TW200632437A - Electronics device, optical panel, inspection probe, inspection device for the optical panel and inspection method for the optical panel - Google Patents

Electronics device, optical panel, inspection probe, inspection device for the optical panel and inspection method for the optical panel

Info

Publication number
TW200632437A
TW200632437A TW095103146A TW95103146A TW200632437A TW 200632437 A TW200632437 A TW 200632437A TW 095103146 A TW095103146 A TW 095103146A TW 95103146 A TW95103146 A TW 95103146A TW 200632437 A TW200632437 A TW 200632437A
Authority
TW
Taiwan
Prior art keywords
optical panel
inspection
signal lines
electronics device
probe
Prior art date
Application number
TW095103146A
Other languages
English (en)
Inventor
Akitoshi Maeda
Eiichi Yamagishi
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Publication of TW200632437A publication Critical patent/TW200632437A/zh

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1345—Conductors connecting electrodes to cell terminals
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
    • G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
    • G09G3/3611—Control of matrices with row and column drivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Nonlinear Science (AREA)
  • Mathematical Physics (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Measuring Leads Or Probes (AREA)
TW095103146A 2005-02-02 2006-01-26 Electronics device, optical panel, inspection probe, inspection device for the optical panel and inspection method for the optical panel TW200632437A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2005026972 2005-02-02
JP2005026974 2005-02-02
JP2005325010A JP4353171B2 (ja) 2005-02-02 2005-11-09 電子機器、光学パネル、検査プローブ、光学パネルの検査装置、光学パネルの検査方法

Publications (1)

Publication Number Publication Date
TW200632437A true TW200632437A (en) 2006-09-16

Family

ID=36755869

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095103146A TW200632437A (en) 2005-02-02 2006-01-26 Electronics device, optical panel, inspection probe, inspection device for the optical panel and inspection method for the optical panel

Country Status (4)

Country Link
US (1) US20060170447A1 (zh)
JP (1) JP4353171B2 (zh)
KR (1) KR20060088853A (zh)
TW (1) TW200632437A (zh)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010054551A (ja) 2008-08-26 2010-03-11 Epson Imaging Devices Corp 表示装置及びこの表示装置の検査プローブ
JP5406790B2 (ja) * 2009-08-04 2014-02-05 株式会社日本マイクロニクス プローブユニット及びこれを用いる試験装置
KR101118650B1 (ko) * 2010-12-30 2012-03-06 경북대학교 산학협력단 도전성 박막의 무손상 저항 균일성 평가 장치
KR101242372B1 (ko) 2012-08-28 2013-03-25 (주)메리테크 패널 테스트용 글라스 범프 타입 프로브 블록
JP2014203000A (ja) 2013-04-08 2014-10-27 パナソニック液晶ディスプレイ株式会社 表示装置
CN104317081A (zh) * 2014-11-17 2015-01-28 合肥京东方光电科技有限公司 一种点灯设备
KR20180024081A (ko) * 2016-08-25 2018-03-08 엘지디스플레이 주식회사 표시패널 및 표시장치
JP6775376B2 (ja) * 2016-10-14 2020-10-28 株式会社ジャパンディスプレイ 表示装置
KR102351977B1 (ko) * 2017-07-18 2022-01-17 삼성디스플레이 주식회사 표시 장치
CN114373409A (zh) * 2020-10-15 2022-04-19 深圳莱宝高科技股份有限公司 显示模组的测试方法、显示模组及显示面板的制作方法
JPWO2022180985A1 (zh) * 2021-02-25 2022-09-01

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100288344B1 (ko) * 1991-09-17 2001-11-30 마쯔모또 에이찌 프린트배선판용검사전극유니트와그것을포함하는검사장치및프린트배선판용의검사방법
JP2994259B2 (ja) * 1996-03-28 1999-12-27 オー・エイチ・ティー株式会社 基板検査方法および基板検査装置
JP3415035B2 (ja) * 1998-08-07 2003-06-09 オー・エイチ・ティー株式会社 基板検査用センサプローブおよびその製造方法
JP3785821B2 (ja) * 1998-08-12 2006-06-14 セイコーエプソン株式会社 液晶表示パネルの検査装置および検査方法
JP2001272430A (ja) * 2000-03-24 2001-10-05 Oht Inc 検査装置及び検査方法
KR100715751B1 (ko) * 2002-08-09 2007-05-08 제이에스알 가부시끼가이샤 이방 도전성 커넥터 및 프로우브 부재 및 웨이퍼 검사장치 및 웨이퍼 검사 방법
JP2004228332A (ja) * 2003-01-23 2004-08-12 Yamaha Fine Technologies Co Ltd 電気検査装置
JP4412143B2 (ja) * 2004-01-14 2010-02-10 セイコーエプソン株式会社 検査用治具の製造方法
JP2006214834A (ja) * 2005-02-02 2006-08-17 Seiko Epson Corp 検査プローブ、光学パネルの検査装置、光学パネルの検査方法
JP4725358B2 (ja) * 2006-02-24 2011-07-13 ソニー株式会社 カラー液晶表示パネル
US7304492B2 (en) * 2006-03-06 2007-12-04 Chunghwa Picture Tubes, Ltd. Inspecting circuit layout for LCD panel and fabricating method for LCD panel

Also Published As

Publication number Publication date
US20060170447A1 (en) 2006-08-03
JP2006243706A (ja) 2006-09-14
KR20060088853A (ko) 2006-08-07
JP4353171B2 (ja) 2009-10-28

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