TW200614888A - Method for correcting measurement error and device for measuring characteristic of electronic component - Google Patents
Method for correcting measurement error and device for measuring characteristic of electronic componentInfo
- Publication number
- TW200614888A TW200614888A TW094122741A TW94122741A TW200614888A TW 200614888 A TW200614888 A TW 200614888A TW 094122741 A TW094122741 A TW 094122741A TW 94122741 A TW94122741 A TW 94122741A TW 200614888 A TW200614888 A TW 200614888A
- Authority
- TW
- Taiwan
- Prior art keywords
- measuring
- electronic component
- measurement error
- measuring characteristic
- correcting measurement
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Resistance Or Impedance (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004270181 | 2004-09-16 | ||
JP2004299259 | 2004-10-13 | ||
JP2004310658 | 2004-10-26 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200614888A true TW200614888A (en) | 2006-05-01 |
TWI296183B TWI296183B (zh) | 2008-04-21 |
Family
ID=36059811
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094122741A TW200614888A (en) | 2004-09-16 | 2005-07-05 | Method for correcting measurement error and device for measuring characteristic of electronic component |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP3965701B2 (zh) |
TW (1) | TW200614888A (zh) |
WO (1) | WO2006030547A1 (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2008065791A1 (fr) * | 2006-11-30 | 2008-06-05 | Murata Manufacturing Co., Ltd. | Procédé de correction d'erreur de caractéristiques hautes fréquences d'un composant électronique |
WO2008066137A1 (fr) * | 2006-11-30 | 2008-06-05 | Murata Manufacturing Co., Ltd. | Procédé et dispositif de correction d'erreur de caractéristique haute fréquence de composant électronique |
WO2012105127A1 (ja) * | 2011-01-31 | 2012-08-09 | 株式会社 村田製作所 | 測定誤差の補正方法及び電子部品特性測定装置 |
KR101831824B1 (ko) | 2014-03-04 | 2018-02-23 | 가부시키가이샤 무라타 세이사쿠쇼 | 측정 오차의 보정 방법 및 전자부품 특성 측정 장치 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4967173A (en) * | 1989-08-21 | 1990-10-30 | Hewlett-Packard Company | Short airline calibration standards and methods for error-corrected microwave network analysis |
JP3558086B1 (ja) * | 2003-03-05 | 2004-08-25 | 株式会社村田製作所 | 測定誤差の補正方法および電子部品特性測定装置 |
-
2005
- 2005-02-22 WO PCT/JP2005/002799 patent/WO2006030547A1/ja active Application Filing
- 2005-02-22 JP JP2006535022A patent/JP3965701B2/ja active Active
- 2005-07-05 TW TW094122741A patent/TW200614888A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
JPWO2006030547A1 (ja) | 2008-05-08 |
TWI296183B (zh) | 2008-04-21 |
JP3965701B2 (ja) | 2007-08-29 |
WO2006030547A1 (ja) | 2006-03-23 |
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