TW200420517A - High concentration silica slurry - Google Patents
High concentration silica slurryInfo
- Publication number
- TW200420517A TW200420517A TW092132959A TW92132959A TW200420517A TW 200420517 A TW200420517 A TW 200420517A TW 092132959 A TW092132959 A TW 092132959A TW 92132959 A TW92132959 A TW 92132959A TW 200420517 A TW200420517 A TW 200420517A
- Authority
- TW
- Taiwan
- Prior art keywords
- less
- silica
- high concentration
- particle size
- ppm
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B33/00—Silicon; Compounds thereof
- C01B33/113—Silicon oxides; Hydrates thereof
- C01B33/12—Silica; Hydrates thereof, e.g. lepidoic silicic acid
- C01B33/14—Colloidal silica, e.g. dispersions, gels, sols
- C01B33/141—Preparation of hydrosols or aqueous dispersions
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B33/00—Silicon; Compounds thereof
- C01B33/113—Silicon oxides; Hydrates thereof
- C01B33/12—Silica; Hydrates thereof, e.g. lepidoic silicic acid
- C01B33/14—Colloidal silica, e.g. dispersions, gels, sols
- C01B33/141—Preparation of hydrosols or aqueous dispersions
- C01B33/1415—Preparation of hydrosols or aqueous dispersions by suspending finely divided silica in water
- C01B33/1417—Preparation of hydrosols or aqueous dispersions by suspending finely divided silica in water an aqueous dispersion being obtained
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Dispersion Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Silicon Compounds (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002339402 | 2002-11-22 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200420517A true TW200420517A (en) | 2004-10-16 |
Family
ID=32212141
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW092132959A TW200420517A (en) | 2002-11-22 | 2003-11-21 | High concentration silica slurry |
Country Status (8)
Country | Link |
---|---|
US (1) | US7192461B2 (zh) |
EP (1) | EP1422277B1 (zh) |
JP (1) | JPWO2004048265A1 (zh) |
KR (1) | KR100688300B1 (zh) |
CN (1) | CN1328163C (zh) |
DE (1) | DE60311053T2 (zh) |
TW (1) | TW200420517A (zh) |
WO (1) | WO2004048265A1 (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1323124C (zh) * | 1996-09-30 | 2007-06-27 | 日立化成工业株式会社 | 氧化铈研磨剂以及基板的研磨方法 |
JPH11181403A (ja) * | 1997-12-18 | 1999-07-06 | Hitachi Chem Co Ltd | 酸化セリウム研磨剤及び基板の研磨法 |
JP4640981B2 (ja) * | 2005-11-25 | 2011-03-02 | 花王株式会社 | 基板の製造方法 |
DE102006046619A1 (de) * | 2006-09-29 | 2008-04-03 | Heraeus Quarzglas Gmbh & Co. Kg | Streichfähiger SiO2-Schlicker für die Herstellung von Quarzglas, Verfahren zur Herstellung von Quarzglas unter Einsatz des Schlickers |
US20110177623A1 (en) * | 2010-01-15 | 2011-07-21 | Confluense Llc | Active Tribology Management of CMP Polishing Material |
Family Cites Families (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3673104A (en) * | 1969-04-28 | 1972-06-27 | Nalco Chemical Co | Method of preparing silica sols containing large particle size silica |
US4588421A (en) * | 1984-10-15 | 1986-05-13 | Nalco Chemical Company | Aqueous silica compositions for polishing silicon wafers |
JPS6230333A (ja) | 1985-05-20 | 1987-02-09 | ナルコ ケミカル カンパニ− | シリコンウエ−ハの研磨方法及び組成物 |
US5030286A (en) * | 1988-09-22 | 1991-07-09 | Ppg Industries, Inc. | High solids aqueous silica slurry |
JPH05154760A (ja) | 1991-12-02 | 1993-06-22 | Fujimi Inkooporeetetsudo:Kk | シリコンウエーハの研磨用組成物及び研磨方法 |
KR19990023544A (ko) * | 1997-08-19 | 1999-03-25 | 마쯔모또 에이찌 | 무기 입자의 수성 분산체와 그의 제조 방법 |
JPH11349925A (ja) * | 1998-06-05 | 1999-12-21 | Fujimi Inc | エッジポリッシング用組成物 |
JP4500380B2 (ja) | 1999-08-11 | 2010-07-14 | 株式会社トクヤマ | ヒュームドシリカスラリーの製造方法 |
DE19943103A1 (de) * | 1999-09-09 | 2001-03-15 | Wacker Chemie Gmbh | Hochgefüllte SiO2-Dispersion, Verfahren zu ihrer Herstellung und Verwendung |
WO2001032799A1 (en) * | 1999-11-04 | 2001-05-10 | Nanogram Corporation | Particle dispersions |
JP2001152134A (ja) * | 1999-11-22 | 2001-06-05 | Speedfam Co Ltd | 酸化物単結晶ウェーハ用研磨用組成物及び酸化物単結晶ウェーハの研磨方法 |
JP4156175B2 (ja) | 2000-05-31 | 2008-09-24 | 山口精研工業株式会社 | タンタル酸リチウム/ニオブ酸リチウム単結晶材料用精密研磨組成物 |
JP4789080B2 (ja) * | 2000-06-20 | 2011-10-05 | 日本アエロジル株式会社 | 非晶質微細シリカ粒子の製造方法 |
US6740589B2 (en) * | 2000-11-30 | 2004-05-25 | Showa Denko Kabushiki Kaisha | Composition for polishing semiconductor wafer, semiconductor circuit wafer, and method for producing the same |
DE10065027A1 (de) * | 2000-12-23 | 2002-07-04 | Degussa | Wäßrige Dispersion, Verfahren zu deren Herstellung und Verwendung |
US6857824B2 (en) * | 2001-10-18 | 2005-02-22 | Akzo Nobel N.V. | Sealing composition and its use |
JP3965497B2 (ja) * | 2001-12-28 | 2007-08-29 | 日本アエロジル株式会社 | 低増粘性フュームドシリカおよびそのスラリー |
US7544726B2 (en) * | 2002-10-14 | 2009-06-09 | Akzo Nobel N.V. | Colloidal silica composition |
-
2003
- 2003-11-21 KR KR1020057008415A patent/KR100688300B1/ko not_active IP Right Cessation
- 2003-11-21 DE DE60311053T patent/DE60311053T2/de not_active Expired - Fee Related
- 2003-11-21 TW TW092132959A patent/TW200420517A/zh unknown
- 2003-11-21 WO PCT/JP2003/014879 patent/WO2004048265A1/ja active Application Filing
- 2003-11-21 EP EP03026847A patent/EP1422277B1/en not_active Expired - Lifetime
- 2003-11-21 CN CNB2003801034414A patent/CN1328163C/zh not_active Expired - Fee Related
- 2003-11-21 JP JP2004554999A patent/JPWO2004048265A1/ja active Pending
- 2003-11-24 US US10/718,573 patent/US7192461B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR20050086527A (ko) | 2005-08-30 |
DE60311053T2 (de) | 2007-11-08 |
US7192461B2 (en) | 2007-03-20 |
EP1422277B1 (en) | 2007-01-10 |
KR100688300B1 (ko) | 2007-03-02 |
CN1711216A (zh) | 2005-12-21 |
US20040129176A1 (en) | 2004-07-08 |
JPWO2004048265A1 (ja) | 2006-03-23 |
DE60311053D1 (de) | 2007-02-22 |
WO2004048265A1 (ja) | 2004-06-10 |
EP1422277A1 (en) | 2004-05-26 |
CN1328163C (zh) | 2007-07-25 |
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