SE8305277L - Sett och anordning for metning av tjockleken hos ett zirkoniumfoder - Google Patents

Sett och anordning for metning av tjockleken hos ett zirkoniumfoder

Info

Publication number
SE8305277L
SE8305277L SE8305277A SE8305277A SE8305277L SE 8305277 L SE8305277 L SE 8305277L SE 8305277 A SE8305277 A SE 8305277A SE 8305277 A SE8305277 A SE 8305277A SE 8305277 L SE8305277 L SE 8305277L
Authority
SE
Sweden
Prior art keywords
thickness
lift
liner
variation
component
Prior art date
Application number
SE8305277A
Other languages
Unknown language ( )
English (en)
Other versions
SE460309B (sv
SE8305277D0 (sv
Inventor
T Sakamoto
T Hiroshima
Original Assignee
Sumitomo Metal Ind
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Metal Ind filed Critical Sumitomo Metal Ind
Publication of SE8305277D0 publication Critical patent/SE8305277D0/sv
Publication of SE8305277L publication Critical patent/SE8305277L/sv
Publication of SE460309B publication Critical patent/SE460309B/sv

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/02Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
    • G01B7/06Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
    • G01B7/10Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance
    • G01B7/105Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using magnetic means, e.g. by measuring change of reluctance for measuring thickness of coating
    • GPHYSICS
    • G21NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21CNUCLEAR REACTORS
    • G21C17/00Monitoring; Testing ; Maintaining
    • G21C17/06Devices or arrangements for monitoring or testing fuel or fuel elements outside the reactor core, e.g. for burn-up, for contamination
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E30/00Energy generation of nuclear origin
    • Y02E30/30Nuclear fission reactors
SE8305277A 1982-09-30 1983-09-29 Saett att maeta tjockleken av ett zirkoniumfoder samt anordning foer utfoerande av saettet SE460309B (sv)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57173034A JPS5967405A (ja) 1982-09-30 1982-09-30 ライナ厚測定方法

Publications (3)

Publication Number Publication Date
SE8305277D0 SE8305277D0 (sv) 1983-09-29
SE8305277L true SE8305277L (sv) 1984-03-31
SE460309B SE460309B (sv) 1989-09-25

Family

ID=15952966

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8305277A SE460309B (sv) 1982-09-30 1983-09-29 Saett att maeta tjockleken av ett zirkoniumfoder samt anordning foer utfoerande av saettet

Country Status (6)

Country Link
US (1) US4673877A (sv)
JP (1) JPS5967405A (sv)
CA (1) CA1237773A (sv)
DE (1) DE3335080C2 (sv)
FR (1) FR2534015B1 (sv)
SE (1) SE460309B (sv)

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JPS5967405A (ja) * 1982-09-30 1984-04-17 Sumitomo Metal Ind Ltd ライナ厚測定方法
JPS6138403A (ja) * 1984-07-30 1986-02-24 Kobe Steel Ltd ライナ−被覆管のライナ−層厚・ジルカロイ厚の測定法
JPS6138404A (ja) * 1984-07-30 1986-02-24 Kobe Steel Ltd ライナ−被覆管のライナ−層厚・ジルカロイ厚測定法
JPS6193901A (ja) * 1984-10-15 1986-05-12 Kobe Steel Ltd ライナ厚測定方法
FR2572175A1 (fr) * 1984-10-24 1986-04-25 Stein Heurtey Procede et dispositif pour mesurer l'epaisseur de couches metalliques minces deposees sur un support conducteur
JPS6196401A (ja) * 1984-10-18 1986-05-15 Kobe Steel Ltd 2周波によるライナ厚測定方法
JPH0514165Y2 (sv) * 1984-12-22 1993-04-15
JPS61225603A (ja) * 1985-03-29 1986-10-07 Sumitomo Metal Ind Ltd ライナ厚さ測定装置
JPS6221003A (ja) * 1985-07-19 1987-01-29 Kobe Steel Ltd ライニング管の厚み測定法
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US5394084A (en) * 1991-12-23 1995-02-28 The Boeing Company Method and apparatus for reducing errors in eddy-current conductivity measurements due to lift-off by interpolating between a plurality of reference conductivity measurements
US5341678A (en) * 1993-05-12 1994-08-30 General Electric Company Method for determining thickness of ferromagnetic material deposition on nuclear fuel rods
US5418823A (en) * 1994-01-04 1995-05-23 General Electric Company Combined ultrasonic and eddy-current method and apparatus for non-destructive testing of tubular objects to determine thickness of metallic linings or coatings
US5541510A (en) * 1995-04-06 1996-07-30 Kaman Instrumentation Corporation Multi-Parameter eddy current measuring system with parameter compensation technical field
US5963031A (en) * 1995-06-29 1999-10-05 N.V. Bekaert Naamloze Vennootschap Method and apparatus for measuring the thickness of a non-ferromagnetic conductive layer on a ferromagnetic conductive substrate
US5661241A (en) * 1995-09-11 1997-08-26 The Babcock & Wilcox Company Ultrasonic technique for measuring the thickness of cladding on the inside surface of vessels from the outside diameter surface
JP2000502189A (ja) * 1995-12-22 2000-02-22 シーメンス アクチエンゲゼルシヤフト 導電性被膜の厚さ決定方法及び装置
SE508354C2 (sv) * 1996-07-05 1998-09-28 Asea Atom Ab Förfarande och anordning för bestämning av skikttjocklek
DE19702950C2 (de) * 1997-01-28 2001-05-03 Helmut Fischer Gmbh & Co Verfahren und Vorrichtung zum Messen der Schichtdicke an zylindrischen Kleinteilen
US7498164B2 (en) * 1998-05-16 2009-03-03 Applied Biosystems, Llc Instrument for monitoring nucleic acid sequence amplification reaction
DE19860487A1 (de) * 1998-12-28 2000-07-06 Siemens Ag Verfahren und Vorrichtung zur räumlichen Vermessung einer Inhomogenität an einer Oberfläche eines Kernreaktorbauteils und Anwendung des Verfahrens zur Vermessung einer elektrisch praktisch nicht leitenden Schicht
EP1052505A1 (de) * 1999-05-11 2000-11-15 Asea Brown Boveri AG Verfahren zur Oberflächenuntersuchung an einem, wenigstens eine elektrisch leitfähige Schicht aufweisenden Prüfgut
US6366083B1 (en) 1999-09-17 2002-04-02 Framatome Anp Inc. Method for measuring the thickness of oxide layer underlying crud layer containing ferromagnetic material on nuclear fuel rods
US6369566B1 (en) 1999-09-27 2002-04-09 Framatone Anp Inc. Method for measuring crud thickness on nuclear fuel rods
EP1244907A1 (en) * 1999-12-23 2002-10-02 KLA-Tencor Corporation In-situ metalization monitoring using eddy current measurements and optical measurements
TWI241398B (en) * 2000-03-28 2005-10-11 Toshiba Corp Eddy current loss measuring sensor, film thickness measuring device, film thickness measuring method and recording medium
US7374477B2 (en) * 2002-02-06 2008-05-20 Applied Materials, Inc. Polishing pads useful for endpoint detection in chemical mechanical polishing
US6924641B1 (en) * 2000-05-19 2005-08-02 Applied Materials, Inc. Method and apparatus for monitoring a metal layer during chemical mechanical polishing
DE10102303C1 (de) * 2001-01-19 2002-08-22 Framatome Anp Gmbh Meßsystem zur Ermittlung der Schichtdicke einer Oxidschicht
US6608495B2 (en) 2001-03-19 2003-08-19 Applied Materials, Inc. Eddy-optic sensor for object inspection
US6966816B2 (en) * 2001-05-02 2005-11-22 Applied Materials, Inc. Integrated endpoint detection system with optical and eddy current monitoring
US6811466B1 (en) * 2001-12-28 2004-11-02 Applied Materials, Inc. System and method for in-line metal profile measurement
US20030210040A1 (en) * 2002-05-08 2003-11-13 Samsung Electro-Mechanics Co., Ltd. Permeability detection system of ferrite core using magnetic field induction method
US6945845B2 (en) * 2003-03-04 2005-09-20 Applied Materials, Inc. Chemical mechanical polishing apparatus with non-conductive elements
US7025658B2 (en) * 2003-08-18 2006-04-11 Applied Materials, Inc. Platen and head rotation rates for monitoring chemical mechanical polishing
JP4451111B2 (ja) * 2003-10-20 2010-04-14 株式会社荏原製作所 渦電流センサ
SE530770C2 (sv) * 2005-08-24 2008-09-09 Westinghouse Electric Sweden System och användning avseende virvelströmsmätningar på komponenter för nukleära reaktorer
US8337278B2 (en) 2007-09-24 2012-12-25 Applied Materials, Inc. Wafer edge characterization by successive radius measurements
US7705589B2 (en) * 2008-02-19 2010-04-27 Korea Research Institute Of Standards And Science Sensor for detecting surface defects of metal tube using eddy current method
JP2010164483A (ja) * 2009-01-16 2010-07-29 Idemitsu Eng Co Ltd 非破壊検査装置および非破壊検査方法
JP2021001814A (ja) * 2019-06-21 2021-01-07 国立大学法人 岡山大学 非破壊検査方法及び非破壊検査装置

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US3132299A (en) * 1960-10-17 1964-05-05 Budd Co Electromagnetic-testing bridge-net-work with digital programming control for operation under a plurality of initial unbalance conditions
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US3526829A (en) * 1968-04-24 1970-09-01 Chrysler Corp Pulsed eddy current apparatus for nondestructive testing of resistance type welds
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JPS58166203A (ja) * 1982-03-26 1983-10-01 Nuclear Fuel Ind Ltd 核燃料用被覆管内面コ−テイング膜厚測定法ならびにその装置
JPS5967405A (ja) * 1982-09-30 1984-04-17 Sumitomo Metal Ind Ltd ライナ厚測定方法

Also Published As

Publication number Publication date
JPH0226721B2 (sv) 1990-06-12
DE3335080A1 (de) 1984-04-05
CA1237773A (en) 1988-06-07
FR2534015A1 (fr) 1984-04-06
SE460309B (sv) 1989-09-25
JPS5967405A (ja) 1984-04-17
DE3335080C2 (de) 1986-01-30
FR2534015B1 (fr) 1985-07-05
US4673877A (en) 1987-06-16
SE8305277D0 (sv) 1983-09-29

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