SG49703A1 - Particle size measuring device - Google Patents

Particle size measuring device

Info

Publication number
SG49703A1
SG49703A1 SG1996004241A SG1996004241A SG49703A1 SG 49703 A1 SG49703 A1 SG 49703A1 SG 1996004241 A SG1996004241 A SG 1996004241A SG 1996004241 A SG1996004241 A SG 1996004241A SG 49703 A1 SG49703 A1 SG 49703A1
Authority
SG
Singapore
Prior art keywords
particle size
measuring device
size measuring
particle
size
Prior art date
Application number
SG1996004241A
Other languages
English (en)
Inventor
Takeshi Niwa
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of SG49703A1 publication Critical patent/SG49703A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4716—Using a ring of sensors, or a combination of diaphragm and sensors; Annular sensor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
SG1996004241A 1992-09-28 1993-09-20 Particle size measuring device SG49703A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4257877A JPH0816646B2 (ja) 1992-09-28 1992-09-28 粒度分布測定装置

Publications (1)

Publication Number Publication Date
SG49703A1 true SG49703A1 (en) 1998-06-15

Family

ID=17312427

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1996004241A SG49703A1 (en) 1992-09-28 1993-09-20 Particle size measuring device

Country Status (5)

Country Link
US (1) US5379113A (ja)
EP (1) EP0590841B1 (ja)
JP (1) JPH0816646B2 (ja)
DE (1) DE69312617T2 (ja)
SG (1) SG49703A1 (ja)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4733065A (en) * 1984-06-27 1988-03-22 Canon Kabushiki Kaisha Optical head device with diffraction grating for separating a light beam incident on an optical recording medium from a light beam reflected therefrom
NO310257B1 (no) * 1992-11-25 2001-06-11 Sumitomo Electric Industries Fremgangsmåte for å detektere forurensninger i smeltet harpiks
NL9301446A (nl) * 1993-08-20 1995-03-16 Univ Delft Tech Werkwijze en inrichting voor het meten van vormeigenschappen van deeltjes.
US6246474B1 (en) * 1998-04-29 2001-06-12 Particle Measuring Systems, Inc. Method and apparatus for measurement of particle size distribution in substantially opaque slurries
US6417920B1 (en) * 1999-05-11 2002-07-09 Shimadzu Corporation Particle size analyzer based on laser diffraction method
JP3397177B2 (ja) * 1999-06-28 2003-04-14 株式会社島津製作所 水中の微生物の監視方法
JP4266075B2 (ja) * 2001-02-19 2009-05-20 株式会社堀場製作所 粒径分布測定装置
US6807874B2 (en) * 2002-01-21 2004-10-26 Shimadzu Corporation Collecting apparatus of floating dusts in atmosphere
US7016791B2 (en) * 2002-10-02 2006-03-21 Airadvice, Inc. Particle sizing refinement system
JP6291740B2 (ja) * 2013-07-26 2018-03-14 セイコーインスツル株式会社 塵埃量検出装置および塵埃量検出装置の制御方法
US10365197B2 (en) * 2015-06-12 2019-07-30 Koninklijke Philips N.V. Optical particle sensor and sensing method
WO2020026704A1 (ja) * 2018-08-01 2020-02-06 株式会社島津製作所 光散乱検出装置
KR102351685B1 (ko) * 2021-04-08 2022-01-17 주식회사 컬처플러스 레이저 유도결합 플라즈마 분광법을 사용한 공기 중 염분센서 및 이를 포함하는 센서 시스템

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2300337A1 (fr) * 1975-02-04 1976-09-03 Cilas Procede et dispositif pour determiner la repartition granulometrique d'un melange de particules
US4188121A (en) * 1977-02-01 1980-02-12 Hirleman Edwin D Jr Multiple ratio single particle counter
US4288162A (en) * 1979-02-27 1981-09-08 Sumitomo Kinzoku Kogyo Kabushiki Kaisha Measuring particle size distribution
US4595291A (en) * 1982-10-15 1986-06-17 Tokyo Shibaura Denki Kabushiki Kaisha Particle diameter measuring device
JPS6474937A (en) * 1987-09-16 1989-03-20 Masaki Kawakita Culture bed for aquiculture
JP2641927B2 (ja) * 1988-11-16 1997-08-20 興和株式会社 微粒子測定装置
JP2715604B2 (ja) * 1989-12-18 1998-02-18 株式会社島津製作所 レーザ回折・散乱式粒度分布測定装置
JPH0484735A (ja) * 1990-07-27 1992-03-18 Shimadzu Corp 固体の屈折率の測定方法
JPH081482Y2 (ja) * 1990-11-17 1996-01-17 株式会社堀場製作所 粒度分布測定装置

Also Published As

Publication number Publication date
US5379113A (en) 1995-01-03
EP0590841B1 (en) 1997-07-30
EP0590841A1 (en) 1994-04-06
DE69312617D1 (de) 1997-09-04
JPH06109615A (ja) 1994-04-22
JPH0816646B2 (ja) 1996-02-21
DE69312617T2 (de) 1997-12-18

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