DK183979A - Apparat til proevning af et kredsloebs elektriske egenskaber - Google Patents

Apparat til proevning af et kredsloebs elektriske egenskaber

Info

Publication number
DK183979A
DK183979A DK183979A DK183979A DK183979A DK 183979 A DK183979 A DK 183979A DK 183979 A DK183979 A DK 183979A DK 183979 A DK183979 A DK 183979A DK 183979 A DK183979 A DK 183979A
Authority
DK
Denmark
Prior art keywords
appliance
testing
circuit
electrical properties
properties
Prior art date
Application number
DK183979A
Other languages
English (en)
Inventor
D W Raymond
T C Garrett
Original Assignee
Zehntel Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Zehntel Inc filed Critical Zehntel Inc
Publication of DK183979A publication Critical patent/DK183979A/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31915—In-circuit Testers
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/2733—Test interface between tester and unit under test

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
DK183979A 1978-05-05 1979-05-04 Apparat til proevning af et kredsloebs elektriske egenskaber DK183979A (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US05/903,160 US4216539A (en) 1978-05-05 1978-05-05 In-circuit digital tester

Publications (1)

Publication Number Publication Date
DK183979A true DK183979A (da) 1979-12-10

Family

ID=25417033

Family Applications (1)

Application Number Title Priority Date Filing Date
DK183979A DK183979A (da) 1978-05-05 1979-05-04 Apparat til proevning af et kredsloebs elektriske egenskaber

Country Status (12)

Country Link
US (1) US4216539A (da)
JP (1) JPS54146940A (da)
AU (1) AU525707B2 (da)
CA (1) CA1141436A (da)
DE (1) DE2918053A1 (da)
DK (1) DK183979A (da)
FI (1) FI791414A (da)
FR (1) FR2425078A1 (da)
GB (1) GB2020439B (da)
IT (1) IT1116589B (da)
NO (1) NO791508L (da)
SE (1) SE437431B (da)

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JP3005250B2 (ja) 1989-06-30 2000-01-31 テキサス インスツルメンツ インコーポレイテツド バスモニター集積回路
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US6405335B1 (en) 1998-02-25 2002-06-11 Texas Instruments Incorporated Position independent testing of circuits
US7058862B2 (en) 2000-05-26 2006-06-06 Texas Instruments Incorporated Selecting different 1149.1 TAP domains from update-IR state
US6311311B1 (en) 1999-08-19 2001-10-30 International Business Machines Corporation Multiple input shift register (MISR) signatures used on architected registers to detect interim functional errors on instruction stream test
US6728915B2 (en) 2000-01-10 2004-04-27 Texas Instruments Incorporated IC with shared scan cells selectively connected in scan path
US6769080B2 (en) 2000-03-09 2004-07-27 Texas Instruments Incorporated Scan circuit low power adapter with counter
US6449576B1 (en) * 2000-03-29 2002-09-10 International Business Machines Corporation Network processor probing and port mirroring
DE10042620B4 (de) * 2000-08-30 2005-05-04 Infineon Technologies Ag Anordnung zum Testen eines Speichermoduls
JP2002131392A (ja) * 2000-10-24 2002-05-09 Ando Electric Co Ltd アナログ・ディジタル特性試験回路
DE10148157B4 (de) * 2001-09-28 2006-05-18 Infineon Technologies Ag Programmgesteuerte Einheit
US7828551B2 (en) * 2001-11-13 2010-11-09 Prometric, Inc. Method and system for computer based testing using customizable templates
US20040153911A1 (en) * 2002-12-24 2004-08-05 Alon Regev Testing of a CAM
US20050278505A1 (en) 2004-05-19 2005-12-15 Lim Seow C Microprocessor architecture including zero impact predictive data pre-fetch mechanism for pipeline data memory
US8307342B2 (en) * 2008-05-14 2012-11-06 Honeywell International Inc. Method, apparatus, and system for automatic test generation from statecharts
US20100192128A1 (en) * 2009-01-27 2010-07-29 Honeywell International Inc. System and methods of using test points and signal overrides in requirements-based test generation
RU200558U1 (ru) * 2020-01-23 2020-10-29 Василий Львович Зотов Устройство для диагностики электронных схем

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Also Published As

Publication number Publication date
IT7948942A0 (it) 1979-05-04
AU4632779A (en) 1979-12-20
US4216539A (en) 1980-08-05
DE2918053C2 (da) 1988-03-10
JPS638435B2 (da) 1988-02-23
SE437431B (sv) 1985-02-25
FI791414A (fi) 1979-11-06
JPS54146940A (en) 1979-11-16
DE2918053A1 (de) 1979-11-15
GB2020439A (en) 1979-11-14
AU525707B2 (en) 1982-11-25
FR2425078B1 (da) 1985-05-17
CA1141436A (en) 1983-02-15
NO791508L (no) 1979-11-06
GB2020439B (en) 1982-12-15
FR2425078A1 (fr) 1979-11-30
SE7903873L (sv) 1979-11-06
IT1116589B (it) 1986-02-10

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Legal Events

Date Code Title Description
AHS Application shelved for other reasons than non-payment