RU2506570C1 - Способ и устройство для выполнения рентгеновского анализа образца - Google Patents

Способ и устройство для выполнения рентгеновского анализа образца Download PDF

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RU2506570C1
RU2506570C1 RU2012129873/28A RU2012129873A RU2506570C1 RU 2506570 C1 RU2506570 C1 RU 2506570C1 RU 2012129873/28 A RU2012129873/28 A RU 2012129873/28A RU 2012129873 A RU2012129873 A RU 2012129873A RU 2506570 C1 RU2506570 C1 RU 2506570C1
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sample
ray
rays
xrd
xrf
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RU2012129873/28A
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Рависекхар ЙЕЛЛЕПЕДДИ
Пьер-Ив НЕГРО
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Термо Фишер Сайентифик (Экубленс) Сарл
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G01N23/2076—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions for spectrometry, i.e. using an analysing crystal, e.g. for measuring X-ray fluorescence spectrum of a sample with wavelength-dispersion, i.e. WDXFS
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/2206—Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/071—Investigating materials by wave or particle radiation secondary emission combination of measurements, at least 1 secondary emission
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/10—Different kinds of radiation or particles
    • G01N2223/101—Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016—X-ray

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
RU2012129873/28A 2009-12-17 2010-12-13 Способ и устройство для выполнения рентгеновского анализа образца RU2506570C1 (ru)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB0921965.0A GB2476255B (en) 2009-12-17 2009-12-17 Method and apparatus for performing x-ray analysis of a sample
GB0921965.0 2009-12-17
PCT/EP2010/069540 WO2011073148A1 (en) 2009-12-17 2010-12-13 Method and apparatus for performing x-ray analysis of a sample

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RU2506570C1 true RU2506570C1 (ru) 2014-02-10

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US (1) US9031187B2 (enExample)
EP (1) EP2513641B1 (enExample)
JP (1) JP5855573B2 (enExample)
CN (1) CN102770753B (enExample)
GB (1) GB2476255B (enExample)
IN (1) IN2012DN05107A (enExample)
RU (1) RU2506570C1 (enExample)
WO (1) WO2011073148A1 (enExample)
ZA (1) ZA201204142B (enExample)

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RU232863U1 (ru) * 2024-12-25 2025-03-24 федеральное государственное автономное образовательное учреждение высшего образования "Санкт-Петербургский политехнический университет Петра Великого" (ФГАОУ ВО "СПбПУ") Стенд для исследования тонкой структуры металлических материалов при термоциклических испытаниях

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CN103076352B (zh) * 2012-12-28 2015-02-25 中国科学院高能物理研究所 一种获得高品质薄膜样品x射线吸收谱的方法
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DE102014219601B4 (de) 2014-08-13 2023-06-29 Bruker Nano Gmbh Verfahren zum Scannen einer Probe mittels einer Röntgenoptik und eine Apparatur zum Scannen einer Probe
US9746432B2 (en) 2014-09-23 2017-08-29 Olympus Scientific Solutions Americas Inc. Spacer accessory for XRF handheld analyzers
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WO2016193968A1 (en) * 2015-06-01 2016-12-08 Xwinsys Ltd. Metrology inspection apparatus
CN105092618A (zh) * 2015-09-18 2015-11-25 北京师范大学 一种微束能量色散的x射线衍射仪及其使用方法
CN105651801B (zh) * 2015-12-30 2018-10-16 北京矿冶研究总院 一种矿浆矿物在线分析方法
CN105891246B (zh) * 2016-06-23 2018-11-16 北京至一恒盛技术服务有限公司 一种x射线荧光探测装置
WO2018051353A1 (en) * 2016-09-19 2018-03-22 Soreq Nuclear Research Center X-ray fluorescence system and method for identifying samples
CN107228871B (zh) * 2017-07-21 2023-07-04 中国地质大学（武汉） 一种便携式x射线分析装置
IT201700100060A1 (it) * 2017-09-06 2019-03-06 De Tec Tor S R L Apparato di selezione di prodotti in base alla loro composizione tramite spettroscopia a fluorescenza a raggi x e relativo procedimento di selezione
EP3553507A1 (en) * 2018-04-13 2019-10-16 Malvern Panalytical B.V. X-ray analysis apparatus
CN112313505B (zh) * 2018-04-20 2025-01-03 美卓奥图泰芬兰有限公司 X射线荧光分析仪和用于执行x射线荧光分析的方法
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JP6871629B2 (ja) * 2018-06-29 2021-05-12 株式会社リガク Ｘ線分析装置及びその光軸調整方法
IL279576B2 (en) * 2018-07-04 2024-09-01 Rigaku Denki Co Ltd Luminescent X-Ray Analysis Device
KR102986678B1 (ko) * 2020-03-04 2026-07-06 주식회사 엘지화학 전지의 xrd 측정용 챔버 장치
JP7380421B2 (ja) * 2020-05-27 2023-11-15 株式会社島津製作所 Ｘ線分析装置およびｘ線分析方法
EP4019951A1 (en) * 2020-12-24 2022-06-29 Inel S.A.S Apparatuses and methods for combined simultaneous analyses of materials
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EP4201328A1 (en) 2021-12-21 2023-06-28 Universität Hamburg X-ray irradiation apparatus, including a spectrally shaping x-ray optic and a spectral filter aperture device, for x-ray imaging
CN119173759A (zh) * 2022-05-02 2024-12-20 斯格瑞公司 X射线顺序阵列波长色散光谱仪
CN114705708B (zh) * 2022-06-07 2022-08-23 四川大学 一种样品表面成分智能分析方法及系统
CN114720496B (zh) * 2022-06-08 2022-08-26 四川大学 实现全场x射线荧光成像分析的衍射分析装置及方法
CN117129501B (zh) * 2023-08-17 2026-06-19 中国科学院高能物理研究所 一种具有样品纵向深度分辨的xrd检测方法
CN116879335B (zh) * 2023-09-08 2023-11-17 四川大学 一种组合扫描式xrd/xrf综合成像方法
WO2025174816A1 (en) * 2024-02-12 2025-08-21 Kub Technologies, Inc. Dba Kubtec System and method for cabinet radiography utilizing x-ray fluorescence
WO2026107363A1 (en) * 2024-11-14 2026-05-21 Veracio Ltd. Assemblies, systems, and methods for analyzing material samples

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US5406608A (en) * 1992-11-11 1995-04-11 Fisons Plc X-ray analysis apparatus
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Publication number Priority date Publication date Assignee Title
RU232863U1 (ru) * 2024-12-25 2025-03-24 федеральное государственное автономное образовательное учреждение высшего образования "Санкт-Петербургский политехнический университет Петра Великого" (ФГАОУ ВО "СПбПУ") Стенд для исследования тонкой структуры металлических материалов при термоциклических испытаниях

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US20120294418A1 (en) 2012-11-22
US9031187B2 (en) 2015-05-12
CN102770753B (zh) 2016-09-14
EP2513641B1 (en) 2019-04-10
GB2476255A (en) 2011-06-22
GB2476255B (en) 2012-03-07
JP5855573B2 (ja) 2016-02-09
JP2013514527A (ja) 2013-04-25
CN102770753A (zh) 2012-11-07
WO2011073148A1 (en) 2011-06-23
ZA201204142B (en) 2013-02-27
EP2513641A1 (en) 2012-10-24
IN2012DN05107A (enExample) 2015-10-09
GB0921965D0 (en) 2010-02-03

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