TR201911203T4 - Yüksek performanslı bellek cihazları için saat ve kontrol sinyali üretimi. - Google Patents

Yüksek performanslı bellek cihazları için saat ve kontrol sinyali üretimi. Download PDF

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Publication number
TR201911203T4
TR201911203T4 TR2019/11203T TR201911203T TR201911203T4 TR 201911203 T4 TR201911203 T4 TR 201911203T4 TR 2019/11203 T TR2019/11203 T TR 2019/11203T TR 201911203 T TR201911203 T TR 201911203T TR 201911203 T4 TR201911203 T4 TR 201911203T4
Authority
TR
Turkey
Prior art keywords
memory devices
clock
control signal
signal generation
high performance
Prior art date
Application number
TR2019/11203T
Other languages
English (en)
Inventor
Chen Zhi̇qi̇n
Ho Jung Chang
Original Assignee
Qualcomm Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Qualcomm Inc filed Critical Qualcomm Inc
Publication of TR201911203T4 publication Critical patent/TR201911203T4/tr

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Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • G11C11/417Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
    • G11C11/418Address circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/41Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
    • G11C11/413Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
    • G11C11/417Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
    • G11C11/419Read-write [R-W] circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • G11C7/222Clock generating, synchronizing or distributing circuits within memory device
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • G11C7/227Timing of memory operations based on dummy memory elements or replica circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2207/00Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/22Control and timing of internal memory operations
    • G11C2207/2281Timing of a read operation
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2207/00Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/22Control and timing of internal memory operations
    • G11C2207/229Timing of a write operation

Abstract

Buluş, genel olarak elektronik ile ve daha spesifik olarak bellek cihazlarında saat ve kontrol sinyalleri üretme teknikleri ile ilgilidir.
TR2019/11203T 2007-05-31 2008-05-31 Yüksek performanslı bellek cihazları için saat ve kontrol sinyali üretimi. TR201911203T4 (tr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/756,017 US7881147B2 (en) 2007-05-31 2007-05-31 Clock and control signal generation for high performance memory devices

Publications (1)

Publication Number Publication Date
TR201911203T4 true TR201911203T4 (tr) 2019-08-21

Family

ID=39884234

Family Applications (1)

Application Number Title Priority Date Filing Date
TR2019/11203T TR201911203T4 (tr) 2007-05-31 2008-05-31 Yüksek performanslı bellek cihazları için saat ve kontrol sinyali üretimi.

Country Status (14)

Country Link
US (1) US7881147B2 (tr)
EP (2) EP2158592B1 (tr)
JP (1) JP5149379B2 (tr)
KR (1) KR101093336B1 (tr)
CN (2) CN101779246B (tr)
DK (1) DK2158592T3 (tr)
ES (2) ES2745948T3 (tr)
HU (2) HUE045650T2 (tr)
PL (1) PL2158592T3 (tr)
PT (1) PT2158592T (tr)
SI (1) SI2158592T1 (tr)
TR (1) TR201911203T4 (tr)
TW (1) TW200931436A (tr)
WO (1) WO2008151099A1 (tr)

Families Citing this family (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100992006B1 (ko) * 2008-12-30 2010-11-04 주식회사 하이닉스반도체 반도체 메모리 장치의 내부 라이트/리드 펄스 생성 회로
JP5244713B2 (ja) * 2009-06-24 2013-07-24 パナソニック株式会社 半導体記憶装置
JP2011008858A (ja) * 2009-06-25 2011-01-13 Fujitsu Ltd 半導体記憶装置
US8477527B2 (en) * 2011-01-31 2013-07-02 Taiwan Semiconductor Manufacturing Company, Ltd. SRAM timing cell apparatus and methods
JP5539916B2 (ja) * 2011-03-04 2014-07-02 ルネサスエレクトロニクス株式会社 半導体装置
US8811109B2 (en) 2012-02-27 2014-08-19 Qualcomm Incorporated Memory pre-decoder circuits employing pulse latch(es) for reducing memory access times, and related systems and methods
US8923069B2 (en) * 2012-06-01 2014-12-30 Lsi Corporation Memory having self-timed edge-detection write tracking
US9105328B2 (en) 2012-07-31 2015-08-11 Taiwan Semiconductor Manufacturing Company, Ltd. Tracking signals in memory write or read operation
US20140355365A1 (en) * 2013-06-04 2014-12-04 Qualcomm Incorporated Pulse generator
CN103871461B (zh) * 2014-03-31 2016-09-14 西安紫光国芯半导体有限公司 一种适用于静态随机存储器的写复制电路
CN105448318A (zh) * 2014-08-29 2016-03-30 展讯通信(上海)有限公司 一种存储器及其时序追踪电路
CN104363393A (zh) * 2014-12-01 2015-02-18 重庆洪深现代视声技术有限公司 数据处理装置、电视信号发生器
CN104637539B (zh) * 2015-02-15 2017-10-24 上海华虹宏力半导体制造有限公司 Rom读数据内部时钟脉冲产生电路和方法
TWI553463B (zh) * 2015-10-21 2016-10-11 世界先進積體電路股份有限公司 記憶體裝置及其控制方法
US9437284B1 (en) 2015-12-02 2016-09-06 Vanguard International Semiconductor Corporation Memory devices and control methods thereof
KR102423289B1 (ko) 2016-03-23 2022-07-20 삼성전자주식회사 동작 속도를 향상시키는 반도체 메모리 장치
JP6784626B2 (ja) * 2017-03-24 2020-11-11 キヤノン株式会社 記録装置、制御方法、及びプログラム
US11568920B2 (en) * 2017-08-02 2023-01-31 Samsung Electronics Co., Ltd. Dual row-column major dram
US10283191B1 (en) 2018-03-09 2019-05-07 Stmicroelectronics International N.V. Method and circuit for adaptive read-write operation in self-timed memory
US10741227B2 (en) * 2018-08-08 2020-08-11 Arm Limited Clock generating circuitry
US10937473B2 (en) * 2018-08-08 2021-03-02 Micron Technology, Inc. Clock signal drivers for read and write memory operations
JP2020042873A (ja) * 2018-09-11 2020-03-19 株式会社東芝 半導体記憶装置
US10901454B2 (en) * 2019-02-06 2021-01-26 Qualcomm Incorporated Clock buffering to reduce memory hold time
KR20200118332A (ko) * 2019-04-05 2020-10-15 에스케이하이닉스 시스템아이씨 주식회사 불휘발성 메모리 장치의 동적 전압 공급 회로 및 이를 포함하는 불휘발성 메모리 장치
US20210327501A1 (en) * 2020-04-20 2021-10-21 Stmicroelectronics International N.V. Lower power memory write operation
US11442875B2 (en) * 2020-05-18 2022-09-13 Integrated Silicon Solution, (Cayman) Inc. Arbitration control for pseudostatic random access memory device
US11417370B2 (en) * 2020-08-12 2022-08-16 Taiwan Semiconductor Manufacturing Company, Ltd. Memory device
KR20220118644A (ko) * 2021-02-19 2022-08-26 에스케이하이닉스 주식회사 분주 회로 시스템 및 이를 포함하는 반도체 메모리 시스템
US11682434B2 (en) * 2021-03-31 2023-06-20 Taiwan Semiconductor Manufacturing Company, Ltd. Low power scheme for power down in integrated dual rail SRAMs
US11670365B2 (en) * 2021-04-15 2023-06-06 Taiwan Semiconductor Manufacturing Company, Ltd. Circuitry for power management assertion

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09128958A (ja) * 1995-11-01 1997-05-16 Sony Corp 半導体メモリ装置
JPH1021688A (ja) * 1996-07-03 1998-01-23 Kawasaki Steel Corp 半導体記憶装置
WO1999019874A1 (en) * 1997-10-10 1999-04-22 Rambus Incorporated Power control system for synchronous memory device
CN1192390C (zh) * 1998-06-23 2005-03-09 自由度半导体公司 流水线双端口集成电路存储器
JP4454925B2 (ja) * 2002-10-29 2010-04-21 富士通マイクロエレクトロニクス株式会社 半導体記憶装置
CN1275455C (zh) * 2003-01-27 2006-09-13 松下电器产业株式会社 图像信号处理装置和图像信号处理方法
JP4305738B2 (ja) * 2003-06-19 2009-07-29 ローム株式会社 Dc/dcコンバータ
JP2005092925A (ja) * 2003-09-12 2005-04-07 Renesas Technology Corp 半導体集積回路
US7016245B2 (en) * 2004-02-02 2006-03-21 Texas Instruments Incorporated Tracking circuit enabling quick/accurate retrieval of data stored in a memory array
JP4390583B2 (ja) * 2004-02-17 2009-12-24 パナソニック株式会社 半導体記憶装置及びその製造方法
US7268526B1 (en) * 2004-04-21 2007-09-11 National Semiconductor Corporation Switch mode power supply control circuit
EP1630815B1 (en) 2004-08-24 2011-10-05 Infineon Technologies AG Memory circuit with supply voltage flexibility and supply voltage adapted performance
JP4936421B2 (ja) * 2005-09-14 2012-05-23 エルピーダメモリ株式会社 Dram、入力制御回路、及び入力制御方法
US7142466B1 (en) * 2005-10-14 2006-11-28 Texas Instruments Incorporated Determining optimal time instances to sense the output of a memory array which can generate data outputs with variable delay
US7319632B2 (en) * 2005-11-17 2008-01-15 Qualcomm Incorporated Pseudo-dual port memory having a clock for each port
US7646658B2 (en) * 2007-05-31 2010-01-12 Qualcomm Incorporated Memory device with delay tracking for improved timing margin

Also Published As

Publication number Publication date
DK2158592T3 (da) 2019-08-26
CN103177757B (zh) 2016-09-21
HUE045650T2 (hu) 2020-01-28
ES2908670T3 (es) 2022-05-03
CN101779246A (zh) 2010-07-14
CN101779246B (zh) 2013-03-27
CN103177757A (zh) 2013-06-26
KR101093336B1 (ko) 2011-12-14
EP3460798A1 (en) 2019-03-27
KR20100028070A (ko) 2010-03-11
WO2008151099A1 (en) 2008-12-11
EP2158592A1 (en) 2010-03-03
US7881147B2 (en) 2011-02-01
US20080298142A1 (en) 2008-12-04
HUE058144T2 (hu) 2022-07-28
PT2158592T (pt) 2019-10-10
JP5149379B2 (ja) 2013-02-20
ES2745948T3 (es) 2020-03-04
SI2158592T1 (sl) 2019-09-30
JP2010529582A (ja) 2010-08-26
EP3460798B1 (en) 2022-02-23
TW200931436A (en) 2009-07-16
EP2158592B1 (en) 2019-06-19
PL2158592T3 (pl) 2019-12-31

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