SG76570A1 - Ultra-shallow semiconductor junction formation - Google Patents
Ultra-shallow semiconductor junction formationInfo
- Publication number
- SG76570A1 SG76570A1 SG1998004574A SG1998004574A SG76570A1 SG 76570 A1 SG76570 A1 SG 76570A1 SG 1998004574 A SG1998004574 A SG 1998004574A SG 1998004574 A SG1998004574 A SG 1998004574A SG 76570 A1 SG76570 A1 SG 76570A1
- Authority
- SG
- Singapore
- Prior art keywords
- ultra
- semiconductor junction
- junction formation
- shallow semiconductor
- shallow
- Prior art date
Links
- 230000015572 biosynthetic process Effects 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/77—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate
- H01L21/78—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
- H01L21/82—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components
- H01L21/822—Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being a semiconductor, using silicon technology
- H01L21/8232—Field-effect technology
- H01L21/8234—MIS technology, i.e. integration processes of field effect transistors of the conductor-insulator-semiconductor type
- H01L21/8238—Complementary field-effect transistors, e.g. CMOS
- H01L21/823814—Complementary field-effect transistors, e.g. CMOS with a particular manufacturing method of the source or drain structures, e.g. specific source or drain implants or silicided source or drain structures or raised source or drain structures
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/265—Bombardment with radiation with high-energy radiation producing ion implantation
- H01L21/26506—Bombardment with radiation with high-energy radiation producing ion implantation in group IV semiconductors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/265—Bombardment with radiation with high-energy radiation producing ion implantation
- H01L21/26506—Bombardment with radiation with high-energy radiation producing ion implantation in group IV semiconductors
- H01L21/26513—Bombardment with radiation with high-energy radiation producing ion implantation in group IV semiconductors of electrically active species
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/26—Bombardment with radiation
- H01L21/263—Bombardment with radiation with high-energy radiation
- H01L21/265—Bombardment with radiation with high-energy radiation producing ion implantation
- H01L21/2658—Bombardment with radiation with high-energy radiation producing ion implantation of a molecular ion, e.g. decaborane
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/04—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their crystalline structure, e.g. polycrystalline, cubic or particular orientation of crystalline planes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/107—Substrate region of field-effect devices
- H01L29/1075—Substrate region of field-effect devices of field-effect transistors
- H01L29/1079—Substrate region of field-effect devices of field-effect transistors with insulated gate
- H01L29/1083—Substrate region of field-effect devices of field-effect transistors with insulated gate with an inactive supplementary region, e.g. for preventing punch-through, improving capacity effect or leakage current
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Ceramic Engineering (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- Insulated Gate Type Field-Effect Transistor (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US96868497A | 1997-11-12 | 1997-11-12 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG76570A1 true SG76570A1 (en) | 2000-11-21 |
Family
ID=25514622
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG1998004574A SG76570A1 (en) | 1997-11-12 | 1998-11-09 | Ultra-shallow semiconductor junction formation |
Country Status (5)
Country | Link |
---|---|
US (2) | US6037640A (zh) |
KR (1) | KR100301273B1 (zh) |
CN (1) | CN100403493C (zh) |
SG (1) | SG76570A1 (zh) |
TW (1) | TW401625B (zh) |
Families Citing this family (69)
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US6136673A (en) * | 1998-02-12 | 2000-10-24 | Lucent Technologies Inc. | Process utilizing selective TED effect when forming devices with shallow junctions |
JP3054123B2 (ja) * | 1998-06-08 | 2000-06-19 | アプライド マテリアルズ インコーポレイテッド | イオン注入方法 |
US6432802B1 (en) * | 1999-09-17 | 2002-08-13 | Matsushita Electronics Corporation | Method for fabricating semiconductor device |
US6399458B1 (en) * | 1999-09-21 | 2002-06-04 | International Business Machines Corporation | Optimized reachthrough implant for simultaneously forming an MOS capacitor |
US6514833B1 (en) * | 1999-09-24 | 2003-02-04 | Advanced Micro Devices, Inc. | Method of inhibiting lateral diffusion between adjacent wells by introducing carbon or fluorine ions into bottom of STI groove |
KR100348702B1 (ko) * | 1999-12-28 | 2002-08-13 | 주식회사 루밴틱스 | 급속 열처리 방법에 의한 도전성 투명 박막의 제조방법 및 그 방법에 의해 제조된 도전성 투명 박막 |
US6472232B1 (en) * | 2000-02-22 | 2002-10-29 | International Business Machines Corporation | Semiconductor temperature monitor |
US6287925B1 (en) * | 2000-02-24 | 2001-09-11 | Advanced Micro Devices, Inc. | Formation of highly conductive junctions by rapid thermal anneal and laser thermal process |
US6361874B1 (en) * | 2000-06-20 | 2002-03-26 | Advanced Micro Devices, Inc. | Dual amorphization process optimized to reduce gate line over-melt |
US6368947B1 (en) * | 2000-06-20 | 2002-04-09 | Advanced Micro Devices, Inc. | Process utilizing a cap layer optimized to reduce gate line over-melt |
US6630386B1 (en) | 2000-07-18 | 2003-10-07 | Advanced Micro Devices, Inc | CMOS manufacturing process with self-amorphized source/drain junctions and extensions |
US6521502B1 (en) | 2000-08-07 | 2003-02-18 | Advanced Micro Devices, Inc. | Solid phase epitaxy activation process for source/drain junction extensions and halo regions |
US6518136B2 (en) * | 2000-12-14 | 2003-02-11 | International Business Machines Corporation | Sacrificial polysilicon sidewall process and rapid thermal spike annealing for advance CMOS fabrication |
US20020187614A1 (en) * | 2001-04-16 | 2002-12-12 | Downey Daniel F. | Methods for forming ultrashallow junctions with low sheet resistance |
US6582995B2 (en) | 2001-07-11 | 2003-06-24 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method for fabricating a shallow ion implanted microelectronic structure |
US6632728B2 (en) | 2001-07-16 | 2003-10-14 | Agere Systems Inc. | Increasing the electrical activation of ion-implanted dopants |
US6812523B1 (en) | 2001-09-21 | 2004-11-02 | Wei-Kan Chu | Semiconductor wafer with ultra thin doping level formed by defect engineering |
US6555451B1 (en) * | 2001-09-28 | 2003-04-29 | The United States Of America As Represented By The Secretary Of The Navy | Method for making shallow diffusion junctions in semiconductors using elemental doping |
JP4212018B2 (ja) * | 2001-11-30 | 2009-01-21 | 富士通マイクロエレクトロニクス株式会社 | 半導体装置の製造方法 |
US6849528B2 (en) * | 2001-12-12 | 2005-02-01 | Texas Instruments Incorporated | Fabrication of ultra shallow junctions from a solid source with fluorine implantation |
US6764909B2 (en) * | 2002-01-14 | 2004-07-20 | Texas Instruments Incorporated | Structure and method of MOS transistor having increased substrate resistance |
GB0200879D0 (en) * | 2002-01-16 | 2002-03-06 | Univ Surrey | Ion implanted junctions in silicon wafers |
US20030186519A1 (en) * | 2002-04-01 | 2003-10-02 | Downey Daniel F. | Dopant diffusion and activation control with athermal annealing |
JP3746246B2 (ja) * | 2002-04-16 | 2006-02-15 | 株式会社東芝 | 半導体装置の製造方法 |
US6682980B2 (en) | 2002-05-06 | 2004-01-27 | Texas Instruments Incorporated | Fabrication of abrupt ultra-shallow junctions using angled PAI and fluorine implant |
US7135423B2 (en) * | 2002-05-09 | 2006-11-14 | Varian Semiconductor Equipment Associates, Inc | Methods for forming low resistivity, ultrashallow junctions with low damage |
AU2003228925A1 (en) * | 2002-05-10 | 2003-11-11 | Varian Semiconductor Equipment Associates, Inc. | Methods and systems for dopant profiling |
US7093225B2 (en) * | 2002-07-17 | 2006-08-15 | Osann Robert Jr | FPGA with hybrid interconnect |
US7679398B2 (en) * | 2002-07-17 | 2010-03-16 | Osann Jr Robert | Reprogrammable instruction DSP |
US20050260836A1 (en) * | 2002-07-22 | 2005-11-24 | Wei-Kan Chu | Method to overcome instability of ultra-shallow semiconductor junctions |
US6897131B2 (en) * | 2002-09-20 | 2005-05-24 | Applied Materials, Inc. | Advances in spike anneal processes for ultra shallow junctions |
CN1286157C (zh) * | 2002-10-10 | 2006-11-22 | 松下电器产业株式会社 | 半导体装置及其制造方法 |
US6727136B1 (en) * | 2002-10-18 | 2004-04-27 | Advanced Micro Devices, Inc. | Formation of ultra-shallow depth source/drain extensions for MOS transistors |
US20040115889A1 (en) * | 2002-12-17 | 2004-06-17 | Amitabh Jain | Ultra shallow junction formation |
US6746944B1 (en) * | 2003-01-14 | 2004-06-08 | Advanced Micro Devices, Inc. | Low nisi/si interface contact resistance with preamorphizing and laser thermal annealing |
US6803270B2 (en) * | 2003-02-21 | 2004-10-12 | International Business Machines Corporation | CMOS performance enhancement using localized voids and extended defects |
US6808997B2 (en) * | 2003-03-21 | 2004-10-26 | Texas Instruments Incorporated | Complementary junction-narrowing implants for ultra-shallow junctions |
DE10339991A1 (de) * | 2003-08-29 | 2005-03-31 | Advanced Micro Devices, Inc., Sunnyvale | Verbesserte Technik zum Einstellen einer Eindringtiefe während der Implantation von Ionen in ein Halbleitergebiet |
EP1665386A1 (en) * | 2003-09-03 | 2006-06-07 | Koninklijke Philips Electronics N.V. | Method of fabricating a double gate field effect transistor device, and such a double gate field effect transistor device |
US7071069B2 (en) * | 2003-12-22 | 2006-07-04 | Chartered Semiconductor Manufacturing, Ltd | Shallow amorphizing implant for gettering of deep secondary end of range defects |
EP1728270A1 (en) * | 2004-03-15 | 2006-12-06 | Koninklijke Philips Electronics N.V. | Method of manufacturing a semiconductor device and semiconductor device obtained with such a method |
US7846822B2 (en) * | 2004-07-30 | 2010-12-07 | The Board Of Trustees Of The University Of Illinois | Methods for controlling dopant concentration and activation in semiconductor structures |
TWI237857B (en) * | 2004-10-21 | 2005-08-11 | Nanya Technology Corp | Method of fabricating MOS transistor by millisecond anneal |
US7172954B2 (en) * | 2005-05-05 | 2007-02-06 | Infineon Technologies Ag | Implantation process in semiconductor fabrication |
US20070037326A1 (en) * | 2005-08-09 | 2007-02-15 | Taiwan Semiconductor Manufacturing Company, Ltd. | Shallow source/drain regions for CMOS transistors |
US7795101B2 (en) * | 2006-04-03 | 2010-09-14 | United Microelectronics Corp. | Method of forming a MOS transistor |
CN101460654A (zh) * | 2006-05-01 | 2009-06-17 | 应用材料股份有限公司 | 使用含碳的硅薄膜形成超浅接合区的方法 |
US7582547B2 (en) | 2006-08-04 | 2009-09-01 | Interuniversitair Microelektronica Centrum Vzw (Imec) | Method for junction formation in a semiconductor device and the semiconductor device made thereof |
EP1884985A1 (en) * | 2006-08-04 | 2008-02-06 | Interuniversitair Microelektronica Centrum | Method for junction formation in a semiconductor device and the semiconductor device thereof |
US7700450B2 (en) * | 2006-10-25 | 2010-04-20 | United Microelectronics Corp. | Method for forming MOS transistor |
JP2008108891A (ja) * | 2006-10-25 | 2008-05-08 | Toshiba Corp | 半導体装置の製造方法 |
US7833886B2 (en) * | 2007-05-14 | 2010-11-16 | Infineon Technologies Ag | Method of producing a semiconductor element in a substrate |
US7968440B2 (en) * | 2008-03-19 | 2011-06-28 | The Board Of Trustees Of The University Of Illinois | Preparation of ultra-shallow semiconductor junctions using intermediate temperature ramp rates and solid interfaces for defect engineering |
US7838887B2 (en) * | 2008-04-30 | 2010-11-23 | Taiwan Semiconductor Manufacturing Company, Ltd. | Source/drain carbon implant and RTA anneal, pre-SiGe deposition |
CN101621006B (zh) * | 2008-07-03 | 2011-01-12 | 中芯国际集成电路制造(上海)有限公司 | 利用锗预非晶处理来形成p-型轻度掺杂的漏极区的方法 |
US8178430B2 (en) * | 2009-04-08 | 2012-05-15 | International Business Machines Corporation | N-type carrier enhancement in semiconductors |
WO2010118266A2 (en) * | 2009-04-10 | 2010-10-14 | Applied Materials, Inc. | Use special ion source apparatus and implant with molecular ions to process hdd (high density magnetic disks) with patterned magnetic domains |
CN101894749B (zh) * | 2009-05-20 | 2013-03-20 | 中芯国际集成电路制造(北京)有限公司 | 半导体器件的栅极掺杂方法 |
CN102543873B (zh) * | 2010-12-27 | 2015-08-19 | 无锡华润上华科技有限公司 | 自对准p+浅结掺杂工艺方法 |
US8871670B2 (en) | 2011-01-05 | 2014-10-28 | The Board Of Trustees Of The University Of Illinois | Defect engineering in metal oxides via surfaces |
KR20120133652A (ko) * | 2011-05-31 | 2012-12-11 | 삼성전자주식회사 | 반도체 소자의 제조 방법 |
US8648412B1 (en) | 2012-06-04 | 2014-02-11 | Semiconductor Components Industries, Llc | Trench power field effect transistor device and method |
US9558973B2 (en) | 2012-06-11 | 2017-01-31 | Ultratech, Inc. | Laser annealing systems and methods with ultra-short dwell times |
CN103077927A (zh) * | 2013-01-11 | 2013-05-01 | 无锡华润上华科技有限公司 | 一种nor闪存器件的退火工艺及nor闪存器件 |
CN103972102A (zh) * | 2014-04-22 | 2014-08-06 | 上海华力微电子有限公司 | 超浅结的形成方法及半导体器件的形成方法 |
US9324867B2 (en) | 2014-05-19 | 2016-04-26 | International Business Machines Corporation | Method to controllably etch silicon recess for ultra shallow junctions |
CN105762116B (zh) * | 2014-12-16 | 2018-09-18 | 中芯国际集成电路制造(上海)有限公司 | 硅衬底、其制作方法及包括其的ipd器件 |
US10083843B2 (en) | 2014-12-17 | 2018-09-25 | Ultratech, Inc. | Laser annealing systems and methods with ultra-short dwell times |
US10529832B2 (en) | 2016-12-19 | 2020-01-07 | International Business Machines Corporation | Shallow, abrupt and highly activated tin extension implant junction |
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US4617066A (en) | 1984-11-26 | 1986-10-14 | Hughes Aircraft Company | Process of making semiconductors having shallow, hyperabrupt doped regions by implantation and two step annealing |
CA1216962A (en) | 1985-06-28 | 1987-01-20 | Hussein M. Naguib | Mos device processing |
US4835112A (en) | 1988-03-08 | 1989-05-30 | Motorola, Inc. | CMOS salicide process using germanium implantation |
NL8802219A (nl) * | 1988-09-09 | 1990-04-02 | Philips Nv | Werkwijze voor het vervaardigen van een halfgeleiderinrichting met een siliciumlichaam waarin door ionenimplantaties halfgeleidergebieden worden gevormd. |
DE4035842A1 (de) * | 1990-11-10 | 1992-05-14 | Telefunken Electronic Gmbh | Verfahren zur rekristallisierung voramorphisierter halbleiteroberflaechenzonen |
US5091763A (en) * | 1990-12-19 | 1992-02-25 | Intel Corporation | Self-aligned overlap MOSFET and method of fabrication |
US5489675A (en) * | 1992-06-25 | 1996-02-06 | E. I. Du Pont De Nemours And Company | Disaccharide sialidase substrates and inhibitors |
JP2760709B2 (ja) * | 1992-07-15 | 1998-06-04 | 株式会社東芝 | 高耐圧のldd構造を有する半導体装置及びその製造方法 |
US5352914A (en) * | 1992-08-03 | 1994-10-04 | Hughes Aircraft Company | Field-effect transistor with structure for suppressing hot-electron effects, and method of fabricating the transistor |
KR0164072B1 (ko) | 1995-11-13 | 1999-02-01 | 김주용 | 반도체 소자의 얕은 접합 형성방법 |
US5897363A (en) * | 1996-05-29 | 1999-04-27 | Micron Technology, Inc. | Shallow junction formation using multiple implant sources |
US5908307A (en) * | 1997-01-31 | 1999-06-01 | Ultratech Stepper, Inc. | Fabrication method for reduced-dimension FET devices |
US5770485A (en) | 1997-03-04 | 1998-06-23 | Advanced Micro Devices, Inc. | MOSFET device with an amorphized source and fabrication method thereof |
JPH10270687A (ja) * | 1997-03-27 | 1998-10-09 | Mitsubishi Electric Corp | 電界効果トランジスタおよびその製造方法 |
-
1998
- 1998-05-12 US US09/076,563 patent/US6037640A/en not_active Expired - Lifetime
- 1998-10-15 TW TW087117139A patent/TW401625B/zh not_active IP Right Cessation
- 1998-11-09 SG SG1998004574A patent/SG76570A1/en unknown
- 1998-11-11 CN CNB981239935A patent/CN100403493C/zh not_active Expired - Lifetime
- 1998-11-12 KR KR1019980048470A patent/KR100301273B1/ko not_active IP Right Cessation
-
2001
- 2001-06-11 US US09/878,694 patent/US6537886B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
US6537886B2 (en) | 2003-03-25 |
US6037640A (en) | 2000-03-14 |
KR19990045244A (ko) | 1999-06-25 |
US20010041432A1 (en) | 2001-11-15 |
KR100301273B1 (ko) | 2001-11-05 |
TW401625B (en) | 2000-08-11 |
CN100403493C (zh) | 2008-07-16 |
CN1218276A (zh) | 1999-06-02 |
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