SG11201908960XA - Probe holder and probe unit - Google Patents

Probe holder and probe unit

Info

Publication number
SG11201908960XA
SG11201908960XA SG11201908960XA SG11201908960XA SG 11201908960X A SG11201908960X A SG 11201908960XA SG 11201908960X A SG11201908960X A SG 11201908960XA SG 11201908960X A SG11201908960X A SG 11201908960XA
Authority
SG
Singapore
Prior art keywords
probe
holder
penetrating direction
hole portion
large diameter
Prior art date
Application number
Inventor
Tsukasa Sakaguchi
Kazuya Souma
Original Assignee
Nhk Spring Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nhk Spring Co Ltd filed Critical Nhk Spring Co Ltd
Publication of SG11201908960XA publication Critical patent/SG11201908960XA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded

Abstract

PROBE HOLDER AND PROBE UNIT A probe holder according to the present invention is a 5 probe holder for holding contact probes each of which comes in contact with one electrode of a contact target on one end portion side in a longitudinal direction and includes a plate in which holder holes configured to hold the respective contact probes are formed and penetrate the 10 probe holder. Each of the holder holes includes a first hole portion disposed on one end of a penetrating direction and extending in the penetrating direction, a large diameter portion connected to the first hole portion and extending in the penetrating direction, the large diameter 15 portion being larger than a diameter of the first hole portion, and a second hole portion disposed on another end of the penetrating direction, connected to the large diameter portion, and extending in the penetrating direction, the second hole portion being smaller than a 20 diameter of the large diameter portion. FIG 2
SG11201908960X 2017-03-30 2018-03-26 Probe holder and probe unit SG11201908960XA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017069271 2017-03-30
PCT/JP2018/012211 WO2018181216A1 (en) 2017-03-30 2018-03-26 Probe holder and probe unit

Publications (1)

Publication Number Publication Date
SG11201908960XA true SG11201908960XA (en) 2019-11-28

Family

ID=63676170

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201908960X SG11201908960XA (en) 2017-03-30 2018-03-26 Probe holder and probe unit

Country Status (7)

Country Link
US (1) US11131691B2 (en)
JP (1) JP6710808B2 (en)
CN (1) CN110462407B (en)
PH (1) PH12019502218A1 (en)
SG (1) SG11201908960XA (en)
TW (1) TWI683107B (en)
WO (1) WO2018181216A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020184684A1 (en) 2019-03-13 2020-09-17 日本発條株式会社 Contact probe and signal transmission method
CN112992600B (en) * 2019-12-17 2023-02-17 天津平高智能电气有限公司 Vacuum arc extinguish chamber vacuum degree measuring device
JP7374037B2 (en) * 2020-03-27 2023-11-06 東京エレクトロン株式会社 pogo block
TWI762320B (en) * 2020-05-26 2022-04-21 中華精測科技股份有限公司 A spring probe

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03200075A (en) * 1989-12-28 1991-09-02 Ngk Insulators Ltd Continuity testing device
JPH05183024A (en) * 1991-12-27 1993-07-23 Mitsubishi Electric Corp Product evaluating apparatus
EP1113274B1 (en) * 1998-07-10 2005-01-12 Nhk Spring Co.Ltd. Conductive contact
JP4409114B2 (en) 1999-03-12 2010-02-03 日本発條株式会社 Conductive contact assembly
JP2001021615A (en) * 1999-07-06 2001-01-26 Yokowo Co Ltd Contact probe of socket for inspecting bga
JP2001174509A (en) * 1999-12-20 2001-06-29 Yokowo Co Ltd Contact probe of socket for ic package inspection
CN1267733C (en) * 2000-05-01 2006-08-02 日本发条株式会社 Conductive contactor and electric probe unit
TW515889B (en) * 2000-06-16 2003-01-01 Nhk Spring Co Ltd Microcontactor probe and electric probe unit
TW534468U (en) * 2001-05-25 2003-05-21 Hon Hai Prec Ind Co Ltd Electrical connector with probe-type terminal
JP2005061876A (en) * 2003-08-19 2005-03-10 Japan Electronic Materials Corp Probe unit, and manufacturing method for the probe unit
JP2005217201A (en) * 2004-01-29 2005-08-11 Ngk Spark Plug Co Ltd Extension board and substrate having the same
JP2006023243A (en) * 2004-07-09 2006-01-26 Tokyo Eletec Kk Ic socket and probe pin usable therefor
JP5183024B2 (en) * 2005-11-10 2013-04-17 三菱電機株式会社 Assembling method of display device
JP4448086B2 (en) * 2005-12-12 2010-04-07 大西電子株式会社 Inspection jig for printed wiring boards
CN100410645C (en) * 2005-12-30 2008-08-13 四川大学 Movable gripping head of Young's modulus instrument
US7479794B2 (en) 2007-02-28 2009-01-20 Sv Probe Pte Ltd Spring loaded probe pin assembly
JP5714817B2 (en) * 2007-07-19 2015-05-07 日本発條株式会社 Probe card
WO2009096318A1 (en) * 2008-02-01 2009-08-06 Nhk Spring Co., Ltd. Probe unit
KR20090126572A (en) * 2008-06-04 2009-12-09 이재학 Test contactor using spring pins
WO2013061486A1 (en) 2011-10-26 2013-05-02 ユニテクノ株式会社 Contact probe and inspection socket provided with same
JP6183024B2 (en) 2013-07-18 2017-08-23 三菱電機株式会社 Air conditioner system
CN104865425B (en) * 2014-02-24 2018-07-20 旺矽科技股份有限公司 Probe device with spring sleeve type probe
JP6522634B2 (en) * 2014-09-19 2019-05-29 日本発條株式会社 Probe unit

Also Published As

Publication number Publication date
CN110462407B (en) 2022-03-11
WO2018181216A1 (en) 2018-10-04
PH12019502218A1 (en) 2020-07-06
JP6710808B2 (en) 2020-06-17
US20200033380A1 (en) 2020-01-30
CN110462407A (en) 2019-11-15
TW201840984A (en) 2018-11-16
TWI683107B (en) 2020-01-21
US11131691B2 (en) 2021-09-28
JPWO2018181216A1 (en) 2020-02-06

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