SE444728B - Metanordning for identifiering av ytprofilen hos ett foremal - Google Patents

Metanordning for identifiering av ytprofilen hos ett foremal

Info

Publication number
SE444728B
SE444728B SE8404376A SE8404376A SE444728B SE 444728 B SE444728 B SE 444728B SE 8404376 A SE8404376 A SE 8404376A SE 8404376 A SE8404376 A SE 8404376A SE 444728 B SE444728 B SE 444728B
Authority
SE
Sweden
Prior art keywords
light
measuring device
point
detector
distance
Prior art date
Application number
SE8404376A
Other languages
English (en)
Swedish (sv)
Other versions
SE8404376L (sv
SE8404376D0 (sv
Inventor
E A Byckling
P P Pihlman
Original Assignee
Electrolux Ab
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Electrolux Ab filed Critical Electrolux Ab
Priority to SE8404376A priority Critical patent/SE444728B/sv
Publication of SE8404376D0 publication Critical patent/SE8404376D0/xx
Priority to DE19853528684 priority patent/DE3528684A1/de
Priority to JP60188739A priority patent/JPH0658213B2/ja
Publication of SE8404376L publication Critical patent/SE8404376L/
Publication of SE444728B publication Critical patent/SE444728B/sv

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
  • Optical Recording Or Reproduction (AREA)
  • Automatic Focus Adjustment (AREA)
SE8404376A 1984-08-31 1984-08-31 Metanordning for identifiering av ytprofilen hos ett foremal SE444728B (sv)

Priority Applications (3)

Application Number Priority Date Filing Date Title
SE8404376A SE444728B (sv) 1984-08-31 1984-08-31 Metanordning for identifiering av ytprofilen hos ett foremal
DE19853528684 DE3528684A1 (de) 1984-08-31 1985-08-09 Messanordnung zum ermitteln des oberflaechenprofils eines objekts
JP60188739A JPH0658213B2 (ja) 1984-08-31 1985-08-29 物体の表面プロフイルを同定するための測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
SE8404376A SE444728B (sv) 1984-08-31 1984-08-31 Metanordning for identifiering av ytprofilen hos ett foremal

Publications (3)

Publication Number Publication Date
SE8404376D0 SE8404376D0 (sv) 1984-08-31
SE8404376L SE8404376L (sv) 1986-03-01
SE444728B true SE444728B (sv) 1986-04-28

Family

ID=20356869

Family Applications (1)

Application Number Title Priority Date Filing Date
SE8404376A SE444728B (sv) 1984-08-31 1984-08-31 Metanordning for identifiering av ytprofilen hos ett foremal

Country Status (3)

Country Link
JP (1) JPH0658213B2 (enrdf_load_stackoverflow)
DE (1) DE3528684A1 (enrdf_load_stackoverflow)
SE (1) SE444728B (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07107481B2 (ja) * 1987-05-21 1995-11-15 アンリツ株式会社 変位測定装置
AU6435690A (en) * 1989-09-22 1991-04-18 Peter Rohleder Device for the production of tooth replacement parts
US5355210A (en) * 1991-12-20 1994-10-11 Rotlex Optics Ltd. Method and apparatus for measuring optical properties of optical devices
DE9204528U1 (de) * 1992-04-02 1992-09-17 Heidelberg Instruments Mikrotechnik GmbH, 6900 Heidelberg Anordnung zur berührungslosen Abtastung

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2256736C3 (de) * 1972-11-18 1979-01-25 Ibm Deutschland Gmbh, 7000 Stuttgart Meßanordnung zur automatischen Prüfung der Oberflächenbeschaffenheit und Ebenheit einer Werkstückoberfläche
US4180322A (en) * 1978-05-01 1979-12-25 Alcyon Equipment S.A. Interior measurement of enclosed spaces
US4299491A (en) * 1979-12-11 1981-11-10 United Technologies Corporation Noncontact optical gauging system
JPS57127933A (en) * 1981-01-27 1982-08-09 Sharp Corp Pickup device
JPS5927207A (ja) * 1982-08-07 1984-02-13 Agency Of Ind Science & Technol 非接触表面形状・あらさ計

Also Published As

Publication number Publication date
SE8404376L (sv) 1986-03-01
DE3528684C2 (enrdf_load_stackoverflow) 1988-12-22
SE8404376D0 (sv) 1984-08-31
DE3528684A1 (de) 1986-03-06
JPS6165106A (ja) 1986-04-03
JPH0658213B2 (ja) 1994-08-03

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