导体晶圆的方法及其电镀装置 | |
| US7854824B2 (en) | Method of manufacturing semiconductor device using electrochemical deposition with electric current revised by reflectance of every substrate surface and semiconductor manufacturing apparatus | |
| TWI802798B (zh) | 鍍覆方法、鍍覆裝置、儲存有程式之非揮發性記憶媒體 | |
| US20030159936A1 (en) | Method and apparatus for reducing organic depletion during non-processing time periods |