RU2560996C2 - Способ измерения на основе структурированного света - Google Patents

Способ измерения на основе структурированного света Download PDF

Info

Publication number
RU2560996C2
RU2560996C2 RU2011129424/28A RU2011129424A RU2560996C2 RU 2560996 C2 RU2560996 C2 RU 2560996C2 RU 2011129424/28 A RU2011129424/28 A RU 2011129424/28A RU 2011129424 A RU2011129424 A RU 2011129424A RU 2560996 C2 RU2560996 C2 RU 2560996C2
Authority
RU
Russia
Prior art keywords
image
light
pixel
light emitter
brightness
Prior art date
Application number
RU2011129424/28A
Other languages
English (en)
Russian (ru)
Other versions
RU2011129424A (ru
Inventor
Кларк Александер БЕНДАЛЛ
Original Assignee
Дженерал Электрик Компани
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Дженерал Электрик Компани filed Critical Дженерал Электрик Компани
Publication of RU2011129424A publication Critical patent/RU2011129424A/ru
Application granted granted Critical
Publication of RU2560996C2 publication Critical patent/RU2560996C2/ru

Links

Images

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/55—Depth or shape recovery from multiple images
    • G06T7/586—Depth or shape recovery from multiple images from multiple light sources, e.g. photometric stereo
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
RU2011129424/28A 2010-07-19 2011-07-18 Способ измерения на основе структурированного света RU2560996C2 (ru)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/838,742 2010-07-19
US12/838,742 US8165351B2 (en) 2010-07-19 2010-07-19 Method of structured light-based measurement

Publications (2)

Publication Number Publication Date
RU2011129424A RU2011129424A (ru) 2013-01-27
RU2560996C2 true RU2560996C2 (ru) 2015-08-20

Family

ID=44510741

Family Applications (1)

Application Number Title Priority Date Filing Date
RU2011129424/28A RU2560996C2 (ru) 2010-07-19 2011-07-18 Способ измерения на основе структурированного света

Country Status (5)

Country Link
US (1) US8165351B2 (enExample)
EP (1) EP2410488A1 (enExample)
JP (1) JP2012027017A (enExample)
CN (1) CN102401646B (enExample)
RU (1) RU2560996C2 (enExample)

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10019812B2 (en) 2011-03-04 2018-07-10 General Electric Company Graphic overlay for measuring dimensions of features using a video inspection device
US10157495B2 (en) 2011-03-04 2018-12-18 General Electric Company Method and device for displaying a two-dimensional image of a viewed object simultaneously with an image depicting the three-dimensional geometry of the viewed object
US9875574B2 (en) 2013-12-17 2018-01-23 General Electric Company Method and device for automatically identifying the deepest point on the surface of an anomaly
US10586341B2 (en) 2011-03-04 2020-03-10 General Electric Company Method and device for measuring features on or near an object
US9984474B2 (en) 2011-03-04 2018-05-29 General Electric Company Method and device for measuring features on or near an object
CN102692207B (zh) * 2011-03-25 2014-07-30 财团法人工业技术研究院 量测方法与量测装置
KR20120117165A (ko) * 2011-04-14 2012-10-24 삼성전자주식회사 3차원 영상의 생성 방법 및 이를 이용하는 내시경 장치
WO2012155142A1 (en) 2011-05-12 2012-11-15 Olive Medical Corporation Pixel array area optimization using stacking scheme for hybrid image sensor with minimal vertical interconnects
JP5918984B2 (ja) * 2011-12-06 2016-05-18 キヤノン株式会社 情報処理装置、情報処理装置の制御方法、およびプログラム
US10568496B2 (en) 2012-07-26 2020-02-25 DePuy Synthes Products, Inc. Continuous video in a light deficient environment
US9516239B2 (en) 2012-07-26 2016-12-06 DePuy Synthes Products, Inc. YCBCR pulsed illumination scheme in a light deficient environment
BR112015001369A2 (pt) 2012-07-26 2017-07-04 Olive Medical Corp sistema de câmera com sensor de imagem cmos monolítico de área mínima
CN104919272B (zh) 2012-10-29 2018-08-03 7D外科有限公司 集成照明及光学表面拓扑检测系统及其使用方法
CN105246394B (zh) 2013-03-15 2018-01-12 德普伊新特斯产品公司 无输入时钟和数据传输时钟的图像传感器同步
JP6107264B2 (ja) * 2013-03-15 2017-04-05 株式会社リコー 撮像ユニット、測色装置、画像形成装置、測色システムおよび距離測定方法
WO2014144986A1 (en) 2013-03-15 2014-09-18 Olive Medical Corporation Scope sensing in a light controlled environment
CA2906798A1 (en) 2013-03-15 2014-09-18 Olive Medical Corporation Super resolution and color motion artifact correction in a pulsed color imaging system
WO2014145248A1 (en) 2013-03-15 2014-09-18 Olive Medical Corporation Minimize image sensor i/o and conductor counts in endoscope applications
US9777913B2 (en) 2013-03-15 2017-10-03 DePuy Synthes Products, Inc. Controlling the integral light energy of a laser pulse
FR3012231B1 (fr) * 2013-10-18 2016-01-01 Univ Aix Marseille Dispositif et procede de reperage de terrain en vol pour microdrone
US9818039B2 (en) 2013-12-17 2017-11-14 General Electric Company Method and device for automatically identifying a point of interest in a depth measurement on a viewed object
US9842430B2 (en) 2013-12-17 2017-12-12 General Electric Company Method and device for automatically identifying a point of interest on a viewed object
WO2015124159A1 (en) * 2014-02-21 2015-08-27 3Dintegrated Aps A set comprising a surgical instrument
DE102014204244A1 (de) * 2014-03-07 2015-09-10 Siemens Aktiengesellschaft Endoskop mit Tiefenbestimmung
DE102014204243A1 (de) * 2014-03-07 2015-09-10 Siemens Aktiengesellschaft Endoskop mit Tiefenbestimmung
EP3119265B1 (en) 2014-03-21 2019-09-11 DePuy Synthes Products, Inc. Card edge connector for an imaging sensor
WO2015199615A1 (en) * 2014-06-27 2015-12-30 Heptagon Micro Optics Pte. Ltd. Structured light imaging system and method
JP6736257B2 (ja) * 2015-04-02 2020-08-05 キヤノン株式会社 情報処理装置、情報処理方法、プログラム
WO2017012624A1 (en) 2015-07-21 2017-01-26 3Dintegrated Aps Cannula assembly kit, trocar assembly kit, sleeve assembly, minimally invasive surgery system and method therefor
US11020144B2 (en) 2015-07-21 2021-06-01 3Dintegrated Aps Minimally invasive surgery system
DK178899B1 (en) 2015-10-09 2017-05-08 3Dintegrated Aps A depiction system
US10704904B2 (en) * 2018-03-20 2020-07-07 Pixart Imaging Inc. Distance detection device
EP3985446B1 (fr) 2020-10-14 2023-05-24 The Swatch Group Research and Development Ltd Dispositif de determination de position d'afficheur d'horlogerie

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5618711A (en) * 1979-07-23 1981-02-21 Canon Inc Device for measuring distance
JPS587515A (ja) * 1981-07-08 1983-01-17 Canon Inc 測距装置
US4937445A (en) * 1986-09-24 1990-06-26 Softac Systems Ltd. Apparatus for determining the distances of points on a surface from a reference axis
SU1682766A1 (ru) * 1988-09-05 1991-10-07 Тернопольский Филиал Львовского Политехнического Института Им.Ленинского Комсомола Способ бесконтактного измерени рассто ний

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4980763A (en) * 1989-06-12 1990-12-25 Welch Allyn, Inc. System for measuring objects viewed through a borescope
US5633675A (en) * 1993-02-16 1997-05-27 Welch Allyn, Inc, Shadow probe
JP3446272B2 (ja) * 1993-11-16 2003-09-16 ソニー株式会社 計測機能付き内視鏡
US5822066A (en) * 1997-02-26 1998-10-13 Ultratech Stepper, Inc. Point diffraction interferometer and pin mirror for use therewith
CA2316838A1 (en) * 1997-12-31 1999-07-08 The Research Foundation Of State University Of New York Method and apparatus for three-dimensional surface contouring using a digital video projection system
US6438272B1 (en) * 1997-12-31 2002-08-20 The Research Foundation Of State University Of Ny Method and apparatus for three dimensional surface contouring using a digital video projection system
JP4387377B2 (ja) * 1998-05-25 2009-12-16 パナソニック株式会社 カメラ
WO1999061948A1 (en) * 1998-05-25 1999-12-02 Matsushita Electric Industrial Co., Ltd. Range finder and camera
JP3912666B2 (ja) * 2001-03-21 2007-05-09 株式会社リコー 光学的形状測定装置
US20020163573A1 (en) * 2001-04-11 2002-11-07 Bieman Leonard H. Imaging system
JP2003050112A (ja) * 2001-08-07 2003-02-21 Minolta Co Ltd 三次元形状入力装置及び投影装置
GB2389914B (en) * 2002-06-18 2004-05-26 Keymed Dual capability borescope
JP2004037272A (ja) * 2002-07-03 2004-02-05 Ricoh Co Ltd 光学的形状測定装置
US7286246B2 (en) * 2003-03-31 2007-10-23 Mitutoyo Corporation Method and apparatus for non-contact three-dimensional surface measurement
SE526735C2 (sv) * 2003-06-13 2005-11-01 Atos Medical Ab Anordning för mätning av fysiska egenskaper hos trumhinnan
CA2528791A1 (en) * 2005-12-01 2007-06-01 Peirong Jia Full-field three-dimensional measurement method
CA2569798C (en) * 2005-12-01 2014-07-29 The University Of Ottawa Full-field three-dimensional measurement method
WO2007079805A1 (de) * 2006-01-08 2007-07-19 Hermann Tropf Erstellung eines abstandsbildes
US8107083B2 (en) * 2008-03-05 2012-01-31 General Electric Company System aspects for a probe system that utilizes structured-light
US7821649B2 (en) 2008-03-05 2010-10-26 Ge Inspection Technologies, Lp Fringe projection system and method for a probe suitable for phase-shift analysis
US7969583B2 (en) 2008-03-05 2011-06-28 General Electric Company System and method to determine an object distance from a reference point to a point on the object surface

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5618711A (en) * 1979-07-23 1981-02-21 Canon Inc Device for measuring distance
JPS587515A (ja) * 1981-07-08 1983-01-17 Canon Inc 測距装置
US4937445A (en) * 1986-09-24 1990-06-26 Softac Systems Ltd. Apparatus for determining the distances of points on a surface from a reference axis
SU1682766A1 (ru) * 1988-09-05 1991-10-07 Тернопольский Филиал Львовского Политехнического Института Им.Ленинского Комсомола Способ бесконтактного измерени рассто ний

Also Published As

Publication number Publication date
CN102401646B (zh) 2014-07-16
US8165351B2 (en) 2012-04-24
RU2011129424A (ru) 2013-01-27
US20120014563A1 (en) 2012-01-19
JP2012027017A (ja) 2012-02-09
CN102401646A (zh) 2012-04-04
EP2410488A1 (en) 2012-01-25

Similar Documents

Publication Publication Date Title
RU2560996C2 (ru) Способ измерения на основе структурированного света
JP7009491B2 (ja) 資産の検査のための方法及びデバイス
US8411083B2 (en) Method and device for displaying an indication of the quality of the three-dimensional data for a surface of a viewed object
EP2175231B1 (en) System aspects for a probe system that utilizes structured-light
JP5432864B2 (ja) 検査装置及び検査方法
JPWO2001073375A1 (ja) 変位センサ
JP2018066740A5 (enExample)
WO2012161239A1 (ja) 内視鏡装置
JP6791631B2 (ja) 画像生成方法及び検査装置
JP2009168582A (ja) 外観検査装置
US20220038613A1 (en) Imaging device
JP2009025189A (ja) 計測器
WO2019194106A1 (ja) 画像処理装置、画像処理方法および画像処理プログラム
JP2011089939A (ja) 外観検査装置及び印刷半田検査装置
JP2007327836A (ja) 外観検査装置及び方法
JP6991600B2 (ja) 画像計測システム、画像計測方法、画像計測プログラムおよび記録媒体
JP2009092409A (ja) ３次元形状測定装置
JP6705301B2 (ja) 計測装置
KR101269128B1 (ko) 중간시점 영상 생성기를 갖는 표면 거칠기 측정 장치 및 방법
JP2007103787A (ja) 固体撮像素子の検査装置
JP2009068898A (ja) 三次元形状測定装置および該方法
KR101314539B1 (ko) 듀얼 동축 카메라를 이용한 비전 검사장치
JP2009014494A (ja) 計測装置
JP2006019901A (ja) 視覚センサ
HK1180036A (en) A method and a device for displaying an indication of the quality of the three-dimensional data for a surface of a viewed object