TW200829856A - Method of measuring the surface contour of object by the use of coherence envelope peak detection - Google Patents

Method of measuring the surface contour of object by the use of coherence envelope peak detection Download PDF

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Publication number
TW200829856A
TW200829856A TW96100501A TW96100501A TW200829856A TW 200829856 A TW200829856 A TW 200829856A TW 96100501 A TW96100501 A TW 96100501A TW 96100501 A TW96100501 A TW 96100501A TW 200829856 A TW200829856 A TW 200829856A
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TW
Taiwan
Prior art keywords
optical path
tested
light
measuring
interference wave
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TW96100501A
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English (en)
Chinese (zh)
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TWI306150B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html
Inventor
Hsien-Chang Wang
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Hirose Tech Co Ltd
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Priority to TW96100501A priority Critical patent/TW200829856A/zh
Publication of TW200829856A publication Critical patent/TW200829856A/zh
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Publication of TWI306150B publication Critical patent/TWI306150B/zh

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  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)
TW96100501A 2007-01-05 2007-01-05 Method of measuring the surface contour of object by the use of coherence envelope peak detection TW200829856A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW96100501A TW200829856A (en) 2007-01-05 2007-01-05 Method of measuring the surface contour of object by the use of coherence envelope peak detection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW96100501A TW200829856A (en) 2007-01-05 2007-01-05 Method of measuring the surface contour of object by the use of coherence envelope peak detection

Publications (2)

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TW200829856A true TW200829856A (en) 2008-07-16
TWI306150B TWI306150B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 2009-02-11

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TW96100501A TW200829856A (en) 2007-01-05 2007-01-05 Method of measuring the surface contour of object by the use of coherence envelope peak detection

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TW (1) TW200829856A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114001657A (zh) * 2021-09-26 2022-02-01 河北大学 基于低相干光串联干涉的量块长度校准装置和校准方法

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114001657A (zh) * 2021-09-26 2022-02-01 河北大学 基于低相干光串联干涉的量块长度校准装置和校准方法
CN114001657B (zh) * 2021-09-26 2023-06-13 河北大学 基于低相干光串联干涉的量块长度校准装置和校准方法

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Publication number Publication date
TWI306150B (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 2009-02-11

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