SG125152A1 - Substrate holding apparatus and substrate polishing apparatus - Google Patents

Substrate holding apparatus and substrate polishing apparatus

Info

Publication number
SG125152A1
SG125152A1 SG200501205A SG200501205A SG125152A1 SG 125152 A1 SG125152 A1 SG 125152A1 SG 200501205 A SG200501205 A SG 200501205A SG 200501205 A SG200501205 A SG 200501205A SG 125152 A1 SG125152 A1 SG 125152A1
Authority
SG
Singapore
Prior art keywords
substrate
polishing
holding
holder body
substrate holding
Prior art date
Application number
SG200501205A
Other languages
English (en)
Inventor
Yoshihiro Gunji
Hozumi Yasuda
Keisuke Namiki
Hiroshi Yoshida
Original Assignee
Ebara Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from JP2000280216A external-priority patent/JP3856634B2/ja
Application filed by Ebara Corp filed Critical Ebara Corp
Publication of SG125152A1 publication Critical patent/SG125152A1/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • B24B37/32Retaining rings
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B49/00Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation
    • B24B49/16Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation taking regard of the load

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
SG200501205A 2000-07-31 2001-07-31 Substrate holding apparatus and substrate polishing apparatus SG125152A1 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2000231892 2000-07-31
JP2000280216A JP3856634B2 (ja) 2000-09-14 2000-09-14 基板保持装置及び該基板保持装置を備えたポリッシング装置

Publications (1)

Publication Number Publication Date
SG125152A1 true SG125152A1 (en) 2006-09-29

Family

ID=26597077

Family Applications (4)

Application Number Title Priority Date Filing Date
SG200501205A SG125152A1 (en) 2000-07-31 2001-07-31 Substrate holding apparatus and substrate polishing apparatus
SG200104611-9A SG129989A1 (en) 2000-07-31 2001-07-31 Substrate holding apparatus and substrate polishing apparatus
SG200804145-1A SG157258A1 (en) 2000-07-31 2001-07-31 Substrate holding apparatus and substrate polishing apparatus
SG10201706765QA SG10201706765QA (en) 2000-07-31 2014-07-31 Substrate holding apparatus and substrate polishing apparatus

Family Applications After (3)

Application Number Title Priority Date Filing Date
SG200104611-9A SG129989A1 (en) 2000-07-31 2001-07-31 Substrate holding apparatus and substrate polishing apparatus
SG200804145-1A SG157258A1 (en) 2000-07-31 2001-07-31 Substrate holding apparatus and substrate polishing apparatus
SG10201706765QA SG10201706765QA (en) 2000-07-31 2014-07-31 Substrate holding apparatus and substrate polishing apparatus

Country Status (6)

Country Link
US (5) US6890402B2 (de)
EP (2) EP2085181A1 (de)
KR (1) KR100876381B1 (de)
DE (1) DE60138343D1 (de)
SG (4) SG125152A1 (de)
TW (1) TW516991B (de)

Families Citing this family (55)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
PT1098972E (pt) * 1998-07-22 2010-12-14 Smithkline Beecham Ltd Proteína semelhante a proteína especificamente neuroendócrina e adnc codificante
US7217175B2 (en) * 2001-05-29 2007-05-15 Ebara Corporation Polishing apparatus and polishing method
TWI289494B (en) 2002-01-22 2007-11-11 Multi Planar Technologies Inc Chemical mechanical polishing apparatus and method having a retaining ring with a contoured surface for slurry distribution
WO2004033152A1 (en) * 2002-10-11 2004-04-22 Semplastics, L.L.C. Retaining ring for use on a carrier of a polishing apparatus
US20040102140A1 (en) * 2002-11-21 2004-05-27 Wood Jeffrey H. Contour following end effectors for lapping/polishing
WO2004070806A1 (en) * 2003-02-10 2004-08-19 Ebara Corporation Substrate holding apparatus and polishing apparatus
DE10394257D2 (de) * 2003-07-09 2006-05-18 Peter Wolters Surface Technolo Halter für flache Werkstücke, insbesondere Halbleiterwafer zum chemisch-mechanischen Polieren
JP2005034959A (ja) * 2003-07-16 2005-02-10 Ebara Corp 研磨装置及びリテーナリング
US20050126708A1 (en) * 2003-12-10 2005-06-16 Applied Materials, Inc. Retaining ring with slurry transport grooves
US7118452B2 (en) * 2004-02-12 2006-10-10 The Boeing Company Pneumatically actuated flexible coupling end effectors for lapping/polishing
US7429410B2 (en) * 2004-09-20 2008-09-30 Applied Materials, Inc. Diffuser gravity support
EP2797109B1 (de) 2004-11-01 2018-02-28 Ebara Corporation Poliervorrichtung
DE102005016411B4 (de) * 2005-04-08 2007-03-29 IGAM Ingenieurgesellschaft für angewandte Mechanik mbH Vorrichtung zur hochgenauen Oberflächenbearbeitung eines Werkstückes
US7326105B2 (en) * 2005-08-31 2008-02-05 Micron Technology, Inc. Retaining rings, and associated planarizing apparatuses, and related methods for planarizing micro-device workpieces
KR100898793B1 (ko) * 2005-12-29 2009-05-20 엘지디스플레이 주식회사 액정표시소자용 기판 합착 장치
US7527271B2 (en) * 2006-06-02 2009-05-05 Applied Materials, Inc. Fast substrate loading on polishing head without membrane inflation step
US7575504B2 (en) * 2006-11-22 2009-08-18 Applied Materials, Inc. Retaining ring, flexible membrane for applying load to a retaining ring, and retaining ring assembly
JP2008177248A (ja) * 2007-01-16 2008-07-31 Tokyo Seimitsu Co Ltd 研磨ヘッド用リテーナリング
DE102007026292A1 (de) * 2007-06-06 2008-12-11 Siltronic Ag Verfahren zur einseitigen Politur nicht strukturierter Halbleiterscheiben
KR100864943B1 (ko) * 2007-08-09 2008-10-23 세메스 주식회사 기판 세정 장치
JP5042778B2 (ja) * 2007-10-31 2012-10-03 信越半導体株式会社 ワーク研磨用ヘッド及びこの研磨ヘッドを備えた研磨装置
JP5464843B2 (ja) * 2007-12-03 2014-04-09 株式会社半導体エネルギー研究所 Soi基板の作製方法
US20090311945A1 (en) * 2008-06-17 2009-12-17 Roland Strasser Planarization System
JP5390807B2 (ja) * 2008-08-21 2014-01-15 株式会社荏原製作所 研磨方法および装置
US8460067B2 (en) 2009-05-14 2013-06-11 Applied Materials, Inc. Polishing head zone boundary smoothing
CA3077883C (en) 2010-02-18 2024-01-16 Ncs Multistage Inc. Downhole tool assembly with debris relief, and method for using same
JP5648954B2 (ja) * 2010-08-31 2015-01-07 不二越機械工業株式会社 研磨装置
CA3022033A1 (en) 2010-10-18 2011-07-12 Ncs Multistage Inc. Tools and methods for use in completion of a wellbore
KR101775464B1 (ko) * 2011-05-31 2017-09-07 삼성전자주식회사 화학 기계적 연마 장치의 리테이너 링
DE102011082777A1 (de) * 2011-09-15 2012-02-09 Siltronic Ag Verfahren zum beidseitigen Polieren einer Halbleiterscheibe
US20130078812A1 (en) * 2011-09-23 2013-03-28 Strasbaugh Wafer Carrier with Flexible Pressure Plate
US9176173B2 (en) * 2011-11-28 2015-11-03 Texas Instruments Incorporated Method for detecting imperfect mounting of a rod-shaped metallic object in a metallic hollow shaft and a device
WO2013112764A1 (en) * 2012-01-25 2013-08-01 Applied Materials, Inc. Retaining ring monitoring and control of pressure
US9050700B2 (en) 2012-01-27 2015-06-09 Applied Materials, Inc. Methods and apparatus for an improved polishing head retaining ring
US8931559B2 (en) 2012-03-23 2015-01-13 Ncs Oilfield Services Canada, Inc. Downhole isolation and depressurization tool
CN102672551A (zh) * 2012-05-22 2012-09-19 江南大学 一种超声波雾化型抛光机
JP5976522B2 (ja) * 2012-05-31 2016-08-23 株式会社荏原製作所 研磨装置および研磨方法
US10702972B2 (en) 2012-05-31 2020-07-07 Ebara Corporation Polishing apparatus
US9016675B2 (en) * 2012-07-06 2015-04-28 Asm Technology Singapore Pte Ltd Apparatus and method for supporting a workpiece during processing
US9908718B2 (en) * 2012-10-19 2018-03-06 Dow Global Technologies Llc Device, system, and method for lifting and moving formable and/or collapsible parts
US8998676B2 (en) * 2012-10-26 2015-04-07 Applied Materials, Inc. Retaining ring with selected stiffness and thickness
JP5538601B1 (ja) * 2013-08-22 2014-07-02 ミクロ技研株式会社 研磨ヘッド及び研磨処理装置
KR101568177B1 (ko) * 2014-01-21 2015-11-11 주식회사 케이씨텍 화학 기계적 연마 장치용 캐리어 헤드 및 이에 사용되는 리테이너 링
JP6336893B2 (ja) * 2014-11-11 2018-06-06 株式会社荏原製作所 研磨装置
KR102173323B1 (ko) 2014-06-23 2020-11-04 삼성전자주식회사 캐리어 헤드, 화학적 기계식 연마 장치 및 웨이퍼 연마 방법
DE102014212176A1 (de) * 2014-06-25 2015-12-31 Siemens Aktiengesellschaft Pulverbettbasiertes additives Fertigungsverfahren und Anlage zur Durchführung dieses Verfahrens
US10510563B2 (en) * 2016-04-15 2019-12-17 Taiwan Semiconductor Manufacturing Company Ltd. Wafer carrier assembly
JP6447575B2 (ja) * 2016-05-23 2019-01-09 トヨタ自動車株式会社 金属皮膜の成膜方法およびその成膜装置
USD839224S1 (en) * 2016-12-12 2019-01-29 Ebara Corporation Elastic membrane for semiconductor wafer polishing
CN108818294A (zh) * 2018-06-26 2018-11-16 长江存储科技有限责任公司 研磨头、研磨系统及研磨方法
US20200055160A1 (en) * 2018-08-14 2020-02-20 Taiwan Semiconductor Manufacturing Co., Ltd. Chemical mechanical polishing method and apparatus
KR20200070825A (ko) * 2018-12-10 2020-06-18 삼성전자주식회사 연마 균일도를 제어할 수 있는 화학 기계적 연마 장치
CN110948385B (zh) * 2019-01-08 2020-08-14 华海清科股份有限公司 一种用于化学机械抛光的弹性膜
CN110497545B (zh) * 2019-08-13 2021-06-08 安徽晶天新能源科技有限责任公司 一种太阳能硅片生产加工工艺
US11325223B2 (en) * 2019-08-23 2022-05-10 Applied Materials, Inc. Carrier head with segmented substrate chuck

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5967885A (en) * 1997-12-01 1999-10-19 Lucent Technologies Inc. Method of manufacturing an integrated circuit using chemical mechanical polishing
WO2000021715A2 (en) * 1998-10-09 2000-04-20 Speedfam-Ipec Corporation Semiconductor wafer polishing apparatus with a variable polishing force wafer carrier head
US6093082A (en) * 1997-05-23 2000-07-25 Applied Materials, Inc. Carrier head with a substrate detection mechanism for a chemical mechanical polishing system

Family Cites Families (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5146259A (en) * 1988-06-30 1992-09-08 Asahi Kogaku Kogyo Kabushiki Kaisha Electronically controlled camera including automatic shutter speed changing apparatus
JPH0569310A (ja) 1991-04-23 1993-03-23 Mitsubishi Materials Corp ウエーハの鏡面研磨装置
US5643053A (en) * 1993-12-27 1997-07-01 Applied Materials, Inc. Chemical mechanical polishing apparatus with improved polishing control
JP3257304B2 (ja) 1994-11-24 2002-02-18 三菱マテリアル株式会社 研磨装置
JP3158934B2 (ja) * 1995-02-28 2001-04-23 三菱マテリアル株式会社 ウェーハ研磨装置
JP3690837B2 (ja) * 1995-05-02 2005-08-31 株式会社荏原製作所 ポリッシング装置及び方法
US5643061A (en) * 1995-07-20 1997-07-01 Integrated Process Equipment Corporation Pneumatic polishing head for CMP apparatus
US5695392A (en) * 1995-08-09 1997-12-09 Speedfam Corporation Polishing device with improved handling of fluid polishing media
JP3724869B2 (ja) * 1995-10-09 2005-12-07 株式会社荏原製作所 ポリッシング装置および方法
US5762539A (en) * 1996-02-27 1998-06-09 Ebara Corporation Apparatus for and method for polishing workpiece
US6595831B1 (en) * 1996-05-16 2003-07-22 Ebara Corporation Method for polishing workpieces using fixed abrasives
US6146259A (en) * 1996-11-08 2000-11-14 Applied Materials, Inc. Carrier head with local pressure control for a chemical mechanical polishing apparatus
US5941758A (en) * 1996-11-13 1999-08-24 Intel Corporation Method and apparatus for chemical-mechanical polishing
JPH10178087A (ja) 1996-12-17 1998-06-30 Tokyo Seimitsu Co Ltd ウェーハ吸着テーブル
US5851140A (en) * 1997-02-13 1998-12-22 Integrated Process Equipment Corp. Semiconductor wafer polishing apparatus with a flexible carrier plate
EP1327498B1 (de) * 1997-04-08 2013-06-12 Ebara Corporation Poliervorrichtung
JP3724911B2 (ja) * 1997-04-08 2005-12-07 株式会社荏原製作所 ポリッシング装置
US5891791A (en) * 1997-05-27 1999-04-06 Micron Technology, Inc. Contamination free source for shallow low energy junction implants
US5964653A (en) * 1997-07-11 1999-10-12 Applied Materials, Inc. Carrier head with a flexible membrane for a chemical mechanical polishing system
KR19990030719A (ko) * 1997-10-04 1999-05-06 로버트 에이치. 씨. 챠오 씨엠피 장비의 폴리싱 헤드용 리테이너 링
EP0923122B1 (de) * 1997-12-01 2011-09-07 Lucent Technologies Inc. Chemisch-mechanisches Polierverfahren zur Herstellung eines integrierten Schaltkreises und zugehörige Haltevorrichtung
US5951382A (en) * 1997-12-01 1999-09-14 Lucent Technologies Inc. Chemical mechanical polishing carrier fixture and system
JP3006568B2 (ja) * 1997-12-04 2000-02-07 日本電気株式会社 ウエハ研磨装置および研磨方法
US6116992A (en) * 1997-12-30 2000-09-12 Applied Materials, Inc. Substrate retaining ring
JPH11267857A (ja) 1998-03-18 1999-10-05 Daido Steel Co Ltd 摩擦接合方法
US6436228B1 (en) * 1998-05-15 2002-08-20 Applied Materials, Inc. Substrate retainer
JPH11333712A (ja) * 1998-05-21 1999-12-07 Nikon Corp 研磨ヘッド及びそれを用いた研磨装置
US6146260A (en) * 1998-08-03 2000-11-14 Promos Technology, Inc. Polishing machine
JP2000124173A (ja) 1998-10-16 2000-04-28 Hitachi Ltd 半導体装置の製造方法
US6159073A (en) * 1998-11-02 2000-12-12 Applied Materials, Inc. Method and apparatus for measuring substrate layer thickness during chemical mechanical polishing
US6422927B1 (en) * 1998-12-30 2002-07-23 Applied Materials, Inc. Carrier head with controllable pressure and loading area for chemical mechanical polishing
JP2000223447A (ja) 1999-02-01 2000-08-11 Nikon Corp 研磨ヘッド及び研磨装置及び研磨方法
TW467795B (en) * 1999-03-15 2001-12-11 Mitsubishi Materials Corp Wafer transporting device, wafer polishing device and method for making wafers
US6227955B1 (en) * 1999-04-20 2001-05-08 Micron Technology, Inc. Carrier heads, planarizing machines and methods for mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies
US6450868B1 (en) * 2000-03-27 2002-09-17 Applied Materials, Inc. Carrier head with multi-part flexible membrane
US6722965B2 (en) * 2000-07-11 2004-04-20 Applied Materials Inc. Carrier head with flexible membranes to provide controllable pressure and loading area
US6857945B1 (en) * 2000-07-25 2005-02-22 Applied Materials, Inc. Multi-chamber carrier head with a flexible membrane
US6419567B1 (en) * 2000-08-14 2002-07-16 Semiconductor 300 Gmbh & Co. Kg Retaining ring for chemical-mechanical polishing (CMP) head, polishing apparatus, slurry cycle system, and method
US6527625B1 (en) * 2000-08-31 2003-03-04 Multi-Planar Technologies, Inc. Chemical mechanical polishing apparatus and method having a soft backed polishing head
US9033934B2 (en) * 2011-09-27 2015-05-19 Shl Group Ab Medical delivery device with an initial locked state, intermediate priming state and a medicament delivery state

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6093082A (en) * 1997-05-23 2000-07-25 Applied Materials, Inc. Carrier head with a substrate detection mechanism for a chemical mechanical polishing system
US5967885A (en) * 1997-12-01 1999-10-19 Lucent Technologies Inc. Method of manufacturing an integrated circuit using chemical mechanical polishing
WO2000021715A2 (en) * 1998-10-09 2000-04-20 Speedfam-Ipec Corporation Semiconductor wafer polishing apparatus with a variable polishing force wafer carrier head

Also Published As

Publication number Publication date
KR100876381B1 (ko) 2008-12-29
EP2085181A1 (de) 2009-08-05
EP1177859A2 (de) 2002-02-06
US20080047667A1 (en) 2008-02-28
US20020017365A1 (en) 2002-02-14
KR20020010881A (ko) 2002-02-06
EP1177859B1 (de) 2009-04-15
SG157258A1 (en) 2009-12-29
US20050072527A1 (en) 2005-04-07
US20080066862A1 (en) 2008-03-20
US6890402B2 (en) 2005-05-10
US7897007B2 (en) 2011-03-01
TW516991B (en) 2003-01-11
SG129989A1 (en) 2007-03-20
US20080299880A1 (en) 2008-12-04
DE60138343D1 (de) 2009-05-28
SG10201706765QA (en) 2017-09-28
EP1177859A3 (de) 2003-10-15

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