SG11201701130TA - Mounting device and measurement method - Google Patents

Mounting device and measurement method

Info

Publication number
SG11201701130TA
SG11201701130TA SG11201701130TA SG11201701130TA SG11201701130TA SG 11201701130T A SG11201701130T A SG 11201701130TA SG 11201701130T A SG11201701130T A SG 11201701130TA SG 11201701130T A SG11201701130T A SG 11201701130TA SG 11201701130T A SG11201701130T A SG 11201701130TA
Authority
SG
Singapore
Prior art keywords
measurement method
mounting device
mounting
measurement
Prior art date
Application number
SG11201701130TA
Other languages
English (en)
Inventor
Akira Sato
Kohei Seyama
Original Assignee
Shinkawa Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinkawa Kk filed Critical Shinkawa Kk
Publication of SG11201701130TA publication Critical patent/SG11201701130TA/en

Links

Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/24Measuring arrangements characterised by the use of mechanical techniques for measuring angles or tapers; for testing the alignment of axes
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04Mounting of components, e.g. of leadless components
    • H05K13/0404Pick-and-place heads or apparatus, e.g. with jaws
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/04Mounting of components, e.g. of leadless components
    • H05K13/0404Pick-and-place heads or apparatus, e.g. with jaws
    • H05K13/0413Pick-and-place heads or apparatus, e.g. with jaws with orientation of the component while holding it; Drive mechanisms for gripping tools, e.g. lifting, lowering or turning of gripping tools
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/081Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0812Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines the monitoring devices being integrated in the mounting machine, e.g. for monitoring components, leads, component placement
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K13/00Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
    • H05K13/08Monitoring manufacture of assemblages
    • H05K13/081Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
    • H05K13/0813Controlling of single components prior to mounting, e.g. orientation, component geometry

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Operations Research (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Wire Bonding (AREA)
  • Supply And Installment Of Electrical Components (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
SG11201701130TA 2014-08-13 2014-10-01 Mounting device and measurement method SG11201701130TA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2014165019 2014-08-13
PCT/JP2014/076313 WO2016024364A1 (ja) 2014-08-13 2014-10-01 実装装置および測定方法

Publications (1)

Publication Number Publication Date
SG11201701130TA true SG11201701130TA (en) 2017-03-30

Family

ID=55304006

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201701130TA SG11201701130TA (en) 2014-08-13 2014-10-01 Mounting device and measurement method

Country Status (7)

Country Link
US (1) US10492351B2 (ja)
JP (1) JP6422499B2 (ja)
KR (1) KR101972363B1 (ja)
CN (1) CN107079619B (ja)
SG (1) SG11201701130TA (ja)
TW (1) TWI602479B (ja)
WO (1) WO2016024364A1 (ja)

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* Cited by examiner, † Cited by third party
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WO2016024364A1 (ja) * 2014-08-13 2016-02-18 株式会社新川 実装装置および測定方法
JP7033878B2 (ja) * 2017-10-16 2022-03-11 ファスフォードテクノロジ株式会社 半導体製造装置および半導体装置の製造方法
KR102038355B1 (ko) * 2018-04-24 2019-10-30 스테코 주식회사 틀어짐이 방지되는 이너리드 본딩 장치
DE102018115144A1 (de) * 2018-06-23 2019-12-24 Besi Switzerland Ag Stellantrieb für einen Bondkopf
US20220039304A1 (en) * 2018-09-27 2022-02-03 Fuji Corporation Component supply apparatus
US11121113B2 (en) * 2020-01-16 2021-09-14 Asm Technology Singapore Pte Ltd Bonding apparatus incorporating variable force distribution
US20230197670A1 (en) * 2020-05-19 2023-06-22 Shinkawa Ltd. Bonding device and adjustment method for bonding head
CN114364940A (zh) * 2020-07-30 2022-04-15 株式会社新川 安装装置以及安装装置中的平行度检测方法
CN114981938A (zh) * 2020-12-14 2022-08-30 株式会社新川 半导体装置的制造装置及制造方法
KR20230074260A (ko) * 2021-02-22 2023-05-26 가부시키가이샤 신가와 실장 장치 및 실장 장치에서의 평행도 검출 방법
JP2024058157A (ja) * 2022-10-14 2024-04-25 株式会社新川 半導体装置の製造装置および部材の吸引方法
CN116387209B (zh) * 2023-06-06 2023-09-05 北京中科同志科技股份有限公司 芯片封装系统及芯片封装方法

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JPH0476931A (ja) * 1990-07-18 1992-03-11 Sumitomo Electric Ind Ltd 半導体素子実装装置
US5454170A (en) * 1994-03-02 1995-10-03 Vlsi Technology Inc. Robot to pedestal alignment head
JP3295529B2 (ja) * 1994-05-06 2002-06-24 松下電器産業株式会社 Ic部品実装方法及び装置
JP2000091360A (ja) * 1998-09-10 2000-03-31 Sanyo Electric Co Ltd ボンディング装置及びボンディングヘッドの平面出し方法
JP3367435B2 (ja) * 1998-11-24 2003-01-14 住友電装株式会社 電子部品の高さおよび傾き検知治具および電子部品の高さおよび傾き検知方法
JP2000301421A (ja) * 1999-04-21 2000-10-31 Sony Corp 電子部品実装機における部品吸着装置及び部品吸着方法
JP4768147B2 (ja) * 2001-04-27 2011-09-07 Nec液晶テクノロジー株式会社 液晶表示装置の製造装置
DE10217028C1 (de) * 2002-04-11 2003-11-20 Nanophotonics Ag Meßmodul für Waferfertigungsanlagen
US6870382B2 (en) * 2002-05-03 2005-03-22 Texas Instruments Incorporated System and method for evaluating the planarity and parallelism of an array of probe tips
CH696615A5 (de) * 2003-09-22 2007-08-15 Esec Trading Sa Verfahren für die Justierung des Bondkopfs eines Die Bonders.
TW200628029A (en) * 2004-12-06 2006-08-01 Matsushita Electric Ind Co Ltd Component mounting apparatus and component mounting method
JP4748118B2 (ja) * 2007-06-14 2011-08-17 パナソニック株式会社 電子部品実装用装置および電子部品実装用装置における基板下受け方法
US7567885B2 (en) * 2007-08-23 2009-07-28 Sokudo Co., Ltd. Method and system for determining object height
CN101877939A (zh) * 2009-04-29 2010-11-03 元港 电路板固定夹具
KR101387295B1 (ko) * 2012-05-14 2014-04-18 삼성전기주식회사 카메라 모듈의 제조 장치 및 방법
KR101332082B1 (ko) * 2012-06-18 2013-11-22 삼성전기주식회사 카메라 모듈의 제조장치
JP2014017328A (ja) * 2012-07-06 2014-01-30 Tdk Corp 実装装置および測定方法
JP5999809B2 (ja) * 2012-07-20 2016-09-28 富士機械製造株式会社 部品実装機
JP5997990B2 (ja) * 2012-09-13 2016-09-28 ヤマハ発動機株式会社 電子部品用実装装置および電子部品用実装装置の使用方法
US9146090B2 (en) * 2013-11-14 2015-09-29 Globalfoundries Inc. Nozzle alignment tool for a fluid dispensing apparatus
WO2016024364A1 (ja) * 2014-08-13 2016-02-18 株式会社新川 実装装置および測定方法
US10269758B2 (en) * 2015-12-24 2019-04-23 Intel Corporation Systems and processes for measuring thickness values of semiconductor substrates
KR102425309B1 (ko) * 2016-10-12 2022-07-26 삼성전자주식회사 본딩 헤드와 스테이지 사이의 평행도 보정 장치 및 이를 포함하는 칩 본더
US10050008B1 (en) * 2017-01-24 2018-08-14 Asm Technology Singapore Pte Ltd Method and system for automatic bond arm alignment

Also Published As

Publication number Publication date
US10492351B2 (en) 2019-11-26
US20170156244A1 (en) 2017-06-01
WO2016024364A1 (ja) 2016-02-18
JPWO2016024364A1 (ja) 2017-06-15
JP6422499B2 (ja) 2018-11-14
CN107079619B (zh) 2020-07-17
TW201607389A (zh) 2016-02-16
TWI602479B (zh) 2017-10-11
KR101972363B1 (ko) 2019-08-16
KR20170041864A (ko) 2017-04-17
CN107079619A (zh) 2017-08-18

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