NO341642B1 - Tidsmerkingssystem og tilhørende metode for merking av hendelser - Google Patents

Tidsmerkingssystem og tilhørende metode for merking av hendelser

Info

Publication number
NO341642B1
NO341642B1 NO20100513A NO20100513A NO341642B1 NO 341642 B1 NO341642 B1 NO 341642B1 NO 20100513 A NO20100513 A NO 20100513A NO 20100513 A NO20100513 A NO 20100513A NO 341642 B1 NO341642 B1 NO 341642B1
Authority
NO
Norway
Prior art keywords
asic
dac
control unit
reference signal
electrically connected
Prior art date
Application number
NO20100513A
Other languages
English (en)
Other versions
NO20100513L (no
Inventor
Naresh Kesavan Rao
Brian David Yanoff
Jianjun Guo
Original Assignee
Gen Electric
Du Yanfeng
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric, Du Yanfeng filed Critical Gen Electric
Publication of NO20100513L publication Critical patent/NO20100513L/no
Publication of NO341642B1 publication Critical patent/NO341642B1/no

Links

Classifications

    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
    • A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
    • A61B6/03—Computed tomography [CT]
    • A61B6/037—Emission tomography
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/247—Detector read-out circuitry
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/249—Measuring radiation intensity with semiconductor detectors specially adapted for use in SPECT or PET
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2985—In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis)
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06G—ANALOGUE COMPUTERS
    • G06G7/00—Devices in which the computing operation is performed by varying electric or magnetic quantities
    • G06G7/12—Arrangements for performing computing operations, e.g. operational amplifiers
    • G06G7/18—Arrangements for performing computing operations, e.g. operational amplifiers for integration or differentiation; for forming integrals
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
    • H04N25/773—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters comprising photon counting circuits, e.g. single photon detection [SPD] or single photon avalanche diodes [SPAD]

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Medical Informatics (AREA)
  • Mathematical Physics (AREA)
  • Theoretical Computer Science (AREA)
  • Biophysics (AREA)
  • Biomedical Technology (AREA)
  • Software Systems (AREA)
  • Veterinary Medicine (AREA)
  • Public Health (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Optics & Photonics (AREA)
  • Pathology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Computer Hardware Design (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Surgery (AREA)
  • Animal Behavior & Ethology (AREA)
  • General Health & Medical Sciences (AREA)
  • Measurement Of Radiation (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Analogue/Digital Conversion (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)

Abstract

Det er frembrakt et datafangstsystem som omfatter en utleser-ASIC (Application Specific Integrated Circuit) med flere kanaler, der hver kanal har en tidsmålerkrets og en energimålerkrets, og hvor ASIC'en er innrettet for å motta flere signaler fra en halvlederbasertstrålingsdetektor. Datafangstsystemet omfatter også en digital- til- analog-omformer (DAG) elektrisk koblet til ASIC'en og innrettet for å levere et referansesignal til ASIC'en anvendt ved generering av digitale avgivelserfra ASICen, og en styringsenhet elektrisk koblet til ASIC'en og til DAC'en, idet styringsenheten er innrettet for å instruere DAC'en til å gi referansesignalet til ASIC'en.
NO20100513A 2008-08-27 2010-04-08 Tidsmerkingssystem og tilhørende metode for merking av hendelser NO341642B1 (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/199,020 US8159286B2 (en) 2007-10-08 2008-08-27 System and method for time-to-voltage conversion with lock-out logic
PCT/US2009/048848 WO2010027551A2 (en) 2008-08-27 2009-06-26 Data acquisition system for photon counting and energy discriminating detectors

Publications (2)

Publication Number Publication Date
NO20100513L NO20100513L (no) 2010-12-07
NO341642B1 true NO341642B1 (no) 2017-12-18

Family

ID=40641281

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20100513A NO341642B1 (no) 2008-08-27 2010-04-08 Tidsmerkingssystem og tilhørende metode for merking av hendelser

Country Status (6)

Country Link
US (1) US8159286B2 (no)
JP (1) JP5600319B2 (no)
CA (1) CA2701545A1 (no)
IL (1) IL204895A0 (no)
NO (1) NO341642B1 (no)
WO (2) WO2010027551A2 (no)

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JP5559471B2 (ja) 2008-11-11 2014-07-23 浜松ホトニクス株式会社 放射線検出装置、放射線画像取得システム、放射線検査システム、及び放射線検出方法
KR101107164B1 (ko) * 2010-01-14 2012-01-25 삼성모바일디스플레이주식회사 엑스레이 검출장치 및 이의 구동방법
US8446308B2 (en) * 2011-04-21 2013-05-21 Kabushiki Kaisha Toshiba Apparatus for detection of a leading edge of a photo sensor output signal
KR101842259B1 (ko) * 2011-09-23 2018-03-27 삼성전자주식회사 이미지 센서 및 이를 포함하는 엑스-레이 이미지 센싱 모듈
FR2983662B1 (fr) * 2011-12-02 2015-02-27 Commissariat Energie Atomique Dispositif de regulation d'un flux aleatoire d'impulsions de tension en entree d'un convertisseur analogique-numerique.
US20140002069A1 (en) * 2012-06-27 2014-01-02 Kenneth Stoddard Eddy current probe
WO2014001984A1 (en) * 2012-06-29 2014-01-03 Koninklijke Philips N.V. Dynamic modeling of imperfections for photon counting detectors
BR112015013392A2 (pt) * 2012-12-12 2017-07-11 Koninklijke Philips Nv sistema de imagem, e método
KR20140092438A (ko) * 2012-12-27 2014-07-24 삼성전자주식회사 엑스선 검출 패널, 엑스선 촬영 장치 및 엑스선 영상 생성 방법
US8786474B1 (en) * 2013-03-15 2014-07-22 Kabushiki Kaisha Toshiba Apparatus for programmable metastable ring oscillator period for multiple-hit delay-chain based time-to-digital circuits
US9063520B2 (en) 2013-03-15 2015-06-23 Kabushiki Kaisha Toshiba Apparatus for inserting delay, nuclear medicine imaging apparatus, method for inserting delay, and method of calibration
EP2871496B1 (en) * 2013-11-12 2020-01-01 Samsung Electronics Co., Ltd Radiation detector and computed tomography apparatus using the same
CN106289333B (zh) * 2015-05-29 2019-01-25 苏州坤元微电子有限公司 电容充放电控制模块以及电流频率转换电路
US10098595B2 (en) * 2015-08-06 2018-10-16 Texas Instruments Incorporated Low power photon counting system
US10117626B2 (en) * 2015-09-29 2018-11-06 General Electric Company Apparatus and method for pile-up correction in photon-counting detector
JP6797909B2 (ja) * 2015-10-20 2020-12-09 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． 直接変換ｘ線検出器のための偏光補正
US10162066B2 (en) 2017-02-06 2018-12-25 General Electric Company Coincidence-enabling photon-counting detector
JP6741613B2 (ja) 2017-03-07 2020-08-19 株式会社日立製作所 放射線撮像装置
US10151845B1 (en) 2017-08-02 2018-12-11 Texas Instruments Incorporated Configurable analog-to-digital converter and processing for photon counting
US10024979B1 (en) 2017-11-01 2018-07-17 Texas Instruments Incorporated Photon counting with coincidence detection
KR20190085740A (ko) 2018-01-11 2019-07-19 삼성전자주식회사 단층 촬영 장치, 그 제어 방법, 및 컴퓨터 프로그램 제품
CN109194331B (zh) * 2018-08-29 2021-10-26 苏州瑞迈斯医疗科技有限公司 电子装置以及校正该电子装置中比较器的方法
US10890674B2 (en) 2019-01-15 2021-01-12 Texas Instruments Incorporated Dynamic noise shaping in a photon counting system

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Also Published As

Publication number Publication date
JP2012511139A (ja) 2012-05-17
WO2010027551A3 (en) 2010-06-03
JP5600319B2 (ja) 2014-10-01
NO20100513L (no) 2010-12-07
IL204895A0 (en) 2010-11-30
WO2010027552A3 (en) 2010-06-03
WO2010027552A2 (en) 2010-03-11
US20090128216A1 (en) 2009-05-21
WO2010027551A2 (en) 2010-03-11
CA2701545A1 (en) 2010-03-11
US8159286B2 (en) 2012-04-17

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