SG11201601265YA - Polishing Composition and Method for Producing Same - Google Patents

Polishing Composition and Method for Producing Same

Info

Publication number
SG11201601265YA
SG11201601265YA SG11201601265YA SG11201601265YA SG11201601265YA SG 11201601265Y A SG11201601265Y A SG 11201601265YA SG 11201601265Y A SG11201601265Y A SG 11201601265YA SG 11201601265Y A SG11201601265Y A SG 11201601265YA SG 11201601265Y A SG11201601265Y A SG 11201601265YA
Authority
SG
Singapore
Prior art keywords
polishing composition
producing same
producing
same
polishing
Prior art date
Application number
SG11201601265YA
Other languages
English (en)
Inventor
Kohsuke Tsuchiya
Yoshio Mori
Original Assignee
Fujimi Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujimi Inc filed Critical Fujimi Inc
Publication of SG11201601265YA publication Critical patent/SG11201601265YA/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09GPOLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00Polishing compositions
    • C09G1/02Polishing compositions containing abrasives or grinding agents
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00Materials not provided for elsewhere
    • C09K3/14Anti-slip materials; Abrasives
    • C09K3/1454Abrasive powders, suspensions and pastes for polishing
    • C09K3/1463Aqueous liquid suspensions
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/042Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
    • B24B37/044Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor characterised by the composition of the lapping agent
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09GPOLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00Polishing compositions
    • C09G1/04Aqueous dispersions
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09KMATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00Materials not provided for elsewhere
    • C09K3/14Anti-slip materials; Abrasives
    • C09K3/1436Composite particles, e.g. coated particles
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002Preparing wafers
    • H01L21/02005Preparing bulk and homogeneous wafers
    • H01L21/02008Multistep processes
    • H01L21/0201Specific process step
    • H01L21/02024Mirror polishing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02043Cleaning before device manufacture, i.e. Begin-Of-Line process
    • H01L21/02052Wet cleaning only
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/304Mechanical treatment, e.g. grinding, polishing, cutting

Landscapes

  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Dispersion Chemistry (AREA)
  • Composite Materials (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
SG11201601265YA 2013-09-30 2014-09-22 Polishing Composition and Method for Producing Same SG11201601265YA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2013204466 2013-09-30
PCT/JP2014/075123 WO2015046163A1 (ja) 2013-09-30 2014-09-22 研磨用組成物およびその製造方法

Publications (1)

Publication Number Publication Date
SG11201601265YA true SG11201601265YA (en) 2016-03-30

Family

ID=52743299

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201601265YA SG11201601265YA (en) 2013-09-30 2014-09-22 Polishing Composition and Method for Producing Same

Country Status (8)

Country Link
US (1) US10227518B2 (zh)
EP (1) EP3053977B1 (zh)
JP (1) JP5892638B2 (zh)
KR (1) KR102239131B1 (zh)
CN (1) CN105593330B (zh)
SG (1) SG11201601265YA (zh)
TW (1) TWI617655B (zh)
WO (1) WO2015046163A1 (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5920840B2 (ja) * 2013-09-30 2016-05-18 株式会社フジミインコーポレーテッド 研磨用組成物およびその製造方法
JP6185432B2 (ja) * 2014-06-24 2017-08-23 株式会社フジミインコーポレーテッド シリコンウェーハ研磨用組成物
US10179870B2 (en) * 2014-12-05 2019-01-15 3M Innovative Properties Company Abrasive composition
US20190241766A1 (en) * 2016-09-29 2019-08-08 Kao Corporation Polishing liquid composition
JP6879798B2 (ja) * 2017-03-30 2021-06-02 株式会社フジミインコーポレーテッド 研磨用組成物および研磨方法
EP3790706A4 (en) * 2018-05-07 2022-02-16 Applied Materials, Inc. CHEMICAL MECHANICAL POLISHING PADS WITH ADJUSTABLE HYDROPHIL AND ZETA POTENTIAL
JP7356248B2 (ja) 2019-03-28 2023-10-04 株式会社フジミインコーポレーテッド リンス用組成物およびリンス方法
CN112872916B (zh) * 2020-12-28 2023-03-10 富联裕展科技(深圳)有限公司 抛光系统及抛光方法

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US5349023A (en) * 1991-12-12 1994-09-20 Kuraray Co., Ltd. Vinyl alcohol copolymer having terminal amino group
JP3996314B2 (ja) 1999-03-26 2007-10-24 三洋化成工業株式会社 研磨用砥粒分散剤および研磨用スラリー
JP2001240850A (ja) 2000-02-29 2001-09-04 Sanyo Chem Ind Ltd 研磨用砥粒分散剤および研磨用スラリー
JP4076012B2 (ja) 2002-04-10 2008-04-16 株式会社日本触媒 化学機械研磨用水系分散体
US7378479B2 (en) * 2002-09-13 2008-05-27 Lubrizol Advanced Materials, Inc. Multi-purpose polymers, methods and compositions
US20040241130A1 (en) * 2002-09-13 2004-12-02 Krishnan Tamareselvy Multi-purpose polymers, methods and compositions
US8466243B2 (en) * 2003-07-11 2013-06-18 Sekisui Specialty Chemicals America, Llc Vinyl alcohol copolymers for use in aqueous dispersions and melt extruded articles
JP4292117B2 (ja) 2004-07-15 2009-07-08 Jsr株式会社 化学機械研磨用水系分散体及び化学機械研磨方法
CN101311205A (zh) * 2004-07-23 2008-11-26 日立化成工业株式会社 Cmp研磨剂以及衬底的研磨方法
US20070218811A1 (en) 2004-09-27 2007-09-20 Hitachi Chemical Co., Ltd. Cmp polishing slurry and method of polishing substrate
CN101032001B (zh) 2004-09-28 2011-12-28 日立化成工业株式会社 Cmp抛光剂以及衬底的抛光方法
ES2341285T3 (es) * 2005-07-19 2010-06-17 Nektar Therapeutics Metodo para preparar maleimidas polimericas.
RS53847B1 (en) * 2005-07-29 2015-08-31 Nektar Therapeutics PROCEDURES FOR OBTAINING POLYMER REAGENTS
CA2678401A1 (en) * 2007-02-22 2008-08-28 Biovectra Inc. Process for purification of water soluble polymers
JP2009070904A (ja) * 2007-09-11 2009-04-02 Mitsui Chemicals Inc 研磨用組成物
JP2008147688A (ja) * 2008-01-15 2008-06-26 Jsr Corp 化学機械研磨用水系分散体及び化学機械研磨方法
KR20100123678A (ko) * 2008-02-18 2010-11-24 제이에스알 가부시끼가이샤 화학 기계 연마용 수계 분산체 및 화학 기계 연마 방법
KR101461261B1 (ko) * 2008-02-18 2014-11-12 제이에스알 가부시끼가이샤 화학 기계 연마용 수계 분산체 및 화학 기계 연마 방법
JP2010016344A (ja) * 2008-02-18 2010-01-21 Jsr Corp 化学機械研磨用水系分散体およびその製造方法、ならびに化学機械研磨方法
WO2010036358A1 (en) * 2008-09-26 2010-04-01 Rhodia Operations Abrasive compositions for chemical mechanical polishing and methods for using same
MY154861A (en) * 2008-12-22 2015-08-14 Kao Corp Polishing liquid composition for magnetic-disk substrate
US20130017744A1 (en) * 2010-03-30 2013-01-17 Daikin Industries, Ltd. Graft copolymer and repellent composition

Also Published As

Publication number Publication date
CN105593330A (zh) 2016-05-18
KR20160063320A (ko) 2016-06-03
WO2015046163A1 (ja) 2015-04-02
EP3053977A1 (en) 2016-08-10
JPWO2015046163A1 (ja) 2017-03-09
EP3053977B1 (en) 2019-09-11
US20160215189A1 (en) 2016-07-28
US10227518B2 (en) 2019-03-12
TW201525120A (zh) 2015-07-01
JP5892638B2 (ja) 2016-03-23
KR102239131B1 (ko) 2021-04-12
EP3053977A4 (en) 2017-03-29
CN105593330B (zh) 2018-06-19
TWI617655B (zh) 2018-03-11

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