SG10201704389PA - Mold, imprinting method, imprint apparatus, and method for manufacturing a semiconductor article - Google Patents

Mold, imprinting method, imprint apparatus, and method for manufacturing a semiconductor article

Info

Publication number
SG10201704389PA
SG10201704389PA SG10201704389PA SG10201704389PA SG10201704389PA SG 10201704389P A SG10201704389P A SG 10201704389PA SG 10201704389P A SG10201704389P A SG 10201704389PA SG 10201704389P A SG10201704389P A SG 10201704389PA SG 10201704389P A SG10201704389P A SG 10201704389PA
Authority
SG
Singapore
Prior art keywords
mold
manufacturing
imprint apparatus
semiconductor article
imprinting
Prior art date
Application number
SG10201704389PA
Other languages
English (en)
Inventor
Ichiro Shinoda Ken
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kk filed Critical Canon Kk
Publication of SG10201704389PA publication Critical patent/SG10201704389PA/en

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20Exposure; Apparatus therefor
    • G03F7/2002Exposure; Apparatus therefor with visible light or UV light, through an original having an opaque pattern on a transparent support, e.g. film printing, projection printing; by reflection of visible or UV light from an original such as a printed image
    • G03F7/2014Contact or film exposure of light sensitive plates such as lithographic plates or circuit boards, e.g. in a vacuum frame
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70691Handling of masks or workpieces
    • G03F7/70775Position control, e.g. interferometers or encoders for determining the stage position
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P76/00Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
    • H10P76/20Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials
    • H10P76/204Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials of organic photoresist masks
    • H10P76/2041Photolithographic processes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/01Manufacture or treatment
    • H10W74/016Manufacture or treatment using moulds

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Shaping Of Tube Ends By Bending Or Straightening (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Moulds For Moulding Plastics Or The Like (AREA)
SG10201704389PA 2016-06-30 2017-05-30 Mold, imprinting method, imprint apparatus, and method for manufacturing a semiconductor article SG10201704389PA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2016130918A JP6748496B2 (ja) 2016-06-30 2016-06-30 モールド、インプリント方法、インプリント装置および物品製造方法

Publications (1)

Publication Number Publication Date
SG10201704389PA true SG10201704389PA (en) 2018-01-30

Family

ID=60806962

Family Applications (1)

Application Number Title Priority Date Filing Date
SG10201704389PA SG10201704389PA (en) 2016-06-30 2017-05-30 Mold, imprinting method, imprint apparatus, and method for manufacturing a semiconductor article

Country Status (6)

Country Link
US (1) US20180004091A1 (https=)
JP (1) JP6748496B2 (https=)
KR (1) KR102280003B1 (https=)
CN (1) CN107561855A (https=)
SG (1) SG10201704389PA (https=)
TW (1) TWI643019B (https=)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6815894B2 (ja) * 2017-02-27 2021-01-20 株式会社ディスコ 静電チャックテーブルの使用方法
CN108445711A (zh) * 2018-03-13 2018-08-24 京东方科技集团股份有限公司 一种显示基板及其制作方法、显示装置
US11281095B2 (en) 2018-12-05 2022-03-22 Canon Kabushiki Kaisha Frame curing template and system and method of using the frame curing template
JP2021027107A (ja) 2019-08-01 2021-02-22 キヤノン株式会社 インプリント装置、インプリント方法及び物品の製造方法
JP7374666B2 (ja) * 2019-08-29 2023-11-07 キヤノン株式会社 インプリント方法、前処理装置、インプリント用基板、および基板の製造方法
JP7346268B2 (ja) * 2019-12-05 2023-09-19 キヤノン株式会社 インプリント用のテンプレート、テンプレートを用いたインプリント方法
JP7465146B2 (ja) * 2020-05-12 2024-04-10 キヤノン株式会社 インプリント方法、インプリント装置、判定方法及び物品の製造方法
CN117761966A (zh) * 2020-07-01 2024-03-26 吉佳蓝科技股份有限公司 纳米压印用复制模制作装置
US11747731B2 (en) 2020-11-20 2023-09-05 Canon Kabishiki Kaisha Curing a shaped film using multiple images of a spatial light modulator
JP7710313B2 (ja) 2021-05-27 2025-07-18 キヤノン株式会社 モールド、インプリント装置、および物品の製造方法
TWI872651B (zh) * 2023-08-18 2025-02-11 光群雷射科技股份有限公司 組版式壓印設備

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3410089B2 (ja) * 1991-11-13 2003-05-26 株式会社東芝 露光用マスクの製造方法及び露光方法
US9573319B2 (en) * 2007-02-06 2017-02-21 Canon Kabushiki Kaisha Imprinting method and process for producing a member in which a mold contacts a pattern forming layer
JP5182470B2 (ja) 2007-07-17 2013-04-17 大日本印刷株式会社 インプリントモールド
JP4799575B2 (ja) * 2008-03-06 2011-10-26 株式会社東芝 インプリント方法
JP5257225B2 (ja) * 2009-04-28 2013-08-07 大日本印刷株式会社 ナノインプリント用モールドおよびその製造方法
JP5531702B2 (ja) * 2010-03-23 2014-06-25 旭硝子株式会社 遮光膜付ガラス基板および液晶表示装置
JP6029494B2 (ja) * 2012-03-12 2016-11-24 キヤノン株式会社 インプリント方法およびインプリント装置、それを用いた物品の製造方法
WO2014115728A1 (ja) * 2013-01-24 2014-07-31 綜研化学株式会社 光透過型インプリント用モールド、大面積モールドの製造方法
JP6368075B2 (ja) * 2013-06-26 2018-08-01 キヤノン株式会社 モールド
JP5909210B2 (ja) * 2013-07-11 2016-04-26 キヤノン株式会社 インプリント装置及び物品の製造方法
JP6097704B2 (ja) * 2014-01-06 2017-03-15 キヤノン株式会社 インプリント装置、インプリント方法及び物品の製造方法
JP2015144193A (ja) * 2014-01-31 2015-08-06 株式会社東芝 インプリント方法、テンプレートおよびインプリント装置
TWI662591B (zh) * 2014-07-08 2019-06-11 Soken Chemical & Engineering Co., Ltd. 使用分步重複用壓印用模具的分步重複壓印方法、及分步重複用壓印用模具之製造方法
JP5900589B2 (ja) * 2014-12-12 2016-04-06 大日本印刷株式会社 インプリント用モールド、アライメント方法、インプリント方法、およびインプリント装置
JP2016028442A (ja) * 2015-10-08 2016-02-25 大日本印刷株式会社 テンプレート

Also Published As

Publication number Publication date
US20180004091A1 (en) 2018-01-04
KR102280003B1 (ko) 2021-07-21
CN107561855A (zh) 2018-01-09
TW201802578A (zh) 2018-01-16
TWI643019B (zh) 2018-12-01
KR20180003437A (ko) 2018-01-09
JP6748496B2 (ja) 2020-09-02
JP2018006553A (ja) 2018-01-11

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