TW200516268A - Signal integrity self-test architecture - Google Patents
Signal integrity self-test architectureInfo
- Publication number
- TW200516268A TW200516268A TW093114805A TW93114805A TW200516268A TW 200516268 A TW200516268 A TW 200516268A TW 093114805 A TW093114805 A TW 093114805A TW 93114805 A TW93114805 A TW 93114805A TW 200516268 A TW200516268 A TW 200516268A
- Authority
- TW
- Taiwan
- Prior art keywords
- signal integrity
- test architecture
- module
- integrity self
- self
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/30—Marginal testing, e.g. by varying supply voltage
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318505—Test of Modular systems, e.g. Wafers, MCM's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31722—Addressing or selecting of test units, e.g. transmission protocols for selecting test units
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
- G11C29/30—Accessing single arrays
- G11C2029/3202—Scan chain
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/50—Marginal testing, e.g. race, voltage or current testing
- G11C2029/5002—Characteristic
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP03101562 | 2003-05-28 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200516268A true TW200516268A (en) | 2005-05-16 |
Family
ID=33484000
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093114805A TW200516268A (en) | 2003-05-28 | 2004-05-25 | Signal integrity self-test architecture |
Country Status (7)
Country | Link |
---|---|
US (1) | US7478302B2 (zh) |
EP (1) | EP1644748A2 (zh) |
JP (1) | JP2007500356A (zh) |
KR (1) | KR20060019556A (zh) |
CN (1) | CN1795393B (zh) |
TW (1) | TW200516268A (zh) |
WO (1) | WO2004106957A2 (zh) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100731106B1 (ko) * | 2005-12-29 | 2007-06-22 | 동부일렉트로닉스 주식회사 | 라이브러리 테스트 회로 및 그 방법 |
KR100884983B1 (ko) * | 2007-06-26 | 2009-02-23 | 주식회사 동부하이텍 | 표준 셀 라이브러리의 성능 개선을 위한 측정 장치 |
US8118122B2 (en) * | 2007-10-25 | 2012-02-21 | GM Global Technology Operations LLC | Method and system for monitoring signal integrity in a distributed controls system |
EP2286256B1 (en) * | 2008-05-29 | 2012-05-16 | Nxp B.V. | Dll for period jitter measurement |
CN101770967A (zh) * | 2009-01-03 | 2010-07-07 | 上海芯豪微电子有限公司 | 一种共用基底集成电路测试方法、装置和系统 |
US9311202B2 (en) * | 2012-11-01 | 2016-04-12 | Futurewei Technologies, Inc. | Network processor online logic test |
TWI589892B (zh) | 2015-04-22 | 2017-07-01 | 威盛電子股份有限公司 | 傳輸介面晶片以及內建式傳輸介面晶片測試方法 |
KR102342851B1 (ko) | 2015-08-17 | 2021-12-23 | 삼성전자주식회사 | 반도체 칩, 테스트 시스템 및 반도체 칩의 테스트 방법 |
US10585817B2 (en) | 2018-05-29 | 2020-03-10 | Seagate Technology Llc | Method of signal integrity and power integrity analysis for address bus |
US10990739B1 (en) | 2019-03-27 | 2021-04-27 | Amazon Technologies, Inc. | Scan channel fabric for tiled circuit designs |
KR102657135B1 (ko) * | 2019-05-15 | 2024-04-15 | 삼성디스플레이 주식회사 | 송수신 시스템 |
CN112198422A (zh) * | 2020-10-19 | 2021-01-08 | 南京宏泰半导体科技有限公司 | 一种高速信号频率测量与信号完整性的测试方法 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4860290A (en) * | 1987-06-02 | 1989-08-22 | Texas Instruments Incorporated | Logic circuit having individually testable logic modules |
US5379308A (en) * | 1992-04-20 | 1995-01-03 | Intel Corporation | Apparatus for a bus-based integrated circuit test architecture |
US5459737A (en) * | 1993-07-07 | 1995-10-17 | National Semiconductor Corporation | Test access port controlled built in current monitor for IC devices |
JPH07159496A (ja) | 1993-10-12 | 1995-06-23 | At & T Global Inf Solutions Internatl Inc | 集積回路の検査のための装置及びその方法 |
US5418470A (en) * | 1993-10-22 | 1995-05-23 | Tektronix, Inc. | Analog multi-channel probe system |
US5894224A (en) | 1996-06-06 | 1999-04-13 | U.S. Philips Corporation | Method of testing a connection which includes a conductor in an integrated circuit |
US5734661A (en) * | 1996-09-20 | 1998-03-31 | Micron Technology, Inc. | Method and apparatus for providing external access to internal integrated circuit test circuits |
US6239604B1 (en) * | 1996-10-04 | 2001-05-29 | U.S. Philips Corporation | Method for inspecting an integrated circuit by measuring a voltage drop in a supply line of sub-circuit thereof |
US6134675A (en) * | 1998-01-14 | 2000-10-17 | Motorola Inc. | Method of testing multi-core processors and multi-core processor testing device |
KR100832187B1 (ko) * | 1998-08-24 | 2008-05-23 | 가부시키가이샤 히타치세이사쿠쇼 | 반도체 집적회로 |
US6421626B1 (en) * | 1998-11-06 | 2002-07-16 | Stmicroelectronics, Inc.. | Low voltage/low power temperature sensor |
US6687863B1 (en) * | 1999-07-29 | 2004-02-03 | Matsushita Electric Industrial Co., Ltd. | Integrated circuit internal signal monitoring apparatus |
US6560663B1 (en) * | 1999-09-02 | 2003-05-06 | Koninklijke Philips Electronics N.V. | Method and system for controlling internal busses to prevent bus contention during internal scan testing |
US6829730B2 (en) * | 2001-04-27 | 2004-12-07 | Logicvision, Inc. | Method of designing circuit having multiple test access ports, circuit produced thereby and method of using same |
DE60218498T2 (de) * | 2001-09-20 | 2007-11-08 | Koninklijke Philips Electronics N.V. | Elektronisches gerät |
US6842022B2 (en) * | 2002-09-20 | 2005-01-11 | Agilent Technologies, Inc. | System and method for heterogeneous multi-site testing |
US6823293B2 (en) * | 2002-12-31 | 2004-11-23 | International Business Machines Corporation | Hierarchical power supply noise monitoring device and system for very large scale integrated circuits |
-
2004
- 2004-05-18 WO PCT/IB2004/050731 patent/WO2004106957A2/en active Application Filing
- 2004-05-18 KR KR1020057022535A patent/KR20060019556A/ko not_active Application Discontinuation
- 2004-05-18 US US10/557,679 patent/US7478302B2/en active Active
- 2004-05-18 JP JP2006530879A patent/JP2007500356A/ja not_active Withdrawn
- 2004-05-18 EP EP04733617A patent/EP1644748A2/en not_active Ceased
- 2004-05-18 CN CN2004800146864A patent/CN1795393B/zh active Active
- 2004-05-25 TW TW093114805A patent/TW200516268A/zh unknown
Also Published As
Publication number | Publication date |
---|---|
WO2004106957A3 (en) | 2005-03-31 |
EP1644748A2 (en) | 2006-04-12 |
CN1795393B (zh) | 2010-06-02 |
CN1795393A (zh) | 2006-06-28 |
JP2007500356A (ja) | 2007-01-11 |
US20070079188A1 (en) | 2007-04-05 |
KR20060019556A (ko) | 2006-03-03 |
US7478302B2 (en) | 2009-01-13 |
WO2004106957A2 (en) | 2004-12-09 |
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