SG71027A1 - Electrically floating shield in a plasma reactor - Google Patents
Electrically floating shield in a plasma reactorInfo
- Publication number
- SG71027A1 SG71027A1 SG1997002340A SG1997002340A SG71027A1 SG 71027 A1 SG71027 A1 SG 71027A1 SG 1997002340 A SG1997002340 A SG 1997002340A SG 1997002340 A SG1997002340 A SG 1997002340A SG 71027 A1 SG71027 A1 SG 71027A1
- Authority
- SG
- Singapore
- Prior art keywords
- plasma reactor
- electrically floating
- floating shield
- shield
- electrically
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/20—Deposition of semiconductor materials on a substrate, e.g. epitaxial growth solid phase epitaxy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32477—Vessel characterised by the means for protecting vessels or internal parts, e.g. coatings
- H01J37/32504—Means for preventing sputtering of the vessel
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
- H01J37/32633—Baffles
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physical Vapour Deposition (AREA)
- Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
- Electrodes Of Semiconductors (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/677,760 US5736021A (en) | 1996-07-10 | 1996-07-10 | Electrically floating shield in a plasma reactor |
Publications (1)
Publication Number | Publication Date |
---|---|
SG71027A1 true SG71027A1 (en) | 2000-03-21 |
Family
ID=24720009
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG1997002340A SG71027A1 (en) | 1996-07-10 | 1997-07-01 | Electrically floating shield in a plasma reactor |
Country Status (6)
Country | Link |
---|---|
US (1) | US5736021A (fr) |
EP (1) | EP0818803A3 (fr) |
JP (1) | JP4233618B2 (fr) |
KR (1) | KR100517474B1 (fr) |
SG (1) | SG71027A1 (fr) |
TW (1) | TW346639B (fr) |
Families Citing this family (70)
Publication number | Priority date | Publication date | Assignee | Title |
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US6073830A (en) * | 1995-04-21 | 2000-06-13 | Praxair S.T. Technology, Inc. | Sputter target/backing plate assembly and method of making same |
US5879523A (en) * | 1997-09-29 | 1999-03-09 | Applied Materials, Inc. | Ceramic coated metallic insulator particularly useful in a plasma sputter reactor |
US6030509A (en) * | 1998-04-06 | 2000-02-29 | Taiwan Semiconductor Manufacturing Co., Ltd | Apparatus and method for shielding a wafer holder |
JP2002533574A (ja) * | 1998-12-21 | 2002-10-08 | アプライド マテリアルズ インコーポレイテッド | 半導体性及び絶縁性物質の物理蒸着装置 |
US6122921A (en) * | 1999-01-19 | 2000-09-26 | Applied Materials, Inc. | Shield to prevent cryopump charcoal array from shedding during cryo-regeneration |
US6468405B1 (en) | 1999-07-15 | 2002-10-22 | Seagate Technology Llc | Sputtering target assembly and method for depositing a thickness gradient layer with narrow transition zone |
US6569294B1 (en) | 1999-07-15 | 2003-05-27 | Seagate Technology Llc | Sputtering target assembly and method for depositing a thickness gradient layer with narrow transition zone |
US6398929B1 (en) * | 1999-10-08 | 2002-06-04 | Applied Materials, Inc. | Plasma reactor and shields generating self-ionized plasma for sputtering |
US10047430B2 (en) | 1999-10-08 | 2018-08-14 | Applied Materials, Inc. | Self-ionized and inductively-coupled plasma for sputtering and resputtering |
US8696875B2 (en) * | 1999-10-08 | 2014-04-15 | Applied Materials, Inc. | Self-ionized and inductively-coupled plasma for sputtering and resputtering |
US20030116427A1 (en) * | 2001-08-30 | 2003-06-26 | Applied Materials, Inc. | Self-ionized and inductively-coupled plasma for sputtering and resputtering |
US6149784A (en) * | 1999-10-22 | 2000-11-21 | Applied Materials, Inc. | Sputtering chamber shield promoting reliable plasma ignition |
JP3972558B2 (ja) * | 2000-06-23 | 2007-09-05 | 松下電器産業株式会社 | スパッタリング装置 |
US6358376B1 (en) * | 2000-07-10 | 2002-03-19 | Applied Materials, Inc. | Biased shield in a magnetron sputter reactor |
JP4717186B2 (ja) * | 2000-07-25 | 2011-07-06 | 株式会社アルバック | スパッタリング装置 |
DE10122070B4 (de) * | 2001-05-07 | 2005-07-07 | Texas Instruments Deutschland Gmbh | Kathodenzerstäubungskammer zum Aufbringen von Material auf der Oberfläche einer in der Kammer befindlichen Halbleiterscheibe |
JP2005504885A (ja) | 2001-07-25 | 2005-02-17 | アプライド マテリアルズ インコーポレイテッド | 新規なスパッタ堆積方法を使用したバリア形成 |
US8110489B2 (en) | 2001-07-25 | 2012-02-07 | Applied Materials, Inc. | Process for forming cobalt-containing materials |
US9051641B2 (en) | 2001-07-25 | 2015-06-09 | Applied Materials, Inc. | Cobalt deposition on barrier surfaces |
US20090004850A1 (en) | 2001-07-25 | 2009-01-01 | Seshadri Ganguli | Process for forming cobalt and cobalt silicide materials in tungsten contact applications |
US20030029715A1 (en) | 2001-07-25 | 2003-02-13 | Applied Materials, Inc. | An Apparatus For Annealing Substrates In Physical Vapor Deposition Systems |
US6730174B2 (en) | 2002-03-06 | 2004-05-04 | Applied Materials, Inc. | Unitary removable shield assembly |
US6998033B2 (en) * | 2002-05-14 | 2006-02-14 | Tokyo Electron Limited | Sputtering cathode adapter assembly and method |
US7504006B2 (en) * | 2002-08-01 | 2009-03-17 | Applied Materials, Inc. | Self-ionized and capacitively-coupled plasma for sputtering and resputtering |
US7001491B2 (en) * | 2003-06-26 | 2006-02-21 | Tokyo Electron Limited | Vacuum-processing chamber-shield and multi-chamber pumping method |
US7910218B2 (en) | 2003-10-22 | 2011-03-22 | Applied Materials, Inc. | Cleaning and refurbishing chamber components having metal coatings |
US20060017387A1 (en) * | 2004-07-09 | 2006-01-26 | Energetiq Technology Inc. | Inductively-driven plasma light source |
US8500973B2 (en) * | 2004-08-20 | 2013-08-06 | Jds Uniphase Corporation | Anode for sputter coating |
US20060049041A1 (en) * | 2004-08-20 | 2006-03-09 | Jds Uniphase Corporation | Anode for sputter coating |
US7879209B2 (en) * | 2004-08-20 | 2011-02-01 | Jds Uniphase Corporation | Cathode for sputter coating |
US7670436B2 (en) | 2004-11-03 | 2010-03-02 | Applied Materials, Inc. | Support ring assembly |
KR100591433B1 (ko) * | 2004-12-29 | 2006-06-22 | 동부일렉트로닉스 주식회사 | 질화 티타늄(TiN) 스퍼터링 공정용 실드 및 코팅방법 |
WO2006093953A1 (fr) * | 2005-02-28 | 2006-09-08 | Tosoh Smd, Inc. | Cible de pulvérisation avec bague isolante et espace entre la bague et la cible |
US7799190B2 (en) * | 2005-04-14 | 2010-09-21 | Tango Systems, Inc. | Target backing plate for sputtering system |
US7550055B2 (en) * | 2005-05-31 | 2009-06-23 | Applied Materials, Inc. | Elastomer bonding of large area sputtering target |
US8617672B2 (en) | 2005-07-13 | 2013-12-31 | Applied Materials, Inc. | Localized surface annealing of components for substrate processing chambers |
US7762114B2 (en) * | 2005-09-09 | 2010-07-27 | Applied Materials, Inc. | Flow-formed chamber component having a textured surface |
US7884032B2 (en) * | 2005-10-28 | 2011-02-08 | Applied Materials, Inc. | Thin film deposition |
US8454804B2 (en) * | 2005-10-28 | 2013-06-04 | Applied Materials Inc. | Protective offset sputtering |
US8460519B2 (en) * | 2005-10-28 | 2013-06-11 | Applied Materials Inc. | Protective offset sputtering |
US9127362B2 (en) | 2005-10-31 | 2015-09-08 | Applied Materials, Inc. | Process kit and target for substrate processing chamber |
US20070113783A1 (en) * | 2005-11-19 | 2007-05-24 | Applied Materials, Inc. | Band shield for substrate processing chamber |
US8647484B2 (en) | 2005-11-25 | 2014-02-11 | Applied Materials, Inc. | Target for sputtering chamber |
JP4936129B2 (ja) * | 2006-07-12 | 2012-05-23 | 富士電機株式会社 | プラズマ処理装置 |
US7981262B2 (en) | 2007-01-29 | 2011-07-19 | Applied Materials, Inc. | Process kit for substrate processing chamber |
KR101140195B1 (ko) | 2007-03-16 | 2012-05-02 | 도쿄엘렉트론가부시키가이샤 | 마그네트론 스퍼터 장치 |
JP5547366B2 (ja) * | 2007-03-29 | 2014-07-09 | 東京エレクトロン株式会社 | プラズマ処理装置 |
US20080257263A1 (en) * | 2007-04-23 | 2008-10-23 | Applied Materials, Inc. | Cooling shield for substrate processing chamber |
US7942969B2 (en) | 2007-05-30 | 2011-05-17 | Applied Materials, Inc. | Substrate cleaning chamber and components |
JP5264231B2 (ja) | 2008-03-21 | 2013-08-14 | 東京エレクトロン株式会社 | プラズマ処理装置 |
KR101511027B1 (ko) * | 2008-05-02 | 2015-04-10 | 어플라이드 머티어리얼스, 인코포레이티드 | Rf물리 기상 증착용 프로세스 키트 |
KR200455669Y1 (ko) * | 2008-05-19 | 2011-09-19 | 노벨러스 시스템즈, 인코포레이티드 | 프로세스 챔버 실드용 에지 프로파일링 |
US8066857B2 (en) * | 2008-12-12 | 2011-11-29 | Fujifilm Corporation | Shaped anode and anode-shield connection for vacuum physical vapor deposition |
EP2209132A1 (fr) * | 2009-01-16 | 2010-07-21 | Applied Materials, Inc. | Dispositif PVD à faisceau de particules chargées, dispositif de blindage, chambre de revêtement pour substrats et procédé de revêtement |
US20110036709A1 (en) * | 2009-08-11 | 2011-02-17 | Applied Materials, Inc. | Process kit for rf physical vapor deposition |
US8133362B2 (en) * | 2010-02-26 | 2012-03-13 | Fujifilm Corporation | Physical vapor deposition with multi-point clamp |
US9181619B2 (en) * | 2010-02-26 | 2015-11-10 | Fujifilm Corporation | Physical vapor deposition with heat diffuser |
JP4918147B2 (ja) * | 2010-03-04 | 2012-04-18 | キヤノンアネルバ株式会社 | エッチング方法 |
CN105177519B (zh) * | 2010-10-29 | 2018-03-27 | 应用材料公司 | 用于物理气相沉积腔室的沉积环及静电夹盘 |
US8702918B2 (en) * | 2011-12-15 | 2014-04-22 | Applied Materials, Inc. | Apparatus for enabling concentricity of plasma dark space |
US9404174B2 (en) | 2011-12-15 | 2016-08-02 | Applied Materials, Inc. | Pinned target design for RF capacitive coupled plasma |
US9960021B2 (en) * | 2013-12-18 | 2018-05-01 | Applied Materials, Inc. | Physical vapor deposition (PVD) target having low friction pads |
CN104099575B (zh) * | 2014-07-11 | 2016-08-03 | 京东方科技集团股份有限公司 | 一种磁控溅射装置 |
JP2014241417A (ja) * | 2014-07-15 | 2014-12-25 | シャープ株式会社 | アルミニウム含有窒化物中間層の製造方法、窒化物層の製造方法および窒化物半導体素子の製造方法 |
US10879651B2 (en) | 2016-06-18 | 2020-12-29 | Molex, Llc | Selectively shielded connector channel |
KR102351170B1 (ko) * | 2018-06-28 | 2022-01-14 | 가부시키가이샤 알박 | 스퍼터 성막 장치 |
JP7240958B2 (ja) * | 2018-09-06 | 2023-03-16 | 東京エレクトロン株式会社 | プラズマ処理装置 |
JP7274347B2 (ja) * | 2019-05-21 | 2023-05-16 | 東京エレクトロン株式会社 | プラズマ処理装置 |
KR20210148458A (ko) | 2020-05-28 | 2021-12-08 | 삼성디스플레이 주식회사 | 증착 장치, 및 증착 장치를 이용한 증착 방법 |
CN114809888B (zh) * | 2022-04-06 | 2023-08-29 | 常州雷宁电磁屏蔽设备有限公司 | 等离子电磁屏蔽门 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4116794A (en) * | 1974-12-23 | 1978-09-26 | Telic Corporation | Glow discharge method and apparatus |
US4169031A (en) * | 1978-01-13 | 1979-09-25 | Polyohm, Inc. | Magnetron sputter cathode assembly |
US4362611A (en) * | 1981-07-27 | 1982-12-07 | International Business Machines Corporation | Quadrupole R.F. sputtering system having an anode/cathode shield and a floating target shield |
JPS5848422A (ja) * | 1981-09-17 | 1983-03-22 | Nec Corp | 複合ドライエツチング装置 |
JPS639117A (ja) * | 1986-06-30 | 1988-01-14 | Matsushita Electric Ind Co Ltd | 半導体薄膜形成装置 |
JPS6454733A (en) * | 1987-08-26 | 1989-03-02 | Toshiba Corp | Production device for semiconductor |
JPH0245917A (ja) * | 1988-08-08 | 1990-02-15 | Matsushita Electron Corp | 薄膜形成装置 |
US5294320A (en) * | 1990-02-09 | 1994-03-15 | Applied Materials, Inc. | Apparatus for cleaning a shield in a physical vapor deposition chamber |
US5135634A (en) * | 1991-02-14 | 1992-08-04 | Sputtered Films, Inc. | Apparatus for depositing a thin layer of sputtered atoms on a member |
DE4126236C2 (de) * | 1991-08-08 | 2000-01-05 | Leybold Ag | Rotierende Magnetron-Kathode und Verwendung einer rotierenden Magnetron-Kathode |
DE4140862A1 (de) * | 1991-12-11 | 1993-06-17 | Leybold Ag | Kathodenzerstaeubungsanlage |
DE4201551C2 (de) * | 1992-01-22 | 1996-04-25 | Leybold Ag | Zerstäubungskathode |
EP0625792B1 (fr) * | 1993-05-19 | 1997-05-28 | Applied Materials, Inc. | Dispositif et procédé pour augmenter l'uniformité des taux de pulvérisation dans un appareil de pulvérisation |
JPH06346234A (ja) * | 1993-06-08 | 1994-12-20 | Anelva Corp | スパッタリング装置 |
US5419029A (en) * | 1994-02-18 | 1995-05-30 | Applied Materials, Inc. | Temperature clamping method for anti-contamination and collimating devices for thin film processes |
US5527439A (en) * | 1995-01-23 | 1996-06-18 | The Boc Group, Inc. | Cylindrical magnetron shield structure |
US5763851A (en) * | 1995-11-27 | 1998-06-09 | Applied Materials, Inc. | Slotted RF coil shield for plasma deposition system |
-
1996
- 1996-07-10 US US08/677,760 patent/US5736021A/en not_active Expired - Lifetime
-
1997
- 1997-06-19 TW TW086108576A patent/TW346639B/zh active
- 1997-06-27 JP JP17190997A patent/JP4233618B2/ja not_active Expired - Fee Related
- 1997-07-01 SG SG1997002340A patent/SG71027A1/en unknown
- 1997-07-04 EP EP97304912A patent/EP0818803A3/fr not_active Withdrawn
- 1997-07-08 KR KR1019970031428A patent/KR100517474B1/ko not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP0818803A3 (fr) | 1999-03-31 |
JP4233618B2 (ja) | 2009-03-04 |
JPH1072665A (ja) | 1998-03-17 |
KR100517474B1 (ko) | 2005-12-07 |
KR980011765A (ko) | 1998-04-30 |
US5736021A (en) | 1998-04-07 |
EP0818803A2 (fr) | 1998-01-14 |
TW346639B (en) | 1998-12-01 |
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