RU2659749C2 - Лазерный прибор с регулируемой поляризацией - Google Patents
Лазерный прибор с регулируемой поляризацией Download PDFInfo
- Publication number
- RU2659749C2 RU2659749C2 RU2016107384A RU2016107384A RU2659749C2 RU 2659749 C2 RU2659749 C2 RU 2659749C2 RU 2016107384 A RU2016107384 A RU 2016107384A RU 2016107384 A RU2016107384 A RU 2016107384A RU 2659749 C2 RU2659749 C2 RU 2659749C2
- Authority
- RU
- Russia
- Prior art keywords
- laser
- laser light
- polarization
- submatrix
- pattern
- Prior art date
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Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18355—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL] having a defined polarisation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J4/00—Measuring polarisation of light
- G01J4/04—Polarimeters using electric detection means
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/50—Depth or shape recovery
- G06T7/55—Depth or shape recovery from multiple images
- G06T7/593—Depth or shape recovery from multiple images from stereo images
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/068—Stabilisation of laser output parameters
- H01S5/06821—Stabilising other output parameters than intensity or frequency, e.g. phase, polarisation or far-fields
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities
- H01S5/183—Surface-emitting [SE] lasers, e.g. having both horizontal and vertical cavities having only vertical cavities, e.g. vertical cavity surface-emitting lasers [VCSEL]
- H01S5/18386—Details of the emission surface for influencing the near- or far-field, e.g. a grating on the surface
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/42—Arrays of surface emitting lasers
- H01S5/423—Arrays of surface emitting lasers having a vertical cavity
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N13/00—Stereoscopic video systems; Multi-view video systems; Details thereof
- H04N13/20—Image signal generators
- H04N13/204—Image signal generators using stereoscopic image cameras
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Optics & Photonics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Signal Processing (AREA)
- Theoretical Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Laser Beam Processing (AREA)
- Semiconductor Lasers (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Measurement Of Optical Distance (AREA)
- Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP13179072.7 | 2013-08-02 | ||
| EP13179072 | 2013-08-02 | ||
| PCT/EP2014/066185 WO2015014797A1 (en) | 2013-08-02 | 2014-07-28 | Laser device with adjustable polarization |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| RU2016107384A RU2016107384A (ru) | 2017-09-07 |
| RU2659749C2 true RU2659749C2 (ru) | 2018-07-03 |
Family
ID=48906169
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| RU2016107384A RU2659749C2 (ru) | 2013-08-02 | 2014-07-28 | Лазерный прибор с регулируемой поляризацией |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US10135225B2 (enExample) |
| EP (1) | EP3028353B1 (enExample) |
| JP (1) | JP6568065B2 (enExample) |
| CN (1) | CN105474482B (enExample) |
| BR (1) | BR112016001885A2 (enExample) |
| RU (1) | RU2659749C2 (enExample) |
| WO (1) | WO2015014797A1 (enExample) |
Families Citing this family (35)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2012114334A1 (en) | 2011-02-24 | 2012-08-30 | Ilan Ben Oren | Hybrid catheter for endoluminal intervention |
| US9581554B2 (en) * | 2013-05-30 | 2017-02-28 | Seagate Technology Llc | Photon emitter array |
| CN106794043B (zh) | 2014-05-18 | 2020-03-13 | 爱克斯莫医疗有限公司 | 使用脉冲激光器进行组织消融的系统 |
| US9984494B2 (en) * | 2015-01-26 | 2018-05-29 | Uber Technologies, Inc. | Map-like summary visualization of street-level distance data and panorama data |
| RU2672767C1 (ru) * | 2015-02-19 | 2018-11-19 | Конинклейке Филипс Н.В. | Устройство инфракрасного лазерного освещения |
| CN107407559B (zh) * | 2015-03-30 | 2019-10-18 | 富士胶片株式会社 | 距离图像获取装置以及距离图像获取方法 |
| US11684420B2 (en) | 2016-05-05 | 2023-06-27 | Eximo Medical Ltd. | Apparatus and methods for resecting and/or ablating an undesired tissue |
| DE102017002235A1 (de) * | 2017-03-08 | 2018-09-13 | Blickfeld GmbH | LIDAR-System mit flexiblen Scanparametern |
| CN106840007A (zh) * | 2017-04-07 | 2017-06-13 | 赵�怡 | 一种结合可调激光测距探头阵列与智能终端的空间扫描系统及方法 |
| EP3422147A1 (en) | 2017-06-28 | 2019-01-02 | Koninklijke Philips N.V. | Display apparatus for computer-mediated reality |
| CN107706734A (zh) * | 2017-10-13 | 2018-02-16 | 中国电子科技集团公司第十三研究所 | 一种密集排列脉冲激光器 |
| EP3480626A1 (en) * | 2017-11-02 | 2019-05-08 | Koninklijke Philips N.V. | Improved depth image reconstruction |
| KR102464368B1 (ko) * | 2017-11-07 | 2022-11-07 | 삼성전자주식회사 | 메타 프로젝터 및 이를 포함하는 전자 장치 |
| KR102526929B1 (ko) * | 2018-04-04 | 2023-05-02 | 삼성전자 주식회사 | 메타 표면이 형성된 투명 부재를 포함하는 광원 모듈 및 이를 포함하는 전자 장치 |
| DE102018205984A1 (de) * | 2018-04-19 | 2019-10-24 | Robert Bosch Gmbh | Vorrichtung und Verfahren zum Bestimmen einer Position von mindestens einem Objekt |
| JP7174041B2 (ja) * | 2018-04-20 | 2022-11-17 | 富士フイルム株式会社 | 光照射装置およびセンサー |
| CN112639518A (zh) * | 2018-05-09 | 2021-04-09 | ams传感器亚洲私人有限公司 | 使用偏振特定vcsel的三维成像和感测应用 |
| US10802382B2 (en) | 2018-07-24 | 2020-10-13 | Qualcomm Incorporated | Adjustable light projector for flood illumination and active depth sensing |
| JP7316277B2 (ja) * | 2018-07-25 | 2023-07-27 | 株式会社小糸製作所 | センサシステム |
| CN109541817B (zh) * | 2019-01-15 | 2025-04-08 | 深圳市安思疆科技有限公司 | 一种偏振态可控的结构光投射模组及3d成像装置 |
| US10985531B2 (en) * | 2019-01-27 | 2021-04-20 | Hewlett Packard Enterprise Development Lp | Intensity noise mitigation for vertical-cavity surface emitting lasers |
| CN109669271B (zh) * | 2019-02-14 | 2025-01-21 | 杭州驭光光电科技有限公司 | 分束光学模组及其制造方法 |
| US12265232B2 (en) | 2019-02-14 | 2025-04-01 | Hangzhou Uphoton Optoelectronics Technology Co., Ltd. | Beam-splitting optical module and manufacturing method thereof |
| US11022813B2 (en) | 2019-04-08 | 2021-06-01 | Qualcomm Incorporated | Multifunction light projector with multistage adjustable diffractive optical elements |
| CN114303071B (zh) * | 2019-06-27 | 2025-07-15 | ams国际有限公司 | 成像系统和检测方法 |
| DE102019133797A1 (de) * | 2019-12-10 | 2021-06-10 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Laser-lichtquelle und lidar-system mit der laser-lichtquelle |
| US12376904B1 (en) | 2020-09-08 | 2025-08-05 | Angiodynamics, Inc. | Dynamic laser stabilization and calibration system |
| CN112332218A (zh) * | 2020-11-11 | 2021-02-05 | 深圳博升光电科技有限公司 | 垂直腔面发射激光器发光阵列及其控制方法 |
| DE102021102799A1 (de) * | 2021-02-05 | 2022-08-11 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Laserdiodenanordnung, beleuchtungseinheit und laserprojektionsvorrichtung |
| KR20230150331A (ko) * | 2021-04-08 | 2023-10-30 | 헤사이 테크놀로지 씨오., 엘티디. | 고체 레이저 레이더 및 이를 사용한 탐지 방법 |
| US12038322B2 (en) | 2022-06-21 | 2024-07-16 | Eximo Medical Ltd. | Devices and methods for testing ablation systems |
| JP2024016593A (ja) * | 2022-07-26 | 2024-02-07 | ソニーセミコンダクタソリューションズ株式会社 | 照明装置、測距装置及び車載装置 |
| CN117629885A (zh) * | 2022-08-15 | 2024-03-01 | 清华大学 | 基于相干光源阵列的傅里叶变换光谱仪 |
| DE102022127126A1 (de) * | 2022-09-16 | 2024-03-21 | Trumpf Photonic Components Gmbh | Vertikalemittierendes Halbleiterlaserbauteil, Array und Chip mit Vorzugsrichtung |
| CN115200550B (zh) * | 2022-09-16 | 2022-12-06 | 济宁鲁威液压科技股份有限公司 | 罐道倾斜测量装置及其使用方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0553266A1 (en) * | 1990-10-15 | 1993-08-04 | Waldean A Schulz | METHOD AND APPARATUS FOR NON-CONTACT DETECTION OF THREE-DIMENSIONAL SHAPES. |
| EP1394500A1 (de) * | 2002-08-28 | 2004-03-03 | Sick AG | Objekterfassung |
| US20100226402A1 (en) * | 2009-03-09 | 2010-09-09 | Sony Corporation | Laser diode and method of manufacturing the same |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0722706B2 (ja) | 1987-05-18 | 1995-03-15 | 三菱重工業株式会社 | メタン含有ガス製造用触媒 |
| JPS649306A (en) * | 1987-07-01 | 1989-01-12 | Fujitsu Ltd | Detector for light transmitting fine pattern |
| US5589822A (en) * | 1992-10-20 | 1996-12-31 | Robotic Vision Systems, Inc. | System for detecting ice or snow on surface which specularly reflects light |
| JP3477744B2 (ja) * | 1993-06-23 | 2003-12-10 | ソニー株式会社 | 発光装置及びこれを用いた立体視覚装置及びその視覚方法及びその駆動方法 |
| JPH0791929A (ja) * | 1993-09-20 | 1995-04-07 | Mitsubishi Heavy Ind Ltd | テレビカメラによる3次元形状計測装置 |
| US5956070A (en) * | 1995-12-22 | 1999-09-21 | Xerox Corporation | Color xerographic printer with multiple linear arrays of surface emitting lasers with dissimilar polarization states and dissimilar wavelengths |
| JP3482824B2 (ja) * | 1997-07-29 | 2004-01-06 | セイコーエプソン株式会社 | 面発光型半導体レーザおよび面発光型半導体レーザアレイ |
| US6154480A (en) * | 1997-10-02 | 2000-11-28 | Board Of Regents, The University Of Texas System | Vertical-cavity laser and laser array incorporating guided-mode resonance effects and method for making the same |
| GB9916145D0 (en) | 1999-07-10 | 1999-09-08 | Secr Defence | Control of polarisation of vertical cavity surface emitting lasers |
| JP2002213931A (ja) * | 2001-01-17 | 2002-07-31 | Fuji Xerox Co Ltd | 3次元形状計測装置および3次元形状計測方法 |
| WO2006105258A2 (en) | 2005-03-30 | 2006-10-05 | Novalux, Inc. | Manufacturable vertical extended cavity surface emitting laser arrays |
| JP2007258657A (ja) | 2005-09-13 | 2007-10-04 | Matsushita Electric Ind Co Ltd | 面発光レーザ装置、受光装置及びそれを用いた光通信システム |
| US7873090B2 (en) | 2005-09-13 | 2011-01-18 | Panasonic Corporation | Surface emitting laser, photodetector and optical communication system using the same |
| JP2008060433A (ja) * | 2006-09-01 | 2008-03-13 | Rohm Co Ltd | レーザアレイ |
| US8102893B2 (en) | 2007-06-14 | 2012-01-24 | Necsel Intellectual Property | Multiple emitter VECSEL |
| JP2009094308A (ja) | 2007-10-10 | 2009-04-30 | Fuji Xerox Co Ltd | 半導体発光モジュール |
| WO2009060365A1 (en) | 2007-11-07 | 2009-05-14 | Koninklijke Philips Electronics N.V. | Extended cavity semiconductor laser device with increased intensity |
| US7959297B2 (en) * | 2008-05-15 | 2011-06-14 | Eastman Kodak Company | Uniform speckle reduced laser projection using spatial and temporal mixing |
| JP5511333B2 (ja) * | 2009-11-30 | 2014-06-04 | 株式会社豊田中央研究所 | 光走査装置、レーザレーダ装置、及び光走査方法 |
| US20110261174A1 (en) | 2010-04-27 | 2011-10-27 | Silverstein Barry D | Stereoscopic digital projection apparatus using polarized light |
| WO2018143188A1 (ja) | 2017-02-02 | 2018-08-09 | 株式会社カネカ | 層間熱接合部材、層間熱接合方法、層間熱接合部材の製造方法 |
-
2014
- 2014-07-28 EP EP14744344.4A patent/EP3028353B1/en active Active
- 2014-07-28 US US14/907,636 patent/US10135225B2/en active Active
- 2014-07-28 WO PCT/EP2014/066185 patent/WO2015014797A1/en not_active Ceased
- 2014-07-28 BR BR112016001885A patent/BR112016001885A2/pt not_active Application Discontinuation
- 2014-07-28 RU RU2016107384A patent/RU2659749C2/ru not_active IP Right Cessation
- 2014-07-28 JP JP2016530477A patent/JP6568065B2/ja active Active
- 2014-07-28 CN CN201480043770.2A patent/CN105474482B/zh active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0553266A1 (en) * | 1990-10-15 | 1993-08-04 | Waldean A Schulz | METHOD AND APPARATUS FOR NON-CONTACT DETECTION OF THREE-DIMENSIONAL SHAPES. |
| EP1394500A1 (de) * | 2002-08-28 | 2004-03-03 | Sick AG | Objekterfassung |
| US20100226402A1 (en) * | 2009-03-09 | 2010-09-09 | Sony Corporation | Laser diode and method of manufacturing the same |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2015014797A1 (en) | 2015-02-05 |
| CN105474482A (zh) | 2016-04-06 |
| JP2016525802A (ja) | 2016-08-25 |
| CN105474482B (zh) | 2019-04-23 |
| JP6568065B2 (ja) | 2019-08-28 |
| US10135225B2 (en) | 2018-11-20 |
| BR112016001885A2 (pt) | 2017-08-01 |
| EP3028353B1 (en) | 2018-07-18 |
| EP3028353A1 (en) | 2016-06-08 |
| RU2016107384A (ru) | 2017-09-07 |
| US20160164258A1 (en) | 2016-06-09 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | The patent is invalid due to non-payment of fees |
Effective date: 20200729 |