NO179538C - Fremgangsmåte og innretning for teksturanalyse - Google Patents

Fremgangsmåte og innretning for teksturanalyse

Info

Publication number
NO179538C
NO179538C NO892438A NO892438A NO179538C NO 179538 C NO179538 C NO 179538C NO 892438 A NO892438 A NO 892438A NO 892438 A NO892438 A NO 892438A NO 179538 C NO179538 C NO 179538C
Authority
NO
Norway
Prior art keywords
sub
texture analysis
sheet
computer
analysis method
Prior art date
Application number
NO892438A
Other languages
English (en)
Norwegian (no)
Other versions
NO892438L (no
NO179538B (no
NO892438D0 (no
Inventor
Hans-Joachim Bunge
Hermann Josef Kopineck
Heiner Otten
Original Assignee
Hoesch Stahl Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hoesch Stahl Ag filed Critical Hoesch Stahl Ag
Publication of NO892438D0 publication Critical patent/NO892438D0/no
Publication of NO892438L publication Critical patent/NO892438L/no
Publication of NO179538B publication Critical patent/NO179538B/no
Publication of NO179538C publication Critical patent/NO179538C/no

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20091—Measuring the energy-dispersion spectrum [EDS] of diffracted radiation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Dispersion Chemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
  • Auxiliary Devices For Music (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
NO892438A 1988-07-29 1989-06-13 Fremgangsmåte og innretning for teksturanalyse NO179538C (no)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3825830A DE3825830A1 (de) 1988-07-29 1988-07-29 Verfahren und vorrichtung zur texturanalyse

Publications (4)

Publication Number Publication Date
NO892438D0 NO892438D0 (no) 1989-06-13
NO892438L NO892438L (no) 1990-01-30
NO179538B NO179538B (no) 1996-07-15
NO179538C true NO179538C (no) 1996-10-23

Family

ID=6359857

Family Applications (1)

Application Number Title Priority Date Filing Date
NO892438A NO179538C (no) 1988-07-29 1989-06-13 Fremgangsmåte og innretning for teksturanalyse

Country Status (7)

Country Link
US (1) US4982417A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
EP (1) EP0352423B1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
JP (1) JP2820440B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
AT (1) ATE94649T1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
CA (1) CA1314335C (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
DE (2) DE3825830A1 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)
NO (1) NO179538C (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3825830A1 (de) 1988-07-29 1990-02-01 Hoesch Stahl Ag Verfahren und vorrichtung zur texturanalyse
FR2783444B1 (fr) * 1998-09-21 2000-12-15 Kvaerner Metals Clecim Procede de laminage d'un produit metallique
US6343110B1 (en) * 2000-07-25 2002-01-29 Ge Medical Systems Global Technology Company, Llc Methods and apparatus for submillimeter CT slices with increased coverage
DE102015108060A1 (de) * 2015-05-21 2016-11-24 Ims Messsysteme Gmbh Verfahren und Vorrichtung zur Charakterisierung eines Gefüges eines Bands oder Blechs aus Metall
DE102017208576A1 (de) 2016-05-25 2017-11-30 Sms Group Gmbh Vorrichtung und Verfahren zum Ermitteln einer Mikrostruktur eines Metallprodukts sowie metallurgische Anlage
CN114424054B (zh) 2019-06-24 2024-03-22 Sms集团有限公司 用于确定多晶产品的材料特性的设备和方法
WO2023113862A2 (en) * 2021-06-16 2023-06-22 Carl Zeiss X-ray Microscopy, Inc. Laboratory crystallographic x-ray diffraction analysis system

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3319065A (en) * 1963-11-29 1967-05-09 Jones & Laughlin Steel Corp Scintillation detector comprising a flat annular scintillating crystal
GB1255644A (en) * 1968-05-10 1971-12-01 Rolls Royce Method of determining the value of a mechanical property or properties of a fibre
JPS608456B2 (ja) * 1974-07-10 1985-03-02 理学電機株式会社 結晶粒度測定法
US3984679A (en) * 1975-02-18 1976-10-05 Gte Laboratories Incorporated Coating thickness monitor for multiple layers
US3963439A (en) * 1975-09-05 1976-06-15 The United States Of America As Represented By The Secretary Of The Navy Multielectrode apparatus and techniques to prepare aligned asbestos fibers on a thin substrate
US4095103A (en) * 1976-03-12 1978-06-13 Northwestern University Apparatus and method for determination of residual stress in crystalline substances
US4125771A (en) * 1977-11-18 1978-11-14 Net Systems Inc. Apparatus for determining stress in nickel and titanium alloyed materials
DE2817742C2 (de) * 1978-04-22 1980-07-24 Hoesch Werke Ag, 4600 Dortmund Verfahren und Vorrichtung zum Bestimmen technologischer Kennwerte
JPS5583841A (en) * 1978-12-20 1980-06-24 Hitachi Ltd X ray stress measuring unit using gamma ray excitation x ray source
GB2039363B (en) * 1979-01-12 1983-02-16 Coal Ind Determining the nature of transported material
JPS5890112A (ja) * 1981-11-26 1983-05-28 Toshiba Corp 放射線厚さ計
US4649556A (en) * 1982-09-24 1987-03-10 Northwestern University Method and apparatus for the "on-line", nondestructive measurement and control of grain size in materials
DE3425295C2 (de) * 1984-07-10 1986-07-24 Hoesch Ag, 4600 Dortmund Vorrichtung zur Messung des Dickenprofils von gewalzten Blechbändern
US4715053A (en) * 1985-01-25 1987-12-22 Westinghouse Electric Corp. Method for monitoring the crystallographic texture of metallic tubes by use of X-ray diffraction
DE3825830A1 (de) 1988-07-29 1990-02-01 Hoesch Stahl Ag Verfahren und vorrichtung zur texturanalyse

Also Published As

Publication number Publication date
NO892438L (no) 1990-01-30
DE58905602D1 (de) 1993-10-21
DE3825830A1 (de) 1990-02-01
NO179538B (no) 1996-07-15
ATE94649T1 (de) 1993-10-15
JPH0288952A (ja) 1990-03-29
US4982417A (en) 1991-01-01
EP0352423A3 (de) 1991-05-29
EP0352423A2 (de) 1990-01-31
DE3825830C2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-06-04
EP0352423B1 (de) 1993-09-15
JP2820440B2 (ja) 1998-11-05
NO892438D0 (no) 1989-06-13
CA1314335C (en) 1993-03-09

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Legal Events

Date Code Title Description
MM1K Lapsed by not paying the annual fees

Free format text: LAPSED IN DECEMBER 2003