JP2012027017A - 構造化光ベースの測定の方法 - Google Patents

構造化光ベースの測定の方法 Download PDF

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Publication number
JP2012027017A
JP2012027017A JP2011154365A JP2011154365A JP2012027017A JP 2012027017 A JP2012027017 A JP 2012027017A JP 2011154365 A JP2011154365 A JP 2011154365A JP 2011154365 A JP2011154365 A JP 2011154365A JP 2012027017 A JP2012027017 A JP 2012027017A
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JP
Japan
Prior art keywords
image
light emitter
shadow
pixels
determining
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
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JP2011154365A
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English (en)
Japanese (ja)
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JP2012027017A5 (enExample
Inventor
Alexander Bendall Klerk
クラーク・アレキサンダー・ベンドール
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General Electric Co
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General Electric Co
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Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2012027017A publication Critical patent/JP2012027017A/ja
Publication of JP2012027017A5 publication Critical patent/JP2012027017A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/55—Depth or shape recovery from multiple images
    • G06T7/586—Depth or shape recovery from multiple images from multiple light sources, e.g. photometric stereo
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/50—Depth or shape recovery
    • G06T7/521—Depth or shape recovery from laser ranging, e.g. using interferometry; from the projection of structured light

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Optics & Photonics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
JP2011154365A 2010-07-19 2011-07-13 構造化光ベースの測定の方法 Pending JP2012027017A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/838,742 2010-07-19
US12/838,742 US8165351B2 (en) 2010-07-19 2010-07-19 Method of structured light-based measurement

Publications (2)

Publication Number Publication Date
JP2012027017A true JP2012027017A (ja) 2012-02-09
JP2012027017A5 JP2012027017A5 (enExample) 2014-08-28

Family

ID=44510741

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011154365A Pending JP2012027017A (ja) 2010-07-19 2011-07-13 構造化光ベースの測定の方法

Country Status (5)

Country Link
US (1) US8165351B2 (enExample)
EP (1) EP2410488A1 (enExample)
JP (1) JP2012027017A (enExample)
CN (1) CN102401646B (enExample)
RU (1) RU2560996C2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014181907A (ja) * 2013-03-15 2014-09-29 Ricoh Co Ltd 撮像ユニット、測色装置、画像形成装置、測色システムおよび距離測定方法

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9875574B2 (en) 2013-12-17 2018-01-23 General Electric Company Method and device for automatically identifying the deepest point on the surface of an anomaly
US9984474B2 (en) 2011-03-04 2018-05-29 General Electric Company Method and device for measuring features on or near an object
US10586341B2 (en) 2011-03-04 2020-03-10 General Electric Company Method and device for measuring features on or near an object
US10157495B2 (en) 2011-03-04 2018-12-18 General Electric Company Method and device for displaying a two-dimensional image of a viewed object simultaneously with an image depicting the three-dimensional geometry of the viewed object
US10019812B2 (en) 2011-03-04 2018-07-10 General Electric Company Graphic overlay for measuring dimensions of features using a video inspection device
CN102692207B (zh) * 2011-03-25 2014-07-30 财团法人工业技术研究院 量测方法与量测装置
KR20120117165A (ko) * 2011-04-14 2012-10-24 삼성전자주식회사 3차원 영상의 생성 방법 및 이를 이용하는 내시경 장치
CN103636000B (zh) 2011-05-12 2017-11-17 德普伊辛迪斯制品公司 具有使公差被最优化的互连的图像传感器
JP5918984B2 (ja) * 2011-12-06 2016-05-18 キヤノン株式会社 情報処理装置、情報処理装置の制御方法、およびプログラム
BR112015001293A2 (pt) 2012-07-26 2017-07-04 Olive Medical Corp esquema de iluminação pulsada ycbcr em ambiente com deficiência de luz
CA2878511A1 (en) 2012-07-26 2014-01-30 Olive Medical Corporation Continuous video in a light deficient environment
CN111938543A (zh) 2012-07-26 2020-11-17 德普伊辛迪斯制品公司 具有最小面积单片式cmos图像传感器的相机系统
CA2925620C (en) 2012-10-29 2020-07-21 7D Surgical Inc. Integrated illumination and optical surface topology detection system and methods of use thereof
CA2906798A1 (en) 2013-03-15 2014-09-18 Olive Medical Corporation Super resolution and color motion artifact correction in a pulsed color imaging system
US9777913B2 (en) 2013-03-15 2017-10-03 DePuy Synthes Products, Inc. Controlling the integral light energy of a laser pulse
AU2014233464B2 (en) * 2013-03-15 2018-11-01 DePuy Synthes Products, Inc. Scope sensing in a light controlled environment
WO2014145248A1 (en) 2013-03-15 2014-09-18 Olive Medical Corporation Minimize image sensor i/o and conductor counts in endoscope applications
EP2967285B1 (en) 2013-03-15 2023-08-16 DePuy Synthes Products, Inc. Image sensor synchronization without input clock and data transmission clock
FR3012231B1 (fr) * 2013-10-18 2016-01-01 Univ Aix Marseille Dispositif et procede de reperage de terrain en vol pour microdrone
US9842430B2 (en) 2013-12-17 2017-12-12 General Electric Company Method and device for automatically identifying a point of interest on a viewed object
US9818039B2 (en) 2013-12-17 2017-11-14 General Electric Company Method and device for automatically identifying a point of interest in a depth measurement on a viewed object
WO2015124159A1 (en) * 2014-02-21 2015-08-27 3Dintegrated Aps A set comprising a surgical instrument
DE102014204244A1 (de) * 2014-03-07 2015-09-10 Siemens Aktiengesellschaft Endoskop mit Tiefenbestimmung
DE102014204243A1 (de) * 2014-03-07 2015-09-10 Siemens Aktiengesellschaft Endoskop mit Tiefenbestimmung
EP3119265B1 (en) 2014-03-21 2019-09-11 DePuy Synthes Products, Inc. Card edge connector for an imaging sensor
KR102425033B1 (ko) * 2014-06-27 2022-07-25 에이엠에스 센서스 싱가포르 피티이. 리미티드. 구조광 이미징 시스템 및 방법
JP6736257B2 (ja) 2015-04-02 2020-08-05 キヤノン株式会社 情報処理装置、情報処理方法、プログラム
JP6776327B2 (ja) 2015-07-21 2020-10-28 スリーディインテグレイテッド アーペーエス３Ｄｉｎｔｅｇｒａｔｅｄ Ａｐｓ カニューレアセンブリキット、套管針アセンブリキット、スリーブアセンブリ、低侵襲性手術システム及び方法
US11020144B2 (en) 2015-07-21 2021-06-01 3Dintegrated Aps Minimally invasive surgery system
DK178899B1 (en) 2015-10-09 2017-05-08 3Dintegrated Aps A depiction system
US10704904B2 (en) * 2018-03-20 2020-07-07 Pixart Imaging Inc. Distance detection device
EP3985446B1 (fr) 2020-10-14 2023-05-24 The Swatch Group Research and Development Ltd Dispositif de determination de position d'afficheur d'horlogerie

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07136101A (ja) * 1993-11-16 1995-05-30 Sony Corp 計測機能付き内視鏡
JP2003004425A (ja) * 2001-03-21 2003-01-08 Ricoh Co Ltd 光学的形状測定装置
JP2003050112A (ja) * 2001-08-07 2003-02-21 Minolta Co Ltd 三次元形状入力装置及び投影装置
US6587183B1 (en) * 1998-05-25 2003-07-01 Matsushita Electric Industrial Co., Ltd. Range finder and camera
JP2004037272A (ja) * 2002-07-03 2004-02-05 Ricoh Co Ltd 光学的形状測定装置
JP2006267123A (ja) * 1998-05-25 2006-10-05 Matsushita Electric Ind Co Ltd カメラ

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5618711A (en) * 1979-07-23 1981-02-21 Canon Inc Device for measuring distance
JPS587515A (ja) * 1981-07-08 1983-01-17 Canon Inc 測距装置
CA1266562A (en) * 1986-09-24 1990-03-13 Donald Stewart Distance measuring apparatus
SU1682766A1 (ru) * 1988-09-05 1991-10-07 Тернопольский Филиал Львовского Политехнического Института Им.Ленинского Комсомола Способ бесконтактного измерени рассто ний
US4980763A (en) * 1989-06-12 1990-12-25 Welch Allyn, Inc. System for measuring objects viewed through a borescope
US5633675A (en) * 1993-02-16 1997-05-27 Welch Allyn, Inc, Shadow probe
US5822066A (en) * 1997-02-26 1998-10-13 Ultratech Stepper, Inc. Point diffraction interferometer and pin mirror for use therewith
JP2002500369A (ja) * 1997-12-31 2002-01-08 ザ リサーチ ファウンデーション オブ ステイト ユニヴァーシティ オブ ニューヨーク デジタル・ビデオ投影システムを使用して三次元表面輪郭描画を行う方法および装置
US6438272B1 (en) * 1997-12-31 2002-08-20 The Research Foundation Of State University Of Ny Method and apparatus for three dimensional surface contouring using a digital video projection system
US20020163573A1 (en) * 2001-04-11 2002-11-07 Bieman Leonard H. Imaging system
GB2389914B (en) * 2002-06-18 2004-05-26 Keymed Dual capability borescope
US7286246B2 (en) * 2003-03-31 2007-10-23 Mitutoyo Corporation Method and apparatus for non-contact three-dimensional surface measurement
SE526735C2 (sv) * 2003-06-13 2005-11-01 Atos Medical Ab Anordning för mätning av fysiska egenskaper hos trumhinnan
CA2528791A1 (en) * 2005-12-01 2007-06-01 Peirong Jia Full-field three-dimensional measurement method
CA2569798C (en) * 2005-12-01 2014-07-29 The University Of Waterloo Full-field three-dimensional measurement method
US7804585B2 (en) * 2006-01-08 2010-09-28 Visiontools Bildanalyse Systeme Gmbh Creation of a range image
US7969583B2 (en) 2008-03-05 2011-06-28 General Electric Company System and method to determine an object distance from a reference point to a point on the object surface
US7821649B2 (en) 2008-03-05 2010-10-26 Ge Inspection Technologies, Lp Fringe projection system and method for a probe suitable for phase-shift analysis
US8107083B2 (en) * 2008-03-05 2012-01-31 General Electric Company System aspects for a probe system that utilizes structured-light

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07136101A (ja) * 1993-11-16 1995-05-30 Sony Corp 計測機能付き内視鏡
US6587183B1 (en) * 1998-05-25 2003-07-01 Matsushita Electric Industrial Co., Ltd. Range finder and camera
JP2006267123A (ja) * 1998-05-25 2006-10-05 Matsushita Electric Ind Co Ltd カメラ
JP2003004425A (ja) * 2001-03-21 2003-01-08 Ricoh Co Ltd 光学的形状測定装置
JP2003050112A (ja) * 2001-08-07 2003-02-21 Minolta Co Ltd 三次元形状入力装置及び投影装置
JP2004037272A (ja) * 2002-07-03 2004-02-05 Ricoh Co Ltd 光学的形状測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2014181907A (ja) * 2013-03-15 2014-09-29 Ricoh Co Ltd 撮像ユニット、測色装置、画像形成装置、測色システムおよび距離測定方法

Also Published As

Publication number Publication date
EP2410488A1 (en) 2012-01-25
CN102401646B (zh) 2014-07-16
US8165351B2 (en) 2012-04-24
US20120014563A1 (en) 2012-01-19
RU2011129424A (ru) 2013-01-27
RU2560996C2 (ru) 2015-08-20
CN102401646A (zh) 2012-04-04

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