SG151198A1 - Methods relating to immersion lithography and an immersion lithographic apparatus - Google Patents

Methods relating to immersion lithography and an immersion lithographic apparatus

Info

Publication number
SG151198A1
SG151198A1 SG200806669-8A SG2008066698A SG151198A1 SG 151198 A1 SG151198 A1 SG 151198A1 SG 2008066698 A SG2008066698 A SG 2008066698A SG 151198 A1 SG151198 A1 SG 151198A1
Authority
SG
Singapore
Prior art keywords
immersion
lithographic apparatus
methods relating
lithography
immersion lithographic
Prior art date
Application number
SG200806669-8A
Other languages
English (en)
Inventor
Streefkerk Bob
Graaf Roelof Frederik De
Johannes Catharinus Hubertus Mulkens
Beckers Marcel
Paul Petrus Joannes Berkvens
David Lucien Anstotz
Original Assignee
Asml Netherlands Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv filed Critical Asml Netherlands Bv
Publication of SG151198A1 publication Critical patent/SG151198A1/en

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
    • H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
    • H01L21/0274—Photolithographic processes
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
    • G03F7/70916—Pollution mitigation, i.e. mitigating effect of contamination or debris, e.g. foil traps
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G03F7/2041—Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Public Health (AREA)
  • Epidemiology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Atmospheric Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
SG200806669-8A 2007-09-27 2008-09-10 Methods relating to immersion lithography and an immersion lithographic apparatus SG151198A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US96038607P 2007-09-27 2007-09-27
US7133508P 2008-04-22 2008-04-22

Publications (1)

Publication Number Publication Date
SG151198A1 true SG151198A1 (en) 2009-04-30

Family

ID=40219384

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200806669-8A SG151198A1 (en) 2007-09-27 2008-09-10 Methods relating to immersion lithography and an immersion lithographic apparatus

Country Status (7)

Country Link
US (1) US8587762B2 (fr)
EP (1) EP2042930B1 (fr)
JP (1) JP5064340B2 (fr)
KR (2) KR101010297B1 (fr)
CN (2) CN102156390B (fr)
SG (1) SG151198A1 (fr)
TW (1) TWI392974B (fr)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI245163B (en) * 2003-08-29 2005-12-11 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
US7880860B2 (en) 2004-12-20 2011-02-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US8817226B2 (en) 2007-02-15 2014-08-26 Asml Holding N.V. Systems and methods for insitu lens cleaning using ozone in immersion lithography
US8654305B2 (en) * 2007-02-15 2014-02-18 Asml Holding N.V. Systems and methods for insitu lens cleaning in immersion lithography
US8011377B2 (en) 2007-05-04 2011-09-06 Asml Netherlands B.V. Cleaning device and a lithographic apparatus cleaning method
US7866330B2 (en) * 2007-05-04 2011-01-11 Asml Netherlands B.V. Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method
US7900641B2 (en) * 2007-05-04 2011-03-08 Asml Netherlands B.V. Cleaning device and a lithographic apparatus cleaning method
US7916269B2 (en) 2007-07-24 2011-03-29 Asml Netherlands B.V. Lithographic apparatus and contamination removal or prevention method
US20090025753A1 (en) * 2007-07-24 2009-01-29 Asml Netherlands B.V. Lithographic Apparatus And Contamination Removal Or Prevention Method
NL1036306A1 (nl) 2007-12-20 2009-06-23 Asml Netherlands Bv Lithographic apparatus and in-line cleaning apparatus.
US8953143B2 (en) * 2009-04-24 2015-02-10 Nikon Corporation Liquid immersion member
NL2005655A (en) 2009-12-09 2011-06-14 Asml Netherlands Bv A lithographic apparatus and a device manufacturing method.
WO2011090690A1 (fr) * 2009-12-28 2011-07-28 Pioneer Hi-Bred International, Inc. Génotypes restaurateurs de fertilité du sorgo, et procédés de sélection assistée par marqueur
EP2381310B1 (fr) 2010-04-22 2015-05-06 ASML Netherlands BV Structure de manipulation de fluide et appareil lithographique
US20120012191A1 (en) * 2010-07-16 2012-01-19 Nikon Corporation Liquid recovery apparatus, exposure apparatus, liquid recovering method, device fabricating method, program, and storage medium
JP2012080007A (ja) * 2010-10-05 2012-04-19 Nikon Corp 露光装置、メンテナンス方法、及びデバイス製造方法
NL2009899A (en) 2011-12-20 2013-06-24 Asml Netherlands Bv A pump system, a carbon dioxide supply system, an extraction system, a lithographic apparatus and a device manufacturing method.
US9720331B2 (en) * 2012-12-27 2017-08-01 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium
US9651873B2 (en) * 2012-12-27 2017-05-16 Nikon Corporation Liquid immersion member, exposure apparatus, exposing method, method of manufacturing device, program, and recording medium
CN103885301B (zh) * 2014-03-21 2015-09-16 浙江大学 浸没式光刻机中浸液传送系统的控制时序的模型匹配方法
CN104570617B (zh) * 2014-12-25 2016-08-17 浙江大学 基于动态压力检测的浸没流场自适应密封方法
NL2019842A (en) 2016-12-14 2018-06-18 Asml Netherlands Bv A lithography apparatus and a method of manufacturing a device
NL2020556A (en) * 2017-04-20 2018-10-24 Asml Netherlands Bv A Method of Performance Testing Working Parameters of a Fluid Handling Structure and A Method of Detecting Loss of Immersion Liquid from a Fluid Handing Structure in an Immersion Lithographic Apparatus
KR102446678B1 (ko) 2017-12-15 2022-09-23 에이에스엠엘 네델란즈 비.브이. 유체 핸들링 구조체, 리소그래피 장치, 유체 핸들링 구조체를 사용하는 방법 및 리소그래피 장치를 사용하는 방법
EP4268020A1 (fr) * 2020-12-23 2023-11-01 ASML Netherlands B.V. Système de manipulation de fluide, procédé et appareil lithographique
CN112782051A (zh) * 2020-12-29 2021-05-11 浙江启尔机电技术有限公司 一种浸没控制单元的洁净度检测系统及其洁净度检测方法
CN113504707B (zh) * 2021-06-17 2023-12-05 华虹半导体(无锡)有限公司 浸没装置上孔洞堵塞的检测方法
EP4359866A1 (fr) * 2021-06-25 2024-05-01 ASML Netherlands B.V. Outil d'inspection, procédé et appareil lithographique
WO2024037801A1 (fr) * 2022-08-19 2024-02-22 Asml Netherlands B.V. Système, agencement et procédé de conditionnement

Family Cites Families (94)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4509852A (en) 1980-10-06 1985-04-09 Werner Tabarelli Apparatus for the photolithographic manufacture of integrated circuit elements
JP2753930B2 (ja) * 1992-11-27 1998-05-20 キヤノン株式会社 液浸式投影露光装置
WO1999027568A1 (fr) 1997-11-21 1999-06-03 Nikon Corporation Graveur de motifs a projection et procede de sensibilisation a projection
AU2747999A (en) 1998-03-26 1999-10-18 Nikon Corporation Projection exposure method and system
JP2000323396A (ja) 1999-05-13 2000-11-24 Canon Inc 露光方法、露光装置、およびデイバイス製造方法
EP1420300B1 (fr) 2002-11-12 2015-07-29 ASML Netherlands B.V. Appareil lithographique et méthode de fabrication d'un dispositif
EP2495613B1 (fr) 2002-11-12 2013-07-31 ASML Netherlands B.V. Appareil lithographique
JP3977324B2 (ja) 2002-11-12 2007-09-19 エーエスエムエル ネザーランズ ビー．ブイ． リソグラフィ装置
SG121822A1 (en) 2002-11-12 2006-05-26 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
JP4423559B2 (ja) 2002-12-03 2010-03-03 株式会社ニコン 汚染物質除去方法
JP4352874B2 (ja) 2002-12-10 2009-10-28 株式会社ニコン 露光装置及びデバイス製造方法
CN101813892B (zh) 2003-04-10 2013-09-25 株式会社尼康 沉浸式光刻装置及使用光刻工艺制造微器件的方法
EP2172809B1 (fr) 2003-04-11 2018-11-07 Nikon Corporation Méthode de nettoyage pour des optiques dans un appareil de lithographie par immersion, et appareil de lithographie par immersion correspondant
EP2270599A1 (fr) 2003-05-13 2011-01-05 ASML Netherlands BV Appareil lithographique
TWI518742B (zh) 2003-05-23 2016-01-21 尼康股份有限公司 A method of manufacturing an exposure apparatus and an element
US7684008B2 (en) 2003-06-11 2010-03-23 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP4492239B2 (ja) * 2003-07-28 2010-06-30 株式会社ニコン 露光装置及びデバイス製造方法、並びに露光装置の制御方法
EP2264534B1 (fr) 2003-07-28 2013-07-17 Nikon Corporation Appareil d'exposition, procédé de fabrication d'un dispositif et procédé de commande de l'appareil
CN101436001B (zh) 2003-07-28 2012-04-11 株式会社尼康 曝光装置、器件制造方法
US7779781B2 (en) * 2003-07-31 2010-08-24 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP2005072404A (ja) 2003-08-27 2005-03-17 Sony Corp 露光装置および半導体装置の製造方法
JP4305095B2 (ja) 2003-08-29 2009-07-29 株式会社ニコン 光学部品の洗浄機構を搭載した液浸投影露光装置及び液浸光学部品洗浄方法
TWI245163B (en) 2003-08-29 2005-12-11 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
KR101248325B1 (ko) 2003-09-26 2013-03-27 가부시키가이샤 니콘 투영노광장치 및 투영노광장치의 세정방법, 메인터넌스방법 그리고 디바이스의 제조방법
WO2005036623A1 (fr) 2003-10-08 2005-04-21 Zao Nikon Co., Ltd. Appareil et procede de transport de substrat, appareil et procede d'exposition, et procede de production de dispositif
EP1524558A1 (fr) * 2003-10-15 2005-04-20 ASML Netherlands B.V. Appareil lithographique et procédé pour la production d'un dispositif
JP2005159322A (ja) * 2003-10-31 2005-06-16 Nikon Corp 定盤、ステージ装置及び露光装置並びに露光方法
US7528929B2 (en) 2003-11-14 2009-05-05 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP1700164B1 (fr) 2003-12-23 2010-08-04 Koninklijke Philips Electronics N.V. Procédé d'irradiation
KR101748504B1 (ko) 2004-01-05 2017-06-16 가부시키가이샤 니콘 노광 장치, 노광 방법 및 디바이스 제조 방법
US7050146B2 (en) 2004-02-09 2006-05-23 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP1724815B1 (fr) 2004-02-10 2012-06-13 Nikon Corporation Aligneur, procede de fabrication de dispositif, procede de maintenance et procede d alignement
JP4479269B2 (ja) 2004-02-20 2010-06-09 株式会社ニコン 露光装置及びデバイス製造方法
US7091502B2 (en) 2004-05-12 2006-08-15 Taiwan Semiconductor Manufacturing, Co., Ltd. Apparatus and method for immersion lithography
CN108490741A (zh) 2004-06-09 2018-09-04 株式会社尼康 曝光装置及元件制造方法
US8698998B2 (en) 2004-06-21 2014-04-15 Nikon Corporation Exposure apparatus, method for cleaning member thereof, maintenance method for exposure apparatus, maintenance device, and method for producing device
US7463330B2 (en) * 2004-07-07 2008-12-09 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
DE102004033208B4 (de) 2004-07-09 2010-04-01 Vistec Semiconductor Systems Gmbh Vorrichtung zur Inspektion eines mikroskopischen Bauteils mit einem Immersionsobjektiv
US7307263B2 (en) 2004-07-14 2007-12-11 Asml Netherlands B.V. Lithographic apparatus, radiation system, contaminant trap, device manufacturing method, and method for trapping contaminants in a contaminant trap
US7224427B2 (en) 2004-08-03 2007-05-29 Taiwan Semiconductor Manufacturing Company, Ltd. Megasonic immersion lithography exposure apparatus and method
US7701550B2 (en) * 2004-08-19 2010-04-20 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP4772306B2 (ja) 2004-09-06 2011-09-14 株式会社東芝 液浸光学装置及び洗浄方法
US7385670B2 (en) 2004-10-05 2008-06-10 Asml Netherlands B.V. Lithographic apparatus, cleaning system and cleaning method for in situ removing contamination from a component in a lithographic apparatus
EP1806773A4 (fr) 2004-10-13 2008-12-31 Nikon Corp Dispositif d'exposition, procede d'exposition et procede de fabrication de dispositif
SG156635A1 (en) * 2004-10-15 2009-11-26 Nikon Corp Exposure apparatus and device manufacturing method
JP2006120674A (ja) 2004-10-19 2006-05-11 Canon Inc 露光装置及び方法、デバイス製造方法
JP2006134999A (ja) 2004-11-04 2006-05-25 Sony Corp 液浸型露光装置、及び、液浸型露光装置における保持台の洗浄方法
US7362412B2 (en) 2004-11-18 2008-04-22 International Business Machines Corporation Method and apparatus for cleaning a semiconductor substrate in an immersion lithography system
KR101559621B1 (ko) * 2004-12-06 2015-10-13 가부시키가이샤 니콘 메인터넌스 방법, 메인터넌스 기기, 노광 장치, 및 디바이스 제조 방법
JP4752473B2 (ja) * 2004-12-09 2011-08-17 株式会社ニコン 露光装置、露光方法及びデバイス製造方法
US7880860B2 (en) 2004-12-20 2011-02-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP4569291B2 (ja) * 2004-12-24 2010-10-27 株式会社ニコン 露光装置及びデバイス製造方法
EP1681597B1 (fr) 2005-01-14 2010-03-10 ASML Netherlands B.V. Appareil lithographique et procédé de fabrication d'un dispositif
US7411654B2 (en) * 2005-04-05 2008-08-12 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP2006310706A (ja) 2005-05-02 2006-11-09 Nikon Corp 光学部品の洗浄方法、液浸投影露光装置および露光方法
US20060250588A1 (en) 2005-05-03 2006-11-09 Stefan Brandl Immersion exposure tool cleaning system and method
US7315033B1 (en) 2005-05-04 2008-01-01 Advanced Micro Devices, Inc. Method and apparatus for reducing biological contamination in an immersion lithography system
WO2006122578A1 (fr) 2005-05-17 2006-11-23 Freescale Semiconductor, Inc. Appareil de suppression des contaminants et procede idoine
US20070085989A1 (en) 2005-06-21 2007-04-19 Nikon Corporation Exposure apparatus and exposure method, maintenance method, and device manufacturing method
US7170583B2 (en) * 2005-06-29 2007-01-30 Asml Netherlands B.V. Lithographic apparatus immersion damage control
US20070002296A1 (en) 2005-06-30 2007-01-04 Taiwan Semiconductor Manufacturing Company, Ltd. Immersion lithography defect reduction
US7262422B2 (en) 2005-07-01 2007-08-28 Spansion Llc Use of supercritical fluid to dry wafer and clean lens in immersion lithography
DE102005031792A1 (de) 2005-07-07 2007-01-11 Carl Zeiss Smt Ag Verfahren zur Entfernung von Kontamination von optischen Elementen, insbesondere von Oberflächen optischer Elemente sowie ein optisches System oder Teilsystem hierfür
JP2007029973A (ja) 2005-07-25 2007-02-08 Sony Corp レーザ加工装置とその加工方法及びデブリ回収装置とその回収方法
JP2007088040A (ja) 2005-09-20 2007-04-05 Canon Inc 露光装置
JP2007088328A (ja) 2005-09-26 2007-04-05 Toshiba Corp 液浸型露光装置の洗浄方法
JP2007103658A (ja) 2005-10-04 2007-04-19 Canon Inc 露光方法および装置ならびにデバイス製造方法
US7986395B2 (en) 2005-10-24 2011-07-26 Taiwan Semiconductor Manufacturing Company, Ltd. Immersion lithography apparatus and methods
CN1963673A (zh) 2005-11-11 2007-05-16 台湾积体电路制造股份有限公司 浸润式微影曝光设备及方法
JP2007142217A (ja) 2005-11-18 2007-06-07 Taiwan Semiconductor Manufacturing Co Ltd イマージョン式リソグラフィ露光装置およびその方法
JP2007150102A (ja) 2005-11-29 2007-06-14 Fujitsu Ltd 露光装置及び光学素子の洗浄方法
US8125610B2 (en) 2005-12-02 2012-02-28 ASML Metherlands B.V. Method for preventing or reducing contamination of an immersion type projection apparatus and an immersion type lithographic apparatus
US7462850B2 (en) 2005-12-08 2008-12-09 Asml Netherlands B.V. Radical cleaning arrangement for a lithographic apparatus
US7405417B2 (en) 2005-12-20 2008-07-29 Asml Netherlands B.V. Lithographic apparatus having a monitoring device for detecting contamination
US20070146658A1 (en) 2005-12-27 2007-06-28 Asml Netherlands B.V. Lithographic apparatus and method
US7522263B2 (en) 2005-12-27 2009-04-21 Asml Netherlands B.V. Lithographic apparatus and method
JP4704221B2 (ja) 2006-01-26 2011-06-15 株式会社Ｓｏｋｕｄｏ 基板処理装置および基板処理方法
JP2007221015A (ja) 2006-02-20 2007-08-30 Sony Corp 液侵露光装置
JP2007227543A (ja) * 2006-02-22 2007-09-06 Toshiba Corp 液浸光学装置、洗浄方法及び液浸露光方法
JP2007227580A (ja) 2006-02-23 2007-09-06 Sony Corp 液浸型露光装置および液浸型露光方法
JP2007266074A (ja) 2006-03-27 2007-10-11 Toshiba Corp 半導体装置の製造方法及び液浸リソグラフィーシステム
JP2007294817A (ja) 2006-04-27 2007-11-08 Sokudo:Kk 基板処理方法、基板処理システムおよび基板処理装置
US7628865B2 (en) 2006-04-28 2009-12-08 Asml Netherlands B.V. Methods to clean a surface, a device manufacturing method, a cleaning assembly, cleaning apparatus, and lithographic apparatus
US7602471B2 (en) 2006-05-17 2009-10-13 Taiwan Semiconductor Manufacturing Company, Ltd. Apparatus and method for particle monitoring in immersion lithography
CN102298274A (zh) 2006-05-18 2011-12-28 株式会社尼康 曝光方法及装置、维护方法、以及组件制造方法
US7969548B2 (en) 2006-05-22 2011-06-28 Asml Netherlands B.V. Lithographic apparatus and lithographic apparatus cleaning method
KR20090023331A (ko) 2006-05-23 2009-03-04 가부시키가이샤 니콘 메인터넌스 방법, 노광 방법 및 장치, 그리고 디바이스 제조 방법
JP2007317987A (ja) 2006-05-29 2007-12-06 Sokudo:Kk 基板処理装置および基板処理方法
WO2008001871A1 (fr) 2006-06-30 2008-01-03 Nikon Corporation Procédé de maintenance, procédé d'exposition et procédé de fabrication d'appareil et de dispositif
JP2008041822A (ja) * 2006-08-03 2008-02-21 Nikon Corp 露光装置及びデバイス製造方法、並びに環境制御装置
US7900641B2 (en) 2007-05-04 2011-03-08 Asml Netherlands B.V. Cleaning device and a lithographic apparatus cleaning method
US8947629B2 (en) 2007-05-04 2015-02-03 Asml Netherlands B.V. Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method
US20090025753A1 (en) 2007-07-24 2009-01-29 Asml Netherlands B.V. Lithographic Apparatus And Contamination Removal Or Prevention Method
US7916269B2 (en) 2007-07-24 2011-03-29 Asml Netherlands B.V. Lithographic apparatus and contamination removal or prevention method

Also Published As

Publication number Publication date
CN102156390A (zh) 2011-08-17
KR20090033128A (ko) 2009-04-01
JP2009088508A (ja) 2009-04-23
EP2042930B1 (fr) 2014-02-12
JP5064340B2 (ja) 2012-10-31
TW200921294A (en) 2009-05-16
KR101010297B1 (ko) 2011-01-24
TWI392974B (zh) 2013-04-11
KR20110004809A (ko) 2011-01-14
CN101408733B (zh) 2013-02-27
EP2042930A2 (fr) 2009-04-01
US8587762B2 (en) 2013-11-19
EP2042930A3 (fr) 2009-06-24
US20090086175A1 (en) 2009-04-02
CN101408733A (zh) 2009-04-15
CN102156390B (zh) 2017-03-01

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