NO791508L - Apparat for aa proeve elektriske egenskaper til en krets - Google Patents
Apparat for aa proeve elektriske egenskaper til en kretsInfo
- Publication number
- NO791508L NO791508L NO791508A NO791508A NO791508L NO 791508 L NO791508 L NO 791508L NO 791508 A NO791508 A NO 791508A NO 791508 A NO791508 A NO 791508A NO 791508 L NO791508 L NO 791508L
- Authority
- NO
- Norway
- Prior art keywords
- signal
- sample
- test
- digital
- signals
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title claims description 226
- 230000015654 memory Effects 0.000 claims description 198
- 230000004044 response Effects 0.000 claims description 65
- 230000006870 function Effects 0.000 claims description 34
- 235000014676 Phragmites communis Nutrition 0.000 claims description 24
- 238000012545 processing Methods 0.000 claims description 18
- 230000007704 transition Effects 0.000 claims description 18
- 238000011990 functional testing Methods 0.000 claims description 13
- 125000004122 cyclic group Chemical group 0.000 claims description 6
- 239000000523 sample Substances 0.000 description 125
- 238000010586 diagram Methods 0.000 description 22
- 238000012546 transfer Methods 0.000 description 22
- 239000000872 buffer Substances 0.000 description 7
- VVOIQBFMTVCINR-WWMZEODYSA-N 11-deoxycorticosterone pivalate Chemical compound C1CC2=CC(=O)CC[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H](C(=O)COC(=O)C(C)(C)C)[C@@]1(C)CC2 VVOIQBFMTVCINR-WWMZEODYSA-N 0.000 description 6
- 238000006243 chemical reaction Methods 0.000 description 6
- 238000012790 confirmation Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 5
- 230000001360 synchronised effect Effects 0.000 description 5
- 238000005516 engineering process Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 101000711846 Homo sapiens Transcription factor SOX-9 Proteins 0.000 description 3
- 102100034204 Transcription factor SOX-9 Human genes 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
- 101100232371 Hordeum vulgare IAT3 gene Proteins 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000010276 construction Methods 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 230000006835 compression Effects 0.000 description 1
- 238000007906 compression Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 230000003278 mimic effect Effects 0.000 description 1
- 230000001343 mnemonic effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31915—In-circuit Testers
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/273—Tester hardware, i.e. output processing circuits
- G06F11/2733—Test interface between tester and unit under test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Tests Of Electronic Circuits (AREA)
- Compositions Of Macromolecular Compounds (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/903,160 US4216539A (en) | 1978-05-05 | 1978-05-05 | In-circuit digital tester |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| NO791508L true NO791508L (no) | 1979-11-06 |
Family
ID=25417033
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| NO791508A NO791508L (no) | 1978-05-05 | 1979-05-04 | Apparat for aa proeve elektriske egenskaper til en krets |
Country Status (12)
| Country | Link |
|---|---|
| US (1) | US4216539A (sv) |
| JP (1) | JPS54146940A (sv) |
| AU (1) | AU525707B2 (sv) |
| CA (1) | CA1141436A (sv) |
| DE (1) | DE2918053A1 (sv) |
| DK (1) | DK183979A (sv) |
| FI (1) | FI791414A (sv) |
| FR (1) | FR2425078A1 (sv) |
| GB (1) | GB2020439B (sv) |
| IT (1) | IT1116589B (sv) |
| NO (1) | NO791508L (sv) |
| SE (1) | SE437431B (sv) |
Families Citing this family (73)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4348759A (en) * | 1979-12-17 | 1982-09-07 | International Business Machines Corporation | Automatic testing of complex semiconductor components with test equipment having less channels than those required by the component under test |
| GB2070300B (en) * | 1980-02-27 | 1984-01-25 | Racal Automation Ltd | Electrical testing apparatus and methods |
| US4500993A (en) * | 1980-06-17 | 1985-02-19 | Zehntel, Inc. | In-circuit digital tester for testing microprocessor boards |
| US4339819A (en) * | 1980-06-17 | 1982-07-13 | Zehntel, Inc. | Programmable sequence generator for in-circuit digital testing |
| US4317412A (en) * | 1980-06-25 | 1982-03-02 | International Business Machines Corporation | Control system and method for testing print hammers in a high speed printer |
| US4392107A (en) * | 1980-09-09 | 1983-07-05 | The Bendix Corporation | Switching equipment for testing apparatus |
| US4357703A (en) * | 1980-10-09 | 1982-11-02 | Control Data Corporation | Test system for LSI circuits resident on LSI chips |
| US4439858A (en) * | 1981-05-28 | 1984-03-27 | Zehntel, Inc. | Digital in-circuit tester |
| US4517661A (en) * | 1981-07-16 | 1985-05-14 | International Business Machines Corporation | Programmable chip tester having plural pin unit buffers which each store sufficient test data for independent operations by each pin unit |
| US4554630A (en) * | 1981-08-24 | 1985-11-19 | Genrad, Inc. | Control apparatus for back-driving computer memory and forcing execution of idle loop program in external memory |
| US4433414A (en) * | 1981-09-30 | 1984-02-21 | Fairchild Camera And Instrument Corporation | Digital tester local memory data storage system |
| US4450560A (en) * | 1981-10-09 | 1984-05-22 | Teradyne, Inc. | Tester for LSI devices and memory devices |
| US4451918A (en) * | 1981-10-09 | 1984-05-29 | Teradyne, Inc. | Test signal reloader |
| EP0077725B1 (en) * | 1981-10-16 | 1986-04-30 | FAIRCHILD CAMERA & INSTRUMENT CORPORATION | Current probe signal processing circuit |
| US4555783A (en) * | 1982-04-30 | 1985-11-26 | Genrad, Inc. | Method of computerized in-circuit testing of electrical components and the like with automatic spurious signal suppression |
| FR2531230A1 (fr) * | 1982-07-27 | 1984-02-03 | Rank Xerox Sa | Ensemble destine au test automatique centralise de circuits imprimes et procede de test de circuits a microprocesseur faisant application de cet ensemble |
| US4504783A (en) * | 1982-09-30 | 1985-03-12 | Storage Technology Partners | Test fixture for providing electrical access to each I/O pin of a VLSI chip having a large number of I/O pins |
| US4550406A (en) * | 1983-06-14 | 1985-10-29 | Everett/Charles Test Equipment, Inc. | Automatic test program list generation using programmed digital computer |
| GB2149129B (en) * | 1983-11-04 | 1987-10-21 | Membrain Ltd | Automatic test equipment |
| CA1242486A (en) * | 1983-11-25 | 1988-09-27 | John J. Comfort | Automatic test equipment |
| US4641254A (en) * | 1984-06-14 | 1987-02-03 | The United States Of America As Represented By The Secretary Of The Navy | Test set for a navigational satellite receiver |
| US4633417A (en) * | 1984-06-20 | 1986-12-30 | Step Engineering | Emulator for non-fixed instruction set VLSI devices |
| US4696006A (en) * | 1984-11-26 | 1987-09-22 | Nec Corporation | Method of generating test patterns for logic network devices |
| US4752886A (en) * | 1985-07-22 | 1988-06-21 | General Electric Company | Method for on-line testing of load control circuitry and the associated load |
| US4709366A (en) * | 1985-07-29 | 1987-11-24 | John Fluke Mfg. Co., Inc. | Computer assisted fault isolation in circuit board testing |
| JPS6244674A (ja) * | 1985-08-23 | 1987-02-26 | Toshiba Corp | 評価容易化回路 |
| US4644265A (en) * | 1985-09-03 | 1987-02-17 | International Business Machines Corporation | Noise reduction during testing of integrated circuit chips |
| US4931723A (en) * | 1985-12-18 | 1990-06-05 | Schlumberger Technologies, Inc. | Automatic test system having a "true tester-per-pin" architecture |
| US4672307A (en) * | 1985-12-20 | 1987-06-09 | University Of Southern California | Simplified delay testing for LSI circuit faults |
| US4760330A (en) * | 1986-06-06 | 1988-07-26 | Northern Telecom Limited | Test system with shared test instruments |
| US5025210A (en) * | 1986-07-18 | 1991-06-18 | Kabushiki Kaisha Toshiba | Evaluation facilitating circuit device |
| US4712058A (en) * | 1986-07-22 | 1987-12-08 | Tektronix, Inc. | Active load network |
| US4856001A (en) * | 1987-05-29 | 1989-08-08 | Zehntel, Inc. | Digital in-circuit tester having channel-memory earse-preventer |
| US6539497B2 (en) * | 1987-06-02 | 2003-03-25 | Texas Instruments Incorporated | IC with selectively applied functional and test clocks |
| US4864570A (en) * | 1987-06-29 | 1989-09-05 | International Business Machines Corporation | Processing pulse control circuit for use in device performing signature analysis of digital circuits |
| US4829521A (en) * | 1987-09-11 | 1989-05-09 | The United States Of America As Represented By The Secretary Of The Navy | Test circuit for detecting short duration pulses |
| US5228139A (en) * | 1988-04-19 | 1993-07-13 | Hitachi Ltd. | Semiconductor integrated circuit device with test mode for testing CPU using external signal |
| US4870354A (en) * | 1988-08-11 | 1989-09-26 | Zehntel, Inc. | Apparatus for contacting a printed circuit board with an array of test probes |
| US6304987B1 (en) | 1995-06-07 | 2001-10-16 | Texas Instruments Incorporated | Integrated test circuit |
| US4998250A (en) * | 1988-09-08 | 1991-03-05 | Data I/O Corporation | Method and apparatus for determining an internal state of an electronic component |
| US4949341A (en) * | 1988-10-28 | 1990-08-14 | Motorola Inc. | Built-in self test method for application specific integrated circuit libraries |
| US4980889A (en) * | 1988-12-29 | 1990-12-25 | Deguise Wayne J | Multi-mode testing systems |
| FR2648916B1 (fr) * | 1989-06-27 | 1991-09-06 | Cit Alcatel | Agencement de test de cartes a circuit imprime et son application au test de cartes a circuit imprime formant un equipement de multiplexage-demultiplexage de signaux numeriques |
| JP3005250B2 (ja) | 1989-06-30 | 2000-01-31 | テキサス インスツルメンツ インコーポレイテツド | バスモニター集積回路 |
| US5045782A (en) * | 1990-01-23 | 1991-09-03 | Hewlett-Packard Company | Negative feedback high current driver for in-circuit tester |
| US5289116A (en) * | 1990-05-31 | 1994-02-22 | Hewlett Packard Company | Apparatus and method for testing electronic devices |
| KR100217535B1 (ko) * | 1990-08-06 | 1999-09-01 | 윌리엄 비. 켐플러 | 이벤트 한정 검사 아키텍춰 |
| US5293123A (en) * | 1990-10-19 | 1994-03-08 | Tandem Computers Incorporated | Pseudo-Random scan test apparatus |
| US5321701A (en) * | 1990-12-06 | 1994-06-14 | Teradyne, Inc. | Method and apparatus for a minimal memory in-circuit digital tester |
| GB2251081B (en) * | 1990-12-18 | 1995-08-23 | Motorola Ltd | Automatic analysis apparatus |
| US5515383A (en) * | 1991-05-28 | 1996-05-07 | The Boeing Company | Built-in self-test system and method for self test of an integrated circuit |
| US5550844A (en) * | 1992-11-19 | 1996-08-27 | Proteus Corporation | Printed circuit board fault injection circuit |
| US5951703A (en) * | 1993-06-28 | 1999-09-14 | Tandem Computers Incorporated | System and method for performing improved pseudo-random testing of systems having multi driver buses |
| US5442644A (en) * | 1993-07-01 | 1995-08-15 | Unisys Corporation | System for sensing the state of interconnection points |
| US5596715A (en) * | 1993-07-06 | 1997-01-21 | Digital Equipment Corporation | Method and apparatus for testing high speed busses using gray-code data |
| US5539753A (en) * | 1995-08-10 | 1996-07-23 | International Business Machines Corporation | Method and apparatus for output deselecting of data during test |
| GB2307051B (en) * | 1995-11-06 | 1999-11-03 | Marconi Instruments Ltd | An equipment for testing electronic circuitry |
| US6408413B1 (en) | 1998-02-18 | 2002-06-18 | Texas Instruments Incorporated | Hierarchical access of test access ports in embedded core integrated circuits |
| US6405335B1 (en) | 1998-02-25 | 2002-06-11 | Texas Instruments Incorporated | Position independent testing of circuits |
| US7058862B2 (en) | 2000-05-26 | 2006-06-06 | Texas Instruments Incorporated | Selecting different 1149.1 TAP domains from update-IR state |
| US6311311B1 (en) | 1999-08-19 | 2001-10-30 | International Business Machines Corporation | Multiple input shift register (MISR) signatures used on architected registers to detect interim functional errors on instruction stream test |
| US6728915B2 (en) | 2000-01-10 | 2004-04-27 | Texas Instruments Incorporated | IC with shared scan cells selectively connected in scan path |
| US6769080B2 (en) | 2000-03-09 | 2004-07-27 | Texas Instruments Incorporated | Scan circuit low power adapter with counter |
| US6449576B1 (en) * | 2000-03-29 | 2002-09-10 | International Business Machines Corporation | Network processor probing and port mirroring |
| DE10042620B4 (de) * | 2000-08-30 | 2005-05-04 | Infineon Technologies Ag | Anordnung zum Testen eines Speichermoduls |
| JP2002131392A (ja) * | 2000-10-24 | 2002-05-09 | Ando Electric Co Ltd | アナログ・ディジタル特性試験回路 |
| DE10148157B4 (de) * | 2001-09-28 | 2006-05-18 | Infineon Technologies Ag | Programmgesteuerte Einheit |
| AU2002361616A1 (en) * | 2001-11-13 | 2003-05-26 | Prometric Inc. | Extensible exam language (xxl) protocol for computer based testing |
| US20040153911A1 (en) * | 2002-12-24 | 2004-08-05 | Alon Regev | Testing of a CAM |
| US20050273559A1 (en) | 2004-05-19 | 2005-12-08 | Aris Aristodemou | Microprocessor architecture including unified cache debug unit |
| US8307342B2 (en) * | 2008-05-14 | 2012-11-06 | Honeywell International Inc. | Method, apparatus, and system for automatic test generation from statecharts |
| US20100192128A1 (en) * | 2009-01-27 | 2010-07-29 | Honeywell International Inc. | System and methods of using test points and signal overrides in requirements-based test generation |
| RU200558U1 (ru) * | 2020-01-23 | 2020-10-29 | Василий Львович Зотов | Устройство для диагностики электронных схем |
Family Cites Families (30)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3076864A (en) * | 1960-07-13 | 1963-02-05 | Ohio Brass Co | Suspension apparatus for bundle conductors |
| US3492571A (en) * | 1965-12-02 | 1970-01-27 | Western Electric Co | Apparatus for testing an electrical circuit for opens,shorts and cross connections with its terminal groups being sequentially connected to the apparatus |
| US3423677A (en) * | 1965-12-07 | 1969-01-21 | Texas Instruments Inc | Test system for automatically making static and dynamic tests on an electronic device |
| US3492572A (en) * | 1966-10-10 | 1970-01-27 | Ibm | Programmable electronic circuit testing apparatus having plural multifunction test condition generating circuits |
| US3549996A (en) * | 1967-04-04 | 1970-12-22 | Bendix Corp | Universal tester for dynamic and static tests on the operating efficiency of electrical apparatus |
| US3546582A (en) * | 1968-01-15 | 1970-12-08 | Ibm | Computer controlled test system for performing functional tests on monolithic devices |
| US3541441A (en) * | 1969-02-17 | 1970-11-17 | Ibm | Test system for evaluating amplitude and response characteristics of logic circuits |
| US3621387A (en) * | 1969-08-21 | 1971-11-16 | Gen Instrument Corp | Computer-controlled tester for integrated circuit devices |
| US3631229A (en) * | 1970-09-30 | 1971-12-28 | Ibm | Monolithic memory array tester |
| US3673397A (en) * | 1970-10-02 | 1972-06-27 | Singer Co | Circuit tester |
| US3622876A (en) * | 1970-12-14 | 1971-11-23 | Datatron Inc | Digital module tester system |
| DE2113302A1 (de) * | 1971-03-19 | 1972-10-19 | Knoll Alois Dr Ing | Verfahren zur Pruefung von Schaltungsanordnungen und Einrichtung zur Ausuebung des Verfahrens mit einer programmgesteuerten Datenverarbeitungsanlage |
| DE2121330C3 (de) * | 1971-04-30 | 1974-10-17 | Ludwig 6369 Dortelweil Illian | Verfahren und Schaltungsanordnung zum Prüfen digital arbeitender elektronischer Geräte und ihrer Bauteile |
| US3764995A (en) * | 1971-12-21 | 1973-10-09 | Prd Electronics Inc | Programmable test systems |
| US3763430A (en) * | 1972-01-14 | 1973-10-02 | Burroughs Corp | Circuit testing method and apparatus |
| US3832535A (en) * | 1972-10-25 | 1974-08-27 | Instrumentation Engineering | Digital word generating and receiving apparatus |
| US3812337A (en) * | 1973-04-06 | 1974-05-21 | Gte Automatic Electric Lab Inc | Sequential control circuit having improved fault detection and diagnostic capabilities |
| US3889109A (en) * | 1973-10-01 | 1975-06-10 | Honeywell Inf Systems | Data communications subchannel having self-testing apparatus |
| US3924181A (en) * | 1973-10-16 | 1975-12-02 | Hughes Aircraft Co | Test circuitry employing a cyclic code generator |
| US4000460A (en) * | 1974-07-01 | 1976-12-28 | Xerox Corporation | Digital circuit module test system |
| US3924109A (en) * | 1974-07-22 | 1975-12-02 | Technology Marketing Inc | Automatic circuit card testing system |
| US4097797A (en) * | 1974-10-17 | 1978-06-27 | Burroughs Corporation | Apparatus for testing electrical circuit units such as printed circuit cards |
| US3931506A (en) * | 1974-12-30 | 1976-01-06 | Zehntel, Inc. | Programmable tester |
| US3943439A (en) * | 1974-12-30 | 1976-03-09 | Zehntel, Inc. | Capacitor test apparatus and method |
| US4012625A (en) * | 1975-09-05 | 1977-03-15 | Honeywell Information Systems, Inc. | Non-logic printed wiring board test system |
| US4001818A (en) * | 1975-10-22 | 1977-01-04 | Storage Technology Corporation | Digital circuit failure detector |
| US4102491A (en) * | 1975-12-23 | 1978-07-25 | Instrumentation Engineering, Inc. | Variable function digital word generating, receiving and monitoring device |
| US4039814A (en) * | 1976-06-18 | 1977-08-02 | Saint Hilaire Gilles | Real time programmable digital register analyser |
| US4044244A (en) * | 1976-08-06 | 1977-08-23 | International Business Machines Corporation | Automatic tester for complex semiconductor components including combinations of logic, memory and analog devices and processes of testing thereof |
| US4070565A (en) * | 1976-08-18 | 1978-01-24 | Zehntel, Inc. | Programmable tester method and apparatus |
-
1978
- 1978-05-05 US US05/903,160 patent/US4216539A/en not_active Ceased
-
1979
- 1979-03-15 CA CA000323474A patent/CA1141436A/en not_active Expired
- 1979-04-24 AU AU46327/79A patent/AU525707B2/en not_active Ceased
- 1979-04-25 GB GB7914406A patent/GB2020439B/en not_active Expired
- 1979-05-02 FI FI791414A patent/FI791414A/fi not_active Application Discontinuation
- 1979-05-04 FR FR7911945A patent/FR2425078A1/fr active Granted
- 1979-05-04 DE DE19792918053 patent/DE2918053A1/de active Granted
- 1979-05-04 JP JP5414479A patent/JPS54146940A/ja active Granted
- 1979-05-04 SE SE7903873A patent/SE437431B/sv not_active IP Right Cessation
- 1979-05-04 NO NO791508A patent/NO791508L/no unknown
- 1979-05-04 DK DK183979A patent/DK183979A/da not_active Application Discontinuation
- 1979-05-04 IT IT48942/79A patent/IT1116589B/it active
Also Published As
| Publication number | Publication date |
|---|---|
| GB2020439A (en) | 1979-11-14 |
| SE437431B (sv) | 1985-02-25 |
| AU525707B2 (en) | 1982-11-25 |
| GB2020439B (en) | 1982-12-15 |
| DE2918053C2 (sv) | 1988-03-10 |
| FI791414A (fi) | 1979-11-06 |
| FR2425078B1 (sv) | 1985-05-17 |
| DE2918053A1 (de) | 1979-11-15 |
| JPS54146940A (en) | 1979-11-16 |
| CA1141436A (en) | 1983-02-15 |
| DK183979A (da) | 1979-12-10 |
| JPS638435B2 (sv) | 1988-02-23 |
| SE7903873L (sv) | 1979-11-06 |
| FR2425078A1 (fr) | 1979-11-30 |
| US4216539A (en) | 1980-08-05 |
| AU4632779A (en) | 1979-12-20 |
| IT1116589B (it) | 1986-02-10 |
| IT7948942A0 (it) | 1979-05-04 |
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