TW200729333A - Etching method and etching device - Google Patents
Etching method and etching deviceInfo
- Publication number
- TW200729333A TW200729333A TW095140285A TW95140285A TW200729333A TW 200729333 A TW200729333 A TW 200729333A TW 095140285 A TW095140285 A TW 095140285A TW 95140285 A TW95140285 A TW 95140285A TW 200729333 A TW200729333 A TW 200729333A
- Authority
- TW
- Taiwan
- Prior art keywords
- etching
- resistant film
- plasma
- recess
- mask
- Prior art date
Links
- 238000005530 etching Methods 0.000 title abstract 12
- 238000000034 method Methods 0.000 title abstract 3
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/3065—Plasma etching; Reactive-ion etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/033—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers
- H01L21/0334—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their size, orientation, disposition, behaviour, shape, in horizontal or vertical plane
- H01L21/0337—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising inorganic layers characterised by their size, orientation, disposition, behaviour, shape, in horizontal or vertical plane characterised by the process involved to create the mask, e.g. lift-off masks, sidewalls, or to modify the mask, e.g. pre-treatment, post-treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
- H01L21/311—Etching the insulating layers by chemical or physical means
- H01L21/31144—Etching the insulating layers by chemical or physical means using masks
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Plasma & Fusion (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005317367A JP2007123766A (ja) | 2005-10-31 | 2005-10-31 | エッチング方法、プラズマ処理装置及び記憶媒体 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200729333A true TW200729333A (en) | 2007-08-01 |
TWI425565B TWI425565B (zh) | 2014-02-01 |
Family
ID=38005686
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095140285A TWI425565B (zh) | 2005-10-31 | 2006-10-31 | Etching apparatus and etching method |
Country Status (6)
Country | Link |
---|---|
US (1) | US20090137125A1 (zh) |
JP (1) | JP2007123766A (zh) |
KR (1) | KR100967458B1 (zh) |
CN (1) | CN101300667A (zh) |
TW (1) | TWI425565B (zh) |
WO (1) | WO2007052534A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI814173B (zh) * | 2020-12-14 | 2023-09-01 | 香港商金展科技有限公司 | 在多個寶石的外表面形成可識別標記的方法和系統,以及根據這種方法標記的寶石 |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8562785B2 (en) * | 2011-05-31 | 2013-10-22 | Lam Research Corporation | Gas distribution showerhead for inductively coupled plasma etch reactor |
US9245717B2 (en) | 2011-05-31 | 2016-01-26 | Lam Research Corporation | Gas distribution system for ceramic showerhead of plasma etch reactor |
JP6050944B2 (ja) * | 2012-04-05 | 2016-12-21 | 東京エレクトロン株式会社 | プラズマエッチング方法及びプラズマ処理装置 |
JP6877290B2 (ja) | 2017-08-03 | 2021-05-26 | 東京エレクトロン株式会社 | 被処理体を処理する方法 |
TWI812762B (zh) * | 2018-07-30 | 2023-08-21 | 日商東京威力科創股份有限公司 | 處理被處理體之方法、處理裝置及處理系統 |
CN110858541B (zh) * | 2018-08-24 | 2022-05-10 | 中芯国际集成电路制造(上海)有限公司 | 半导体结构及其形成方法 |
CN110931354B (zh) * | 2018-09-19 | 2023-05-05 | 中芯国际集成电路制造(上海)有限公司 | 半导体结构以及半导体结构的制造方法 |
RU205508U1 (ru) * | 2021-03-11 | 2021-07-19 | Акционерное общество "ГРУППА КРЕМНИЙ ЭЛ" | Маска для взрывной фотолитографии |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4871630A (en) * | 1986-10-28 | 1989-10-03 | International Business Machines Corporation | Mask using lithographic image size reduction |
US5296410A (en) * | 1992-12-16 | 1994-03-22 | Samsung Electronics Co., Ltd. | Method for separating fine patterns of a semiconductor device |
JPH07106310A (ja) * | 1993-09-29 | 1995-04-21 | Victor Co Of Japan Ltd | ドライエッチング方法 |
US5736296A (en) * | 1994-04-25 | 1998-04-07 | Tokyo Ohka Kogyo Co., Ltd. | Positive resist composition comprising a mixture of two polyhydroxystyrenes having different acid cleavable groups and an acid generating compound |
TW367587B (en) * | 1998-03-31 | 1999-08-21 | Taiwan Semiconductor Mfg Co Ltd | Manufacturing method for on-chip interconnected wiring without damage to inter-layer dielectric |
US7223676B2 (en) * | 2002-06-05 | 2007-05-29 | Applied Materials, Inc. | Very low temperature CVD process with independently variable conformality, stress and composition of the CVD layer |
US6831742B1 (en) * | 2000-10-23 | 2004-12-14 | Applied Materials, Inc | Monitoring substrate processing using reflected radiation |
US6750150B2 (en) * | 2001-10-18 | 2004-06-15 | Macronix International Co., Ltd. | Method for reducing dimensions between patterns on a photoresist |
US7473377B2 (en) * | 2002-06-27 | 2009-01-06 | Tokyo Electron Limited | Plasma processing method |
AU2003244166A1 (en) * | 2002-06-27 | 2004-01-19 | Tokyo Electron Limited | Plasma processing method |
KR100928098B1 (ko) * | 2002-12-24 | 2009-11-24 | 동부일렉트로닉스 주식회사 | 산화막을 이용한 메탈라인 형성방법 |
US7015885B2 (en) * | 2003-03-22 | 2006-03-21 | Active Optical Networks, Inc. | MEMS devices monolithically integrated with drive and control circuitry |
JP2004319972A (ja) * | 2003-03-31 | 2004-11-11 | Tokyo Electron Ltd | エッチング方法及びエッチング装置 |
DE102005020132B4 (de) * | 2005-04-29 | 2011-01-27 | Advanced Micro Devices, Inc., Sunnyvale | Technik zur Herstellung selbstjustierter Durchführungen in einer Metallisierungsschicht |
-
2005
- 2005-10-31 JP JP2005317367A patent/JP2007123766A/ja active Pending
-
2006
- 2006-10-26 US US12/091,961 patent/US20090137125A1/en not_active Abandoned
- 2006-10-26 CN CNA2006800407651A patent/CN101300667A/zh active Pending
- 2006-10-26 WO PCT/JP2006/321410 patent/WO2007052534A1/ja active Application Filing
- 2006-10-26 KR KR1020087010398A patent/KR100967458B1/ko active IP Right Grant
- 2006-10-31 TW TW095140285A patent/TWI425565B/zh active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI814173B (zh) * | 2020-12-14 | 2023-09-01 | 香港商金展科技有限公司 | 在多個寶石的外表面形成可識別標記的方法和系統,以及根據這種方法標記的寶石 |
Also Published As
Publication number | Publication date |
---|---|
CN101300667A (zh) | 2008-11-05 |
US20090137125A1 (en) | 2009-05-28 |
KR100967458B1 (ko) | 2010-07-01 |
JP2007123766A (ja) | 2007-05-17 |
WO2007052534A1 (ja) | 2007-05-10 |
KR20080054430A (ko) | 2008-06-17 |
TWI425565B (zh) | 2014-02-01 |
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