NO892438D0 - Fremgangsmaate og innretning for teksturanalyse. - Google Patents
Fremgangsmaate og innretning for teksturanalyse.Info
- Publication number
- NO892438D0 NO892438D0 NO892438A NO892438A NO892438D0 NO 892438 D0 NO892438 D0 NO 892438D0 NO 892438 A NO892438 A NO 892438A NO 892438 A NO892438 A NO 892438A NO 892438 D0 NO892438 D0 NO 892438D0
- Authority
- NO
- Norway
- Prior art keywords
- sub
- sheet
- texture analysis
- procedure
- computer
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/20091—Measuring the energy-dispersion spectrum [EDS] of diffracted radiation
Landscapes
- Chemical & Material Sciences (AREA)
- Dispersion Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Auxiliary Devices For Music (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Investigating Or Analysing Materials By The Use Of Chemical Reactions (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE3825830A DE3825830A1 (de) | 1988-07-29 | 1988-07-29 | Verfahren und vorrichtung zur texturanalyse |
Publications (4)
Publication Number | Publication Date |
---|---|
NO892438D0 true NO892438D0 (no) | 1989-06-13 |
NO892438L NO892438L (no) | 1990-01-30 |
NO179538B NO179538B (no) | 1996-07-15 |
NO179538C NO179538C (no) | 1996-10-23 |
Family
ID=6359857
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
NO892438A NO179538C (no) | 1988-07-29 | 1989-06-13 | Fremgangsmåte og innretning for teksturanalyse |
Country Status (7)
Country | Link |
---|---|
US (1) | US4982417A (no) |
EP (1) | EP0352423B1 (no) |
JP (1) | JP2820440B2 (no) |
AT (1) | ATE94649T1 (no) |
CA (1) | CA1314335C (no) |
DE (2) | DE3825830A1 (no) |
NO (1) | NO179538C (no) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE3825830A1 (de) | 1988-07-29 | 1990-02-01 | Hoesch Stahl Ag | Verfahren und vorrichtung zur texturanalyse |
FR2783444B1 (fr) * | 1998-09-21 | 2000-12-15 | Kvaerner Metals Clecim | Procede de laminage d'un produit metallique |
US6343110B1 (en) * | 2000-07-25 | 2002-01-29 | Ge Medical Systems Global Technology Company, Llc | Methods and apparatus for submillimeter CT slices with increased coverage |
DE102015108060A1 (de) * | 2015-05-21 | 2016-11-24 | Ims Messsysteme Gmbh | Verfahren und Vorrichtung zur Charakterisierung eines Gefüges eines Bands oder Blechs aus Metall |
DE102017208576A1 (de) | 2016-05-25 | 2017-11-30 | Sms Group Gmbh | Vorrichtung und Verfahren zum Ermitteln einer Mikrostruktur eines Metallprodukts sowie metallurgische Anlage |
EP3987279B1 (de) | 2019-06-24 | 2023-11-08 | SMS Group GmbH | Vorrichtung und verfahren zum bestimmen der werkstoffeigenschaften eines polykristallinen produkts |
WO2023113862A2 (en) * | 2021-06-16 | 2023-06-22 | Carl Zeiss X-ray Microscopy, Inc. | Laboratory crystallographic x-ray diffraction analysis system |
Family Cites Families (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3319065A (en) * | 1963-11-29 | 1967-05-09 | Jones & Laughlin Steel Corp | Scintillation detector comprising a flat annular scintillating crystal |
GB1255644A (en) * | 1968-05-10 | 1971-12-01 | Rolls Royce | Method of determining the value of a mechanical property or properties of a fibre |
JPS608456B2 (ja) * | 1974-07-10 | 1985-03-02 | 理学電機株式会社 | 結晶粒度測定法 |
US3984679A (en) * | 1975-02-18 | 1976-10-05 | Gte Laboratories Incorporated | Coating thickness monitor for multiple layers |
US3963439A (en) * | 1975-09-05 | 1976-06-15 | The United States Of America As Represented By The Secretary Of The Navy | Multielectrode apparatus and techniques to prepare aligned asbestos fibers on a thin substrate |
US4095103A (en) * | 1976-03-12 | 1978-06-13 | Northwestern University | Apparatus and method for determination of residual stress in crystalline substances |
US4125771A (en) * | 1977-11-18 | 1978-11-14 | Net Systems Inc. | Apparatus for determining stress in nickel and titanium alloyed materials |
DE2817742C2 (de) * | 1978-04-22 | 1980-07-24 | Hoesch Werke Ag, 4600 Dortmund | Verfahren und Vorrichtung zum Bestimmen technologischer Kennwerte |
JPS5583841A (en) * | 1978-12-20 | 1980-06-24 | Hitachi Ltd | X ray stress measuring unit using gamma ray excitation x ray source |
GB2039363B (en) * | 1979-01-12 | 1983-02-16 | Coal Ind | Determining the nature of transported material |
JPS5890112A (ja) * | 1981-11-26 | 1983-05-28 | Toshiba Corp | 放射線厚さ計 |
US4649556A (en) * | 1982-09-24 | 1987-03-10 | Northwestern University | Method and apparatus for the "on-line", nondestructive measurement and control of grain size in materials |
DE3425295C2 (de) * | 1984-07-10 | 1986-07-24 | Hoesch Ag, 4600 Dortmund | Vorrichtung zur Messung des Dickenprofils von gewalzten Blechbändern |
US4715053A (en) * | 1985-01-25 | 1987-12-22 | Westinghouse Electric Corp. | Method for monitoring the crystallographic texture of metallic tubes by use of X-ray diffraction |
DE3825830A1 (de) | 1988-07-29 | 1990-02-01 | Hoesch Stahl Ag | Verfahren und vorrichtung zur texturanalyse |
-
1988
- 1988-07-29 DE DE3825830A patent/DE3825830A1/de active Granted
-
1989
- 1989-05-19 EP EP89108996A patent/EP0352423B1/de not_active Expired - Lifetime
- 1989-05-19 AT AT89108996T patent/ATE94649T1/de not_active IP Right Cessation
- 1989-05-19 DE DE89108996T patent/DE58905602D1/de not_active Expired - Fee Related
- 1989-06-13 NO NO892438A patent/NO179538C/no not_active IP Right Cessation
- 1989-06-22 CA CA000603657A patent/CA1314335C/en not_active Expired - Fee Related
- 1989-07-27 US US07/386,418 patent/US4982417A/en not_active Expired - Fee Related
- 1989-07-28 JP JP1194423A patent/JP2820440B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE3825830C2 (no) | 1992-06-04 |
JP2820440B2 (ja) | 1998-11-05 |
CA1314335C (en) | 1993-03-09 |
EP0352423A3 (de) | 1991-05-29 |
JPH0288952A (ja) | 1990-03-29 |
EP0352423B1 (de) | 1993-09-15 |
NO179538C (no) | 1996-10-23 |
EP0352423A2 (de) | 1990-01-31 |
DE3825830A1 (de) | 1990-02-01 |
US4982417A (en) | 1991-01-01 |
NO892438L (no) | 1990-01-30 |
NO179538B (no) | 1996-07-15 |
DE58905602D1 (de) | 1993-10-21 |
ATE94649T1 (de) | 1993-10-15 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM1K | Lapsed by not paying the annual fees |
Free format text: LAPSED IN DECEMBER 2003 |