TW200729412A - Magnetic devices and techniques for formation thereof - Google Patents

Magnetic devices and techniques for formation thereof

Info

Publication number
TW200729412A
TW200729412A TW095129353A TW95129353A TW200729412A TW 200729412 A TW200729412 A TW 200729412A TW 095129353 A TW095129353 A TW 095129353A TW 95129353 A TW95129353 A TW 95129353A TW 200729412 A TW200729412 A TW 200729412A
Authority
TW
Taiwan
Prior art keywords
magnetic device
underlayer
dielectric layer
techniques
formation
Prior art date
Application number
TW095129353A
Other languages
English (en)
Chinese (zh)
Inventor
Sivananda K Kanakasabapathy
Michael C Gaidis
Original Assignee
Ibm
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ibm filed Critical Ibm
Publication of TW200729412A publication Critical patent/TW200729412A/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76897—Formation of self-aligned vias or contact plugs, i.e. involving a lithographically uncritical step
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
    • G11C11/15—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
    • H10B61/10—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices comprising components having two electrodes, e.g. diodes or MIM elements
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00—Galvanomagnetic devices
    • H10N50/01—Manufacture or treatment
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N50/00—Galvanomagnetic devices
    • H10N50/10—Magnetoresistive devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30—Technical effects
    • H01L2924/301—Electrical effects
    • H01L2924/3011—Impedance
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Mram Or Spin Memory Techniques (AREA)
  • Drying Of Semiconductors (AREA)
  • Hall/Mr Elements (AREA)
  • Thin Magnetic Films (AREA)
  • Magnetic Heads (AREA)
TW095129353A 2005-08-23 2006-08-10 Magnetic devices and techniques for formation thereof TW200729412A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/209,951 US7399646B2 (en) 2005-08-23 2005-08-23 Magnetic devices and techniques for formation thereof

Publications (1)

Publication Number Publication Date
TW200729412A true TW200729412A (en) 2007-08-01

Family

ID=37772063

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095129353A TW200729412A (en) 2005-08-23 2006-08-10 Magnetic devices and techniques for formation thereof

Country Status (7)

Country Link
US (2) US7399646B2 (enExample)
EP (1) EP1917678B1 (enExample)
JP (1) JP4939537B2 (enExample)
KR (1) KR101027226B1 (enExample)
CN (1) CN101288150B (enExample)
TW (1) TW200729412A (enExample)
WO (1) WO2007024300A2 (enExample)

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US7989224B2 (en) 2009-04-30 2011-08-02 International Business Machines Corporation Sidewall coating for non-uniform spin momentum-transfer magnetic tunnel junction current flow
JP5010650B2 (ja) * 2009-08-11 2012-08-29 株式会社東芝 磁気抵抗メモリ
US20110065276A1 (en) * 2009-09-11 2011-03-17 Applied Materials, Inc. Apparatus and Methods for Cyclical Oxidation and Etching
US8981502B2 (en) * 2010-03-29 2015-03-17 Qualcomm Incorporated Fabricating a magnetic tunnel junction storage element
US9054297B2 (en) 2010-12-17 2015-06-09 Everspin Technologies, Inc. Magnetic random access memory integration having improved scaling
US8921959B2 (en) 2011-07-26 2014-12-30 Taiwan Semiconductor Manufacturing Company, Ltd. MRAM device and fabrication method thereof
US8881209B2 (en) 2012-10-26 2014-11-04 Mobitv, Inc. Feedback loop content recommendation
US9172033B2 (en) 2013-07-03 2015-10-27 Taiwan Semiconductor Manufacturing Company, Ltd. MRAM device and fabrication method thereof
US9318696B2 (en) * 2014-03-03 2016-04-19 Qualcomm Incorporated Self-aligned top contact for MRAM fabrication
US9847473B2 (en) 2015-04-16 2017-12-19 Taiwan Semiconductor Manufacturing Co., Ltd. MRAM structure for process damage minimization
US9490168B1 (en) 2015-05-13 2016-11-08 International Business Machines Corporation Via formation using sidewall image transfer process to define lateral dimension
US10707411B1 (en) 2015-06-19 2020-07-07 Marvell International Ltd. MRAM structure for efficient manufacturability
US9502640B1 (en) * 2015-11-03 2016-11-22 International Business Machines Corporation Structure and method to reduce shorting in STT-MRAM device
WO2017177389A1 (zh) * 2016-04-13 2017-10-19 深圳线易科技有限责任公司 具有集成磁性器件的转接板
US10276436B2 (en) 2016-08-05 2019-04-30 International Business Machines Corporation Selective recessing to form a fully aligned via
US10312102B2 (en) * 2016-08-29 2019-06-04 Tokyo Electron Limited Method of quasi-atomic layer etching of silicon nitride
US10446405B2 (en) 2017-02-23 2019-10-15 Tokyo Electron Limited Method of anisotropic extraction of silicon nitride mandrel for fabrication of self-aligned block structures
WO2018156975A1 (en) 2017-02-23 2018-08-30 Tokyo Electron Limited Method of quasi-atomic layer etching of silicon nitride
US9966337B1 (en) 2017-03-15 2018-05-08 International Business Machines Corporation Fully aligned via with integrated air gaps
CN107342240B (zh) * 2017-06-08 2020-12-25 上海华力微电子有限公司 一种检测晶圆表面氮化硅残留的方法
CN116437788A (zh) 2018-06-08 2023-07-14 联华电子股份有限公司 半导体元件
US11374170B2 (en) * 2018-09-25 2022-06-28 Applied Materials, Inc. Methods to form top contact to a magnetic tunnel junction
US11488863B2 (en) 2019-07-15 2022-11-01 International Business Machines Corporation Self-aligned contact scheme for pillar-based memory elements
US11195993B2 (en) * 2019-09-16 2021-12-07 International Business Machines Corporation Encapsulation topography-assisted self-aligned MRAM top contact

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JPH0432227A (ja) * 1990-05-29 1992-02-04 Matsushita Electric Ind Co Ltd コンタクトホール形成方法
US5640343A (en) 1996-03-18 1997-06-17 International Business Machines Corporation Magnetic memory array using magnetic tunnel junction devices in the memory cells
KR19990065141A (ko) * 1998-01-08 1999-08-05 윤종용 자기 정렬된 콘택홀 형성방법
JP2000040691A (ja) * 1998-07-21 2000-02-08 Oki Electric Ind Co Ltd 半導体装置製造方法
US6165803A (en) * 1999-05-17 2000-12-26 Motorola, Inc. Magnetic random access memory and fabricating method thereof
DE10043159A1 (de) * 2000-09-01 2002-03-21 Infineon Technologies Ag Speicherzellenanordnung und Verfahren zu deren Herstellung
JP4123428B2 (ja) * 2001-11-30 2008-07-23 東京エレクトロン株式会社 エッチング方法
US6812040B2 (en) 2002-03-12 2004-11-02 Freescale Semiconductor, Inc. Method of fabricating a self-aligned via contact for a magnetic memory element
JP2003298015A (ja) * 2002-03-28 2003-10-17 Seiko Epson Corp 強誘電体メモリ装置およびその製造方法
US6783995B2 (en) * 2002-04-30 2004-08-31 Micron Technology, Inc. Protective layers for MRAM devices
JP2003347279A (ja) * 2002-05-24 2003-12-05 Renesas Technology Corp 半導体装置の製造方法
JP2004055918A (ja) * 2002-07-22 2004-02-19 Toshiba Corp 磁気記憶装置及びその製造方法
KR100533971B1 (ko) * 2002-12-12 2005-12-07 주식회사 하이닉스반도체 반도체 소자의 캐패시터 제조방법
KR100485384B1 (ko) 2003-02-03 2005-04-27 삼성전자주식회사 반도체 소자의 제조방법
JP4618989B2 (ja) * 2003-02-18 2011-01-26 三菱電機株式会社 磁気記憶半導体装置
US6881351B2 (en) * 2003-04-22 2005-04-19 Freescale Semiconductor, Inc. Methods for contacting conducting layers overlying magnetoelectronic elements of MRAM devices
US20040257861A1 (en) * 2003-06-17 2004-12-23 Berndt Dale F. Method of incorporating magnetic materials in a semiconductor manufacturing process
US6783999B1 (en) 2003-06-20 2004-08-31 Infineon Technologies Ag Subtractive stud formation for MRAM manufacturing
US6713802B1 (en) 2003-06-20 2004-03-30 Infineon Technologies Ag Magnetic tunnel junction patterning using SiC or SiN
US20050090119A1 (en) * 2003-10-24 2005-04-28 Heon Lee Magnetic tunnel junction device with dual-damascene conductor and dielectric spacer
JP2005191280A (ja) * 2003-12-25 2005-07-14 Semiconductor Leading Edge Technologies Inc 半導体装置の製造方法
KR100561859B1 (ko) * 2004-01-16 2006-03-16 삼성전자주식회사 컨택홀이 없는 나노 크기의 자기터널접합 셀 형성 방법
US7205164B1 (en) * 2005-01-19 2007-04-17 Silicon Magnetic Systems Methods for fabricating magnetic cell junctions and a structure resulting and/or used for such methods

Also Published As

Publication number Publication date
US20070048950A1 (en) 2007-03-01
JP4939537B2 (ja) 2012-05-30
WO2007024300A2 (en) 2007-03-01
EP1917678A4 (en) 2012-08-22
US20080043379A1 (en) 2008-02-21
US7399646B2 (en) 2008-07-15
US8164128B2 (en) 2012-04-24
EP1917678A2 (en) 2008-05-07
KR20080045122A (ko) 2008-05-22
KR101027226B1 (ko) 2011-04-06
JP2009506531A (ja) 2009-02-12
EP1917678B1 (en) 2013-11-20
CN101288150A (zh) 2008-10-15
CN101288150B (zh) 2010-05-19
WO2007024300A3 (en) 2008-06-05

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