SG11201900593WA - Method and device for lithographically producing a target structure on a non-planar initial structure - Google Patents
Method and device for lithographically producing a target structure on a non-planar initial structureInfo
- Publication number
- SG11201900593WA SG11201900593WA SG11201900593WA SG11201900593WA SG11201900593WA SG 11201900593W A SG11201900593W A SG 11201900593WA SG 11201900593W A SG11201900593W A SG 11201900593WA SG 11201900593W A SG11201900593W A SG 11201900593WA SG 11201900593W A SG11201900593W A SG 11201900593WA
- Authority
- SG
- Singapore
- Prior art keywords
- lithography beam
- target
- initial structure
- planar
- producing
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/703—Non-planar pattern areas or non-planar masks, e.g. curved masks or substrates
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0005—Production of optical devices or components in so far as characterised by the lithographic processes or materials used therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0037—Production of three-dimensional images
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70383—Direct write, i.e. pattern is written directly without the use of a mask by one or multiple beams
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Optics & Photonics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102016214606.8A DE102016214606B3 (de) | 2016-08-05 | 2016-08-05 | Verfahren und Vorrichtung zur lithographischen Erzeugung einer Zielstruktur an einer nicht-planaren Ausgangsstruktur |
PCT/EP2017/069764 WO2018024872A1 (de) | 2016-08-05 | 2017-08-04 | Verfahren und vorrichtung zur lithographischen erzeugung einer zielstruktur an einer nicht-planaren ausgangsstruktur |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201900593WA true SG11201900593WA (en) | 2019-02-27 |
Family
ID=59558404
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201900593WA SG11201900593WA (en) | 2016-08-05 | 2017-08-04 | Method and device for lithographically producing a target structure on a non-planar initial structure |
SG10202101208YA SG10202101208YA (en) | 2016-08-05 | 2017-08-04 | Method and device for lithographically producing a target structure on a non-planar initial structure |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10202101208YA SG10202101208YA (en) | 2016-08-05 | 2017-08-04 | Method and device for lithographically producing a target structure on a non-planar initial structure |
Country Status (8)
Country | Link |
---|---|
US (2) | US11143966B2 (de) |
EP (1) | EP3494440A1 (de) |
JP (1) | JP7023928B2 (de) |
CN (1) | CN109997081B (de) |
CA (1) | CA3033331A1 (de) |
DE (1) | DE102016214606B3 (de) |
SG (2) | SG11201900593WA (de) |
WO (1) | WO2018024872A1 (de) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102017128824A1 (de) * | 2017-12-05 | 2019-06-06 | Osram Opto Semiconductors Gmbh | Verfahren zur Herstellung eines strahlungsemittierenden Bauteils und strahlungsemittierendes Bauteil |
US10942313B2 (en) * | 2019-02-13 | 2021-03-09 | United States Of America As Represented By The Secretary Of The Air Force | Temperature-immune self-referencing Fabry-Pérot cavity sensors |
CN110263588B (zh) * | 2019-07-23 | 2023-05-16 | 南方电网科学研究院有限责任公司 | 一种物理不可克隆函数电路,集成电路及制备方法 |
TWI715277B (zh) * | 2019-11-05 | 2021-01-01 | 友達光電股份有限公司 | 顯示面板及其製造方法 |
DE102020202821A1 (de) | 2020-03-05 | 2021-09-09 | Karlsruher Institut für Technologie | Lokalisierung von optischen Koppelstellen |
CN113031149B (zh) * | 2021-04-06 | 2022-03-18 | 上海大学 | 基于微流控型双光子激光直写技术的超长三维纳米光纤制备系统及方法 |
DE102021110860B3 (de) | 2021-04-28 | 2022-03-17 | Nanoscribe Holding Gmbh | Verfahren zum Erzeugen einer dreidimensionalen Struktur in einem Lithographiematerial mittels einer Laserlithographie-Vorrichtung und Laserlithographie-Vorrichtung |
US20220357484A1 (en) * | 2021-05-10 | 2022-11-10 | Juejun Hu | Methods and Systems for Metasurface-Based Nanofabrication |
CN113532280B (zh) * | 2021-06-04 | 2023-03-21 | 华南师范大学 | 可用于纳米级位移测量的液晶光尺及其制备方法 |
CN113985536B (zh) * | 2021-10-28 | 2023-06-13 | 中国科学院半导体研究所 | 一种光电子集成器件及其制备方法 |
DE102022104797A1 (de) | 2022-03-01 | 2023-09-07 | Carl Zeiss Ag | 3D-Druckvorrichtung und 3D-Druckverfahren zur Fertigung eines Werkstücks |
DE102022118641A1 (de) | 2022-07-26 | 2024-02-01 | Baden-Württemberg Stiftung Ggmbh | Verfahren zur Herstellung einer Mikrooptik |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09243869A (ja) * | 1996-03-14 | 1997-09-19 | Hitachi Ltd | 光モジュールの製造方法 |
JPH10209000A (ja) * | 1997-01-17 | 1998-08-07 | Sony Corp | 電子ビーム描画装置及びパターン描画方法 |
US6346979B1 (en) * | 1999-03-17 | 2002-02-12 | International Business Machines Corporation | Process and apparatus to adjust exposure dose in lithography systems |
WO2001096959A2 (en) | 2000-06-15 | 2001-12-20 | 3M Innovative Properties Company | Multidirectional photoreactive absorption method |
US8597871B2 (en) | 2005-06-18 | 2013-12-03 | The Regents Of The University Of Colorado | Three-dimensional direct-write lithography |
US7265057B2 (en) | 2005-11-18 | 2007-09-04 | Matsushita Electric Industrial Co., Ltd | 3D lithography with laser beam writer for making hybrid surfaces |
WO2009009208A2 (en) | 2007-04-23 | 2009-01-15 | The Trustees Of The University Of Pennsylvania | Patterning structures using deformable substrates |
JP5234315B2 (ja) | 2007-12-03 | 2013-07-10 | ソニー株式会社 | 光造形装置および光造形方法 |
DE102008054582A1 (de) | 2007-12-21 | 2009-07-09 | Carl Zeiss Smt Ag | Mikrolithographische Projektionsbelichtungsanlage |
US7902526B2 (en) | 2008-04-28 | 2011-03-08 | Massachusetts Institute Of Technology | 3D two-photon lithographic microfabrication system |
US8636496B2 (en) | 2008-05-05 | 2014-01-28 | Georgia Tech Research Corporation | Systems and methods for fabricating three-dimensional objects |
WO2010065247A2 (en) | 2008-12-05 | 2010-06-10 | 3M Innovative Properties Company | Three-dimensional articles using nonlinear thermal polymerization |
US8903205B2 (en) * | 2012-02-23 | 2014-12-02 | Karlsruhe Institute of Technology (KIT) | Three-dimensional freeform waveguides for chip-chip connections |
US9034222B2 (en) | 2012-02-23 | 2015-05-19 | Karlsruhe Institut Fuer Technologie | Method for producing photonic wire bonds |
DE102012010635B4 (de) | 2012-05-18 | 2022-04-07 | Leibniz-Institut für Oberflächenmodifizierung e.V. | Verfahren zur 3D-Strukturierung und Formgebung von Oberflächen aus harten, spröden und optischen Materialien |
GB2502313A (en) | 2012-05-24 | 2013-11-27 | Ibm | Manufacturing three dimensional photonic device by two photon absorption polymerization |
-
2016
- 2016-08-05 DE DE102016214606.8A patent/DE102016214606B3/de active Active
-
2017
- 2017-08-04 SG SG11201900593WA patent/SG11201900593WA/en unknown
- 2017-08-04 JP JP2019506085A patent/JP7023928B2/ja active Active
- 2017-08-04 CN CN201780061245.7A patent/CN109997081B/zh active Active
- 2017-08-04 WO PCT/EP2017/069764 patent/WO2018024872A1/de unknown
- 2017-08-04 CA CA3033331A patent/CA3033331A1/en active Pending
- 2017-08-04 SG SG10202101208YA patent/SG10202101208YA/en unknown
- 2017-08-04 EP EP17749175.0A patent/EP3494440A1/de active Pending
-
2019
- 2019-01-31 US US16/263,461 patent/US11143966B2/en active Active
-
2021
- 2021-09-10 US US17/471,740 patent/US11630394B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
JP7023928B2 (ja) | 2022-02-22 |
DE102016214606B3 (de) | 2017-08-31 |
US11143966B2 (en) | 2021-10-12 |
JP2019525249A (ja) | 2019-09-05 |
EP3494440A1 (de) | 2019-06-12 |
US11630394B2 (en) | 2023-04-18 |
WO2018024872A1 (de) | 2018-02-08 |
SG10202101208YA (en) | 2021-03-30 |
CA3033331A1 (en) | 2018-02-08 |
CN109997081B (zh) | 2021-12-14 |
US20210405537A1 (en) | 2021-12-30 |
CN109997081A (zh) | 2019-07-09 |
US20190163067A1 (en) | 2019-05-30 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
SG11201900593WA (en) | Method and device for lithographically producing a target structure on a non-planar initial structure | |
SG11201903901TA (en) | Method for producing an optical system and optical system | |
SG170012A1 (en) | Pattern forming apparatus and pattern forming method, movable body drive system and movable body drive method, exposure apparatus and exposure method, and device manufacturing method | |
BR112018069045A2 (pt) | métodos e aparelho para homogeneização de campo magnético | |
IL276811B2 (en) | Metrology and control of coverage and end position errors | |
WO2016012425A3 (de) | Abbildende optik für ein metrologiesystem zur untersuchung einer lithographiemaske | |
ES2618349T3 (es) | Método de acoplamiento para co-simulación no iterativa | |
MX2015008589A (es) | Produccion de un objeto voluminoso mediante litografia, con resolucion espacial mejorada. | |
EP3741395A3 (de) | Verfahren zum berechnen einer expositionszeit zur desinfektion eines raumes unter verwendung einer ultravioletten desinfektionsvorrichtung | |
EP2500775A3 (de) | Strukturierungsverfahren und Zusammensetzung zur Bildung von siliciumhaltigem Film dafür | |
TW200745779A (en) | A method for obtaining improved feedforward data, a lithographic apparatus for carrying out the method and a device manufacturing method | |
WO2007130220A3 (en) | Auto tip calibration in an extrusion apparatus | |
IL228201B (en) | Substrate and patterning device for use in metrology, metrology method and device manufacturing method | |
TW200602813A (en) | Lithographic apparatus and device manufacturing method | |
SG142289A1 (en) | Lithographic apparatus and method | |
TW200625025A (en) | Lithographic apparatus, analyser plate, subassembly, method of measuring a parameter of a projection system and patterning means | |
WO2012041461A3 (en) | Projection exposure tool for microlithography and method for microlithographic exposure | |
MX2016009584A (es) | Sistema, aparato y metodo para medir las caracteristicas de un cuerpo. | |
IL250472B (en) | Metrology testing structure and measuring method for structures with a template | |
SG11201908481QA (en) | Vertical control method for use in lithography machine | |
CN105093845A (zh) | 光刻装置、确定方法和产品的制造方法 | |
WO2017137142A8 (en) | A polymer, composition, forming sacrificial layer and method for semiconductor device therewith | |
SG11201808608UA (en) | Projection exposure apparatus and method | |
PH12018501598A1 (en) | Method and system for optical three-dimensional topography measurement | |
SG10201708703TA (en) | Template replication |