JPS5622925A - Analytic measurement method for base material for optical fiber - Google Patents
Analytic measurement method for base material for optical fiberInfo
- Publication number
- JPS5622925A JPS5622925A JP9826979A JP9826979A JPS5622925A JP S5622925 A JPS5622925 A JP S5622925A JP 9826979 A JP9826979 A JP 9826979A JP 9826979 A JP9826979 A JP 9826979A JP S5622925 A JPS5622925 A JP S5622925A
- Authority
- JP
- Japan
- Prior art keywords
- rays
- optical fiber
- base material
- analysis
- transmissivity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
PURPOSE: To enable an easy analysis without destruction by irradiating a workpiece as an optical-fiber base material in process or after manufacture with X-rays of γ- rays, by measuring energy dependency characteristics of transmissivity, and then by analyzing the component on the basis of the analysis.
CONSTITUTION: When X-ray source 1 is used, optical fiber workpiece 8 is irradiated with X-rays, which are detected by detector 2 through lead-made slit structure 3 with slit 4 and its output is passed through amplifier 5 and multichannel pulse height analyzer 6 to record energy spectrum by recorder 7. Exposure source 1 can use monochromatic X-rays and γ-rays by using a crystal monochromator, etc. When the optical fiber consists of n elements, the structure can be determined from transmissivity that corresponds to n energies. Therefore, the analysis can be carried out easily without destruction.
COPYRIGHT: (C)1981,JPO&Japio
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9826979A JPS5622925A (en) | 1979-08-01 | 1979-08-01 | Analytic measurement method for base material for optical fiber |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9826979A JPS5622925A (en) | 1979-08-01 | 1979-08-01 | Analytic measurement method for base material for optical fiber |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5622925A true JPS5622925A (en) | 1981-03-04 |
Family
ID=14215215
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP9826979A Pending JPS5622925A (en) | 1979-08-01 | 1979-08-01 | Analytic measurement method for base material for optical fiber |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5622925A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61167848A (en) * | 1985-01-21 | 1986-07-29 | Furukawa Electric Co Ltd:The | Method for analyzing composition of object to be measured by x-ray |
JPS61167847A (en) * | 1985-01-21 | 1986-07-29 | Furukawa Electric Co Ltd:The | Method for analyzing composition of object to be measured by x-ray |
JPS61240146A (en) * | 1985-04-17 | 1986-10-25 | Furukawa Electric Co Ltd:The | Method for analyzing composition of article to be measured by x-rays |
JPS61240148A (en) * | 1985-04-17 | 1986-10-25 | Furukawa Electric Co Ltd:The | Method for analyzing composition of article to be measured by x-rays |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4168431A (en) * | 1978-01-06 | 1979-09-18 | The Kartridg Pak Co. | Multiple-level X-ray analysis for determining fat percentage |
-
1979
- 1979-08-01 JP JP9826979A patent/JPS5622925A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4168431A (en) * | 1978-01-06 | 1979-09-18 | The Kartridg Pak Co. | Multiple-level X-ray analysis for determining fat percentage |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS61167848A (en) * | 1985-01-21 | 1986-07-29 | Furukawa Electric Co Ltd:The | Method for analyzing composition of object to be measured by x-ray |
JPS61167847A (en) * | 1985-01-21 | 1986-07-29 | Furukawa Electric Co Ltd:The | Method for analyzing composition of object to be measured by x-ray |
JPS61240146A (en) * | 1985-04-17 | 1986-10-25 | Furukawa Electric Co Ltd:The | Method for analyzing composition of article to be measured by x-rays |
JPS61240148A (en) * | 1985-04-17 | 1986-10-25 | Furukawa Electric Co Ltd:The | Method for analyzing composition of article to be measured by x-rays |
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