SG142264A1 - Lithographic apparatus and device manufacturing method - Google Patents

Lithographic apparatus and device manufacturing method

Info

Publication number
SG142264A1
SG142264A1 SG200717002-0A SG2007170020A SG142264A1 SG 142264 A1 SG142264 A1 SG 142264A1 SG 2007170020 A SG2007170020 A SG 2007170020A SG 142264 A1 SG142264 A1 SG 142264A1
Authority
SG
Singapore
Prior art keywords
lithographic apparatus
path length
optical
device manufacturing
optical path
Prior art date
Application number
SG200717002-0A
Other languages
English (en)
Inventor
Jansen Bastiaan Step Hendricus
Loopstra Erik Roelof
Ravensbergen Marius
Hauf Markus Josef
Original Assignee
Asml Netherlands Bv
Zeiss Carl Smt Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv, Zeiss Carl Smt Ag filed Critical Asml Netherlands Bv
Publication of SG142264A1 publication Critical patent/SG142264A1/en

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70058—Mask illumination systems
    • G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/0025—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00—Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02—Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G02B7/028—Mountings, adjusting means, or light-tight connections, for optical elements for lenses with means for compensating for changes in temperature or for controlling the temperature; thermal stabilisation
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216—Mask projection systems
    • G03F7/70308—Optical correction elements, filters or phase plates for manipulating imaging light, e.g. intensity, wavelength, polarisation, phase or image shift
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
    • G03F7/70883—Environment aspects, e.g. pressure of beam-path gas, temperature of optical system
    • G03F7/70891—Temperature

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Environmental & Geological Engineering (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Engineering & Computer Science (AREA)
  • Atmospheric Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
SG200717002-0A 2006-11-07 2007-10-18 Lithographic apparatus and device manufacturing method SG142264A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/593,648 US7525640B2 (en) 2006-11-07 2006-11-07 Lithographic apparatus and device manufacturing method

Publications (1)

Publication Number Publication Date
SG142264A1 true SG142264A1 (en) 2008-05-28

Family

ID=39093001

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200717002-0A SG142264A1 (en) 2006-11-07 2007-10-18 Lithographic apparatus and device manufacturing method

Country Status (8)

Country Link
US (1) US7525640B2 (de)
EP (1) EP1921505B1 (de)
JP (1) JP4686527B2 (de)
KR (1) KR100909455B1 (de)
CN (1) CN101178547B (de)
DE (1) DE602007012636D1 (de)
SG (1) SG142264A1 (de)
TW (1) TWI372317B (de)

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006045075A1 (de) * 2006-09-21 2008-04-03 Carl Zeiss Smt Ag Steuerbares optisches Element
US8064151B2 (en) * 2007-08-14 2011-11-22 Asml Netherlands B.V. Lithographic apparatus and thermal optical manipulator control method
JP5579063B2 (ja) * 2007-08-24 2014-08-27 カール・ツァイス・エスエムティー・ゲーエムベーハー 制御可能な光学素子、熱アクチュエータによる光学素子の操作方法および半導体リソグラフィのための投影露光装置
KR20170116248A (ko) 2007-10-09 2017-10-18 칼 짜이스 에스엠테 게엠베하 광학 소자의 온도 제어 장치
NL1036905A1 (nl) * 2008-06-03 2009-12-04 Asml Netherlands Bv Lithographic apparatus and device manufacturing method.
JP4970498B2 (ja) 2008-06-24 2012-07-04 エーエスエムエル ネザーランズ ビー．ブイ． リソグラフィ装置およびデバイス製造方法
NL2003640A (en) * 2008-11-17 2010-05-18 Asml Netherlands Bv Method for a lithographic apparatus.
NL2003689A (en) * 2008-11-26 2010-05-27 Asml Netherlands Bv Method for a lithographic apparatus.
NL2003806A (en) * 2008-12-15 2010-06-16 Asml Netherlands Bv Method for a lithographic apparatus.
NL2004323A (en) * 2009-04-16 2010-10-18 Asml Netherlands Bv Device manufacturing method and lithographic apparatus.
KR101626737B1 (ko) * 2009-05-16 2016-06-01 칼 짜이스 에스엠테 게엠베하 광학 교정 배열체를 포함하는 반도체 리소그래피를 위한 투사 노광 장치
NL2005009A (en) * 2009-07-27 2011-01-31 Asml Netherlands Bv Lithographic apparatus and device manufacturing method.
NL2005449A (en) * 2009-11-16 2012-04-05 Asml Netherlands Bv Lithographic method and apparatus.
KR101156431B1 (ko) * 2009-12-01 2012-06-18 삼성모바일디스플레이주식회사 증착 장치 및 이를 이용한 유기 발광 소자 제조 방법
JP2011192991A (ja) * 2010-03-12 2011-09-29 Asml Netherlands Bv リソグラフィ装置および方法
JP5127875B2 (ja) 2010-04-28 2013-01-23 キヤノン株式会社 リソグラフィ装置及び物品の製造方法
US11105686B2 (en) * 2010-05-10 2021-08-31 University of Pittshurgh-Of the Commonwealth System of Higher Education Spatial-domain low-coherence quantitative phase microscopy
CN102375344B (zh) * 2010-08-18 2013-09-11 上海微电子装备有限公司 控制透镜像质变化的方法
DE102010041528A1 (de) * 2010-09-28 2012-03-29 Carl Zeiss Smt Gmbh Projektionsbelichtungsanlage mit optimierter Justagemöglichkeit
NL2007439A (en) * 2010-10-19 2012-04-23 Asml Netherlands Bv Gas manifold, module for a lithographic apparatus, lithographic apparatus and device manufacturing method.
NL2007477A (en) * 2010-10-22 2012-04-24 Asml Netherlands Bv Method of optimizing a lithographic process, device manufacturing method, lithographic apparatus, computer program product and simulation apparatus.
NL2007498A (en) 2010-12-23 2012-06-27 Asml Netherlands Bv Lithographic apparatus and method of modifying a beam of radiation within a lithographic apparatus.
NL2008184A (en) 2011-02-28 2012-08-29 Asml Netherlands Bv Gas manifold, module for a lithographic apparatus, lithographic apparatus and device manufacturing method.
US8736814B2 (en) * 2011-06-13 2014-05-27 Micron Technology, Inc. Lithography wave-front control system and method
DE102011077784A1 (de) * 2011-06-20 2012-12-20 Carl Zeiss Smt Gmbh Projektionsanordnung
WO2013044936A1 (en) * 2011-09-29 2013-04-04 Carl Zeiss Smt Gmbh Projection objective of a microlithographic projection exposure apparatus
NL2009850A (en) 2011-12-02 2013-06-05 Asml Netherlands Bv Lithographic method and apparatus.
FR3011331B1 (fr) * 2013-10-01 2017-02-17 Univ Aix Marseille Capteur a gaz a couche sensible chauffee
KR101901729B1 (ko) 2014-05-02 2018-09-28 에이에스엠엘 네델란즈 비.브이. 조밀 피처들의 핫스폿들의 감소
WO2016096338A1 (en) 2014-12-17 2016-06-23 Asml Netherlands B.V. Method and apparatus for using patterning device topography induced phase
KR20170096002A (ko) 2014-12-17 2017-08-23 에이에스엠엘 네델란즈 비.브이. 패터닝 디바이스 토포그래피 유도 위상을 이용하는 장치 및 방법
US20170285483A1 (en) 2014-12-17 2017-10-05 Asml Netherlands B.V. Method and apparatus for using patterning device topography induced phase
DE102017203571A1 (de) * 2017-03-06 2018-09-06 Carl Zeiss Smt Gmbh Optische anordnung für eine lithographieanlage sowie verfahren zum betreiben einer lithographieanlage
DE102017206256A1 (de) 2017-04-11 2018-10-11 Carl Zeiss Smt Gmbh Wellenfrontkorrekturelement zur Verwendung in einem optischen System
JP2022185871A (ja) 2021-06-03 2022-12-15 キヤノン株式会社 露光方法、露光装置、および物品製造方法
DE102022211636A1 (de) * 2022-11-04 2024-05-08 Carl Zeiss Smt Gmbh Optisches System, sowie Verfahren zum Betreiben eines optischen Systems

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS57114327A (en) * 1980-12-29 1982-07-16 Fanuc Ltd Method for correcting corner shape
JPS60163046A (ja) * 1984-02-03 1985-08-24 Nippon Kogaku Kk <Nikon> 投影露光光学装置及び投影露光方法
US4790654A (en) * 1987-07-17 1988-12-13 Trw Inc. Spectral filter
CA2077572C (en) * 1991-09-07 1998-08-18 Masahito Niibe Method of and apparatus for stabilizing shapes of objects, such as optical elements, as well as exposure apparatus using same and method of manufacturing semiconductr devices
JP3652325B2 (ja) * 1994-04-22 2005-05-25 キヤノン株式会社 投影露光装置及びデバイスの製造方法
JP3368091B2 (ja) * 1994-04-22 2003-01-20 キヤノン株式会社 投影露光装置及びデバイスの製造方法
JPH09232213A (ja) * 1996-02-26 1997-09-05 Nikon Corp 投影露光装置
JPH1167651A (ja) * 1997-08-25 1999-03-09 Nikon Corp 投影露光装置
JPH11154643A (ja) * 1997-09-16 1999-06-08 Nikon Corp 露光装置および該装置を用いた露光方法
DE19956353C1 (de) * 1999-11-24 2001-08-09 Zeiss Carl Optische Anordnung
US7095484B1 (en) * 2001-06-27 2006-08-22 University Of South Florida Method and apparatus for maskless photolithography
JP2003297729A (ja) * 2002-04-03 2003-10-17 Nikon Corp 投影光学系、露光装置および露光方法
US7343271B2 (en) * 2003-10-27 2008-03-11 International Business Machines Corporation Incorporation of a phase map into fast model-based optical proximity correction simulation kernels to account for near and mid-range flare
US7782440B2 (en) 2004-11-18 2010-08-24 Carl Zeiss Smt Ag Projection lens system of a microlithographic projection exposure installation
DE102006045075A1 (de) 2006-09-21 2008-04-03 Carl Zeiss Smt Ag Steuerbares optisches Element

Also Published As

Publication number Publication date
EP1921505A1 (de) 2008-05-14
TWI372317B (en) 2012-09-11
EP1921505B1 (de) 2011-02-23
US20080123066A1 (en) 2008-05-29
CN101178547A (zh) 2008-05-14
KR20080041583A (ko) 2008-05-13
KR100909455B1 (ko) 2009-07-28
DE602007012636D1 (de) 2011-04-07
US7525640B2 (en) 2009-04-28
JP4686527B2 (ja) 2011-05-25
JP2008118135A (ja) 2008-05-22
TW200827941A (en) 2008-07-01
CN101178547B (zh) 2010-09-29

Similar Documents

Publication Publication Date Title
SG142264A1 (en) Lithographic apparatus and device manufacturing method
SG149006A1 (en) Lithographic apparatus, contaminant trap, and device manufacturing method
TW200734800A (en) Lithographic apparatus and device manufacturing method
TW200942977A (en) Exposure apparatus, exposure method, and device manufacturing method
SG131880A1 (en) Method and arrangement for predicting thermally-induced deformation of a substrate, and a semiconductor device
WO2013152878A3 (en) Position measuring method, position measuring apparatus, lithographic apparatus and device manufacturing method, optical element
FR2923673B1 (fr) Dispositif de commande electronique et procede de fabrication du dispositif electronique
TW200632591A (en) Exposure method, manufacturing method of electronic device, exposure device, and illuminating optical device
NL2003157A1 (nl) Radiation source, lithographic apparatus, and device manufacturing method.
ATE537476T1 (de) Vorrichtung zur homogenisierung von strahlung mit nicht regelmässigen mikrolinsenarrays
BRPI0819981A2 (pt) Eletrodo frontal incuindo revestimento condutor transparente sobre substrato de vidro padronizado, para uso em dispositivo fotovoltaico, e métodos de produção do mesmo
PL2022108T3 (pl) Organiczne urządzenia optoelektroniczne i ich zastosowania
BRPI0815594A2 (pt) Conjunto de célula de combustível, célula de combustível sensora, dispositivo elétrico, aparelho, e, método para operar um conjunto de célula de combustível.
NL2003310A1 (nl) Radiation source, lithographic apparatus and device manufacturing method.
UY33466A (es) Mejoras de seguridad para sustratos flexibles
BR112013015061A2 (pt) método e sistema para configurar um dispositivo para corrigir o efeito de um meio em um sinal luminoso, método, aparelho e sistema para corrigir o referido efeito
WO2010037732A3 (en) Projection exposure apparatus for microlithography for the production of semiconductor components
ATE525679T1 (de) Optischer integrator für eine beleuchtungssystem einer mikrolithographie-projektions- belichtungsvorrichtung
GB2434687B (en) Thin film transistor array substrate system and method for manufacturing
NL2003152A1 (nl) Radiation source, lithographic apparatus and device manufacturing method.
TW200734830A (en) Lithogrpahic apparatus and device manufacturing method using multiple exposures and multiple exposure types
TW200717039A (en) Reflector, optical element, interferometer system, stage device, exposure apparatus, and device fabricating method
ATE554420T1 (de) Beleuchtungssystem einer mikrolithografischen projektionsbelichtungsvorrichtung
TW200736574A (en) Position measuring device and position measuring method, mobile body driving system and mobile body driving method, pattern forming device and pattern forming method, exposure device and exposure method, and device manufacturing method
TW200943382A (en) Computer generated hologram, generation method, and exposure apparatus