TW200614888A - Method for correcting measurement error and device for measuring characteristic of electronic component - Google Patents

Method for correcting measurement error and device for measuring characteristic of electronic component

Info

Publication number
TW200614888A
TW200614888A TW094122741A TW94122741A TW200614888A TW 200614888 A TW200614888 A TW 200614888A TW 094122741 A TW094122741 A TW 094122741A TW 94122741 A TW94122741 A TW 94122741A TW 200614888 A TW200614888 A TW 200614888A
Authority
TW
Taiwan
Prior art keywords
measuring
electronic component
measurement error
measuring characteristic
correcting measurement
Prior art date
Application number
TW094122741A
Other languages
English (en)
Other versions
TWI296183B (zh
Inventor
Taichi Mori
Gaku Kamitani
Original Assignee
Murata Manufacturing Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Murata Manufacturing Co filed Critical Murata Manufacturing Co
Publication of TW200614888A publication Critical patent/TW200614888A/zh
Application granted granted Critical
Publication of TWI296183B publication Critical patent/TWI296183B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
TW094122741A 2004-09-16 2005-07-05 Method for correcting measurement error and device for measuring characteristic of electronic component TW200614888A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2004270181 2004-09-16
JP2004299259 2004-10-13
JP2004310658 2004-10-26

Publications (2)

Publication Number Publication Date
TW200614888A true TW200614888A (en) 2006-05-01
TWI296183B TWI296183B (zh) 2008-04-21

Family

ID=36059811

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094122741A TW200614888A (en) 2004-09-16 2005-07-05 Method for correcting measurement error and device for measuring characteristic of electronic component

Country Status (3)

Country Link
JP (1) JP3965701B2 (zh)
TW (1) TW200614888A (zh)
WO (1) WO2006030547A1 (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008065791A1 (fr) * 2006-11-30 2008-06-05 Murata Manufacturing Co., Ltd. Procédé de correction d'erreur de caractéristiques hautes fréquences d'un composant électronique
WO2008066137A1 (fr) * 2006-11-30 2008-06-05 Murata Manufacturing Co., Ltd. Procédé et dispositif de correction d'erreur de caractéristique haute fréquence de composant électronique
WO2012105127A1 (ja) * 2011-01-31 2012-08-09 株式会社 村田製作所 測定誤差の補正方法及び電子部品特性測定装置
KR101831824B1 (ko) 2014-03-04 2018-02-23 가부시키가이샤 무라타 세이사쿠쇼 측정 오차의 보정 방법 및 전자부품 특성 측정 장치

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4967173A (en) * 1989-08-21 1990-10-30 Hewlett-Packard Company Short airline calibration standards and methods for error-corrected microwave network analysis
JP3558086B1 (ja) * 2003-03-05 2004-08-25 株式会社村田製作所 測定誤差の補正方法および電子部品特性測定装置

Also Published As

Publication number Publication date
JPWO2006030547A1 (ja) 2008-05-08
TWI296183B (zh) 2008-04-21
JP3965701B2 (ja) 2007-08-29
WO2006030547A1 (ja) 2006-03-23

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