JP2012027017A5 - - Google Patents

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Publication number
JP2012027017A5
JP2012027017A5 JP2011154365A JP2011154365A JP2012027017A5 JP 2012027017 A5 JP2012027017 A5 JP 2012027017A5 JP 2011154365 A JP2011154365 A JP 2011154365A JP 2011154365 A JP2011154365 A JP 2011154365A JP 2012027017 A5 JP2012027017 A5 JP 2012027017A5
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JP
Japan
Prior art keywords
image
pixels
light emitter
determining
illuminant
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2011154365A
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English (en)
Japanese (ja)
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JP2012027017A (ja
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Publication date
Priority claimed from US12/838,742 external-priority patent/US8165351B2/en
Application filed filed Critical
Publication of JP2012027017A publication Critical patent/JP2012027017A/ja
Publication of JP2012027017A5 publication Critical patent/JP2012027017A5/ja
Pending legal-status Critical Current

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JP2011154365A 2010-07-19 2011-07-13 構造化光ベースの測定の方法 Pending JP2012027017A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/838,742 US8165351B2 (en) 2010-07-19 2010-07-19 Method of structured light-based measurement
US12/838,742 2010-07-19

Publications (2)

Publication Number Publication Date
JP2012027017A JP2012027017A (ja) 2012-02-09
JP2012027017A5 true JP2012027017A5 (enExample) 2014-08-28

Family

ID=44510741

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2011154365A Pending JP2012027017A (ja) 2010-07-19 2011-07-13 構造化光ベースの測定の方法

Country Status (5)

Country Link
US (1) US8165351B2 (enExample)
EP (1) EP2410488A1 (enExample)
JP (1) JP2012027017A (enExample)
CN (1) CN102401646B (enExample)
RU (1) RU2560996C2 (enExample)

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US9842430B2 (en) 2013-12-17 2017-12-12 General Electric Company Method and device for automatically identifying a point of interest on a viewed object
US9818039B2 (en) 2013-12-17 2017-11-14 General Electric Company Method and device for automatically identifying a point of interest in a depth measurement on a viewed object
DK3228254T3 (da) * 2014-02-21 2020-03-23 3Dintegrated Aps Sæt omfattende et kirurgisk instrument
DE102014204244A1 (de) * 2014-03-07 2015-09-10 Siemens Aktiengesellschaft Endoskop mit Tiefenbestimmung
DE102014204243A1 (de) * 2014-03-07 2015-09-10 Siemens Aktiengesellschaft Endoskop mit Tiefenbestimmung
AU2015230978B2 (en) 2014-03-21 2020-01-23 DePuy Synthes Products, Inc. Card edge connector for an imaging sensor
KR102425033B1 (ko) * 2014-06-27 2022-07-25 에이엠에스 센서스 싱가포르 피티이. 리미티드. 구조광 이미징 시스템 및 방법
JP6736257B2 (ja) * 2015-04-02 2020-08-05 キヤノン株式会社 情報処理装置、情報処理方法、プログラム
JP6776327B2 (ja) 2015-07-21 2020-10-28 スリーディインテグレイテッド アーペーエス３Ｄｉｎｔｅｇｒａｔｅｄ Ａｐｓ カニューレアセンブリキット、套管針アセンブリキット、スリーブアセンブリ、低侵襲性手術システム及び方法
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