NO20042350L - To modus hoyspenningsforsyning for a gi okt hastighet ved programmering under testing av lav spennings ikke volatile minner - Google Patents

To modus hoyspenningsforsyning for a gi okt hastighet ved programmering under testing av lav spennings ikke volatile minner

Info

Publication number
NO20042350L
NO20042350L NO20042350A NO20042350A NO20042350L NO 20042350 L NO20042350 L NO 20042350L NO 20042350 A NO20042350 A NO 20042350A NO 20042350 A NO20042350 A NO 20042350A NO 20042350 L NO20042350 L NO 20042350L
Authority
NO
Norway
Prior art keywords
volatile memory
provide increased
increased speed
non volatile
high voltage
Prior art date
Application number
NO20042350A
Other languages
English (en)
Norwegian (no)
Inventor
Emil Lambrache
George Smarandoiu
Original Assignee
Atmel Corp A Delaware Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atmel Corp A Delaware Corp filed Critical Atmel Corp A Delaware Corp
Publication of NO20042350L publication Critical patent/NO20042350L/no

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/30—Power supply circuits
NO20042350A 2001-11-06 2004-06-07 To modus hoyspenningsforsyning for a gi okt hastighet ved programmering under testing av lav spennings ikke volatile minner NO20042350L (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/005,317 US6597603B2 (en) 2001-11-06 2001-11-06 Dual mode high voltage power supply for providing increased speed in programming during testing of low voltage non-volatile memories
PCT/US2002/026727 WO2003041085A1 (en) 2001-11-06 2002-08-21 Dual mode high voltage power supply for providing increased speed in programming during testing of low voltage non-volatile memories

Publications (1)

Publication Number Publication Date
NO20042350L true NO20042350L (no) 2004-08-05

Family

ID=21715259

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20042350A NO20042350L (no) 2001-11-06 2004-06-07 To modus hoyspenningsforsyning for a gi okt hastighet ved programmering under testing av lav spennings ikke volatile minner

Country Status (8)

Country Link
US (1) US6597603B2 (ja)
EP (1) EP1451827A4 (ja)
JP (1) JP2005509241A (ja)
CN (1) CN100485809C (ja)
CA (1) CA2465843A1 (ja)
NO (1) NO20042350L (ja)
TW (1) TW574688B (ja)
WO (1) WO2003041085A1 (ja)

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US6809960B2 (en) * 2002-08-26 2004-10-26 Micron Technology, Inc. High speed low voltage driver
JP2004335057A (ja) * 2003-05-12 2004-11-25 Sharp Corp 誤作動防止装置付き半導体記憶装置とそれを用いた携帯電子機器
KR100526576B1 (ko) * 2003-05-30 2005-11-03 주식회사 하이닉스반도체 고전압 전달 회로
JP2005141811A (ja) * 2003-11-05 2005-06-02 Renesas Technology Corp 不揮発性メモリ
US7139198B2 (en) * 2004-01-27 2006-11-21 Sandisk Corporation Efficient verification for coarse/fine programming of non-volatile memory
US7002843B2 (en) * 2004-01-27 2006-02-21 Sandisk Corporation Variable current sinking for coarse/fine programming of non-volatile memory
US7068539B2 (en) * 2004-01-27 2006-06-27 Sandisk Corporation Charge packet metering for coarse/fine programming of non-volatile memory
US7071748B2 (en) * 2004-04-26 2006-07-04 Atmel Corporation Charge pump clock for non-volatile memories
US7110298B2 (en) * 2004-07-20 2006-09-19 Sandisk Corporation Non-volatile system with program time control
KR100757410B1 (ko) * 2005-09-16 2007-09-11 삼성전자주식회사 상 변화 메모리 장치 및 그것의 프로그램 방법
US7304514B2 (en) * 2006-04-06 2007-12-04 Atmel Corporation Methods and circuits for sensing on-chip voltage in powerup mode
JP4808109B2 (ja) * 2006-09-01 2011-11-02 富士通セミコンダクター株式会社 半導体装置
US7427890B2 (en) * 2006-12-29 2008-09-23 Atmel Corporation Charge pump regulator with multiple control options
US8115597B1 (en) * 2007-03-07 2012-02-14 Impinj, Inc. RFID tags with synchronous power rectifier
KR100889312B1 (ko) * 2007-06-08 2009-03-18 주식회사 하이닉스반도체 반도체 소자의 문턱전압 검출부 및 검출방법, 이를 이용한내부전압 생성회로
KR100863019B1 (ko) * 2007-06-22 2008-10-13 주식회사 하이닉스반도체 반도체 집적 회로의 내부 전압 생성 장치
KR100870428B1 (ko) * 2007-09-07 2008-11-26 주식회사 하이닉스반도체 반도체 메모리장치의 고전압발생회로
JP2009122909A (ja) * 2007-11-14 2009-06-04 Toshiba Corp メモリシステム
JP5228468B2 (ja) * 2007-12-17 2013-07-03 富士通セミコンダクター株式会社 システム装置およびシステム装置の動作方法
KR101003154B1 (ko) * 2009-05-15 2010-12-21 주식회사 하이닉스반도체 반도체 메모리 장치
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CN102110483B (zh) * 2009-12-24 2013-05-01 上海华虹集成电路有限责任公司 Eeprom的测试电路及其测试方法
US8248153B2 (en) * 2010-06-29 2012-08-21 Taiwan Semiconductor Manufacturing Co., Ltd. Method and apparatus for full clock cycle charge pump operation
KR101780421B1 (ko) * 2011-02-28 2017-09-21 삼성전자주식회사 비휘발성 메모리 장치, 그것의 워드라인 전압 발생 방법, 프로그램 방법 및 읽기 방법, 그리고 그것을 포함하는 메모리 시스템 및 전자 장치
US8867278B2 (en) 2011-02-28 2014-10-21 Samsung Electronics Co., Ltd. Nonvolatile memory device, memory system including the same, and method of operating nonvolatile memory device
KR101874408B1 (ko) 2011-11-09 2018-07-05 삼성전자주식회사 비휘발성 메모리 장치 및 이를 포함하는 메모리 시스템
KR101391352B1 (ko) * 2011-12-19 2014-05-07 삼성전자주식회사 메모리 시스템 및 그것의 프로그램 방법
KR102291505B1 (ko) * 2014-11-24 2021-08-23 삼성전자주식회사 스토리지 장치 및 스토리지 장치의 동작 방법
US9898059B2 (en) 2016-03-13 2018-02-20 Apple Inc. Dynamic control of power consumption based on memory device activity
GB2558765B (en) * 2016-10-14 2022-05-11 Cirrus Logic Int Semiconductor Ltd Charge pump input current limiter
US10147734B1 (en) 2017-08-30 2018-12-04 Cypress Semiconductor Corporation Memory gate driver technology for flash memory cells
TWI669714B (zh) * 2018-05-29 2019-08-21 力旺電子股份有限公司 電壓控制裝置及記憶體系統
CN110580930B (zh) * 2018-06-11 2021-05-28 立锜科技股份有限公司 具有拟接地电位的内存电路
US11056155B1 (en) 2018-06-20 2021-07-06 Adesto Technologies Corporation Nonvolatile memory devices, systems and methods with switching charge pump architectures
CN111140483B (zh) * 2018-11-06 2022-01-21 研能科技股份有限公司 微型流体输送模块
CN113556103B (zh) * 2020-04-26 2023-07-04 智原微电子(苏州)有限公司 具迟滞功能的比较电路与比较模块

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US6278633B1 (en) * 1999-11-05 2001-08-21 Multi Level Memory Technology High bandwidth flash memory that selects programming parameters according to measurements of previous programming operations

Also Published As

Publication number Publication date
CA2465843A1 (en) 2003-05-15
CN100485809C (zh) 2009-05-06
JP2005509241A (ja) 2005-04-07
WO2003041085A1 (en) 2003-05-15
EP1451827A4 (en) 2007-04-25
US6597603B2 (en) 2003-07-22
US20030090940A1 (en) 2003-05-15
TW574688B (en) 2004-02-01
EP1451827A1 (en) 2004-09-01
CN1613119A (zh) 2005-05-04

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