TW200524487A - Phase change thermal interface materials including polyester resin - Google Patents
Phase change thermal interface materials including polyester resin Download PDFInfo
- Publication number
- TW200524487A TW200524487A TW093122775A TW93122775A TW200524487A TW 200524487 A TW200524487 A TW 200524487A TW 093122775 A TW093122775 A TW 093122775A TW 93122775 A TW93122775 A TW 93122775A TW 200524487 A TW200524487 A TW 200524487A
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- Prior art keywords
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- patent application
- thermal interface
- thermal
- thermally conductive
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- 239000000463 material Substances 0.000 title claims description 115
- 230000008859 change Effects 0.000 title abstract description 16
- 229920001225 polyester resin Polymers 0.000 title abstract description 7
- 239000004645 polyester resin Substances 0.000 title abstract description 7
- 239000011159 matrix material Substances 0.000 claims abstract description 22
- 229920000728 polyester Polymers 0.000 claims abstract description 16
- 239000000654 additive Substances 0.000 claims abstract description 7
- 238000002844 melting Methods 0.000 claims abstract description 7
- 230000008018 melting Effects 0.000 claims abstract description 7
- 229920005672 polyolefin resin Polymers 0.000 claims abstract description 4
- 239000004927 clay Substances 0.000 claims description 55
- 239000004020 conductor Substances 0.000 claims description 19
- 239000000758 substrate Substances 0.000 claims description 15
- 239000012782 phase change material Substances 0.000 claims description 13
- 239000002245 particle Substances 0.000 claims description 11
- 230000003647 oxidation Effects 0.000 claims description 10
- 238000007254 oxidation reaction Methods 0.000 claims description 10
- 229910000679 solder Inorganic materials 0.000 claims description 8
- 229910052751 metal Inorganic materials 0.000 claims description 7
- 239000002184 metal Substances 0.000 claims description 7
- 229920000098 polyolefin Polymers 0.000 claims description 7
- 230000005855 radiation Effects 0.000 claims description 7
- -1 hectrite Substances 0.000 claims description 6
- 239000003822 epoxy resin Substances 0.000 claims description 5
- 230000006872 improvement Effects 0.000 claims description 5
- 229920000647 polyepoxide Polymers 0.000 claims description 5
- 229920005989 resin Polymers 0.000 claims description 5
- 239000011347 resin Substances 0.000 claims description 5
- 238000007789 sealing Methods 0.000 claims description 5
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 claims description 4
- 239000000919 ceramic Substances 0.000 claims description 4
- 239000013078 crystal Substances 0.000 claims description 4
- 239000010445 mica Substances 0.000 claims description 4
- 229910052618 mica group Inorganic materials 0.000 claims description 4
- 229920001610 polycaprolactone Polymers 0.000 claims description 4
- 239000004632 polycaprolactone Substances 0.000 claims description 4
- 238000010521 absorption reaction Methods 0.000 claims description 3
- 238000005341 cation exchange Methods 0.000 claims description 3
- GUJOJGAPFQRJSV-UHFFFAOYSA-N dialuminum;dioxosilane;oxygen(2-);hydrate Chemical class O.[O-2].[O-2].[O-2].[Al+3].[Al+3].O=[Si]=O.O=[Si]=O.O=[Si]=O.O=[Si]=O GUJOJGAPFQRJSV-UHFFFAOYSA-N 0.000 claims description 3
- 239000000843 powder Substances 0.000 claims description 3
- 229910052582 BN Inorganic materials 0.000 claims description 2
- PZNSFCLAULLKQX-UHFFFAOYSA-N Boron nitride Chemical compound N#B PZNSFCLAULLKQX-UHFFFAOYSA-N 0.000 claims description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 2
- 239000004793 Polystyrene Substances 0.000 claims description 2
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 claims description 2
- RJDOZRNNYVAULJ-UHFFFAOYSA-L [O--].[O--].[O--].[O--].[O--].[O--].[O--].[O--].[O--].[O--].[F-].[F-].[Mg++].[Mg++].[Mg++].[Al+3].[Si+4].[Si+4].[Si+4].[K+] Chemical compound [O--].[O--].[O--].[O--].[O--].[O--].[O--].[O--].[O--].[O--].[F-].[F-].[Mg++].[Mg++].[Mg++].[Al+3].[Si+4].[Si+4].[Si+4].[K+] RJDOZRNNYVAULJ-UHFFFAOYSA-L 0.000 claims description 2
- 229910052782 aluminium Inorganic materials 0.000 claims description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 2
- 229910001919 chlorite Inorganic materials 0.000 claims description 2
- 229910052619 chlorite group Inorganic materials 0.000 claims description 2
- QBWCMBCROVPCKQ-UHFFFAOYSA-N chlorous acid Chemical compound OCl=O QBWCMBCROVPCKQ-UHFFFAOYSA-N 0.000 claims description 2
- 239000003086 colorant Substances 0.000 claims description 2
- 229910052802 copper Inorganic materials 0.000 claims description 2
- 239000010949 copper Substances 0.000 claims description 2
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 claims description 2
- 239000007822 coupling agent Substances 0.000 claims description 2
- 229910052738 indium Inorganic materials 0.000 claims description 2
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 2
- 229910052500 inorganic mineral Inorganic materials 0.000 claims description 2
- 238000004377 microelectronic Methods 0.000 claims description 2
- 239000011707 mineral Substances 0.000 claims description 2
- 239000003607 modifier Substances 0.000 claims description 2
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 claims description 2
- 229920000058 polyacrylate Polymers 0.000 claims description 2
- 229920001230 polyarylate Polymers 0.000 claims description 2
- 229920002223 polystyrene Polymers 0.000 claims description 2
- 229910052709 silver Inorganic materials 0.000 claims description 2
- 239000004332 silver Substances 0.000 claims description 2
- 239000003381 stabilizer Substances 0.000 claims description 2
- 239000004094 surface-active agent Substances 0.000 claims description 2
- 229910052718 tin Inorganic materials 0.000 claims description 2
- AZJYLVAUMGUUBL-UHFFFAOYSA-A u1qj22mc8e Chemical compound [F-].[F-].[F-].[F-].[F-].[F-].[F-].[F-].[F-].[F-].[F-].[F-].[F-].[F-].[F-].[F-].[F-].[F-].[Na+].[Na+].[Na+].[Na+].[Na+].[Na+].[Na+].[Na+].[Na+].[Na+].[Mg+2].[Mg+2].[Mg+2].[Mg+2].[Mg+2].[Mg+2].[Mg+2].[Mg+2].[Mg+2].[Mg+2].[Mg+2].[Mg+2].[Mg+2].[Mg+2].[Mg+2].[Mg+2].O=[Si]=O.O=[Si]=O.O=[Si]=O.O1[Si](O2)([O-])O[Si]3([O-])O[Si]1([O-])O[Si]2([O-])O3.O1[Si](O2)([O-])O[Si]3([O-])O[Si]1([O-])O[Si]2([O-])O3.O1[Si](O2)([O-])O[Si]3([O-])O[Si]1([O-])O[Si]2([O-])O3.O1[Si](O2)([O-])O[Si]3([O-])O[Si]1([O-])O[Si]2([O-])O3.O1[Si](O2)([O-])O[Si]3([O-])O[Si]1([O-])O[Si]2([O-])O3.O1[Si](O2)([O-])O[Si]3([O-])O[Si]1([O-])O[Si]2([O-])O3 AZJYLVAUMGUUBL-UHFFFAOYSA-A 0.000 claims description 2
- 239000000080 wetting agent Substances 0.000 claims description 2
- 239000011787 zinc oxide Substances 0.000 claims description 2
- 239000004575 stone Substances 0.000 claims 2
- VTYYLEPIZMXCLO-UHFFFAOYSA-L Calcium carbonate Chemical compound [Ca+2].[O-]C([O-])=O VTYYLEPIZMXCLO-UHFFFAOYSA-L 0.000 claims 1
- 239000013032 Hydrocarbon resin Substances 0.000 claims 1
- 230000000996 additive effect Effects 0.000 claims 1
- 239000000853 adhesive Substances 0.000 claims 1
- 230000001070 adhesive effect Effects 0.000 claims 1
- 150000001412 amines Chemical class 0.000 claims 1
- 229920006270 hydrocarbon resin Polymers 0.000 claims 1
- 229920000768 polyamine Polymers 0.000 claims 1
- 239000002689 soil Substances 0.000 claims 1
- 238000012360 testing method Methods 0.000 abstract description 5
- 239000011231 conductive filler Substances 0.000 abstract description 2
- 239000004065 semiconductor Substances 0.000 description 26
- 239000012071 phase Substances 0.000 description 15
- 239000002131 composite material Substances 0.000 description 12
- 229920000642 polymer Polymers 0.000 description 12
- 101710149792 Triosephosphate isomerase, chloroplastic Proteins 0.000 description 11
- 101710195516 Triosephosphate isomerase, glycosomal Proteins 0.000 description 11
- 238000000034 method Methods 0.000 description 10
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 9
- 238000012546 transfer Methods 0.000 description 8
- 239000000203 mixture Substances 0.000 description 6
- 239000003566 sealing material Substances 0.000 description 6
- 239000007789 gas Substances 0.000 description 5
- 238000009472 formulation Methods 0.000 description 4
- 239000000499 gel Substances 0.000 description 4
- LNEPOXFFQSENCJ-UHFFFAOYSA-N haloperidol Chemical compound C1CC(O)(C=2C=CC(Cl)=CC=2)CCN1CCCC(=O)C1=CC=C(F)C=C1 LNEPOXFFQSENCJ-UHFFFAOYSA-N 0.000 description 4
- 239000007787 solid Substances 0.000 description 4
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 3
- 230000015556 catabolic process Effects 0.000 description 3
- 238000006731 degradation reaction Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000009792 diffusion process Methods 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 3
- 238000007792 addition Methods 0.000 description 2
- 229910000278 bentonite Inorganic materials 0.000 description 2
- 239000000440 bentonite Substances 0.000 description 2
- SVPXDRXYRYOSEX-UHFFFAOYSA-N bentoquatam Chemical compound O.O=[Si]=O.O=[Al]O[Al]=O SVPXDRXYRYOSEX-UHFFFAOYSA-N 0.000 description 2
- 150000001768 cations Chemical class 0.000 description 2
- 229920006037 cross link polymer Polymers 0.000 description 2
- 238000004132 cross linking Methods 0.000 description 2
- 230000001351 cycling effect Effects 0.000 description 2
- 230000032798 delamination Effects 0.000 description 2
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 2
- 238000000605 extraction Methods 0.000 description 2
- 239000004519 grease Substances 0.000 description 2
- 229910052735 hafnium Inorganic materials 0.000 description 2
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 description 2
- 230000017525 heat dissipation Effects 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 238000003801 milling Methods 0.000 description 2
- 150000002892 organic cations Chemical class 0.000 description 2
- 230000035699 permeability Effects 0.000 description 2
- 229920005862 polyol Polymers 0.000 description 2
- 150000003077 polyols Chemical class 0.000 description 2
- 238000002411 thermogravimetry Methods 0.000 description 2
- 229920002799 BoPET Polymers 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 1
- 239000005041 Mylar™ Substances 0.000 description 1
- 239000004952 Polyamide Substances 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 150000003868 ammonium compounds Chemical class 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- VNSBYDPZHCQWNB-UHFFFAOYSA-N calcium;aluminum;dioxido(oxo)silane;sodium;hydrate Chemical compound O.[Na].[Al].[Ca+2].[O-][Si]([O-])=O VNSBYDPZHCQWNB-UHFFFAOYSA-N 0.000 description 1
- 125000002091 cationic group Chemical group 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000011437 continuous method Methods 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 239000003431 cross linking reagent Chemical group 0.000 description 1
- 239000011243 crosslinked material Substances 0.000 description 1
- 125000004122 cyclic group Chemical group 0.000 description 1
- 239000003085 diluting agent Substances 0.000 description 1
- 238000010130 dispersion processing Methods 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- 238000003621 hammer milling Methods 0.000 description 1
- 239000003779 heat-resistant material Substances 0.000 description 1
- 229910000271 hectorite Inorganic materials 0.000 description 1
- KWLMIXQRALPRBC-UHFFFAOYSA-L hectorite Chemical compound [Li+].[OH-].[OH-].[Na+].[Mg+2].O1[Si]2([O-])O[Si]1([O-])O[Si]([O-])(O1)O[Si]1([O-])O2 KWLMIXQRALPRBC-UHFFFAOYSA-L 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 239000012770 industrial material Substances 0.000 description 1
- 150000002632 lipids Chemical class 0.000 description 1
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- 229910052901 montmorillonite Inorganic materials 0.000 description 1
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- 235000006408 oxalic acid Nutrition 0.000 description 1
- 238000010525 oxidative degradation reaction Methods 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000012466 permeate Substances 0.000 description 1
- 238000005191 phase separation Methods 0.000 description 1
- 229910052615 phyllosilicate Inorganic materials 0.000 description 1
- 229920002647 polyamide Polymers 0.000 description 1
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- 238000012805 post-processing Methods 0.000 description 1
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- 238000010298 pulverizing process Methods 0.000 description 1
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- 229910000275 saponite Inorganic materials 0.000 description 1
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- 239000010703 silicon Substances 0.000 description 1
- 150000003384 small molecules Chemical class 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
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- 238000002076 thermal analysis method Methods 0.000 description 1
- 238000005382 thermal cycling Methods 0.000 description 1
- 230000000930 thermomechanical effect Effects 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 229910052902 vermiculite Inorganic materials 0.000 description 1
- 239000010455 vermiculite Substances 0.000 description 1
- 235000019354 vermiculite Nutrition 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 239000002918 waste heat Substances 0.000 description 1
- 229920003176 water-insoluble polymer Polymers 0.000 description 1
- 229920003169 water-soluble polymer Polymers 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
- 239000004711 α-olefin Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K5/00—Heat-transfer, heat-exchange or heat-storage materials, e.g. refrigerants; Materials for the production of heat or cold by chemical reactions other than by combustion
- C09K5/02—Materials undergoing a change of physical state when used
- C09K5/06—Materials undergoing a change of physical state when used the change of state being from liquid to solid or vice versa
- C09K5/063—Materials absorbing or liberating heat during crystallisation; Heat storage materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
- H01L23/06—Containers; Seals characterised by the material of the container or its electrical properties
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/50—Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
- H01L21/56—Encapsulations, e.g. encapsulation layers, coatings
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/02—Containers; Seals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3737—Organic materials with or without a thermoconductive filler
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/42—Fillings or auxiliary members in containers or encapsulations selected or arranged to facilitate heating or cooling
- H01L23/427—Cooling by change of state, e.g. use of heat pipes
- H01L23/4275—Cooling by change of state, e.g. use of heat pipes by melting or evaporation of solids
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L24/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29199—Material of the matrix
- H01L2224/2929—Material of the matrix with a principal constituent of the material being a polymer, e.g. polyester, phenolic based polymer, epoxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29298—Fillers
- H01L2224/29299—Base material
- H01L2224/293—Base material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/28—Structure, shape, material or disposition of the layer connectors prior to the connecting process
- H01L2224/29—Structure, shape, material or disposition of the layer connectors prior to the connecting process of an individual layer connector
- H01L2224/29001—Core members of the layer connector
- H01L2224/29099—Material
- H01L2224/29198—Material with a principal constituent of the material being a combination of two or more materials in the form of a matrix with a filler, i.e. being a hybrid material, e.g. segmented structures, foams
- H01L2224/29298—Fillers
- H01L2224/29299—Base material
- H01L2224/29386—Base material with a principal constituent of the material being a non metallic, non metalloid inorganic material
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
- H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
- H01L2224/321—Disposition
- H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
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Description
200524487 (1) 九、發明說明 【發明所屬之技術領域】 本發明係關於含聚酯樹脂之相變化熱界面材料(TIM5s) 和含此TIM’S的電子裝置。 【先前技術】 現今的半導體裝置,無論個別電源或邏輯積體電路, 都比較小,運轉的比較快,做的多且產生更多的熱。由於 提高的電力,有些桌上型微處理器會散發出介於50至 1 00瓦的熱。這些電力量需要熱管制技術,該技術涉及大 容量散熱座、良好的空氣流動及熱界面阻抗的細心管理。 設計良好的熱管制程序將使操作溫度保持在可接受的限度 內,以便使裝置性能與可靠度最佳化。 半導體裝置藉著將接合面產生的廢熱傳送至周圍環 境,例如周圍的室內空氣,而保持在其操作溫度限制內。 將散熱座接設於半導體封裝件表面,因而增加熱機殼與冷 空氣之間熱傳最谷易達到。選擇散熱座以提供最佳的熱效 能。一旦選定正確的散熱座,就必須將該散熱座小心地連 至半導體封裝件以確保通過此新形成的熱界面之有效熱 傳。 已經有熱材料用於接合半導體封裝件和散熱座,及散 發半導體裝置,例如微處理器的熱。TIM 一般都包含聚合 物基質和導熱性塡料。用於電子封裝件的tim技術包含 環氧樹脂、油脂、凝膠和相變化材料等數種材料。 200524487 (2) 普通塡充金屬的係熱固化成高度交聯材料的高傳導性 材料。然而,塡充金屬的環氧樹脂會由於封裝熱機械行爲 及其高模數導致界面脫層而具有局部相分離。 熱油脂展示良好的溼潤及順從界面的能力,無需分散 後加工及高總體熱傳導率。然而,油脂傾向受到溫度循環 期間的循環應力的作用而自界面之間往外遷移,習知稱爲 「抽出」的現象。 凝膠通常包含可交聯的砂氧院聚合物,例如具末端乙 烯基的矽氧烷聚合物、交聯劑和導熱性塡料。固化之後, 凝膠就變成交聯的塡料聚合物,且交聯反應可提供內聚強 度而能避開溫度循環期間油脂顯現的抽出問題。由於該交 聯的塡料聚合物之模數(E 5 )夠低,所以該材料可持續地驅 散內部應力,並防止界面脫層,但並無法低到可通過可靠 度-應力測試。 相變化材料(PCMs)屬於施加熱時會由固態轉變成液相 之類的材料。這些材料在室溫時呈固態,而在模具操作溫 度時呈液態。若呈液態,PCMs將易於順從表面,並提供 低材料界面阻抗。PCMs由於可製成膜狀且無需分散後加 工而易於處理及加工。然而,由配方的觀點來看,已經用 於PCMs的聚合物和塡料組合會限制這些材料的總體熱傳 導率。大體上抽出、滲出及乾出(dry-〇ut)都是相變化 TIMs的連續可靠度問題。商業上的相變化熱界面材料(例 如 C h 〇 m e r i c s T 4 5 4)皆係以聚燒烴爲主。因爲其經化學糸士 構’聚烯烴在氧化超過約1 2 5。(:時會迅速地降解,伴隨耐 200524487 (3) 熱性(Rja)相對提高;參見第1圖。這表示在操作溫度低 於約1 1 0 °C時會隨著時間有熱氧化降解的高風險性,但操 作溫度高於1 1 〇 °C時就無法應用。 【發明內容】 本發明提供形態與功能類似於現在的聚烯烴之基礎樹 脂,又提供明顯改良的熱氧化安定性,該熱氧化安定性可 供用於高接合溫度(Tj5s)應用之熱溶液及用於低Tj’s應用 之改良烘烤安定性。 通用配方 本發明之相變化TIM具體例包含熔融溫度接近或低 於操作溫度(通常都小於約l3〇°C )的聚酯基質、總體熱傳 導率大於約5 0 W/mK的導熱性塡料及視情況需要地其他 添加物。 比起聚烯烴樹脂,該聚酯樹脂具有改良的熱氧化安定 性,藉以提供改良的可靠度性能,特別是在烘烤及HAST 測試期間。 相變化TIΜ,s可用於各式各樣的應用。尤其可用作電 子封裝件與散熱座或加熱板之間的熱界面材料。該相變化 TIM ’ s可用於各式各樣的電子封裝件,包括有機覆晶、陶 瓷覆晶及引線接合的封裝件。視情況需要地,該封裝件可 包含散熱座及晶粒與散熱座之間的另一熱界面材料。該 TIM’S可作爲第一層TIM (在晶粒與散熱片之間)、作爲第 200524487 (4) 二層TIM (在散熱片與散熱座之間)及作爲裸露晶粒的TIM (在晶粒與加熱板或散熱座之間)。本發明的電子裝置具有 改良的可靠度性能。 相變化熱界面材料(PCM’s)包含一*或更多聚酷基質聚 合物、一或更多導熱性塡料及視情況需要之其他添加物。 PCM s可作爲自半導體封零件移除熱的熱界面材料,且目 有由聚酯樹脂之改良的熱氧化安定性得到的可靠度性能。 最好聚酯樹脂具有稍高於室溫(即,約4〇t ),並低於 電子裝置的操作溫度(通常低於約1 3 0 °c )的熔點。必要 時’該聚酯樹脂可包含交聯用的反應性基團。較佳的聚酯 樹脂係聚己內酯。必要時,可包括其他樹脂以改良/控制 所需的性質,例如模數、黏度及溼氣吸收度。樹脂添加物 的實施例包括聚烯烴、聚苯乙烯、聚丙烯酸酯、聚醯胺、 聚醯亞胺、聚芳酯、環氧樹脂等或其混合物。 導熱性塡料較佳應具有大於約5 0 W/mK之總體熱傳 導率。可用的塡料之實施例包括陶瓷物,例如氧化鋅、氧 化鋁、氮化硼、氮化鋁等;金屬類,例如鋁、銅、銀等; 焊料,例如銦、錫等;及其組合。一般而言,導熱性塡料 的量係約1 0至9 0重量百分比(重量% ),取決於所需的總 體熱傳導率之類的因素及塡料的選用。 可用的添加物之實施例包括界面活性劑、偶合劑、黏 著改質劑、濕潤劑、色料、安定劑等。爲了更進一步獲得 可靠度改良,可包括有機黏土材料以進一步改良熱氧化安 定性,並減少氣體和小分子擴散。 -7- 200524487 (5) PC M’s司藉由許多方法加以混合,包括批次式、半連 糸買式及連續式方法’視情況需要可使用溶劑或稀釋劑。本 發明有一具體例中’ PCM係製成含底層和離型層的薄膜 以爲現今此技藝已知的PCM,s之當下形式和功能的即用 式替代品。 【實施方式】 實施例 實施例1 此實施例係聚酯爲主的相變化熱界面材料之代表例, 該相變化熱界面材料具有明顯改良的熱氧化安定性:5 〇 克甲苯、5〇克熔點爲5(rc之聚己內酯(D〇w Chemicai Company股份有限公司的POLYOL 1 27 8®),及5 0克的 BN在8 0°C時在R0SS雙行星混合器中混合3小時。在3 密爾厚的M y 1 a r ®膜上使材料成形,並在1 0 0 °C時乾燥成 約1 3密爾之最終厚度。以界面測試機在9 〇 p s i和9 0 °C時 評估該材料發現具有〇 .〗t cm 2/W的熱阻抗。如第2圖說 明的’在空氣中的TGA分析顯示該材料在約200 °C以上 時會降解,在約3 〇 〇它之後有明顯的降解。 實施例2 此實施例係聚酯有機黏土奈米級複合材料爲主的相變 化熱界面材料之代表例,該相變化熱界面材料具有明顯改 良的熱氧化安定性:5 0克甲苯、5 0克熔點爲5 〇。(:之聚己 -8 - 200524487 (6)
內酉旨(Dow Chemical Company 股份有限公司的 POLYOL 1 2 7 8 ®)、49克的BN及2克有機黏土(Nanocor股份有限 公司的Nanomei*® I.30P)在8 0 °C時在Ro s s雙行星混合器 中混合3小時。在3密爾厚的Mylar⑧膜上使材料成形, 並在1 0 0 °C時乾燥成約1 3密爾之最終厚度。以界面測試 機在90 p si和90 °C時評估該材料發現具有〇. 1 °C cm 2/W的 熱阻抗。如弟2圖說明的’在空氣中的τ G A分析顯不該 材料在約2 〇 0 °C以上時會降解,在約3 2 0 °C之後有明顯的 降解。 比較實施例 此實施例係聚烯烴爲主的相變化熱界面材料之代表 例:50克甲苯、50克軟化點爲59°C之α-烯烴樹脂(Mitsui Chemicals America 股份有限公司的 ADMER® AT 1 03 0A) 及50克的BN在8〇°C時在Ross雙行星混合器中混合3小 時。在3密爾厚的M y 1 a r ®膜上使材料成形,並在 1 〇 〇 °C 時乾燥成約1 3密爾之最終厚度。以界面測試機在90 p si 和9 0°C時評估該材料發現具有〇. i °C Cm2/W的熱阻抗。如 第2圖說明的,在空氣中的TGA分析顯示該材料在約 2 〇 0 °C以上時會降解,在約2 0 (TC之後會發生明顯的降 解。 半導體封裝件 以下的圖式表示適用於半導體或電子裝置(例如,但 200524487 (7) 不限於’用於電腦的微處理器)之熱轉移裝置用的裝置和 方法。本發明的範圍並未明確地限於微處理器或一般的電 腦組件。本發明的範圍包括,但不限於,任何需要得益於 熱轉移裝置之裝置或儀器,該熱轉移裝置包括本發明的熱 界面材料。 第3圖說明使用本發明之具體例的半導體封裝件1 〇〇 之截面圖。該半導體封裝件100包括基材1〇1,該基材 101含有裝設於基材1〇1上表面的半導體裝置1〇3。該半 導體裝置1 0 3係內部形成積體電路的微電子晶粒。有一具 體例中,Μ基材1 0 1係印刷電路板。另一具體例中,該基 材1 0 1可爲不同的材料,例如矽或陶瓷。 半導體裝置103係經由多數焊料凸塊連接件1〇2,以 機械方式及電力方式連至基材101上表面。有某些具體例 中’可以環氧系底塡材料(未圖示)塡充間隙。基材1〇丨包 含至少一配線層(未圖示),該配線層以電力的方式連結至 Μ衣置沿者基材1 0 1底表面設置的針腳或球。將焊料球 1 〇2置於陣列中,且通常稱爲球格陣列。因爲半導體封裝 件1 03係翻過來放置,所以焊料球1 02可以電力及機械的 方式連結至基材1〇1的墊子或平台,該半導體裝置1〇3有 時候稱爲覆晶。 第一種散熱片]〇5形式的放熱板係以熱的方式接到半 導體裝置1 〇3的主要表面,該主要表面並未經由習知充當 熱界面材料的依從性熱轉移媒介1 〇4承載焊料球i 〇 2。有 一具體例中,熱界面材料係奈米級複合材料相變化熱界面 -10- 200524487 (8) 材料,該熱 導熱性塡料 化熱界面材 (無焊料球ί 105的對應 設半導體裝 進一步 封材料1 0 7 片1 〇 5之間 洞穴。使用 有更具彈性 或另一密封 1 〇 ]之間的 的熱傳導路 材料。經顯 代密封材料 使用熱 處的散熱片 第二放熱板 中,熱界面 一具體例中 變化熱界面 物、一或更 冷卻用的表 界面材料包括一或更多基質聚合物、一或更多 及一或更多黏土材料。該奈米級複合材料相變 料塡滿半導體裝置103背面的主要表面 1勺主要表面)和裝設半導體裝置〗之散熱片 表面中之小孔隙。半導體裝置〗〇 3的背面和裝 置103之散熱片1〇5的表面係熱界面。 用密封材料1 0 7將散熱片1 0 5裝設於基材。密 環繞著裝置103四周,並塡滿基材101與散熱 的間隙’形成含於裝置1 〇 3中之完全封起來的 密封材料1〇7可使基材1〇1與散熱片1〇5之間 的黏合。有一具體例中,密封材料可爲矽氧烷 材料。彈性黏合對於補償散熱片1〇5與基材 熱膨脹係數(CTE)差異有幫助,產生更—致性 經。另一具體例中,以鄰接的金屬壁代替密封 不密封材料1 〇7之運用可導致比利用金屬壁取 時更輕質的半導體封裝件1 0 0。 界面材料108將散熱座1〇6接設於另—熱界面 105 °散熱座106包括第二放熱板〗10和自該 110延伸出來之多數鰭片112。有一具體例 材料108與熱界面材料1〇4係相同的材料。另 ’熱界面材料;! 08係不同的奈米級複合材料相 材料’該熱界面材料包括一或更多基質聚合 夕導熱性塡料及一或更多黏土材料。由於增加 面積’所以散熱座1 〇 6能使熱更快驅散。要注 -11 - 200524487 Ο) 意的是有些具體例中,熱界面材米斗ι〇4和熱界面材 其中之-可能係奈米級複合材料相變化熱界面材料, 界面材料包括一或更多基質聚合物、一或更多導熱性 及一或更多黏土材料。有一種熱界面材料可爲另一類 面材料。熱界面材料通常都包括聚合物基質和導熱 料’並包含數類材料’例如環氧樹脂、油脂、凝膠及 化材料。同時也要注意的是第3圖係封裝件〗〇 〇之一 例’該封裝件1 0 0使用熱界面材料1 〇4、1 〇 8,且還 他類型的封裝件。再者,要注意如第1圖所示之熱界 料1 0 4的厚度和熱界面材料i 0 8的厚度對於要達到說 界面材料1 0 4和1 0 8的位置而言係厚的。如以下的方 禾口本文所示’跨越熱界面的熱傳阻抗直接地正比於界 厚度。因此,由於熱效率的緣故,所以希望使熱界面 能的薄。 半導體封裝件另一通用形式與第1圖所示者相似 此類的封裝件(有時候稱爲裸露晶粒)中,省略散熱片 和熱界面材料1 〇 8,並使散熱座的放熱板部分與T IΜ 104直接接觸。 橫越該界面的熱傳導速率,Q,表示如下: q = kA(Tc^Ts)
式中k係界面的熱傳導率,A係熱傳導面積,L f 108 該熱 塡料 熱界 性塡 相變 實施 有其 面材 明熱 程式 面的 儘可 。在 104 材料 係界 -12- 200524487 (10) 面厚度,且Tc和Ts係裝置機殼和散熱座溫度。接合面的 熱阻,Rc-s,表示如下 R c - s ^ (Tc-Ts)
Q 再整理之後, Ώ —L R c - s-- 0 因此,接合面的熱阻直接地正比於接合厚度,並反比 於構成接合面的媒介之熱傳導率及熱傳面積大小。藉著使 接合面僅可能薄,除去空隙中的空氣及二表面確實緊密接 觸而使熱阻降至最小。 將散熱座接設於半導體封裝件需要使二固體表面緊密 的接觸。不幸的是,無論準備得多好,固體表面都不曾真 正的平坦或夠平順而能緊密接觸。由於微觀的山峰和山谷 使得所有的表面都相當粗糙。疊在這樣表面粗糙度上的是 呈凹面、凸面或扭曲外形的巨觀非平面。若將二個此等表 面靠在一起,僅有表面的山峰可產生物理接觸。該熱界面 材料必須薄’且同時必須塡滿分開並形成塡滿空氣之間隙 的山谷。 黏土之添加 用作熱界面材料的奈米級複合材料相變化材料可包括 -13- 200524487 (11) 一或更多黏土材料。藉著使黏土剝落變成熱界面材料,該 黏土粒子將變得分散成具有高縱長比(通常大於2 〇 〇 )及高 表面積的極小片。因爲高縱長比和表面積,所以需要非常 小量的黏土’通常少於1 〇重量%,且像〇· 5重量%那麼少 就可提供熱界面材料以明顯的所需改良。該黏土粒子可藉 著使氧氣擴散及使水通過熱界面材料減慢而改良TIM的 可罪度和性能。最後得到的奈米級複合材料相變化材料具 有改良的局加速應力測試(「H A S T」)性能,並使用以減 少熱界面材料之抽出、滲出及乾出的揮發性成分之釋放減 慢。該黏土粒子也可改良 τ IΜ的熱氧化安定性,以便得 到改良的烘烤和熱循環(「TC」)性能。 本發明的PCM’s可包含少於含片狀粒子的黏土材料 之約2 5重量百分比,較佳少於約5重量百分比。大體而 言,可用於本發明的係個別片狀粒子像卡片緊密堆疊在一 起的凝集物,在此領域中稱爲類晶團聚體(tacto id)。黏土 的個別片狀粒子以具有小於約2奈米的厚度和大於約i 〇 奈米的直徑,一般都在約1〇至約3 000奈米爲宜。可用的 黏土材料包括天然的、合成的和改良的葉矽酸鹽類。天然 的黏土包括膨潤性黏土,例如蒙脫石、皂石、鋰蒙脫石 (hectorite)、雲母、蛭石、膨潤土、綠脫石、貝得石、鉻 嶺石、美格礦(magadite)、水羥矽鈉石等。合成的黏土包 括合成雲母、合成皂石、合成鋰蒙脫石等。改良的黏土包 括氟化的蒙脫石、氟化的雲母等。再者,層狀黏土材料一 般都是可膨潤的自由流動粉末,該粉末具有每克礦物質約 -14- 200524487 (12) 〇 . 3至約3.0毫當量(m e g / g )的陽離子交換容量,較佳地約 0.90 至約 1.5 meg/g。 在本發明的具體例中’夾在中間的層狀黏土材料係藉 由可膨潤層狀黏土與一或更多陽離子,較佳爲銨化合物的 反應,引發局部或完全的陽離子交換而製備,已知有許多 以有機陽離子改良層狀黏土的方法,這些當中的任何方法 皆可用以實現本發明。本發明有一具體例係藉由以下方 法,利用有機陽離子鹽進行層狀黏土之有機改質,將層狀 黏土或黏土混合物分散在熱水(5 0至8 0 t:)中,配合攪動 添加有機陽離子鹽(純的或溶於水或醇中),然後摻混一段 足以使有機陽離子可交換大部分在黏土材料層之間的通道 內之金屬陽離子的時.間。然後,藉由此技藝中習知的方法 分離以有機方式改良的層狀黏土材料,該方法包括過濾、 離心、噴霧乾燥及組合。一般而言,都藉由此技藝中習知 的方法使有機黏土減小爲小於約1 0 0微米的大小,該方法 包括磨粉、搗碎、粉碎、鎚磨、噴磨及其組合。 爲了達到協助複合材料剝離及/或改良聚合物/黏土界 面的強度之目的,可進一步處理黏土。任何可達到以上目 的之處理皆可使用。可用的處理方法實施例包括添加於水 溶性或水不可溶性聚合物、有機試劑或單體、矽烷化合 物、金屬或有機金屬及/或其組合中。 較佳地,使黏土分散於配方中,使大部分黏土材料以 個別片狀粒子、小類晶團聚體及尺寸小於約20奈米之小 類晶團聚體凝集物。以具有更高濃度片狀粒子和較少類晶 -15- 200524487 (13) 團聚體或凝集物爲宜。不欲受任何特定理論限制,咸相信 本發明的材料之改良性質係藉由片狀粒子可降低氣體和低 分子量成分通過本材料的擴散作用之獨特性質。 第4圖係可用於本發明的熱界面材料之具體例的層狀 黏土材料2 1 0槪略示意圖。該黏土會形成縱長比接近2〇〇 的層。如第4圖所示,黏土層220的厚度係將近1奈米。 黏土層220的長度係將近200奈米。第4圖也顯示用於本 發明之一具體例中的黏土結構。黏土層,例如層220,會 降低氣體和低分子量成分通過形成熱界面材料的奈米級複 合材料相變化材料的擴散速率。所說明的氣體和低分子成 分係如第2圖中的小圓形物體,例如2 3 0、2 3 2及2 3 4。 第5圖係形成黏土層及黏、土片狀產生的曲折路徑之黏 土片狀的槪略圖,根據本發明的具體例,該黏土片狀可使 奈米級複合材料的阻障獲得改良。用以解釋此改良之一理 論係曲折路徑理論,其中據說該滲透物,例如第4圖參考 編號23 0、23 2及:2 3 4說明的氣體和低分子成分,由於具 大長縱比的片狀粒子存在,所以會滲透較長的距離。第5 圖顯示三黏土片狀層310、312及314。以Pmatrix表示通 過此不含片狀之材料的路徑長度。以PNanoeomposite表示通 過含片狀3 1 0、3 1 2及3 1 4之材料的路徑長度。簡而言 之,與 Pmatrix相比,片狀 310、312及 314會產生使 P N a η。e。m p。s i t e的路徑長度變長之曲折路徑。 還有可用以表示阻障改良的曲折路徑機構之方程式, 如下: -16- 200524487 (14) p .= (基體體積分率)* (Pmatrix)
Nan〇C〇mP〇Slte 1 + (板餐體运雨* (板體縱長比)/ 2 式中 ·
P m a t r i X係單只有基質材料的渗透率 PNa n。。。mp。site係奈米級複合材料配方的滲透率 基質體積分率係基質(例如,聚合物和有機添加物)的 體積分率 II 片狀體積分率係黏土材料的體積分率 片狀縱長比係片狀的平均直徑比長度的測定 儘管附圖中已經說明並顯示某些例示性具體例,要瞭 解此等具體例僅爲例示,而非限制本發明,且因爲普通熟 習此技藝者可以想得到諸多修飾,所以本發明並不限於所 示及說明的特定解釋及配置。 【圖式簡帛^ 本發明係藉由實施例對照附圖加以說明,其中: - 第1圖係含習知C h 0 m e r i c s T 4 5 4相變化材料之測試 , 媒介在1 2 5 °C時烘烤的Rj a對時間圖形; 第2圖係熱分析材料(T GA)在空氣中的圖形,該圖形 顯示與 Chomerics之聚烯烴爲主的工業用材料t454相 比,實施例1及2的聚酯樹脂具有改良的熱氧化安定性; 第3圖係使用本發明的熱界面材料具體例之半導體封 裝件的截面圖; -17 - 200524487 (15) 第4圖係可用於本發明之熱界面材料具體例的層狀黏 土材料之槪略圖示;以及 第5圖係黏土片與該黏土片產生的曲折路徑的槪略圖 示’根據本發明,該曲折路徑會使奈米級複合材料獲得阻 障改良。 【主要元件符號說明】
1 〇 0半導體封裝件 101 基材 1 0 2焊料凸塊連接件 ]03 半導體裝置
1 0 4依從性熱轉移媒介 1 0 5散熱片 106散熱性 1 0 7 密封材料 1 〇8 熱界面材料 1 1 0第二放熱板 1 12鰭片 2 1 0層狀黏土材料 22〇黏土層 2 3 0 小的圓形物體 2 3 2 小的圓形物體 2 3 4 小的圓形物體 3 1 0黏土層或片狀 -18- 200524487 (16) 3 1 2黏土層或片狀 3 1 4黏土層或片狀
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Claims (1)
- 200524487 (1) 十、申請專利範圍 1. 一種電子封裝件,其包含: 第一裝置,包括含積體電路之微電 第一裝置,包括第一放熱板;以及 熱界面材料,係介於第一與第二裝 與第二裝置接觸,該熱界面材料包括: 至少一聚酯基質材料;以及 至少一分散於該聚酯基質材料 2 ·如申請專利範圍第1項之電子封 面材料係相變化材料。 3,如申請專利範圍第1項之電子封 基質材料具有介於4 0 t與1 3 〇 t之間的 4 .如申請專利範圍第1項之電子封 烴樹脂相比,該聚酯基質材料具有改良 5 .如申請專利範圍第1項之電子封 基質材料係聚己內酯。 6 ·如申請專利範圍第丨項之電子封 面材料進一步包括修飾模數、黏度及溼 一者的添加物。 7 .如申請專利範圍第6項之電子封 物係樹脂。 8 .如申請專利範圍第6項之電子封 物係聚烯烴、聚苯乙烯、聚丙烯酸酯、 胺' 聚芳酯及環氧樹脂中之至少一者。 子晶粒; 置之間,並與第一 內之導熱性塡料。 裝件,其中該熱界 裝件,其中該聚酯 熔點。 裝件,其中與聚烯 的熱氧化安定性。 裝件,其中該聚酯 裝件,其中該熱界 氣吸收度中之至少 裝件’其中該添加 裝件’其中該添加 聚醯胺、聚醯亞 -20- 200524487 (2) 9 .如申請專利範圍第1項之電子封裝件,其中該導熱 性塡料具有大於5 0 w/mK的總體熱傳導率。 1 0 .如申請專利範圍第1項之電子封裝件,其中該導 熱性ί具料包括陶瓷、金屬及焊料中之至少一者。 1 1 ·如申請專利範圍第1項之電子封裝件,其中該導 熱性塡料包括氧化鋅、氧化鋁、氮化硼、氮化鋁 '鋁、 銅、銀、銦及錫中之至少一者。 1 2.如申請專利範圍第1項之電子封裝件,其中該導 熱性塡料佔熱界面材料重量的1 0至9 0 %。 1 3 .如申請專利範圍第1項之電子封裝件,其中該導 熱性塡料進一步包栝界面活性劑、偶合劑、黏著改質劑、 濕潤劑、色料及安定劑中之至少一者。, 1 4 .如申請專利範圍第1項之電子封裝件,其中該導 熱性塡料進一步包括黏土。 1 5 .如申請專利範圍第1 4項之電子封裝件,其中該黏 土的個別片狀粒子具有小於2奈米的厚度及大於1 〇奈米 的直徑。 1 6 .如申請專利範圍第1 4項之電子封裝件,其中該黏 土包括豕脫石、巷石、鋰蒙脫石(hect〇rite)、雲母、虫至 石、k潤土 、綠脫石、貝得石、鉻嶺石、美格礦 (magadite)、水羥矽鈉石、合成雲母、合成皂石、合成鋰 蒙脫石 '氟化的蒙脫石及氟化的雲母中之至少一者。 1 7 ·如申請專利範圍第1 4項之電子封裝件,其中該黏 土係可膨潤的自由流動粉末,該粉末具有每克礦物質約 >21 - 200524487 (3) 0.〇至約3.0毫當量(meq/g)的陽離子交換容量。 8 .如申請專利範圍第1項之電子封裝件,其中使該 熱界面材料與一側上的晶粒及相反側上的放熱板接觸。 1 9 .如申請專利範圍第1項之電子封裝件,其中該第 衣巳括以熱力方式連至晶粒的第二放熱板、該熱界面 材料在一側上與第二放熱板接觸並在相反側上與第一放熱 板接觸。 20·~種熱界面材料,其包含: 至少一聚酯基質材料;以及 至少一分散在聚酯基質材料中的導熱性塡料。 2 1 .如申請專利範圍第2〇項之熱界面材料,其中該熱 界面材料係相變化材料.。 2 2.如申請專利範圍第2〇項之熱界面材料,其中該聚 酯基質材料係聚己內酯。 2 3 ·如申請專利範圍第2 〇項之熱界面材料,其中該導 熱性塡料佔熱界面材料之1 〇重量%至9 〇重量%。 2 4 .如申請專利範圍第2 3項之熱界面材料,其中該導 熱性塡料進一步包括黏土。 25.—種熱界面材料,其包含: 至少一聚酯基質材料,其具有介於4〇它與1;3(rc之間 的熔融溫度,及與聚烯烴樹脂相比,具有改良的熱氧化安 定性;以及 至少一導熱性塡料,其具有大於5 〇 w / m K之總體熱 傳導率’並佔聚酯基質材料與導熱性塡料之組合的1 〇重 -22- 200524487 (4) 量%至9 0重量%。 2 6 .如申請專利範圍第2 5項之熱界面材料,其中該導 熱性塡料進一步包含樹脂添加物以改良模數、黏度及溼氣 吸收度中之至少一者。 2 7.如申請專利範圍第25項之熱界面材料,其中該導 熱性塡料進一步包括黏土。-23-
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US10/631,912 US7408787B2 (en) | 2003-07-30 | 2003-07-30 | Phase change thermal interface materials including polyester resin |
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US (1) | US7408787B2 (zh) |
EP (1) | EP1654759B1 (zh) |
KR (1) | KR101181102B1 (zh) |
CN (1) | CN100477182C (zh) |
AT (1) | ATE547810T1 (zh) |
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WO (1) | WO2005013362A1 (zh) |
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ATE547810T1 (de) | 2012-03-15 |
US7408787B2 (en) | 2008-08-05 |
CN100477182C (zh) | 2009-04-08 |
KR20060059989A (ko) | 2006-06-02 |
KR101181102B1 (ko) | 2012-09-07 |
US20050041406A1 (en) | 2005-02-24 |
EP1654759B1 (en) | 2012-02-29 |
CN1830082A (zh) | 2006-09-06 |
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EP1654759A1 (en) | 2006-05-10 |
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