TW200510744A - Comparator circuit, calibration apparatus, testing apparatus, and calibration method - Google Patents
Comparator circuit, calibration apparatus, testing apparatus, and calibration methodInfo
- Publication number
- TW200510744A TW200510744A TW093127412A TW93127412A TW200510744A TW 200510744 A TW200510744 A TW 200510744A TW 093127412 A TW093127412 A TW 093127412A TW 93127412 A TW93127412 A TW 93127412A TW 200510744 A TW200510744 A TW 200510744A
- Authority
- TW
- Taiwan
- Prior art keywords
- timing
- calibration
- testing apparatus
- signals
- testing
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
- G01R31/31932—Comparators
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31908—Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns
- G01R31/3191—Calibration
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003316484 | 2003-09-09 |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200510744A true TW200510744A (en) | 2005-03-16 |
TWI284210B TWI284210B (en) | 2007-07-21 |
Family
ID=34308456
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW093127412A TWI284210B (en) | 2003-09-09 | 2004-09-09 | Comparator circuit, calibration apparatus, testing apparatus, and calibration method |
Country Status (8)
Country | Link |
---|---|
US (1) | US7389190B2 (zh) |
EP (3) | EP2081036A3 (zh) |
JP (1) | JP4313799B2 (zh) |
KR (1) | KR100767739B1 (zh) |
CN (1) | CN100529783C (zh) |
DE (1) | DE602004024903D1 (zh) |
TW (1) | TWI284210B (zh) |
WO (1) | WO2005026759A1 (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101788898B (zh) * | 2006-03-21 | 2012-07-04 | 联发科技股份有限公司 | 存储器装置 |
TWI393911B (zh) * | 2005-06-27 | 2013-04-21 | Advantest Singapore Pte Ltd | 用以校準自動化電路測試系統之方法 |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2006092173A1 (en) * | 2005-03-02 | 2006-09-08 | Agilent Technologies, Inc. | Analog signal test using a-priori information |
US7480581B2 (en) * | 2006-06-27 | 2009-01-20 | Teradyne, Inc. | Calibrating a testing device |
JP2008102060A (ja) * | 2006-10-20 | 2008-05-01 | Yokogawa Electric Corp | 半導体試験装置のタイミング校正回路及びタイミング校正方法 |
US7511645B1 (en) * | 2007-03-27 | 2009-03-31 | National Semiconductor Corporation | Apparatus and method for auto-zeroing a sampled comparator |
JP5274550B2 (ja) * | 2008-05-09 | 2013-08-28 | 株式会社アドバンテスト | デジタル変調信号の試験装置、ならびにデジタル変調器、変調方法およびそれを用いた半導体装置 |
CN101339052B (zh) * | 2008-08-11 | 2010-06-09 | 山东力创科技有限公司 | 幅度频率变化差异比较式采样器 |
TWI381175B (zh) * | 2008-10-15 | 2013-01-01 | Inventec Corp | 電子元件之測量方法及其測量裝置 |
WO2012125719A2 (en) | 2011-03-14 | 2012-09-20 | Rambus Inc. | Methods and apparatus for testing inaccessible interface circuits in a semiconductor device |
US8692538B2 (en) * | 2011-06-09 | 2014-04-08 | Teradyne, Inc. | Test equipment calibration |
US8760188B2 (en) * | 2011-06-30 | 2014-06-24 | Silicon Image, Inc. | Configurable multi-dimensional driver and receiver |
US9071243B2 (en) | 2011-06-30 | 2015-06-30 | Silicon Image, Inc. | Single ended configurable multi-mode driver |
CN103078723B (zh) * | 2012-12-31 | 2015-08-19 | 华为技术有限公司 | 非整数倍并串映射的多路复用器数据延时的校准方法及装置 |
TWI562541B (en) * | 2015-12-09 | 2016-12-11 | Chroma Ate Inc | Wave form generating apparatus capable of calibration and calibrating method thereof |
US9813050B1 (en) * | 2016-04-13 | 2017-11-07 | Analog Devices, Inc. | Comparator circuit with input attenuator |
US10132846B2 (en) * | 2016-06-14 | 2018-11-20 | Analog Devices Global | Method of and apparatus for learning the phase error or timing delays within a current transducer and power measurement apparatus including current transducer error correction |
CN108089575B (zh) * | 2016-11-23 | 2021-08-10 | 苏州宝时得电动工具有限公司 | 自移动设备定位装置和方法 |
CN108427089B (zh) * | 2018-03-22 | 2020-07-24 | 中国南方电网有限责任公司超高压输电公司检修试验中心 | 一种非接触分布式测距系统的测试系统及方法 |
CN108562839A (zh) | 2018-03-28 | 2018-09-21 | 鄂尔多斯市源盛光电有限责任公司 | 一种测试电路及其测试方法、测试系统 |
JP7450804B2 (ja) | 2021-04-28 | 2024-03-15 | 株式会社アドバンテスト | 複数の自動試験装置チャネルを較正するための回路および方法 |
CN114499486B (zh) * | 2021-09-06 | 2023-03-21 | 上海芯圣电子股份有限公司 | 一种抗噪声的触摸按键集成电路 |
CN114371761A (zh) * | 2021-12-13 | 2022-04-19 | 中电科思仪科技股份有限公司 | 任意波形发生器输出信号电压摆幅的自校准电路及方法 |
Family Cites Families (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4523143A (en) * | 1982-06-18 | 1985-06-11 | Fairchild Camera And Instrument Corporation | Digital logic level comparator particularly for digital test systems |
US4641246A (en) * | 1983-10-20 | 1987-02-03 | Burr-Brown Corporation | Sampling waveform digitizer for dynamic testing of high speed data conversion components |
US4807147A (en) * | 1983-10-20 | 1989-02-21 | Burr-Brown Corporation | Sampling wave-form digitizer for dynamic testing of high speed data conversion components |
JPH0787011B2 (ja) * | 1987-10-21 | 1995-09-20 | ティアツク株式会社 | 2次歪除去回路 |
JP2688941B2 (ja) * | 1988-08-29 | 1997-12-10 | 株式会社アドバンテスト | 位相補正装置 |
US5353243A (en) * | 1989-05-31 | 1994-10-04 | Synopsys Inc. | Hardware modeling system and method of use |
JP2517456Y2 (ja) * | 1990-04-20 | 1996-11-20 | 株式会社アドバンテスト | アナログicテスタの校正用治具 |
JP2517456B2 (ja) | 1990-07-20 | 1996-07-24 | 三洋電機株式会社 | 液体供給装置 |
US5194818A (en) * | 1991-02-27 | 1993-03-16 | National Semiconductor Corporation | Risetime and falltime test system and method |
JP3197325B2 (ja) * | 1992-03-12 | 2001-08-13 | 岩崎通信機株式会社 | 光信号を用いた半導体試験装置 |
US5473666A (en) * | 1992-09-11 | 1995-12-05 | Reliance Comm/Tec Corporation | Method and apparatus for digitally controlling gain in a talking path |
US5646948A (en) * | 1993-09-03 | 1997-07-08 | Advantest Corporation | Apparatus for concurrently testing a plurality of semiconductor memories in parallel |
US5761210A (en) * | 1995-06-07 | 1998-06-02 | Discovision Associates | Signal processing apparatus and method |
JP3508489B2 (ja) * | 1997-07-29 | 2004-03-22 | 安藤電気株式会社 | プログラマブル比較器のキャリブレーション装置 |
JPH11237454A (ja) * | 1998-02-20 | 1999-08-31 | Advantest Corp | 半導体試験装置 |
KR19990084337A (ko) * | 1998-05-04 | 1999-12-06 | 장정곤 | 플리커메터 출력분석방법 및 그 장치 |
JP3569154B2 (ja) * | 1998-05-19 | 2004-09-22 | 株式会社アドバンテスト | 半導体デバイス試験装置及びそのキャリブレーション方法 |
US6242899B1 (en) * | 1998-06-13 | 2001-06-05 | Lecroy Corporation | Waveform translator for DC to 75 GHz oscillography |
JP2000314764A (ja) * | 1999-05-06 | 2000-11-14 | Advantest Corp | Ic試験装置のタイミング校正方法及びこの校正方法に用いるショートデバイス |
JP2000352578A (ja) | 1999-06-09 | 2000-12-19 | Advantest Corp | Ic試験装置のタイミング校正方法及びこのタイミング校正方法を用いたic試験装置 |
KR100402653B1 (ko) * | 1999-08-16 | 2003-10-22 | 가부시키가이샤 아드반테스트 | Ic 시험장치의 타이밍 교정방법 및 그 교정방법을이용한 교정기능을 갖는 ic 시험장치 |
US6281699B1 (en) * | 2000-03-15 | 2001-08-28 | Teradyne, Inc. | Detector with common mode comparator for automatic test equipment |
JP4291494B2 (ja) * | 2000-04-04 | 2009-07-08 | 株式会社アドバンテスト | Ic試験装置のタイミング校正装置 |
CN100573176C (zh) * | 2001-06-07 | 2009-12-23 | 株式会社艾德温特斯特 | 半导体试验装置的校准方法 |
JP3994713B2 (ja) * | 2001-10-03 | 2007-10-24 | 日本電気株式会社 | 波形測定用半導体集積回路 |
WO2003044550A1 (fr) | 2001-11-20 | 2003-05-30 | Advantest Corporation | Testeur de semi-conducteur |
-
2004
- 2004-09-08 JP JP2005513879A patent/JP4313799B2/ja not_active Expired - Fee Related
- 2004-09-08 CN CNB2004800253353A patent/CN100529783C/zh active Active
- 2004-09-08 KR KR1020067003814A patent/KR100767739B1/ko not_active IP Right Cessation
- 2004-09-08 US US10/569,654 patent/US7389190B2/en not_active Expired - Fee Related
- 2004-09-08 WO PCT/JP2004/013065 patent/WO2005026759A1/ja active Application Filing
- 2004-09-08 EP EP09004194A patent/EP2081036A3/en not_active Withdrawn
- 2004-09-08 EP EP04787748A patent/EP1669768B1/en not_active Expired - Fee Related
- 2004-09-08 DE DE602004024903T patent/DE602004024903D1/de active Active
- 2004-09-08 EP EP08014756A patent/EP1990644A3/en not_active Withdrawn
- 2004-09-09 TW TW093127412A patent/TWI284210B/zh not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI393911B (zh) * | 2005-06-27 | 2013-04-21 | Advantest Singapore Pte Ltd | 用以校準自動化電路測試系統之方法 |
CN101788898B (zh) * | 2006-03-21 | 2012-07-04 | 联发科技股份有限公司 | 存储器装置 |
Also Published As
Publication number | Publication date |
---|---|
CN1846141A (zh) | 2006-10-11 |
US20060267637A1 (en) | 2006-11-30 |
EP2081036A2 (en) | 2009-07-22 |
CN100529783C (zh) | 2009-08-19 |
EP2081036A8 (en) | 2010-06-23 |
EP1990644A3 (en) | 2009-09-30 |
DE602004024903D1 (de) | 2010-02-11 |
US7389190B2 (en) | 2008-06-17 |
TWI284210B (en) | 2007-07-21 |
EP1669768B1 (en) | 2009-12-30 |
EP1669768A1 (en) | 2006-06-14 |
JP4313799B2 (ja) | 2009-08-12 |
WO2005026759A1 (ja) | 2005-03-24 |
EP1990644A2 (en) | 2008-11-12 |
EP2081036A3 (en) | 2010-06-09 |
KR100767739B1 (ko) | 2007-10-17 |
KR20060060701A (ko) | 2006-06-05 |
JPWO2005026759A1 (ja) | 2007-11-08 |
EP1669768A4 (en) | 2008-01-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |