NO317781B1 - System for bruk i grensesnitt-testere med adresseavhengige instruksjoner - Google Patents
System for bruk i grensesnitt-testere med adresseavhengige instruksjoner Download PDFInfo
- Publication number
- NO317781B1 NO317781B1 NO20002268A NO20002268A NO317781B1 NO 317781 B1 NO317781 B1 NO 317781B1 NO 20002268 A NO20002268 A NO 20002268A NO 20002268 A NO20002268 A NO 20002268A NO 317781 B1 NO317781 B1 NO 317781B1
- Authority
- NO
- Norway
- Prior art keywords
- register
- test
- address
- instruction
- test data
- Prior art date
Links
- 230000001419 dependent effect Effects 0.000 title claims description 13
- 238000012360 testing method Methods 0.000 claims description 129
- 238000000034 method Methods 0.000 claims description 11
- 230000003190 augmentative effect Effects 0.000 claims 1
- 210000004027 cell Anatomy 0.000 description 15
- 238000010586 diagram Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 2
- 238000010998 test method Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 210000003888 boundary cell Anatomy 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 150000002148 esters Chemical class 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 230000003864 performance function Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 230000001960 triggered effect Effects 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318558—Addressing or selecting of subparts of the device under test
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Debugging And Monitoring (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/965,919 US6032279A (en) | 1997-11-07 | 1997-11-07 | Boundary scan system with address dependent instructions |
PCT/US1998/023420 WO1999024841A1 (en) | 1997-11-07 | 1998-11-03 | Boundary scan system with address dependent instructions |
Publications (3)
Publication Number | Publication Date |
---|---|
NO20002268D0 NO20002268D0 (no) | 2000-04-28 |
NO20002268L NO20002268L (no) | 2000-07-06 |
NO317781B1 true NO317781B1 (no) | 2004-12-13 |
Family
ID=25510676
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NO20002268A NO317781B1 (no) | 1997-11-07 | 2000-04-28 | System for bruk i grensesnitt-testere med adresseavhengige instruksjoner |
Country Status (12)
Country | Link |
---|---|
US (1) | US6032279A (ko) |
EP (1) | EP1036338B1 (ko) |
JP (1) | JP2001523005A (ko) |
KR (1) | KR20010040269A (ko) |
CN (1) | CN1176383C (ko) |
CA (1) | CA2309144A1 (ko) |
DE (1) | DE69827159T2 (ko) |
HK (1) | HK1030810A1 (ko) |
MY (1) | MY114077A (ko) |
NO (1) | NO317781B1 (ko) |
TW (1) | TW411393B (ko) |
WO (1) | WO1999024841A1 (ko) |
Families Citing this family (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7590910B2 (en) * | 1998-03-27 | 2009-09-15 | Texas Instruments Incorporated | Tap and linking module for scan access of multiple cores with IEEE 1149.1 test access ports |
US6408413B1 (en) * | 1998-02-18 | 2002-06-18 | Texas Instruments Incorporated | Hierarchical access of test access ports in embedded core integrated circuits |
US6694467B2 (en) * | 1999-06-24 | 2004-02-17 | Texas Instruments Incorporated | Low power testing of very large circuits |
US6595685B2 (en) * | 1998-10-13 | 2003-07-22 | National Research Laboratory Of Metrology | Method and apparatus for measuring thermophysical properties |
JP4489870B2 (ja) * | 1999-06-28 | 2010-06-23 | 三菱電機株式会社 | 内部信号観測方法 |
US6779145B1 (en) * | 1999-10-01 | 2004-08-17 | Stmicroelectronics Limited | System and method for communicating with an integrated circuit |
US6594802B1 (en) * | 2000-03-23 | 2003-07-15 | Intellitech Corporation | Method and apparatus for providing optimized access to circuits for debug, programming, and test |
US6651201B1 (en) * | 2000-07-26 | 2003-11-18 | International Business Machines Corporation | Programmable memory built-in self-test combining microcode and finite state machine self-test |
KR100399355B1 (ko) * | 2001-03-12 | 2003-09-26 | 삼성전자주식회사 | 로컬 모니터 회로를 포함하는 반도체 집적 회로 |
US7065675B1 (en) * | 2001-05-08 | 2006-06-20 | Mips Technologies, Inc. | System and method for speeding up EJTAG block data transfers |
WO2003025595A2 (en) * | 2001-09-20 | 2003-03-27 | Koninklijke Philips Electronics N.V. | Electronic device |
US7231552B2 (en) * | 2002-10-24 | 2007-06-12 | Intel Corporation | Method and apparatus for independent control of devices under test connected in parallel |
JP2006510980A (ja) * | 2002-12-20 | 2006-03-30 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 単一の試験アクセス・ポートを介する複数の試験アクセス・ポート・コントローラの接続 |
JP2004264057A (ja) * | 2003-02-12 | 2004-09-24 | Sharp Corp | バウンダリスキャンコントローラ、半導体装置、半導体装置の半導体回路チップ識別方法、半導体装置の半導体回路チップ制御方法 |
CN100365584C (zh) * | 2003-07-28 | 2008-01-30 | 华为技术有限公司 | 一种边界扫描测试的实现方法及装置 |
CN100427964C (zh) * | 2003-08-04 | 2008-10-22 | 华为技术有限公司 | 一种电路板的边界扫描测试方法 |
CN100357751C (zh) * | 2004-02-26 | 2007-12-26 | 联想(北京)有限公司 | 一种jtag模块及应用该模块的调试方法 |
WO2010096711A2 (en) * | 2009-02-19 | 2010-08-26 | Touchdown Technologies, Inc. | Probe head for a microelectronic contactor assembly, and methods of making same |
GB2518866A (en) * | 2013-10-03 | 2015-04-08 | St Microelectronics Res & Dev | Flexible interface |
CN103678068B (zh) * | 2013-12-23 | 2016-09-28 | 大唐微电子技术有限公司 | 一种环形边界扫描装置及方法 |
CN108693466B (zh) * | 2017-04-12 | 2020-09-11 | 上海鹏武电子科技有限公司 | 一种边界扫描器件、装置及控制方法和扫描方法 |
CN108008275B (zh) * | 2017-11-20 | 2020-05-01 | 上海华力微电子有限公司 | 一种具备故障诊断的系统级芯片生产方法 |
CN108845829B (zh) * | 2018-07-03 | 2021-06-25 | 中国人民解放军国防科技大学 | 一种系统寄存器访问指令的执行方法 |
US11408935B2 (en) * | 2019-05-31 | 2022-08-09 | Micron Technology, Inc. | JTAG registers with concurrent inputs |
CN112098818B (zh) * | 2020-11-02 | 2021-02-02 | 创意电子(南京)有限公司 | 一种基于标准边界扫描电路的sip器件测试系统 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5155732A (en) * | 1990-10-09 | 1992-10-13 | At&T Bell Laboratories | Method and apparatus for data transfer to and from devices through a boundary-scan test access port |
US5355369A (en) * | 1991-04-26 | 1994-10-11 | At&T Bell Laboratories | High-speed integrated circuit testing with JTAG |
US5237218A (en) * | 1991-05-03 | 1993-08-17 | Lattice Semiconductor Corporation | Structure and method for multiplexing pins for in-system programming |
US5412260A (en) * | 1991-05-03 | 1995-05-02 | Lattice Semiconductor Corporation | Multiplexed control pins for in-system programming and boundary scan state machines in a high density programmable logic device |
US5394403A (en) * | 1992-06-12 | 1995-02-28 | Sun Microsystems, Inc. | Fully testable chip having self-timed memory arrays |
US5477545A (en) * | 1993-02-09 | 1995-12-19 | Lsi Logic Corporation | Method and apparatus for testing of core-cell based integrated circuits |
US5459737A (en) * | 1993-07-07 | 1995-10-17 | National Semiconductor Corporation | Test access port controlled built in current monitor for IC devices |
US5635855A (en) * | 1995-07-21 | 1997-06-03 | Lattice Semiconductor Corporation | Method for simultaneous programming of in-system programmable integrated circuits |
JP3287539B2 (ja) * | 1996-11-13 | 2002-06-04 | 富士通株式会社 | テスト機構を有する処理システム |
-
1997
- 1997-11-07 US US08/965,919 patent/US6032279A/en not_active Expired - Lifetime
-
1998
- 1998-11-03 CA CA002309144A patent/CA2309144A1/en not_active Abandoned
- 1998-11-03 KR KR1020007004881A patent/KR20010040269A/ko active IP Right Grant
- 1998-11-03 EP EP98956523A patent/EP1036338B1/en not_active Expired - Lifetime
- 1998-11-03 CN CNB98810850XA patent/CN1176383C/zh not_active Expired - Fee Related
- 1998-11-03 JP JP2000519793A patent/JP2001523005A/ja not_active Withdrawn
- 1998-11-03 WO PCT/US1998/023420 patent/WO1999024841A1/en active IP Right Grant
- 1998-11-03 DE DE69827159T patent/DE69827159T2/de not_active Expired - Lifetime
- 1998-11-07 MY MYPI98005078A patent/MY114077A/en unknown
- 1998-11-07 TW TW087118562A patent/TW411393B/zh not_active IP Right Cessation
-
2000
- 2000-04-28 NO NO20002268A patent/NO317781B1/no not_active IP Right Cessation
-
2001
- 2001-03-08 HK HK01101675A patent/HK1030810A1/xx not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP1036338A1 (en) | 2000-09-20 |
MY114077A (en) | 2002-07-31 |
KR20010040269A (ko) | 2001-05-15 |
CN1176383C (zh) | 2004-11-17 |
DE69827159T2 (de) | 2005-11-17 |
NO20002268D0 (no) | 2000-04-28 |
NO20002268L (no) | 2000-07-06 |
US6032279A (en) | 2000-02-29 |
DE69827159D1 (de) | 2004-11-25 |
WO1999024841A1 (en) | 1999-05-20 |
TW411393B (en) | 2000-11-11 |
CN1278332A (zh) | 2000-12-27 |
JP2001523005A (ja) | 2001-11-20 |
EP1036338A4 (en) | 2003-06-18 |
EP1036338B1 (en) | 2004-10-20 |
CA2309144A1 (en) | 1999-05-20 |
HK1030810A1 (en) | 2001-05-18 |
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Guide | SCANSTA101 STA Master |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM1K | Lapsed by not paying the annual fees |