SG11201908960XA - Probe holder and probe unit - Google Patents

Probe holder and probe unit

Info

Publication number
SG11201908960XA
SG11201908960XA SG11201908960XA SG11201908960XA SG 11201908960X A SG11201908960X A SG 11201908960XA SG 11201908960X A SG11201908960X A SG 11201908960XA SG 11201908960X A SG11201908960X A SG 11201908960XA
Authority
SG
Singapore
Prior art keywords
probe
holder
penetrating direction
hole portion
large diameter
Prior art date
Application number
Other languages
English (en)
Inventor
Tsukasa Sakaguchi
Kazuya Souma
Original Assignee
Nhk Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of SG11201908960XA publication Critical patent/SG11201908960XA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
SG11201908960X 2017-03-30 2018-03-26 Probe holder and probe unit SG11201908960XA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017069271 2017-03-30
PCT/JP2018/012211 WO2018181216A1 (ja) 2017-03-30 2018-03-26 プローブホルダおよびプローブユニット

Publications (1)

Publication Number Publication Date
SG11201908960XA true SG11201908960XA (en) 2019-11-28

Family

ID=63676170

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201908960X SG11201908960XA (en) 2017-03-30 2018-03-26 Probe holder and probe unit

Country Status (7)

Country Link
US (1) US11131691B2 (ja)
JP (1) JP6710808B2 (ja)
CN (1) CN110462407B (ja)
PH (1) PH12019502218A1 (ja)
SG (1) SG11201908960XA (ja)
TW (1) TWI683107B (ja)
WO (1) WO2018181216A1 (ja)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6840298B2 (ja) 2019-03-13 2021-03-10 日本発條株式会社 コンタクトプローブおよび信号伝送方法
CN112992600B (zh) * 2019-12-17 2023-02-17 天津平高智能电气有限公司 一种真空灭弧室真空度测量装置
JP7374037B2 (ja) * 2020-03-27 2023-11-06 東京エレクトロン株式会社 ポゴブロック
TWI762320B (zh) * 2020-05-26 2022-04-21 中華精測科技股份有限公司 彈簧探針

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03200075A (ja) * 1989-12-28 1991-09-02 Ngk Insulators Ltd 導通状態試験装置
JPH05183024A (ja) * 1991-12-27 1993-07-23 Mitsubishi Electric Corp 製品評価装置
US6556033B1 (en) 1998-07-10 2003-04-29 Nhk Spring Co., Ltd. Electroconductive contact unit assembly
JP4409114B2 (ja) * 1999-03-12 2010-02-03 日本発條株式会社 導電性接触子アセンブリ
JP2001021615A (ja) * 1999-07-06 2001-01-26 Yokowo Co Ltd Ｂｇａ検査用ソケットのコンタクトプローブ
JP2001174509A (ja) * 1999-12-20 2001-06-29 Yokowo Co Ltd Ｉｃパッケージ検査用ソケットのコンタクトプローブ
CN1267733C (zh) * 2000-05-01 2006-08-02 日本发条株式会社 导电性探针及电探测装置
CN1262842C (zh) * 2000-06-16 2006-07-05 日本发条株式会社 微型接触器探针和电探针单元
TW534468U (en) * 2001-05-25 2003-05-21 Hon Hai Prec Ind Co Ltd Electrical connector with probe-type terminal
JP2005061876A (ja) * 2003-08-19 2005-03-10 Japan Electronic Materials Corp プローブユニット及びこのプローブユニットの製造方法
JP2005217201A (ja) * 2004-01-29 2005-08-11 Ngk Spark Plug Co Ltd 中継基板、中継基板付き基板
JP2006023243A (ja) * 2004-07-09 2006-01-26 Tokyo Eletec Kk Ｉｃソケット及びそれに使用可能なプローブピン
JP5183024B2 (ja) * 2005-11-10 2013-04-17 三菱電機株式会社 表示装置の組み立て方法
JP4448086B2 (ja) * 2005-12-12 2010-04-07 大西電子株式会社 プリント配線板の検査治具
CN100410645C (zh) * 2005-12-30 2008-08-13 四川大学 杨氏模量仪活动夹头
US7479794B2 (en) * 2007-02-28 2009-01-20 Sv Probe Pte Ltd Spring loaded probe pin assembly
JP5714817B2 (ja) * 2007-07-19 2015-05-07 日本発條株式会社 プローブカード
US8344747B2 (en) 2008-02-01 2013-01-01 Nhk Spring Co., Ltd. Probe unit
KR20090126572A (ko) * 2008-06-04 2009-12-09 이재학 용수철 핀을 이용한 테스트 콘택터
WO2013061486A1 (ja) 2011-10-26 2013-05-02 ユニテクノ株式会社 コンタクトプローブおよびそれを備えた検査ソケット
JP6183024B2 (ja) 2013-07-18 2017-08-23 三菱電機株式会社 空調機システム
CN104865424B (zh) * 2014-02-24 2017-11-14 旺矽科技股份有限公司 具有弹簧套筒式探针的探针装置
JP6522634B2 (ja) * 2014-09-19 2019-05-29 日本発條株式会社 プローブユニット

Also Published As

Publication number Publication date
US20200033380A1 (en) 2020-01-30
TW201840984A (zh) 2018-11-16
US11131691B2 (en) 2021-09-28
JP6710808B2 (ja) 2020-06-17
WO2018181216A1 (ja) 2018-10-04
CN110462407B (zh) 2022-03-11
PH12019502218A1 (en) 2020-07-06
TWI683107B (zh) 2020-01-21
CN110462407A (zh) 2019-11-15
JPWO2018181216A1 (ja) 2020-02-06

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