TWI762320B - A spring probe - Google Patents

Abstract

The invention discloses a spring probe. The both end of the spring probe is fixed on a first guide plate and a second guide plate of a probe device. The spring probe has a housing, a spring and a needle shaft. The spring is arranged in the housing. The needle shaft and the elastic part are fixed to each other. The housing has two protruding structures. The needle shaft and the two protruding structures of each spring probe can be inserted between the first guide plate and the second guide plate through the probe hole of the second guide plate and the two positioning hole of the second guide plate. The two protruding structures of each spring probe can abut a side of the second guide plate, and the two protruding structures can limit the movable range of the spring probe relative to the second guide plate. The casing also has two auxiliary positioning structures, the two auxiliary positioning structures and the two protruding structures are respectively adjacent to the opposite ends of the housing.

Description

spring probe

The present invention relates to a spring probe, in particular to a spring probe with a spring.

Please refer to FIG. 1 , which is a schematic cross-sectional view of a conventional probe device. The existing probe device P includes a base P1, a plurality of spring probes P2 and a top cover P3. The base P1 includes a plurality of limiting through holes P11, and the top cover P3 has a plurality of top cover through holes P31. The installation method of the probe device P is as follows: firstly, the needle implantation operation is performed, so that one end of the plurality of spring probes P2 is correspondingly arranged in the plurality of limit holes P11 of the base P1; then, the plurality of top covers of the top cover P3 The through holes P31 pass through the plurality of spring probes P2 correspondingly, so that the top cover P3 and the base P1 can be fixed to each other, and accordingly, the movement ranges of the plurality of spring probes P2 are limited by the base P1 and the top cover P3.

According to the above, in practical applications, in an embodiment with a large number of spring probes P2 or a small size of the spring probes P2, it is easy to occur that the plurality of top cover perforations P31 of the top cover P3 cannot pass through the plurality of holes smoothly. A spring probe P2 is placed, and the problem that the top cover P3 and the base P1 cannot be fixed to each other occurs.

The invention discloses a spring probe, which is mainly used to improve the problem that the conventional spring probe is not easy to implant needles.

One of the embodiments of the present invention discloses a spring probe, which includes: a casing with a accommodating groove inside, and two protruding structures on the outer side of the casing; an elastic member disposed in the casing a needle shaft, one end of which is fixed to the elastic member, and the opposite end of the needle shaft disposed in the accommodating groove is defined as a contact end; when the contact end is pressed, the elastic member It can be elastically deformed; wherein, the housing also has two auxiliary positioning structures, the two auxiliary positioning structures and the two protruding structures are respectively adjacent to the opposite ends of the housing, and the two auxiliary positioning structures and the two protruding structures are respectively adjacent to each other. are arranged offset from each other.

To sum up, in the spring probe of the present invention, by designing the spring probe with two protruding structures and auxiliary positioning structures, the spring probe can cooperate with the plurality of perforation groups on the second guide plate, So that the spring probe can be easily assembled.

In order to further understand the features and technical content of the present invention, please refer to the following detailed description and accompanying drawings of the present invention, but these descriptions and drawings are only used to illustrate the present invention, rather than make any claims to the protection scope of the present invention. limit.

In the following description, if it is indicated to refer to a specific figure or as shown in a specific figure, it is only used for emphasis in the subsequent description, and most of the related content mentioned appears in the specific figure, However, it is not limited that only the specific drawings may be referred to in this subsequent description.

Please refer to FIG. 2 to FIG. 4 together. FIG. 2 is a schematic partial cross-sectional view of the first embodiment of the probe device of the present invention, and FIG. 3 is an exploded schematic view of the first embodiment of the probe device of the present invention. 4 is a schematic diagram showing one of the probes of the probe device of the present invention passing through the second guide plate. The probe device 100 of the present invention includes a first guide plate 1 , a spacer frame 2 , a second guide plate 3 and a plurality of spring probes 4 . The first guide plate 1 has a plurality of first through holes 11 . Each of the first through holes 11 is spaced apart from each other, and each of the first through holes 11 penetrates through the first guide plate 1 . In the drawings of this embodiment, the probe device 100 includes nine spring probes 4 as an example, but the number of the spring probes 4 is not limited to nine.

The spacer frame 2 is disposed on one side of the first guide plate 1 , the second guide plate 3 is disposed on the side of the spacer frame 2 opposite to the first guide plate 1 , and the second guide plate 3 and the first guide plate 1 are mutually set at intervals. In practical applications, the first guide plate 1 , the spacer frame 2 and the second guide plate 3 may be fixed to each other by a plurality of screws, for example, but not limited thereto. The spacer frame body 2 is mainly used to make the first guide plate 1 and the second guide plate 3 spaced apart from each other. Therefore, the shape and thickness of the spacer frame body 2 can be changed according to the requirements. Limits shown. It is particularly noted that as long as the first guide plate 1 and the second guide plate 3 are arranged at intervals, the probe device 100 may also not have the interval frame 2. For example, in different embodiments, the interval The frame body 2 and the first guide plate 1 may be integrally formed, or the interval frame body 2 and the second guide plate 3 may be integrally formed.

The second guide plate 3 has multiple groups of perforation groups 31 , each group of perforation groups 31 includes a needle shaft through hole 311 and two positioning through holes 312 , each needle shaft through hole 311 and each positioning through hole 312 pass through the second guide plate 3 , and each group of perforation holes The needle shaft perforation 311 of the group 31 communicates with the two positioning perforations 312, and the plurality of perforation groups 31 are spaced apart from each other and not communicated with each other. Wherein, each needle shaft through hole 311 is provided roughly corresponding to each first through hole 11 of the first guide plate 1 .

Each spring probe 4 includes a housing 41, a needle shaft 42 and an elastic member 43 (such as a compression spring). The elastic member 43 is connected, and the other end of the needle shaft 42 is exposed to the housing 41 . When the end of the needle shaft 42 exposed to the housing 41 is pressed, the elastic member 43 will elastically deform correspondingly to the pressure, and correspondingly generate an elastic restoring force, and when the end of the needle shaft 42 is no longer pressed, the elastic member 43 will elastically recover. The force will return the needle shaft 42 to its uncompressed state. The outer side of the housing 41 has two protruding structures 411 . The housing 41 and the two protruding structures 411 of each spring probe 4 can simultaneously pass through the needle shaft through holes 311 and the two positioning through holes 312 of a group of through holes 31 .

A plurality of spring probes 4 are disposed between the first guide plate 1 and the second guide plate 3 , and the two protruding structures 411 of each spring probe 4 abut against the second guide plate 3 and face the first guide plate 1 1A, and the two protruding structures 411 are not accommodated in the two adjacent positioning holes 312, through the two protruding structures 411 of each spring probe 4 against the second guide plate 3, each spring The movable range of the probe 4 relative to the second guide plate 3 will be limited, and each spring probe 4 will not easily move relative to the second guide plate 3 .

The two protruding structures 411 are mainly used to limit the movement range of the housing 41 relative to the second guide plate 3 . Therefore, the two protruding structures 411 of each spring probe 4 can limit the relative movement of the housing 41 to the second guide plate 3 . The moving range of the guide plate 3 and the shapes of the two protruding structures 411 can be changed according to requirements. In this embodiment, the two protruding structures 411 of each spring probe 4 are disposed on both sides of the casing 41 opposite to each other, but the positions where the two protruding structures 411 are disposed on the casing 41 are not shown in the figure. shown in the limit.

One end of the needle shafts 42 of the plurality of spring probes 4 protrudes through the plurality of first through holes 11 and is exposed on the side of the first guide plate 1 opposite to the second guide plate 3, and the needle shafts 42 of each spring probe 4 are exposed on the side of the first guide plate 1 opposite to the second guide plate 3. One end of the first guide plate 1 is defined as a contact end, and the contact end is used to contact the device under test (DUT). In practical applications, each spring probe 4 can be a spring connector (POGO PIN) in various forms according to requirements.

As shown in FIG. 2 and FIG. 3 , the center of the spacer frame 2 has a through hole 21 , and the through hole 21 is disposed through the spacer frame 2 . When the first guide plate 1 , the spacer frame 2 and the second guide plate 3 of the probe device 100 are fixed to each other, an accommodating space SP will be formed together, and the plurality of spring probes 4 have two parts of the protruding structure 411 The correspondence is located in the accommodating space SP. In practical applications, the spacer frame 2 is mainly used to space the first guide plate 1 and the second guide plate 3 from each other, so that the protruding structures 411 of each spring probe 4 can correspond to the accommodating space SP Movement; more specifically, through the arrangement of the spacer frame 2, when each spring probe 4 is rotated, the two protruding structures 411 can move correspondingly in the accommodating space SP.

As shown in FIG. 4 and FIG. 2 , in the actual assembly process of the probe device 100 of the present invention, the casing 41 and the two protruding parts of each spring probe 4 can be firstly assembled by using a related mechanical arm or manually. The exit structure 411 correspondingly passes through a needle shaft through hole 311 and two positioning through holes 312 connected to it. Then, when one end of the needle shaft 42 of the spring probe 4 is inserted into the first through hole 11 of the first guide plate 1, and When the two protruding structures 411 are located in the accommodating space SP correspondingly, the spring probe 4 can be rotated by a related mechanical arm or manually, so that the two protruding structures 411 are no longer correspondingly located in the two positioning holes 312 one side of the second guide plate 3 facing the first guide plate 1 , and the two protruding structures 411 are correspondingly abutted against the side surface 3A of the second guide plate 1 , whereby a single spring probe 4 of the probe device 100 can be completed. needle planting work.

To sum up, the probe device 100 of the present invention is designed by the protruding structure 411 of the spring probe 4, the plurality of perforation groups 31 of the second guide plate 3, etc., and the relevant mechanical arm or personnel insert each spring probe 4 into the first After the first guide plate 1 and the second guide plate 3 are rotated together, the needle implantation operation of the spring probe 4 can be completed, and the probe device 100 of the present invention does not have the conventional probe device P shown in FIG. 1 . , after the multiple spring probes P2 are implanted in the base P1, when the top cover P3 and the base P1 are to be fixed to each other, it is easy to happen that the multiple spring probes P2 cannot correctly pass through the multiple top cover through holes P31 of the top cover P3 The problem.

Please refer to FIG. 5 to FIG. 7 together. FIG. 5 is a schematic three-dimensional partial cross-sectional view of the second embodiment of the probe device of the present invention, and FIG. 6 is an exploded schematic view of the second embodiment of the probe device of the present invention. FIG. 7 is a schematic cross-sectional view of the probe device of the present invention during the needle implantation process.

As shown in FIG. 5 and FIG. 6 , the biggest difference between the probe device 100 of this embodiment and the previous embodiment is that a plurality of sets of limiting structures 32 are formed on the side surface 3A of the second guide plate 3 , and each set of limiting structures is 32 includes two grooves 321, each groove 321 does not penetrate the second guide plate 3, the two grooves 321 of each set of limiting structures 32 and the needle shaft perforations 311 of each set of perforation groups 31 communicate with each other, and each set of limited The two grooves 321 of the positioning structure 32 are not communicated with the two positioning through holes 312 of each group of perforation groups 31, and the two grooves 321 communicated with each needle shaft through hole 311 can correspondingly accommodate a single spring probe. 4 of the two protruding structures 411. In short, the second guide plate 3 is formed with a plurality of grooves 321 which are blind holes on the side surface 3A, and each needle shaft through hole 311 is communicated with two grooves 321 .

As shown in FIG. 5 and FIG. 7 , in practical applications, the needle implantation process of the plurality of spring probes 4 of the probe device 100 of the present embodiment may be as follows: first use a relevant mechanism (for example, a gasket, a components of the spacer frame 2, etc.), the second guide plate 3 is arranged at a distance from the spacer frame 2, and then the housing 41 and the two protruding structures 411 of each spring probe 4 are passed through the second guide plate 3 After the needle shaft through-hole 311 and the two positioning through-holes 312 are formed, rotate each spring probe 4 so that the two protruding structures 411 of each spring probe 4 are located directly below the two grooves 321; When the two protruding structures 411 of 4 are located directly below the two grooves 321, the related mechanisms originally arranged between the second guide plate 3 and the spacer frame 2 are removed, so that the second guide plate 3 3 can be moved in the direction of the spacer frame 2, so that the two protruding structures 411 of each spring probe 4 are correspondingly accommodated in the two grooves 321 located on the side surface 3A of the second guide plate 3; The first guide plate 1 , the spacer frame 2 and the second guide plate 3 are fixed to each other, so as to complete the needle implantation operation. That is to say, in the probe device 100 of this embodiment, after the needle implantation of each spring probe 4 is completed, the two protruding structures 411 of each spring probe 4 will be engaged in the two grooves 321 correspondingly, And each spring probe 4 will be difficult to rotate relative to the second guide plate 3 .

According to the above, by forming a plurality of grooves 321 on the side surface 3A of the second guide plate 3, the two protruding structures 411 of each spring probe 4 can be correspondingly engaged in the two grooves 321. Therefore, each spring probe 4 will not easily rotate relative to the first guide plate 1 and the second guide plate 3 . In practical applications, as long as each protruding structure 411 can be correspondingly engaged in the groove 321, and accordingly, each spring probe 4 is not easily rotated relative to the second guide plate 3, the shape and size of each protruding structure 411 The shape and size of each groove 321 can be set according to requirements.

Please refer to FIG. 8 and FIG. 9 together. FIG. 8 is a three-dimensional partial cross-sectional schematic view of the probe device according to the third embodiment of the present invention, and FIG. 9 is an exploded schematic view of the probe device according to the third embodiment of the present invention. The biggest difference between the probe device 100 of this embodiment and the previous embodiments is that the probe device 100 further includes an auxiliary guide plate 5 . The auxiliary guide plate 5 is disposed on the side of the second guide plate 3 facing the first guide plate 1 . In practical applications, the second guide plate 3 , the auxiliary guide plate 5 , the spacer frame 2 and the first guide plate 1 may be fixed to each other by screws, but the fixing method is not limited thereto.

The auxiliary guide plate 5 has a plurality of auxiliary perforation groups 51 . Each auxiliary perforation group 51 includes a needle shaft auxiliary through hole 511 , two engaging grooves 512 and two avoidance through holes 513 . The side is concavely formed, and each engaging groove 512 is disposed facing the first guide plate 1 , each avoidance hole 513 penetrates through the auxiliary guide plate 5 , and the needle shaft auxiliary hole 511 of each auxiliary hole group 51 communicates with the two engaging grooves 512 , the needle shaft auxiliary through hole 511 of each auxiliary perforation group 51 and the two avoidance holes 513 communicate with each other, and the two engaging grooves 512 and the two avoidance holes 513 of each auxiliary hole group 51 are not communicated with each other.

The auxiliary guide plate 5 is fixed on one side of the second guide plate 3 , and the needle shaft through holes 311 of each group of perforation groups 31 and the needle shaft auxiliary through holes 511 of each group of auxiliary perforation groups 51 communicate with each other, and the two The positioning through-holes 312 communicate with the two avoidance through-holes 513 of each auxiliary through-hole group 51 . In practical applications, the needle shaft perforation 311 and the two positioning perforations 312 of each group of perforation groups 31 may have the exact same appearance and size, and the housing 41 and the two protruding structures 411 of each spring probe 4 can sequentially pass through the needle shaft perforations of each group of perforation groups 31 and the two positioning perforations 312 communicated with them, and each group of auxiliary perforation groups 51. The needle shaft auxiliary perforation 511 and two avoidance perforations 513 communicated with it. The two engaging grooves 512 of each auxiliary perforation group 51 are used for engaging with the two protruding structures 411 of each spring probe 4 .

The needle implantation process of each spring probe 4 of the probe device 100 of the present embodiment may be as follows: first, use related components to form a space between the auxiliary guide plate 5 and the spacer frame 2 , and then make the The housing 41 and the two protruding structures 411 pass through the needle shaft through hole 311 of the second guide plate 3 and the two positioning through holes connected to it, the needle shaft auxiliary through hole 511 of the auxiliary guide plate 5 and the two avoidance holes connected to it in sequence. After the holes 513 are punched, the spring probes 4 are rotated so that the two protruding structures 411 are located under the two engaging grooves 512 correspondingly; finally, when all the spring probes 4 are inserted through the second guide plate 3 and the auxiliary guide plate 5 and rotated, the components originally arranged between the auxiliary guide plate 5 and the spacer frame body 2 are pulled away, so that the auxiliary guide plate 5 and the second guide plate 3 move in the direction of the spacer frame body 2, thereby, Each engaging groove 512 will engage with each protruding structure 411 correspondingly, and each spring probe 4 will not be able to be easily rotated. In different embodiments, each of the above-mentioned engaging grooves 512 may also be provided through the auxiliary guide plate 5 .

Please refer to FIG. 10 and FIG. 11 together. FIG. 10 is a three-dimensional partial cross-sectional schematic view of the fourth embodiment of the probe device of the present invention, and FIG. 11 is an exploded schematic view of the fourth embodiment of the probe device of the present invention. The biggest difference between this embodiment and the aforementioned first embodiment is that the probe device 100 further includes an auxiliary positioning guide plate 6 . The auxiliary positioning guide plate 6 is disposed on the side of the first guide plate 1 facing the second guide plate 3 . The auxiliary positioning guide plate 6 has multiple sets of auxiliary positioning through-hole groups 61 , each group of auxiliary positioning through-hole groups 61 includes a first auxiliary through-hole 611 and two second auxiliary through-holes 612 , and each first auxiliary through-hole 611 penetrates through the auxiliary positioning guide plate 6 , Each second auxiliary through hole 612 penetrates through the auxiliary positioning guide plate 6 , and the first auxiliary through hole 611 and the two second auxiliary through holes 612 of each group of auxiliary positioning through hole groups 61 communicate with each other.

The outer side of the housing 41 of each spring probe 4 also has two auxiliary positioning structures 44 , the two auxiliary positioning structures 44 and the two protruding structures 411 are respectively adjacent to opposite ends of the housing 41 , and the two auxiliary positioning structures 44 and The positioning structure 44 and the two protruding structures 411 are arranged in a staggered manner. In practical applications, the casing 41 may have a first section 41A and a second section 41B, the outer diameter of the first section 41A is larger than the outer diameter of the second section 41B, and the two protruding structures 411 are located at In the first section 41A, the two auxiliary positioning structures 44 are located in the second section 41B.

The two auxiliary positioning structures 44 of each spring probe 4 can be engaged with the two second auxiliary through holes 612 of each group of auxiliary stator through-hole groups 31 , and each spring probe 4 is formed with a housing of the two auxiliary positioning structures 44 41 can correspond to the first auxiliary perforations 611 passing through each group of auxiliary positioning perforation groups 61 .

The needle implantation process of each spring probe 4 in this embodiment may be as follows: first, the housing 41 and the two positioning holes 312 of each spring probe 4 are passed through the second guide plate 3 , and then the One end of the needle shaft 42 is correspondingly penetrated through the first through hole 11 of the first guide plate 1 . At this time, the two protruding structures 411 are correspondingly located in the spacer frame 2 , the second guide plate 3 and the first guide plate 1 to form together. In the accommodating space SP, and the two auxiliary positioning structures 44 are correspondingly against the side of the first guide plate 1 facing the second guide plate 3, and the second section 41B of the housing 41 of the spring probe 4 A part of it should be inserted into the first auxiliary through hole 611 ; finally, the spring probe 4 is rotated so that the two auxiliary positioning structures 44 are correspondingly snapped into the two second auxiliary through holes 612 .

It is particularly noted that, in practical applications, the spring probes 4 referred to in the above embodiments can also be manufactured and sold separately, and the spring probes 4 are not limited to being manufactured together with the probe device 100 only. , sold.

To sum up, in the probe device and the spring probe disclosed in the present invention, the spring probe is provided with two protruding structures, and the second guide plate is provided with a plurality of perforation groups, and each perforation group includes a needle shaft perforation and a Designs such as two positioning perforations allow the probe device to be easily assembled.

The above descriptions are only preferred feasible embodiments of the present invention, which do not limit the scope of the present invention. Therefore, any equivalent technical changes made by using the contents of the description and drawings of the present invention are included in the protection scope of the present invention. .

Known technology: P: Probe device P1: base P11: Limit perforation P2: spring probe P3: Top cover P31: Top cover perforation this invention: 100: Probe device 1: The first guide plate 1A: Side 11: The first piercing 2: Spacer frame 21: Perforation 3: Second guide plate 3A: Side 31: Piercing Group 311: Needle shaft perforation 312: Positioning perforation 32: Limit structure 321: Groove 4: spring probe 41: Shell 411: Protruding structure 41A: First Section 41B: Second Section 42: Needle shaft 43: Elastic 44: Auxiliary positioning structure 5: Auxiliary guide 51: Auxiliary perforation group 511: Needle shaft assisted perforation 512: snap groove 513: Avoid Perforations 6: Auxiliary positioning guide 61: Assisted positioning perforation group 611: First auxiliary perforation 612: Second auxiliary perforation SP: accommodation space

FIG. 1 is a schematic cross-sectional view of a conventional probe device.

FIG. 2 is a partial perspective cross-sectional schematic diagram of the first embodiment of the probe device of the present invention.

FIG. 3 is an exploded schematic view of the first embodiment of the probe device of the present invention.

FIG. 4 is a schematic diagram of a process in which the spring probe of the first embodiment of the probe device of the present invention penetrates into the second guide plate.

FIG. 5 is a partial perspective cross-sectional schematic diagram of the second embodiment of the probe device of the present invention.

6 is an exploded schematic view of a second embodiment of the probe device of the present invention.

7 is a partial cross-sectional schematic diagram of the needle implantation process of the spring probe of the probe device of the present invention.

8 is a partial perspective cross-sectional schematic diagram of a third embodiment of the probe device of the present invention.

9 is an exploded schematic view of a third embodiment of the probe device of the present invention.

10 is a partial perspective cross-sectional schematic diagram of a fourth embodiment of the probe device of the present invention.

FIG. 11 is an exploded schematic view of a fourth embodiment of the probe device of the present invention.

100: Probe device

1: The first guide plate

2: Spacer frame

3: Second guide plate

31: Piercing Group

3A: Side

311: Needle shaft perforation

312: Positioning perforation

4: spring probe

41: Shell

411: Protruding structure

42: Needle shaft

43: Elastic

SP: accommodation space

Claims (2)

A spring probe comprising: a casing with an accommodating groove inside, and two protruding structures on the outer side of the casing; an elastic member disposed in the container; and A needle shaft, one end of which is fixed to the elastic member, and the opposite end of the needle shaft disposed in the accommodating groove is defined as a contact end; when the contact end is pressed, the elastic member can elastically deform ; Wherein, the housing further has two auxiliary positioning structures, the two auxiliary positioning structures and the two protruding structures are respectively adjacent to opposite ends of the housing, and the two auxiliary positioning structures The two protruding structures are arranged offset from each other. The spring probe of claim 1, wherein the housing has a first section and a second section, the outer diameter of the first section is larger than the outer diameter of the second section, Two of the protruding structures are located in the first section, and two of the auxiliary positioning structures are located in the second section.

Images