SG87790A1 - Automatic handler for ic test system, test tray stopping mechanism and test tray transferring method for automatic handler of ic test system - Google Patents

Automatic handler for ic test system, test tray stopping mechanism and test tray transferring method for automatic handler of ic test system

Info

Publication number
SG87790A1
SG87790A1 SG9900774A SG1999000774A SG87790A1 SG 87790 A1 SG87790 A1 SG 87790A1 SG 9900774 A SG9900774 A SG 9900774A SG 1999000774 A SG1999000774 A SG 1999000774A SG 87790 A1 SG87790 A1 SG 87790A1
Authority
SG
Singapore
Prior art keywords
test
automatic handler
test system
test tray
stopping mechanism
Prior art date
Application number
SG9900774A
Other languages
English (en)
Inventor
Nakamura Hiroto
Kobayashi Yoshihito
Sagawa Makoto
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to JP6171913A priority Critical patent/JP3067005B2/ja
Priority to US08/410,821 priority patent/US5625287A/en
Priority to KR1019950006694A priority patent/KR100186792B1/ko
Priority to DE19512144A priority patent/DE19512144B4/de
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to SG9900774A priority patent/SG87790A1/en
Priority to US08/725,377 priority patent/US5973493A/en
Publication of SG87790A1 publication Critical patent/SG87790A1/en

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q7/00—Arrangements for handling work specially combined with or arranged in, or specially adapted for use in connection with, machine tools, e.g. for conveying, loading, positioning, discharging, sorting
    • B23Q7/14—Arrangements for handling work specially combined with or arranged in, or specially adapted for use in connection with, machine tools, e.g. for conveying, loading, positioning, discharging, sorting co-ordinated in production lines
    • B23Q7/1426—Arrangements for handling work specially combined with or arranged in, or specially adapted for use in connection with, machine tools, e.g. for conveying, loading, positioning, discharging, sorting co-ordinated in production lines with work holders not rigidly fixed to the transport devices
    • B23Q7/1447—Arrangements for handling work specially combined with or arranged in, or specially adapted for use in connection with, machine tools, e.g. for conveying, loading, positioning, discharging, sorting co-ordinated in production lines with work holders not rigidly fixed to the transport devices using endless conveyors
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23Q—DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING; MACHINE TOOLS IN GENERAL CHARACTERISED BY THE CONSTRUCTION OF PARTICULAR DETAILS OR COMPONENTS; COMBINATIONS OR ASSOCIATIONS OF METAL-WORKING MACHINES, NOT DIRECTED TO A PARTICULAR RESULT
    • B23Q16/00—Equipment for precise positioning of tool or work into particular locations not otherwise provided for
    • B23Q16/001—Stops, cams, or holders therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
SG9900774A 1994-06-30 1995-08-08 Automatic handler for ic test system, test tray stopping mechanism and test tray transferring method for automatic handler of ic test system SG87790A1 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP6171913A JP3067005B2 (ja) 1994-06-30 1994-06-30 テストトレイ用位置決めストッパ
US08/410,821 US5625287A (en) 1994-06-30 1995-03-27 Test tray positioning stopper mechanism for automatic handler
KR1019950006694A KR100186792B1 (ko) 1994-06-30 1995-03-28 오토핸들러용 테스트트레이의 위치 결정 스토퍼기구
DE19512144A DE19512144B4 (de) 1994-06-30 1995-03-31 Automatische Transportvorrichtung mit einem Anschlagmechanismus zum Positionieren von Prüftabletts
SG9900774A SG87790A1 (en) 1994-06-30 1995-08-08 Automatic handler for ic test system, test tray stopping mechanism and test tray transferring method for automatic handler of ic test system
US08/725,377 US5973493A (en) 1994-06-30 1996-10-03 Test tray positioning stopper mechanism for automatic handler

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP6171913A JP3067005B2 (ja) 1994-06-30 1994-06-30 テストトレイ用位置決めストッパ
SG9900774A SG87790A1 (en) 1994-06-30 1995-08-08 Automatic handler for ic test system, test tray stopping mechanism and test tray transferring method for automatic handler of ic test system

Publications (1)

Publication Number Publication Date
SG87790A1 true SG87790A1 (en) 2002-04-16

Family

ID=26494472

Family Applications (1)

Application Number Title Priority Date Filing Date
SG9900774A SG87790A1 (en) 1994-06-30 1995-08-08 Automatic handler for ic test system, test tray stopping mechanism and test tray transferring method for automatic handler of ic test system

Country Status (5)

Country Link
US (2) US5625287A (ja)
JP (1) JP3067005B2 (ja)
KR (1) KR100186792B1 (ja)
DE (1) DE19512144B4 (ja)
SG (1) SG87790A1 (ja)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996009644A1 (fr) * 1994-09-22 1996-03-28 Advantest Corporation Conteneur pour plateaux a circuits integres et sa plaque de base de montage
KR0146216B1 (ko) * 1995-04-24 1998-11-02 정문술 반도체 소자검사기의 소자로딩,언로딩장치
JP3226780B2 (ja) * 1996-02-27 2001-11-05 東芝マイクロエレクトロニクス株式会社 半導体装置のテストハンドラ
JP3533879B2 (ja) * 1996-07-15 2004-05-31 セイコーエプソン株式会社 部材の受け渡し装置および集積回路デバイスの検査装置
USRE38622E1 (en) 1996-07-15 2004-10-12 Seiko Epson Corporation Parts handling method
SG82566A1 (en) * 1996-10-17 2001-08-21 Motorola Inc Method and apparatus for transporting ang testing electronic devices attached to a leadframe
JP3344548B2 (ja) 1997-04-16 2002-11-11 株式会社アドバンテスト Ｉｃ試験装置
US6530805B1 (en) 1998-07-20 2003-03-11 International Business Machines Corporation Contact pin holder assembly
KR100546871B1 (ko) * 1998-09-30 2006-05-23 삼성전자주식회사 테스트 핸들러
JP2000338195A (ja) * 1999-05-31 2000-12-08 Ando Electric Co Ltd 集積回路試験方法及び装置
US6731127B2 (en) * 2001-12-21 2004-05-04 Texas Instruments Incorporated Parallel integrated circuit test apparatus and test method
CN1675115A (zh) * 2002-08-16 2005-09-28 电子科学工业公司 电子组件的模块化传送带
JP4043339B2 (ja) * 2002-10-22 2008-02-06 川崎マイクロエレクトロニクス株式会社 試験方法および試験装置
US6744165B2 (en) * 2002-10-29 2004-06-01 Visteon Global Technologies, Inc. High power permanent magnet hybrid alternator rotor
KR100652404B1 (ko) 2005-03-05 2006-12-01 삼성전자주식회사 핸들러용 테스트 트레이
US20060213806A1 (en) * 2005-03-25 2006-09-28 Saunders William J Configurations of electronic component-carrying apertures in a termination belt
US7684608B2 (en) * 2006-02-23 2010-03-23 Vistech Corporation Tape and reel inspection system
US9638749B2 (en) * 2014-06-06 2017-05-02 Advantest Corporation Supporting automated testing of devices in a test floor system
US9618570B2 (en) 2014-06-06 2017-04-11 Advantest Corporation Multi-configurable testing module for automated testing of a device
US9618574B2 (en) * 2014-06-06 2017-04-11 Advantest Corporation Controlling automated testing of devices
US9678148B2 (en) 2014-06-06 2017-06-13 Advantest Corporation Customizable tester having testing modules for automated testing of devices
US9933454B2 (en) * 2014-06-06 2018-04-03 Advantest Corporation Universal test floor system

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5313156A (en) * 1991-12-04 1994-05-17 Advantest Corporation Apparatus for automatic handling

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3236374A (en) * 1964-02-10 1966-02-22 Universal Instruments Corp Line testing and handling apparatus
US3844428A (en) * 1972-04-07 1974-10-29 Packard Instrument Co Inc Tray storage and handling system for scintillation spectrometers and the like
US4114752A (en) * 1977-02-09 1978-09-19 Schiek Robert J All purpose indexing device
US4320339A (en) * 1977-11-07 1982-03-16 Usm Corporation Component testing station
JPS5617219U (ja) * 1979-07-20 1981-02-14
US4371075A (en) * 1980-08-04 1983-02-01 Polaroid Corporation Modular production line unit and system
US4453807A (en) * 1981-06-17 1984-06-12 Smithkline Beckman Corp System for handling slides
US4488633A (en) * 1981-12-15 1984-12-18 Beckman Instruments, Inc. Apparatus for transporting sample holders
US4516318A (en) * 1983-04-26 1985-05-14 At&T Technologies, Inc. Methods of processing substrates
JP2547021Y2 (ja) * 1990-10-08 1997-09-03 株式会社アドバンテスト Ｉｃ試験装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5313156A (en) * 1991-12-04 1994-05-17 Advantest Corporation Apparatus for automatic handling

Also Published As

Publication number Publication date
DE19512144A1 (de) 1996-01-11
US5973493A (en) 1999-10-26
DE19512144B4 (de) 2006-04-20
JPH0812068A (ja) 1996-01-16
JP3067005B2 (ja) 2000-07-17
KR100186792B1 (ko) 1999-04-15
US5625287A (en) 1997-04-29

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